IRF IRFH9310PBF Charge and discharge switch for notebook pc battery application Datasheet

IRFH9310PbF
HEXFET® Power MOSFET
VDS
-30
RDS(on) max
V
S
S
6 mm
mΩ
nC
RG (typical)
110
2.8
ID
-21
A
(@VGS = 10V)
Qg (typical)
(@TA = 25°C)
D
S
D
5 mm
4.6
G
D
Ω
D
PQFN
5mm x 6mm
Applications
• Charge and Discharge Switch for Notebook PC Battery Application
Features and Benefits
Resulting Benefits
Features
Low RDSon (≤ 4.6mΩ)
Industry-Standard PQFN Package
RoHS Compliant Containing no Lead, no Bromide and no Halogen
Orderable part number
Package Type
IRFH9310TRPBF
PQFN 5mm x 6mm
Lower Conduction Losses
results in
Multi-Vendor Compatibility
⇒
Environmentally Friendlier
Standard Pack
Form
Quantity
Tape and Reel
4000
Note
Absolute Maximum Ratings
VDS
VGS
ID @ TA = 25°C
ID @ TA = 70°C
ID @ TC = 25°C
ID @ TC = 70°C
ID @ TC = 25°C
IDM
PD @TA = 25°C
PD @ TA = 70°C
TJ
TSTG
Max.
-30
± 20
Parameter
Drain-to-Source Voltage
Gate-to-Source Voltage
Continuous Drain Current, VGS @ -10V
Continuous Drain Current, VGS @ -10V
Continuous Drain Current, VGS @ -10V (Silicon Limited)
Continuous Drain Current, VGS @ -10V (Silicon Limited)
Continuous Drain Current, VGS @ -10V (Package Limited)
c
Pulsed Drain Current
Power Dissipation
Power Dissipation
Linear Derating Factor
Operating Junction and
Storage Temperature Range
f
f
-21
-17
-107
- 86
-40
-170
3.1
2.0
0.025
-55 to + 150
Units
V
A
W
W/°C
°C
Notes  through † are on page 2
1
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IRFH9310PbF
Static @ TJ = 25°C (unless otherwise specified)
Min.
Typ.
Max.
Units
BVDSS
Drain-to-Source Breakdown Voltage
Parameter
-30
–––
–––
V
∆ΒVDSS/∆TJ
RDS(on)
Breakdown Voltage Temp. Coefficient
–––
–––
0.020
3.7
–––
4.6
V/°C
Static Drain-to-Source On-Resistance
mΩ
Conditions
VGS = 0V, ID = -250µA
Reference to 25°C, ID = -1mA
VGS = -10V, ID = -21A
VGS = -4.5V, ID = -17A
e
e
–––
5.7
7.1
VGS(th)
Gate Threshold Voltage
-1.3
-1.9
-2.4
V
∆VGS(th)
Gate Threshold Voltage Coefficient
–––
-5.8
–––
mV/°C
IDSS
Drain-to-Source Leakage Current
–––
–––
–––
–––
-1.0
-150
µA
VDS = -24V, VGS = 0V
VDS = -24V, VGS = 0V, TJ = 125°C
IGSS
Gate-to-Source Forward Leakage
Gate-to-Source Reverse Leakage
–––
–––
–––
–––
-100
100
nA
VGS = -20V
VGS = 20V
gfs
Qg
Forward Transconductance
Total Gate Charge
39
–––
–––
58
–––
–––
S
nC
110
17
165
–––
nC
Qg
Qgs
h
Total Gate Charge h
Gate-to-Source Charge
–––
–––
Qgd
Gate-to-Drain Charge
–––
28
–––
RG
td(on)
Gate Resistance
Turn-On Delay Time
–––
–––
2.8
25
–––
–––
tr
td(off)
Rise Time
Turn-Off Delay Time
–––
–––
47
65
–––
–––
tf
Ciss
Fall Time
Input Capacitance
–––
–––
70
5250
–––
–––
Coss
Crss
Output Capacitance
Reverse Transfer Capacitance
–––
–––
1300
880
–––
–––
h
h
h
VDS = VGS, ID = -100µA
VDS = -10V, ID = -17A
VDS = -15V,VGS = -4.5V,ID = - 17A
VGS = -10V
VDS = -15V
ID = -17A
Ω
VDD = -15V, VGS = -4.5V
ns
ID = -1.0A
e
RG = 1.8Ω
See Figs. 19a & 19b
VGS = 0V
pF
VDS = -15V
ƒ = 1.0MHz
Avalanche Characteristics
Parameter
EAS
Single Pulse Avalanche Energy
IAR
Avalanche Current
Diode Characteristics
c
d
Parameter
Min.
IS
Continuous Source Current
ISM
(Body Diode)
Pulsed Source Current
Typ.
