FAIRCHILD FDD6680AS_NL

FDD6680AS
30V N-Channel PowerTrench® SyncFET™
General Description
Features
The FDD6680AS is designed to replace a single
MOSFET and Schottky diode in synchronous DC:DC
power supplies. This 30V MOSFET is designed to
maximize power conversion efficiency, providing a low
and low gate charge.
The FDD6680AS
RDS(ON)
includes an integrated Schottky diode using Fairchild’s
monolithic SyncFET technology. The performance of
the FDD6680AS as the low-side switch in a
synchronous rectifier is indistinguishable from the
performance of the FDD6680A in parallel with a
Schottky diode.
• 55 A, 30 V
RDS(ON) max= 10.5 mΩ @ VGS = 10 V
RDS(ON) max= 13.0 mΩ @ VGS = 4.5 V
• Includes SyncFET Schottky body diode
• Low gate charge (21nC typical)
• High performance trench technology for extremely
low RDS(ON)
• High power and current handling capability
Applications
• DC/DC converter
.
• Low side notebook
D
D
G
G
S
TO-252
S
Absolute Maximum Ratings
Symbol
TA=25oC unless otherwise noted
Parameter
Ratings
Unit
s
VDSS
Drain-Source Voltage
30
V
VGSS
Gate-Source Voltage
±20
V
ID
Drain Current
(Note 3)
55
A
(Note 1a)
100
(Note 1)
60
(Note 1a)
3.1
– Continuous
– Pulsed
PD
Power Dissipation
(Note 1b)
TJ, TSTG
W
1.3
–55 to +150
°C
(Note 1)
2.1
°C/W
Operating and Storage Junction Temperature Range
Thermal Characteristics
RθJC
Thermal Resistance, Junction-to-Case
RθJA
Thermal Resistance, Junction-to-Ambient
(Note 1a)
40
°C/W
RθJA
Thermal Resistance, Junction-to-Ambient
(Note 1b)
96
°C/W
Package Marking and Ordering Information
Device Marking
FDD6680AS
FDD6680AS
Device
FDD6680AS
FDD6680AS_NL (Note 4)
©2004 Fairchild Semiconductor Corporation
Reel Size
13’’
13’’
Tape width
16mm
16mm
Quantity
2500 units
2500 units
FDD6680AS Rev A(X)
FDD6680AS
December 2004
Symbol
TA = 25°C unless otherwise noted
Parameter
Test Conditions
Min
Typ
Max
Units
54
205
mJ
13.5
A
Drain-Source Avalanche Ratings (Note 2)
WDSS
Drain-Source Avalanche Energy
IAR
Drain-Source Avalanche Current
Single Pulse, VDD = 15 V,
ID=13.5A
Off Characteristics
BVDSS
∆BVDSS
∆TJ
IDSS
IGSS
Drain–Source Breakdown
Voltage
Breakdown Voltage Temperature
Coefficient
30
V
29
mV/°C
Zero Gate Voltage Drain Current
VDS = 24 V,
VGS = 0 V
500
µA
Gate–Body Leakage
VGS = ±20 V,
VDS = 0 V
±100
nA
1.4
–3
3
V
mV/°C
8.6
10.3
12.5
10.5
13.0
16.0
mΩ
On Characteristics
VGS(th)
∆VGS(th)
∆TJ
RDS(on)
VGS = 0 V, ID = 1 mA
ID = 1 mA, Referenced to 25°C
(Note 2)
Gate Threshold Voltage
Gate Threshold Voltage
Temperature Coefficient
VDS = VGS, ID = 1 mA
ID = 1 mA, Referenced to 25°C
1
Static Drain–Source
On–Resistance
VGS = 10 V,
ID = 12.5 A
ID = 10 A
VGS = 4.5 V,
VGS= 10 V, ID = 12.5A, TJ= 125°C
ID(on)
On–State Drain Current
VGS = 10 V,
VDS = 5 V
gFS
Forward Transconductance
VDS = 15 V,
ID = 12.5 A
44
S
VDS = 15 V,
f = 1.0 MHz
V GS = 0 V,
1200
pF
50
A
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
350
pF
Crss
Reverse Transfer Capacitance
120
pF
1.6
Ω
RG
VGS = 15 mV,
Gate Resistance
Switching Characteristics
td(on)
Turn–On Delay Time
tr
Turn–On Rise Time
td(off)
Turn–Off Delay Time
f = 1.0 MHz
(Note 2)
VDD = 15 V,
VGS = 10 V,
ID = 1 A,
RGEN = 6 Ω
10
20
ns
6
12
ns
28
45
ns
tf
Turn–Off Fall Time
12
22
ns
td(on)
Turn–On Delay Time
14
25
ns
13
23
ns
20
32
ns
tr
Turn–On Rise Time
td(off)
Turn–Off Delay Time
tf
Turn–Off Fall Time
11
20
ns
Qg(TOT)
Qg
Total Gate Charge at Vgs=10V
21
29
nC
11
15
nC
Qgs
Gate–Source Charge
Qgd
Gate–Drain Charge
Total Gate Charge at Vgs=5V
VDD = 15 V,
VGS = 4.5 V,
VDD = 15 V,
ID = 1 A,
RGEN = 6 Ω
ID = 12.5 A
3
nC
4
nC
Drain–Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain–Source Diode Forward Current
VSD
Drain–Source Diode Forward
Voltage
trr
Qrr
Diode Reverse Recovery Time
Diode Reverse Recovery Charge
VGS = 0 V, IS = 4.4 A
VGS = 0 V, IS = 7 A
IF = 12.5A,
diF/dt = 300 A/µs
(Note 2)
(Note 2)
0.5
0.6
17
4.4
A
0.7
V
nS
(Note 3)
11
nC
FDD6680AS Rev A (X)
FDD6680AS
Electrical Characteristics
TA = 25°C unless otherwise noted
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.
