Freescale MMA1260EGR2 Low g micromachined accelerometer Datasheet

MMA1260KEG
Rev 0, 11/2009
Freescale Semiconductor
Technical Data
Low G
Micromachined Accelerometer
MMA1260KEG
The MMA series of silicon capacitive, micromachined accelerometers feature
signal conditioning, a 2-pole low pass filter and temperature compensation.
Zero-g offset full scale span and filter cut-off are factory set and require no
external devices. A full system self-test capability verifies system functionality.
MMA1260KEG: Z-AXIS SENSITIVITY
MICROMACHINED
ACCELEROMETER
±1.5g
Features
•
•
•
•
•
•
•
•
Integral Signal Conditioning
Linear Output
2nd Order Bessel Filter
Calibrated Self-test
EPROM Parity Check Status
Transducer Hermetically Sealed at Wafer Level for Superior Reliability
Robust Design, High Shock Survivability
Qualified AEC-Q100, Rev. F Grade 2 (-40°C/ +105°C)
Typical Applications
•
•
•
•
•
•
•
Vibration Monitoring and Recording
Appliance Control
Mechanical Bearing Monitoring
Computer Hard Drive Protection
Computer Mouse and Joysticks
Virtual Reality Input Devices
Sports Diagnostic Devices and Systems
KEG SUFFIX (Pb-FREE)
16-LEAD SOIC
CASE 475-01
ORDERING INFORMATION
Device Name
Temperature Range
Case No.
Package
MMA1260EG
–40° to 105°C
475-01
SOIC-16
MMA1260EGR2
–40° to 105°C
475-01
SOIC-16, Tape & Reel
MMA1260KEG*
–40° to 105°C
475-01
SOIC-16
MMA1260KEGR2*
–40° to 105°C
475-01
SOIC-16, Tape & Reel
*Part number sourced from a different facility.
VDD
G-Cell
Sensor
Integrator
Self-test
Control Logic &
EPROM Trim Circuits
ST
Gain
Filter
Temp Comp
and Gain
Oscillator
Clock
Generator
VOUT
VSS
VSS
VSS
VSS
VOUT
STATUS
VDD
VSS
ST
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
N/C
N/C
N/C
N/C
N/C
N/C
N/C
N/C
STATUS
Figure 1. Simplified Accelerometer Functional Block Diagram
© Freescale Semiconductor, Inc., 2009. All rights reserved.
Figure 2. Pin Connections
Table 1. Maximum Ratings
(Maximum ratings are the limits to which the device can be exposed without causing permanent damage.)
Rating
Symbol
Value
Unit
Powered Acceleration (all axes)
Gpd
1500
g
Unpowered Acceleration (all axes)
Gupd
2000
g
Supply Voltage
VDD
–0.3 to +7.0
V
Drop Test (1)
Ddrop
1.2
m
Tstg
–40 to +125
°C
Storage Temperature Range
1. Dropped onto concrete surface from any axis.
ELECTRO STATIC DISCHARGE (ESD)
WARNING: This device is sensitive to electrostatic
discharge.
Although the Freescale accelerometers contain internal
2 kV ESD protection circuitry, extra precaution must be taken
by the user to protect the chip from ESD. A charge of over
2000 volts can accumulate on the human body or associated
test equipment. A charge of this magnitude can alter the
performance or cause failure of the chip. When handling the
accelerometer, proper ESD precautions should be followed
to avoid exposing the device to discharges which may be
detrimental to its performance.