Typ.
Max.
Units
–––
170
mJ
–––
-17
A
Max.
–––
–––
-3.1
–––
–––
-170
Units
A
c
(Body Diode)
Conditions
MOSFET symbol
showing the
integral reverse
D
G
p-n junction diode.
S
e
VSD
Diode Forward Voltage
–––
–––
-1.2
V
TJ = 25°C, IS = -3.1A, VGS = 0V
trr
Reverse Recovery Time
–––
42
63
ns
TJ = 25°C, IF = -3.1A, VDD = -24V
Qrr
Reverse Recovery Charge
–––
42
63
nC
di/dt = 100/µs
Thermal Resistance
Parameter
g
RθJC
Junction-to-Case
RθJA
Junction-to-Ambient
RθJA
Junction-to-Ambient (t<10s)
f
f
Typ.
Max.
–––
1.6
–––
40
–––
35
e
Units
°C/W
Notes:
 Repetitive rating; pulse width limited by max. junction temperature.
‚ Starting TJ = 25°C, L = 1.1mH, RG = 50Ω, IAS = -17A.
ƒ Pulse width ≤ 400µs; duty cycle ≤ 2%.
„ When mounted on 1 inch square copper board.
Rθ is measured at TJ of approximately 90°C.
† For DESIGN AID ONLY, not subject to production testing.
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1000
1000
100
BOTTOM
TOP
-ID, Drain-to-Source Current (A)
-ID, Drain-to-Source Current (A)
TOP
VGS
-10V
-5.0V
-4.5V
-3.5V
-3.3V
-3.1V
-2.9V
-2.7V
100
10
1
2.7V
≤60µs PULSE WIDTH
BOTTOM
10
-2.7V
≤60µs PULSE WIDTH
Tj = 150°C
Tj = 25°C
1
0.1
0.1
1
10
0.1
100
1000
100
1.6
RDS(on) , Drain-to-Source On Resistance
(Normalized)
-I D, Drain-to-Source Current (A)
10
Fig 2. Typical Output Characteristics
Fig 1. Typical Output Characteristics
100
10
T J = 25°C
TJ = 150°C
1
VDS = -15V
≤60µs PULSE WIDTH
0.1
ID = -21A
VGS = -10V
1.4
1.2
1.0
0.8
0.6
1
2
3
4
5
-60 -40 -20 0
Fig 3. Typical Transfer Characteristics
100000
Fig 4. Normalized On-Resistance vs. Temperature
12.0
VGS = 0V,
f = 1 MHZ
C iss = C gs + C gd, C ds SHORTED
C rss = C gd
-V GS, Gate-to-Source Voltage (V)
ID= -17A
C oss = C ds + C gd
10000
Ciss
Coss
Crss
1000
20 40 60 80 100 120 140 160
T J , Junction Temperature (°C)
-VGS, Gate-to-Source Voltage (V)
C, Capacitance (pF)
1
-V DS, Drain-to-Source Voltage (V)
-V DS, Drain-to-Source Voltage (V)
10.0
VDS= -24V
VDS= -15V
VDS = -6.0V
8.0
6.0
4.0
2.0
0.0
100
1
10
0
100
25
Fig 5. Typical Capacitance vs.Drain-to-Source Voltage
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50
75
100
125
QG Total Gate Charge (nC)
-VDS, Drain-to-Source Voltage (V)
3
VGS
-10V
-5.0V
-4.5V
-3.5V
-3.3V
-3.1V
-2.9V
-2.7V
Fig 6. Typical Gate Charge vs.Gate-to-Source Voltage
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IRFH9310PbF
1000
-I D, Drain-to-Source Current (A)
-I SD, Reverse Drain Current (A)
1000
OPERATION IN THIS AREA
LIMITED BY R DS(on)
100µsec
100
100
T J = 150°C
T J = 25°C
10
1msec
10
1
T A = 25°C
Tj = 150°C
Single Pulse
VGS = 0V
1.0
0.1
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.1
0
1
10
100
-VDS, Drain-to-Source Voltage (V)
-VSD, Source-to-Drain Voltage (V)
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 8. Maximum Safe Operating Area
2.2
-V GS(th), Gate threshold Voltage (V)
25
20
-I D, Drain Current (A)
10msec
DC
15
10
5
2.0
1.8
1.6
ID = -100µA
1.4
1.2
1.0
0
25
50
75
100
125
-75 -50 -25
150
0
25
50
75 100 125 150
T J , Temperature ( °C )
T A , Ambient Temperature (°C)
Fig 10. Threshold Voltage vs. Temperature
Fig 9. Maximum Drain Current vs.
