ON MMBTA20LT1 General purpose amplifier(npn silicon) Datasheet

ON Semiconductor
MMBTA20LT1
General Purpose Amplifier
NPN Silicon
MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Collector–Emitter Voltage
VCEO
40
Vdc
Emitter–Base Voltage
VEBO
4.0
Vdc
IC
100
mAdc
Symbol
Max
Unit
PD
225
mW
1.8
mW/°C
RJA
556
°C/W
PD
300
mW
2.4
mW/°C
RJA
417
°C/W
TJ, Tstg
–55 to +150
°C
Collector Current — Continuous
3
1
2
THERMAL CHARACTERISTICS
Characteristic
Total Device Dissipation FR–5 Board(1)
TA = 25°C
Derate above 25°C
Thermal Resistance Junction to Ambient
Total Device Dissipation
Alumina Substrate,(2) TA = 25°C
Derate above 25°C
Thermal Resistance Junction to Ambient
Junction and Storage Temperature
CASE 318–08, STYLE 6
SOT–23 (TO–236AB)
COLLECTOR
3
1
BASE
DEVICE MARKING
2
EMITTER
MMBTA20LT1 = 1C
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Max
Unit
Collector–Emitter Breakdown Voltage
(IC = 1.0 mAdc, IB = 0)
V(BR)CEO
40
—
Vdc
Emitter–Base Breakdown Voltage
(IE = 100 Adc, IC = 0)
V(BR)EBO
4.0
—
Vdc
ICBO
—
100
nAdc
Symbol
Min
Max
Unit
hFE
40
400
—
VCE(sat)
—
0.25
Vdc
fT
125
—
MHz
Cobo
—
4.0
pF
OFF CHARACTERISTICS
Collector Cutoff Current
(VCB = 30 Vdc, IE = 0)
1. FR–5 = 1.0 0.75 0.062 in.
2. Alumina = 0.4 0.3 0.024 in. 99.5% alumina.
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Continued)
Characteristic
ON CHARACTERISTICS
DC Current Gain
(IC = 5.0 mAdc, VCE = 10 Vdc)
Collector–Emitter Saturation Voltage
(IC = 10 mAdc, IB = 1.0 mAdc)
SMALL–SIGNAL CHARACTERISTICS
Current–Gain — Bandwidth Product
(IC = 5.0 mAdc, VCE = 10 Vdc, f = 100 MHz)
Output Capacitance
(VCB = 10 Vdc, IE = 0, f = 1.0 MHz)
 Semiconductor Components Industries, LLC, 2001
March, 2001 – Rev. 1
1
Publication Order Number:
MMBTA20LT1/D
MMBTA20LT1
EQUIVALENT SWITCHING TIME TEST CIRCUITS
+3.0 V
300 ns
DUTY CYCLE = 2%
+10.9 V
275
10 k
10 < t1 < 500 µs
DUTY CYCLE = 2%
+3.0 V
t1
+10.9 V
275
10 k
0
-0.5 V
<1.0 ns
CS < 4.0 pF*
-9.1 V
CS < 4.0 pF*
1N916
<1.0 ns
*Total shunt capacitance of test jig and connectors
Figure 1. Turn–On Time
Figure 2. Turn–Off Time
TYPICAL NOISE CHARACTERISTICS
(VCE = 5.0 Vdc, TA = 25°C)
100
IC = 1.0 mA
BANDWIDTH = 1.0 Hz
RS = 0
50
300 µA
10
7.0
In, NOISE CURRENT (pA)
en, NOISE VOLTAGE (nV)
20
100 µA
5.0
10 µA
3.0
2.0
20
300 µA
100 µA
10
5.0
2.0
1.0
30 µA
0.5
30 µA
10 µA
0.2
10
20
50
100 200
500 1k
f, FREQUENCY (Hz)
2k
5k
0.1
10k
BANDWIDTH = 1.0 Hz
RS ≈ ∞
IC = 1.0 mA
10
Figure 3. Noise Voltage
20
50
100 200
500 1k
f, FREQUENCY (Hz)
Figure 4. Noise Current
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2k
5k
10k
MMBTA20LT1
NOISE FIGURE CONTOURS
(VCE = 5.0 Vdc, TA = 25°C)
1M
500k
BANDWIDTH = 1.0 Hz
200k
100k
50k
RS , SOURCE RESISTANCE (OHMS)