MMA1260KEG
2
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Freescale Semiconductor
Table 2. Operating Characteristics
(Unless otherwise noted: –40°C ≤ TA ≤ +105°C, 4.75 ≤ VDD ≤ 5.25, Acceleration = 0g, Loaded output.(1))
Characteristic
Symbol
Min
Typ
Max
Unit
VDD
IDD
TA
gFS
4.75
1.1
–40
—
5.00
2.2
—
1.55
5.25
3.2
+105
—
V
mA
°C
g
VOFF
VOFF
S
S
f–3dB
NLOUT
2.25
2.2
1140
1110
40
–1.0
2.5
2.5
1200
1200
50
—
2.75
2.8
1260
1290
60
+1.0
V
V
mV/g
mV/g
Hz
% FSO
Noise
RMS (0.1 Hz – 1.0 kHz)
Spectral Density (RMS, 0.1 Hz – 1.0 KHz)(6)
nRMS
nSD
—
—
5.0
500
9.0
—
mVrms
μg/ Hz
Self-Test
Output Response (VDD = 5.0 V)
Input Low
Input High
Input Loading(7)
Response Time(8)
ΔVST
VIL
VIH
IIN
tST
0.3
VSS
0.7 VDD
–300
—
0.6
—
—
–125
10
0.9
0.3 VDD
VDD
–50
25
V
V
V
μA
ms
Status(9), (10)
Output Low (Iload = 100 μA)
Output High (Iload = 100 μA)
VOL
VOH
—
VDD – 0.8
—
—
0.4
—
V
V
Output Stage Performance
Electrical Saturation Recovery Time(11)
Full Scale Output Range (IOUT = 200 μA)
Capacitive Load Drive(12)
Output Impedance
tDELAY
VFSO
CL
ZO
—
VSS + 0.25
—
—
—
—
—
50
2.0
VDD – 0.25
100
—
ms
V
pF
Ω
Mechanical Characteristics
Transverse Sensitivity(13)
VXZ,YZ
—
—
5.0
% FSO
(2)
Operating Range
Supply Voltage(3)
Supply Current
Operating Temperature Range
Acceleration Range
Output Signal
Zero g (TA = 25°C, VDD = 5.0 V)(4)
Zero g (VDD = 5.0 V)
Sensitivity (TA = 25°C, VDD = 5.0 V)(5)
Sensitivity (VDD = 5.0 V)
Bandwidth Response
Nonlinearity
1. For a loaded output the measurements are observed after an RC filter consisting of a 1 kΩ resistor and a 0.1 μF capacitor to ground.
2. These limits define the range of operation for which the part will meet specification.
3. Within the supply range of 4.75 and 5.25 volts, the device operates as a fully calibrated linear accelerometer. Beyond these supply limits the
device may operate as a linear device but is not guaranteed to be in calibration.
4. The device can measure both + and – acceleration. With no input acceleration the output is at midsupply. For positive acceleration the output
will increase above VDD/2 and for negative acceleration the output will decrease below VDD/2.
5. The device is calibrated at 1g. Sensitivity limits apply to 0Hz acceleration.
6. At clock frequency ≅70 kHz.
7. The digital input pin has an internal pull-down current source to prevent inadvertent self test initiation due to external board level leakages.
8. Time for the output to reach 90% of its final value after a self-test is initiated.
9. The Status pin output is not valid following power-up until at least one rising edge has been applied to the self-test pin. The Status pin is high
whenever the self-test input is high, as a means to check the connectivity of the self-test and Status pins in the application.
10. The Status pin output latches high if a Low Voltage Detection or Clock Frequency failure occurs, or the EPROM parity changes to odd. The
Status pin can be reset low if the self-test pin is pulsed with a high input for at least 100 μs, unless a fault condition continues to exist.
11. Time for amplifiers to recover after an acceleration signal causes them to saturate.
12. Preserves phase margin (60°) to guarantee output amplifier stability.
13. A measure of the device's ability to reject an acceleration applied 90° from the true axis of sensitivity.
MMA1260KEG
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Freescale Semiconductor
3
PRINCIPLE OF OPERATION
The Freescale accelerometer is a surface-micromachined
integrated-circuit accelerometer.
The device consists of a surface micromachined
capacitive sensing cell (g-cell) and a CMOS signal
conditioning ASIC contained in a single integrated circuit
package. The sensing element is sealed hermetically at the
wafer level using a bulk micromachined “cap'' wafer.
The g-cell is a mechanical structure formed from
semiconductor materials (polysilicon) using semiconductor
processes (masking and etching). It can be modeled as two
stationary plates with a moveable plate in-between. The
center plate can be deflected from its rest position by
subjecting the system to an acceleration (Figure 3).
When the center plate deflects, the distance from it to one
fixed plate will increase by the same amount that the distance
to the other plate decreases. The change in distance is a
measure of acceleration.
The g-cell plates form two back-to-back capacitors
(Figure 4). As the center plate moves with acceleration, the
distance between the plates changes and each capacitor's
value will change, (C = Aε/D). Where A is the area of the
plate, ε is the dielectric constant, and D is the distance
between the plates.
The CMOS ASIC uses switched capacitor techniques to
measure the g-cell capacitors and extract the acceleration
data from the difference between the two capacitors. The
ASIC also signal conditions and filters (switched capacitor)
the signal, providing a high level output voltage that is
ratiometric and proportional to acceleration.
Acceleration
Figure 3. Transducer
Physical Model
SPECIAL FEATURES
Filtering
The Freescale accelerometers contain an onboard 2-pole
switched capacitor filter. A Bessel implementation is used
because it provides a maximally flat delay response (linear
phase) thus preserving pulse shape integrity. Because the
filter is realized using switched capacitor techniques, there is
no requirement for external passive components (resistors
and capacitors) to set the cut-off frequency.