a) RθJA = 40°C/W when mounted on a
1in2 pad of 2 oz copper
b) RθJA = 96°C/W when mounted
on a minimum pad.
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%
3. Maximum current is calculated as:
PD
R DS(ON)
where PD is maximum power dissipation at TC = 25°C and RDS(on) is at TJ(max) and VGS = 10V. Package current limitation is 21A
4. FDD6680AS_NL is a lead free product. The FDD6680AS_NL marking will appear on the reel label.
FDD6680AS Rev A (X)
FDD6680AS
Electrical Characteristics
FDD6680AS
Typical Characteristics
100
2
VGS = 10V
VGS = 3.0V
RDS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
4.0V
ID, DRAIN CURRENT (A)
80
6.0V
4.5V
3.5V
60
40
3.0V
20
2.5V
0
0.5
1
1.5
2
VDS, DRAIN-SOURCE VOLTAGE (V)
2.5
3.5V
1.4
4.0V
4.5V
1.2
5.0V
6.0V
10V
1
0
3
Figure 1. On-Region Characteristics.
20
40
60
ID, DRAIN CURRENT (A)
80
100
Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
0.032
1.6
ID = 12.5A
VGS =10V
RDS(ON), ON-RESISTANCE (OHM)
RDS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
1.6
0.8
0
1.4
1.2
1
0.8
ID = 6.3A
0.026
0.02
o
TA = 125 C
0.014
o
TA =25 C
0.008
0.6
-50
-25
0
25
50
75
100
o
TJ, JUNCTION TEMPERATURE ( C)
125
2
150
Figure 3. On-Resistance Variation with
Temperature.
4
6
8
VGS, GATE TO SOURCE VOLTAGE (V)
10
Figure 4. On-Resistance Variation with
Gate-to-Source Voltage.
100
100
VGS = 0V
IS, REVERSE DRAIN CURRENT (A)
VDS = 5V
80
ID, DRAIN CURRENT (A)
1.8
60
TA = 125oC
40
-55oC
20
25oC
0
10
TA = 125oC
1
o
25 C
-55oC
0.1
0.01
1
1.5
2
2.5
3
3.5
VGS, GATE TO SOURCE VOLTAGE (V)
4
Figure 5. Transfer Characteristics.
4.5
0
0.2
0.4
0.6
0.8
VSD, BODY DIODE FORWARD VOLTAGE (V)
1
Figure 6. Body Diode Forward Voltage Variation
with Source Current and Temperature.
FDD6680AS Rev A (X)
1800
ID = 12.5A
f = 1MHz
VGS = 0 V
VDS = 10V
1500
8
CAPACITANCE (pF)
VGS, GATE-SOURCE VOLTAGE (V)
10
20V
6
15V
4
1200
Ciss
900
600
Coss
2
300
0
Crss
0
0
5
10
15
20
25
0
5
Qg, GATE CHARGE (nC)
Figure 7. Gate Charge Characteristics.
30
Figure 8. Capacitance Characteristics.
100
P(pk), PEAK TRANSIENT POWER (W)
1000
100
100us
1ms
10ms
100ms
1s
10s
RDS(ON) LIMIT
10
1
DC
VGS = 10V
SINGLE PULSE
RθJA = 96oC/W
0.1
o
TA = 25 C
0.01
0.01
0.1
1
10
VDS, DRAIN-SOURCE VOLTAGE (V)
100
SINGLE PULSE
RθJA = 96°C/W
TA = 25°C
80
60
40
20
0
0.001
Figure 9. Maximum Safe Operating Area.
r(t), NORMALIZED EFFECTIVE TRANSIENT
THERMAL RESISTANCE
ID, DRAIN CURRENT (A)
10
15
20
25
VDS, DRAIN TO SOURCE VOLTAGE (V)
0.01
0.1
1
t1, TIME (sec)
10
100
1000
Figure 10. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
RθJA(t) = r(t) * RθJA
RθJA = 96 °C/W
0.2
0.1
0.1
0.05
P(pk
0.02
0.01
t1
t2
TJ - TA = P * RθJA(t)
Duty Cycle, D = t1 / t2
0.01
SINGLE PULSE
0.001
0.0001
0.001
0.01
0.1
1
10
100
1000
t1, TIME (sec)
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1b.