RS , SOURCE RESISTANCE (OHMS)
500k
20k
10k
5k
2.0 dB
2k
1k
500
200
100
50
BANDWIDTH = 1.0 Hz
200k
100k
50k
3.0 dB 4.0 dB
10
20
30
6.0 dB
50 70 100
200 300
IC, COLLECTOR CURRENT (µA)
10 dB
500 700
20k
10k
2.0 dB
2k
1k
500
200
100
1k
1.0 dB
5k
5.0 dB
8.0 dB
10
20
Figure 5. Narrow Band, 100 Hz
RS , SOURCE RESISTANCE (OHMS)
500k
30
50 70 100
200 300
IC, COLLECTOR CURRENT (µA)
500 700
1k
Figure 6. Narrow Band, 1.0 kHz
10 Hz to 15.7 kHz
200k
100k
50k
Noise Figure is defined as:
20k
10k
5k
NF 20 log10
1.0 dB
2k
1k
500
200
100
50
3.0 dB
2.0 dB
en = Noise Voltage of the Transistor referred to the input. (Figure 3)
In = Noise Current of the Transistor referred to the input. (Figure 4)
K = Boltzman’s Constant (1.38 x 10–23 j/°K)
T = Temperature of the Source Resistance (°K)
RS = Source Resistance (Ohms)
3.0 dB
5.0 dB
8.0 dB
10
20
30
50 70 100
200 300
500 700
2 2 12
S In RS en2 4KTR
4KTRS
1k
IC, COLLECTOR CURRENT (µA)
Figure 7. Wideband
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MMBTA20LT1
TYPICAL STATIC CHARACTERISTICS
h FE, DC CURRENT GAIN
400
TJ = 125°C
25°C
200
-55°C
100
80
MPS390
VCE
4 = 1.0 V
VCE = 10 V
60
40
0.004 0.006 0.01
0.02 0.03
0.05 0.07 0.1
0.2 0.3
0.5 0.7 1.0
2.0
IC, COLLECTOR CURRENT (mA)
3.0
5.0 7.0 10
20
30
50
70 100
1.0
100
MPS3904
TJ = 25°C
0.8
IC = 1.0 mA
0.6
10 mA
50 mA
IC, COLLECTOR CURRENT (mA)
VCE , COLLECTOR-EMITTER VOLTAGE (VOLTS)
Figure 8. DC Current Gain
100 mA
0.4
0.2
0
0.002 0.005 0.01 0.02 0.05 0.1 0.2 0.5 1.0 2.0
IB, BASE CURRENT (mA)
5.0 10
TA = 25°C
PULSE WIDTH = 300 µs
80 DUTY CYCLE ≤ 2.0%
200 µA
40
100 µA
20
0
TJ = 25°C
V, VOLTAGE (VOLTS)
1.2
1.0
0.8
VBE(sat) @ IC/IB = 10
0.6
VBE(on) @ VCE = 1.0 V
0.4
0.2
0
VCE(sat) @ IC/IB = 10
0.1
0.2
0.5 1.0
2.0
5.0
10
20
IC, COLLECTOR CURRENT (mA)
5.0
10
15
20
25
30
35
VCE, COLLECTOR-EMITTER VOLTAGE (VOLTS)
40
Figure 10. Collector Characteristics
θV, TEMPERATURE COEFFICIENTS (mV/°C)
Figure 9. Collector Saturation Region
1.4
400 µA
300 µA
60
0
20
IB = 500 µA
50
100
1.6
*APPLIES for IC/IB ≤ hFE/2
0.8
0
25°C to 125°C
*VC for VCE(sat)
-55°C to 25°C
-0.8
25°C to 125°C
-1.6
-2.4
0.1
Figure 11. “On” Voltages
VB for VBE
0.2
-55°C to 25°C
1.0 2.0
5.0 10 20
0.5
IC, COLLECTOR CURRENT (mA)
Figure 12. Temperature Coefficients
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50
100
MMBTA20LT1
TYPICAL DYNAMIC CHARACTERISTICS
1000
VCC = 3.0 V
IC/IB = 10
TJ = 25°C
100
70
50
700
500
ts
300
200
t, TIME (ns)
t, TIME (ns)
300
200
tr
30
20
td @ VBE(off) = 0.5 Vdc
10
7.0
5.0
100
70
50
tf
30
VCC = 3.0 V
IC/IB = 10
IB1 = IB2
TJ = 25°C
20
3.0
1.0
2.0
20 30
5.0 7.0 10
3.0
IC, COLLECTOR CURRENT (mA)
50 70
10
1.0
100
2.0
3.0
500
70 100
10
TJ = 25°C
f = 100 MHz
300
TJ = 25°C