Self-Test
The sensor provides a self-test feature that allows the
verification of the mechanical and electrical integrity of the
accelerometer at any time before or after installation. This
feature is critical in applications such as automotive airbag
systems where system integrity must be ensured over the life
of the vehicle. A fourth “plate'' is used in the g-cell as a selftest plate. When the user applies a logic high input to the selftest pin, a calibrated potential is applied across the self-test
plate and the moveable plate. The resulting electrostatic
force (Fe = 1/2 AV2/d2) causes the center plate to deflect. The
resultant deflection is measured by the accelerometer's
control ASIC and a proportional output voltage results. This
procedure assures that both the mechanical (g-cell) and
electronic sections of the accelerometer are functioning.
Status
Freescale accelerometers include fault detection circuitry
and a fault latch. The Status pin is an output from the fault
latch, OR'd with self-test, and is set high whenever the
following event occurs:
• Parity of the EPROM bits becomes odd in number.
The fault latch can be reset by a rising edge on the self-test
input pin, unless one (or more) of the fault conditions
continues to exist.
Figure 4. Equivalent
Circuit Model
MMA1260KEG
4
Sensors
Freescale Semiconductor
BASIC CONNECTIONS
PCB Layout
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
8
N/C
N/C
N/C
N/C
N/C
N/C
N/C
N/C
STATUS
P1
ST
P0
Accelerometer
VSS
VSS
VSS
VOUT
STATUS
VDD
VSS
ST
VOUT
VSS
VDD
R
1 kΩ
A/D In
C
0.1 μF
C 0.1 μF
VSS
C 0.1 μF
VDD
VRH
C
Table 3. Pin Descriptions
Microcontroller
Pinout Description
0.1 μF
Power Supply
Pin No.
Pin Name
Description
1 thru 3
VSS
Redundant connections to the internal
VSS and may be left unconnected.
4
VOUT
5
STATUS
6
VDD
The power supply input.
7
VSS
The power supply ground.
8
ST
Logic input pin used to initiate self-test.
9 thru 13
Trim pins
14 thru 16
—
Output voltage of the accelerometer.
Logic output pin to indicate fault.
Figure 6. Recommended PCB Layout for Interfacing
Accelerometer to Microcontroller
NOTES:
1. Use a 0.1 μF capacitor on VDD to decouple the power
source.
2. Physical coupling distance of the accelerometer to the
microcontroller should be minimal.
Used for factory trim. Leave
unconnected.
3. Place a ground plane beneath the accelerometer to
reduce noise, the ground plane should be attached to
all of the open ended terminals shown in Figure 6.
4. Use an RC filter of 1 kΩ and 0.1 μF on the output of the
accelerometer to minimize clock noise (from the
switched capacitor filter circuit).
No internal connection. Leave
unconnected.
5. PCB layout of power and ground should not couple
power supply noise.
VDD
8
Logic
Input
C1
0.1 μF
6
1
2
3
MMA1260KEG
5
ST
VDD
VSS
VSS
VSS
7 VSS
VOUT 4
STATUS
R1
1 kΩ
Output
Signal
C2
0.1 μF
6. Accelerometer and microcontroller should not be a
high current path.
7. A/D sampling rate and any external power supply
switching frequency should be selected such that they
do not interfere with the internal accelerometer
sampling frequency. This will prevent aliasing errors.
Figure 5. SOIC Accelerometer with Recommended
Connection Diagram
MMA1260KEG
Sensors
Freescale Semiconductor
5
ACCELERATION SENSING DIRECTIONS
DYNAMIC ACCELERATION
VSS
1
VSS
2
3
4
VSS
VOUT
+g
STATUS
VDD
VSS
ST
5
6
7
8
16
15
14
13
12
11
10
9
N/C
N/C
N/C
N/C
N/C
N/C
N/C
N/C
16-Pin SOIC Package
N/C pins are recommended to be left FLOATING
–g
STATIC ACCELERATION
Direction of Earth's gravity field(1)
+1g
VOUT = 3.7 V
0g
0g
VOUT = 2.50 V
VOUT = 2.50 V
-1g
VOUT = 1.3 V
1. When positioned as shown, the Earth's gravity will result in a positive 1g output
MMA1260KEG
6
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Freescale Semiconductor
PACKAGE DIMENSIONS
PAGE 1 OF 2
CASE 475-01
ISSUE C
16 LEAD SOIC
MMA1260KEG
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Freescale Semiconductor
7
PACKAGE DIMENSIONS
PAGE 2 OF 2
CASE 475-01
ISSUE C
16 LEAD SOIC
MMA1260KEG
8
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Freescale Semiconductor
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MMA1260KEG
Rev. 0
11/2009
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