Transient thermal response will change depending on the circuit board design.
FDD6680AS Rev A (X)
FDD6680AS
Typical Characteristics (continued)
FDD6680AS
Typical Characteristics (continued)
SyncFET Schottky Body Diode
Characteristics
Current: 3A/div
Fairchild’s SyncFET process embeds a Schottky diode
in parallel with PowerTrench MOSFET. This diode
exhibits similar characteristics to a discrete external
Schottky diode in parallel with a MOSFET. Figure 12
shows the reverse recovery characteristic of the
FDD6680AS.
Schottky barrie diodes exhibit significant leakage at
high temperature and high reverse voltage. This will
increase the power in the device.
10nS/div
Figure 12. FDD6680AS SyncFET body diode
reverse recovery characteris
For comparison purposes, Figure 13 shows the
reverse recovery characteristics of the body diode
of an equivalent size MOSFET produced without
SyncFET (FDD6680).
IDSS, REVERSE LEAKAGE CURRENT (A)
0.1
TA = 125oC
0.01
0.001
TA = 100oC
0.0001
TA = 25oC
0.00001
0.000001
0
5
10
15
20
VDS, REVERSE VOLTAGE (V)
25
30
Current: 3A/div
Figure 14. SyncFET body diode reverse
leakage versus drain-source voltage and
temperature.
10nS/div
Figure 13. Non-SyncFET (FDD6680) body
diode reverse recovery characteristic.
FDD6680AS Rev A (X)
FDD6680AS
Typical Characteristics
L
VDS
VGS
RGE
VGS
BVDSS
tP
+
DUT
VDS
IAS
VDD
VDD
-
0V
tp
vary tP to obtain
required peak IAS
IAS
0.01Ω
tAV
Figure 12. Unclamped Inductive Load Test
Circuit
Figure 13. Unclamped Inductive
Waveforms
Drain Current
Same type as
+
50kΩ
10V
-
10µF
+
1µF
VDD
-
VGS
QG(TOT)
10V
DUT
QGD
QGS
VGS
Ig(REF
Charge, (nC)
Figure 14. Gate Charge Test Circuit
VDS
tON
td(ON)
RL
VDS
tr
90%
tOFF
td(OFF
tf
)
90%
+
VGS
RGEN
Figure 15. Gate Charge Waveform
VDD
DUT
VGSPulse Width ≤ 1µs
Duty Cycle ≤ 0.1%
Figure 16. Switching Time Test
Circuit
-
10%
0V
90%
VGS
0V
10%
50%
10%
50%
Pulse Width
Figure 17. Switching Time Waveforms
FDD6680AS Rev A (X)
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
ACEx™
FAST
ActiveArray™
FASTr™
Bottomless™ FPS™
CoolFET™
FRFET™
CROSSVOLT™ GlobalOptoisolator™
DOME™
GTO™
EcoSPARK™ HiSeC™
E2CMOS™
I2C™
EnSigna™
i-Lo™
FACT™
ImpliedDisconnect™
FACT Quiet Series™
IntelliMAX™
ISOPLANAR™
LittleFET™
MICROCOUPLER™
MicroFET™
MicroPak™
MICROWIRE™
MSX™
MSXPro™
OCX™
OCXPro™

Across the board. Around the world.™ OPTOLOGIC
OPTOPLANAR™
The Power Franchise
PACMAN™
Programmable Active Droop™
POP™
Power247™
PowerEdge™
PowerSaver™
PowerTrench
QFET
QS™
QT Optoelectronics™
Quiet Series™
RapidConfigure™
RapidConnect™
µSerDes™
SILENT SWITCHER
SMART START™
SPM™
Stealth™
SuperFET™
SuperSOT™-3
SuperSOT™-6
SuperSOT™-8
SyncFET™
TinyLogic
TINYOPTO™
TruTranslation™
UHC™
UltraFET
UniFET™
VCX™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
2. A critical component is any component of a life
1. Life support devices or systems are devices or
support device or system whose failure to perform can
systems which, (a) are intended for surgical implant into
be reasonably expected to cause the failure of the life
the body, or (b) support or sustain life, or (c) whose
support device or system, or to affect its safety or
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I15