f = 1.0 MHz
7.0
200
C, CAPACITANCE (pF)
VCE = 20 V
5.0 V
100
Cib
5.0
Cob
3.0
2.0
70
50
0.5 0.7 1.0
2.0
3.0
5.0 7.0
10
20
30
1.0
0.05
50
0.1
0.2
0.5
1.0
2.0
5.0
IC, COLLECTOR CURRENT (mA)
VR, REVERSE VOLTAGE (VOLTS)
Figure 15. Current–Gain — Bandwidth Product
Figure 16. Capacitance
20
hie , INPUT IMPEDANCE (k Ω )
50
Figure 14. Turn–Off Time
10
MPS3904
hfe ≈ 200 @ IC = 1.0 mA
7.0
5.0
200
VCE = 10 Vdc
f = 1.0 kHz
TA = 25°C
hoe, OUTPUT ADMITTANCE ( mhos)
f,
T CURRENT-GAIN BANDWIDTH PRODUCT (MHz)
Figure 13. Turn–On Time
20 30
5.0 7.0 10
IC, COLLECTOR CURRENT (mA)
3.0
2.0
1.0
0.7
0.5
0.3
0.2
0.1
0.2
0.5
20
1.0 2.0
5.0
10
IC, COLLECTOR CURRENT (mA)
50
100
70
50
50
MPS3904
hfe ≈ 200 @ IC = 1.0 mA
30
20
10
7.0
5.0
3.0
Figure 17. Input Impedance
0.2
0.5
20
1.0 2.0
5.0
10
IC, COLLECTOR CURRENT (mA)
Figure 18. Output Admittance
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5
20
VCE = 10 Vdc
f = 1.0 kHz
TA = 25°C
2.0
0.1
100
10
50
100
r(t) TRANSIENT THERMAL RESISTANCE
(NORMALIZED)
MMBTA20LT1
1.0
0.7
0.5
D = 0.5
0.3
0.2
0.2
0.1
0.1
0.07
0.05
FIGURE 19A
0.05
P(pk)
0.02
0.03
0.02
t1
0.01
0.01
0.01 0.02
SINGLE PULSE
0.05
0.1
0.2
0.5
t2
1.0
2.0
5.0
10
20
50
t, TIME (ms)
100 200
DUTY CYCLE, D = t1/t2
D CURVES APPLY FOR POWER
PULSE TRAIN SHOWN
READ TIME AT t1 (SEE AN–569)
ZθJA(t) = r(t) • RθJA
TJ(pk) – TA = P(pk) ZθJA(t)
500 1.0k 2.0k
5.0k 10k 20k 50k 100k
Figure 19. Thermal Response
IC, COLLECTOR CURRENT (nA)
104
DESIGN NOTE: USE OF THERMAL RESPONSE DATA
103
VCC = 30 Vdc
102
A train of periodical power pulses can be represented by the
model as shown in Figure 19A. Using the model and the device thermal response the normalized effective transient thermal resistance of Figure 19 was calculated for various duty
cycles.
To find ZθJA(t), multiply the value obtained from Figure 19
by the steady state value RθJA.
Example:
The MPS3904 is dissipating 2.0 watts peak under the following conditions:
t1 = 1.0 ms, t2 = 5.0 ms. (D = 0.2)
Using Figure 19 at a pulse width of 1.0 ms and D = 0.2, the
reading of r(t) is 0.22.
The peak rise in junction temperature is therefore
∆T = r(t) x P(pk) x RθJA = 0.22 x 2.0 x 200 = 88°C.
For more information, see AN–569.
ICEO
101
ICBO
AND
100
ICEX @ VBE(off) = 3.0 Vdc
10-1
10-2
-40
-20
0
+20 +40 +60 +80 +100 +120 +140 +160
TJ, JUNCTION TEMPERATURE (°C)
Figure 19A.
IC, COLLECTOR CURRENT (mA)
400
1.0 ms
200
100
60
40
TC = 25°C
TA = 25°C
TJ = 150°C
10
CURRENT LIMIT
THERMAL LIMIT
SECOND BREAKDOWN LIMIT
4.0
2.0
The safe operating area curves indicate IC–VCE limits of
the transistor that must be observed for reliable operation.
Collector load lines for specific circuits must fall below the
limits indicated by the applicable curve.
