FAIRCHILD 74F794

Revised August 1999
74F794
8-Bit Register with Readback
General Description
Features
The 74F794 is an 8-bit register with readback capability
designed to store data as well as read the register information back onto the data bus. The I/O bus (D bus) has 3STATE outputs. Current sinking capability is 64 mA on both
the D and Q busses.
■ 3-STATE outputs on the I/O port
■ D and Q output sink capability of 64 mA
■ Functionally and pin equivalent to the 74LS794
Data is loaded into the registers on the LOW-to-HIGH transition of the clock (CP). The output enable (OE) is used to
enable data on D0–D7. When OE is LOW, the output of the
registers is enabled on D0–D7, enabling D as an output
bus. When OE is HIGH, D0–D7 are inputs to the registers
configuring D as an input bus.
Ordering Code:
Order Number
Package Number
Package Description
74F794SC
M20B
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
74F794PC
N20A
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbol
© 1999 Fairchild Semiconductor Corporation
Connection Diagram
DS010652
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74F794 8-Bit Register with Readback
March 1990
74F794
Input Loading/Fan-Out
Pin Names
HIGH/LOW
Description
(U.L.)
20 µA/−0.6 mA
1.0/1.0
20 µA/−0.6 mA
Output Enable Input
CP
Clock Pulse Inputs
D0–D7
D Bus Inputs/
3.5/1.083
70 µA/−650 µA
3-STATE Outputs
750/106.6
−15 mA/64 mA
Q Bus Outputs
750/106.6
−15 mA/64 mA
Q0–Q7
Logic Diagram
Truth Table
Inputs
Outputs
OE
Q
D
L or H or ↓
L
Qn
Output, Q
L or H or ↓
CP
Current
1.0/1.0
OE
H
Qn
Input
↑
L
Qn
Output, Q (Note 1)
↑
H
D
Input
Note 1: In this case the output of the register is clocked to the inputs and
the overall Q output is unchanged at Qn.
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Recommended Operating
Conditions
−65°C to + 150°C
Storage Temperature
Ambient Temperature under Bias
−55° to +125°C
Junction Temperature under Bias
−55°C to +150°C
VCC Pin Potential to Ground Pin
74F794
Absolute Maximum Ratings(Note 2)
Free Air Ambient Temperature
0°C to 70°C
+4.5V to +5.5V
Supply Voltage
−0.5V to +7.0V
Input Voltage (Note 3)
−0.5V to +7.0V
Input Current (Note 3)
−30 mA to +5.0 mA
ESD Last Passing Voltage (Min)
4000V
Voltage Applied to Output
In HIGH State (with VCC = 0V)
Standard Output
−0.5V to VCC
3-STATE Output
−0.5V to +5.5V
Note 2: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 3: In this case the output of the register is clocked to the inputs and
the overall Q output is unchanged at Qn.
Current Applied to Output
DC Electrical Characteristics
Symbol
Note 4: Either voltage limit or current limit is sufficient to protect inputs.
Twice the Rated IOL (mA)
in LOW State (Max)
Parameter
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
VCD
Input Clamp
over Operating Temperature Range unless otherwise specified
Min
Typ
Max
2.0
Diode Voltage
VOH
VOL
Output HIGH
2.4
2.8
Voltage
2.0
2.44
Output LOW
0.45
Voltage
IIH
Input HIGH
Current
IBVI
Input HIGH Current
Breakdown Test
IBVIT
Input HIGH Current
Breakdown (I/O)
ICEX
Output HIGH
Leakage Current
VID
Input Leakage
Test
IOD
Output Leakage
IIL
Input LOW
Current
IOS
Output ShortCircuit Current
IIH +
−100
Output Leakage Current
IOZH
IIL +
Output Leakage
IOZL
Current
VID
Input Leakage
Test
IOD
Output Circuit
Conditions
Recognized as a HIGH Signal
0.8
V
Recognized as a LOW Signal
−1.2
V
Min
V
Min
0.55
V
Min
IOL = 64 mA
5.0
µA
Max
VIN = 2.7V
7.0
µA
Max
VIN = 7.0V (OE, CP)
0.5
mA
Max
VIN = 5.5V (Dn)
50
µA
Max
VOUT = VCC
V
0.0
3.75
µA
0.0
−0.6
mA
Max
−225
mA
Max
70
µA
Max
−650
µA
Max
V
0.0
µA
0.0
4.75
3.75
Leakage Current
VCC
V
4.75
Circuit Current
Units
IIN = −18 mA
IOH = −3 mA
IOH = −15 mA
IID = 1.9 µA
All Other Pins Grounded
VIOD = 150 mV
All Other Pins Grounded
VIN = 0.5V
(OE, CP)
VOUT = 0V
VOUT = 2.7V
(Dn)
VOUT = 0.5V
(Dn)
IID = 1.9 µA
All Other Pins Grounded
VIOD = 150 mV
All Other Pins Grounded
IZZ
Bus Drainage Test
100
µA
0.0
VOUT = 5.25V
ICCH
Power Supply Current
65
mA
Max
VO = HIGH
ICCL
Power Supply Current
80
mA
Max
VO = LOW
ICCZ
Power Supply Current
80
mA
Max
VO = HIGH Z
3
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74F794
AC Electrical Characteristics
Symbol
Parameter
Min
TA = +25°C
TA = 0°C to +70°C
VCC = +5.0V
VCC = +5.0V
CL = 50 pF
CL = 50 pF
Typ
Max
Min
Max
fMAX
Maximum Clock Frequency
90
tPLH
Propagation Delay
2.5
7.0
2.5
8.0
tPHL
CP to Qn
2.5
8.0
2.5
9.0
tPZH
Output Enable Time
2.3
8.5
2.0
9.0
2.0
10.0
2.0
10.5
1.0
7.0
1.0
8.0
1.0
7.0
1.0
8.0
tPZL
tPHZ
Output Disable Time
tPLZ
Setup Time, HIGH or LOW
tS(L)
Bus to Clock
4.0
4.0
tH(H)
Hold Time, HIGH or LOW
1.5
1.5
tH(L)
Bus to Clock
1.5
1.5
tW(H
Clock Pulse Width
5.8
5.8
HIGH or LOW
5.8
5.8
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4.0
90
tS(H)
4
4.0
Units
MHz
ns
ns
ns
ns
ns
ns
74F794
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
Package Number M20B
5
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74F794 8-Bit Register with Readback
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N20A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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