Ambient Temperature
Thermal Response ( Z thJA ) °C/W
100
D = 0.50
10
0.20
0.10
0.05
1
0.02
0.01
0.1
0.01
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthja + T A
SINGLE PULSE
( THERMAL RESPONSE )
0.001
1E-006
1E-005
0.0001
0.001
0.01
0.1
1
10
100
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
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IRFH9310PbF
RDS(on), Drain-to -Source On Resistance ( mΩ)
RDS(on), Drain-to -Source On Resistance (m Ω)
12
ID = -21A
10
8
T J = 125°C
6
4
T J = 25°C
2
0
2
4
6
8
10
12
14
16
18
8
Vgs = -4.5V
6
4
Vgs = -10V
2
0
20
0
20
-V GS, Gate -to -Source Voltage (V)
60
100
120
50000
ID
TOP
-2.0A
-3.1A
BOTTOM -17A
40000
Power (W)
600
400
200
30000
20000
10000
0
1E-8 1E-7 1E-6 1E-5 1E-4 1E-3 1E-2 1E-1
0
25
50
75
100
125
150
Time (sec)
Starting T J , Junction Temperature (°C)
Fig 14. Maximum Avalanche Energy vs. Drain Current
D.U.T *
Fig 15. Typical Power vs. Time
Driver Gate Drive
+
ƒ
+
‚
*
D.U.T. ISD Waveform
Reverse
Recovery
Current
+

•
•
•
•
di/dt controlled by RG
Driver same type as D.U.T.
I SD controlled by Duty Factor "D"
D.U.T. - Device Under Test
VDD
+
-
Re-Applied
Voltage
Body Diode Forward
Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
Body Diode
VDD
Forward Drop
Inductor
Current
Inductor Curent
Ripple ≤ 5%
Reverse Polarity of D.U.T for P-Channel
P.W.
Period
VGS=10V
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
„
D=
Period
P.W.
-
-
*
80
Fig 13. Typical On-Resistance vs. Drain Current
800
RG
40
-I D, Drain Current (A)
Fig 12. On-Resistance vs. Gate Voltage
EAS , Single Pulse Avalanche Energy (mJ)
10
ISD
* VGS = 5V for Logic Level Devices
Fig 16. Diode Reverse Recovery Test Circuit for P-Channel HEXFET® Power MOSFETs
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IRFH9310PbF
Id
Vds
Vgs
L
VCC
DUT
0
20K
1K
Vgs(th)
SS
Qgodr
Fig 17a. Gate Charge Test Circuit
I AS
D.U.T
RG
IAS
-V
GS
-20V
tp
Qgs2 Qgs1
Fig 17b. Gate Charge Waveform
L
VDS
Qgd
VDD
A
DRIVER
0.01Ω
tp
V(BR)DSS
15V
Fig 18b. Unclamped Inductive Waveforms
Fig 18a. Unclamped Inductive Test Circuit
VDS
RD
td(on)
VGS
RG
t d(off)
tf
VGS
D.U.T.
-
+
10%
V DD
-VGS
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Fig 19a. Switching Time Test Circuit
6
tr
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90%
VDS
Fig 19b. Switching Time Waveforms
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IRFH9310PbF
PQFN Package Details
PQFN Part Marking
INTERNATIONAL
RECTIFIER LOGO
6
DATE CODE
ASSEMBLY SITE CODE
(Per SCOP 200-002)
XXXX
XYWWX
XXXXX
PART NUMBER
MARKING CODE
(Per Marking Spec.)
PIN 1
IDENTIFIER
LOT CODE
(Eng Mode - Min. last 4 digits of EATI #)
(Prod Mode - 4 digits SPN code)
TOP MARKING (LASER)
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
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IRFH9310PbF
PQFN Tape and Reel
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
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IRFH9310PbF
Qualification Information†
Qualification level
Moisture Sensitivity Level
Consumer
††
(per JEDEC JESD47F
†††
guidelines)
MSL2
PQFN 5mm x 6mm
†††
(per JEDEC J-STD-020D
)
Yes
RoHS Compliant
† Qualification standards can be found at International Rectifier’s web site
http://www.irf.com/product-info/reliability
†† Higher qualification ratings may be available should the user have such requirements.
Please contact your International Rectifier sales representative for further information:
http://www.irf.com/whoto-call/salesrep/
††† Applicable version of JEDEC standard at the time of product release.
†††† Higher MSL ratings may be available for the specific package types listed here. Please contact your
International Rectifier sales representative for further information: http://www.irf.com/whoto-call/salesrep/
Revision History
Date
8/19/2014
Comments
• Updated datasheet as per new IR Corporate Template
• Updated data sheet with latest PQFN Tape and Reel Diagram.
IR WORLD HEADQUARTERS: 101 N. Sepulveda Blvd., El Segundo, California 90245, USA
To contact International Rectifier, please visit http://www.irf.com/whoto-call/
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