The data of Figure 20 is based upon TJ(pk) = 150°C; TC or
TA is variable depending upon conditions. Pulse curves are
valid for duty cycles to 10% provided TJ(pk) ≤ 150°C. TJ(pk)
may be calculated from the data in Figure 19. At high case or
ambient temperatures, thermal limitations will reduce the
power that can be handled to values less than the limitations
imposed by second breakdown.
10 µs
1.0 s
dc
dc
20
6.0
100 µs
4.0
6.0 8.0 10
20
VCE, COLLECTOR-EMITTER VOLTAGE (VOLTS)
40
Figure 20.
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MMBTA20LT1
INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE
MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the total
design. The footprint for the semiconductor packages must
be the correct size to insure proper solder connection
interface between the board and the package. With the
correct pad geometry, the packages will self align when
subjected to a solder reflow process.
0.037
0.95
0.037
0.95
0.079
2.0
0.035
0.9
0.031
0.8
inches
mm
SOT–23
SOT–23 POWER DISSIPATION
SOLDERING PRECAUTIONS
The power dissipation of the SOT–23 is a function of the
pad size. This can vary from the minimum pad size for
soldering to a pad size given for maximum power
dissipation. Power dissipation for a surface mount device is
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from the
device junction to ambient, and the operating temperature,
TA. Using the values provided on the data sheet for the
SOT–23 package, PD can be calculated as follows:
PD =
•
•
TJ(max) – TA
RθJA
•
The values for the equation are found in the maximum
ratings table on the data sheet. Substituting these values into
the equation for an ambient temperature TA of 25°C, one can
calculate the power dissipation of the device which in this
case is 225 milliwatts.
150°C – 25°C
PD =
556°C/W
•
= 225 milliwatts
•
The 556°C/W for the SOT–23 package assumes the use of
the recommended footprint on a glass epoxy printed circuit
board to achieve a power dissipation of 225 milliwatts.
There are other alternatives to achieving higher power
dissipation from the SOT–23 package. Another alternative
would be to use a ceramic substrate or an aluminum core
board such as Thermal Clad. Using a board material such
as Thermal Clad, an aluminum core board, the power
dissipation can be doubled using the same footprint.
•
•
The melting temperature of solder is higher than the rated
temperature of the device. When the entire device is heated
to a high temperature, failure to complete soldering within
a short time could result in device failure. Therefore, the
following items should always be observed in order to
minimize the thermal stress to which the devices are
subjected.
Always preheat the device.
The delta temperature between the preheat and soldering
should be 100°C or less.*
When preheating and soldering, the temperature of the
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When
using infrared heating with the reflow soldering method,
the difference shall be a maximum of 10°C.
The soldering temperature and time shall not exceed
260°C for more than 10 seconds.
When shifting from preheating to soldering, the maximum
temperature gradient shall be 5°C or less.
After soldering has been completed, the device should be
allowed to cool naturally for at least three minutes.
Gradual cooling should be used as the use of forced
cooling will increase the temperature gradient and result
in latent failure due to mechanical stress.
Mechanical stress or shock should not be applied during
cooling.
* Soldering a device without preheating can cause
excessive thermal shock and stress which can result in
damage to the device.
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MMBTA20LT1
PACKAGE DIMENSIONS
SOT–23 (TO–236)
CASE 318–08
ISSUE AF
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. MAXIMUM LEAD THICKNESS INCLUDES LEAD
FINISH THICKNESS. MINIMUM LEAD THICKNESS
IS THE MINIMUM THICKNESS OF BASE
MATERIAL.
A
L
3
1
V
B S
2
DIM
A
B
C
D
G
H
J
K
L
S
V
G
C
D
H
J
K
INCHES
MIN
MAX
0.1102 0.1197
0.0472 0.0551
0.0350 0.0440
0.0150 0.0200
0.0701 0.0807
0.0005 0.0040
0.0034 0.0070
0.0140 0.0285
0.0350 0.0401
0.0830 0.1039
0.0177 0.0236
MILLIMETERS
MIN
MAX
2.80
3.04
1.20
1.40
0.89
1.11
0.37
0.50
1.78
2.04
0.013
0.100
0.085
0.177
0.35
0.69
0.89
1.02
2.10
2.64
0.45
0.60
STYLE 6:
PIN 1. BASE
2. EMITTER
3. COLLECTOR
Thermal Clad is a trademark of the Bergquist Company
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes
without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular
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including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or
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MMBTA20LT1/D
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