MOTOROLA MC74HC373ADW

SEMICONDUCTOR TECHNICAL DATA
High–Performance Silicon–Gate CMOS
The MC54/74HC373A is identical in pinout to the LS373. The device
inputs are compatible with standard CMOS outputs; with pullup resistors,
they are compatible with LSTTL outputs.
These latches appear transparent to data (i.e., the outputs change
asynchronously) when Latch Enable is high. When Latch Enable goes low,
data meeting the setup and hold time becomes latched.
The Output Enable input does not affect the state of the latches, but when
Output Enable is high, all device outputs are forced to the high–impedance
state. Thus, data may be latched even when the outputs are not enabled.
The HC373A is identical in function to the HC573A which has the data
inputs on the opposite side of the package from the outputs to facilitate PC
board layout.
The HC373A is the non–inverting version of the HC533A.
J SUFFIX
CERAMIC PACKAGE
CASE 732–03
20
1
N SUFFIX
PLASTIC PACKAGE
CASE 738–03
20
1
1
1
SD SUFFIX
SSOP PACKAGE
CASE 940C–03
1
DT SUFFIX
TSSOP PACKAGE
CASE 948E–02
20
•
•
•
•
•
•
Output Drive Capability: 15 LSTTL Loads
Outputs Directly Interface to CMOS, NMOS and TTL
Operating Voltage Range: 2.0 to 6.0 V
Low Input Current: 1.0 µA
High Noise Immunity Characteristic of CMOS Devices
In Compliance with the Requirements Defined by JEDEC Standard
No. 7A
• Chip Complexity: 186 FETs or 46.5 Equivalent Gates
20
ORDERING INFORMATION
MC54HCXXXAJ
Ceramic
MC74HCXXXAN
Plastic
MC74HCXXXADW
SOIC
MC74HCXXXASD
SSOP
MC74HCXXXADT
TSSOP
LOGIC DIAGRAM
D0
D1
D2
DATA
INPUTS
D3
D4
D5
D6
D7
3
PIN ASSIGNMENT
2
4
5
7
6
8
9
13
12
14
15
17
16
18
19
OUTPUT
ENABLE
Q0
1
20
VCC
2
19
Q7
D0
3
18
D7
D1
4
17
D6
Q1
5
16
Q6
Q2
6
15
Q5
Q5
D2
7
14
D5
Q6
D3
8
13
D4
Q3
9
12
Q4
10
11
LATCH
ENABLE
Q0
Q1
Q2
Q3
Q4
NONINVERTING
OUTPUTS
Q7
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LATCH ENABLE
OUTPUT ENABLE
11
1
Design Criteria
Internal Gate Count*
GND
PIN 20 = VCC
PIN 10 = GND
Value
Units
46.5
ea
Internal Gate Propagation Delay
1.5
ns
Internal Gate Power Dissipation
5.0
µW
0.0075
pJ
Speed Power Product
* Equivalent to a two–input NAND gate.
FUNCTION TABLE
Inputs
1
REV 6
Output
Output
Enable
Latch
Enable
D
Q
L
L
L
H
H
H
L
X
H
L
X
X
H
L
No Change
Z
X = Don’t Care
Z = High Impedance
10/95
 Motorola, Inc. 1995
DW SUFFIX
SOIC PACKAGE
CASE 751D–04
20
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MC54/74HC373A
MAXIMUM RATINGS*
Symbol
VCC
Parameter
DC Supply Voltage (Referenced to GND)
Value
Unit
– 0.5 to + 7.0
V
V
Vin
DC Input Voltage (Referenced to GND)
– 1.5 to VCC + 1.5
Vout
DC Output Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
DC Input Current, per Pin
± 20
mA
Iout
DC Output Current, per Pin
± 35
mA
ICC
DC Supply Current, VCC and GND Pins
± 75
mA
PD
Power Dissipation in Still Air, Plastic or Ceramic DIP†
SOIC Package†
SSOP or TSSOP Package†
750
500
450
mW
Tstg
Storage Temperature
– 65 to + 150
_C
Iin
TL
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high–impedance circuit. For proper operation, Vin and
Vout should be constrained to the
range GND (Vin or Vout) VCC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or VCC).
Unused outputs must be left open.
v
v
_C
Lead Temperature, 1 mm from Case for 10 Seconds
(Plastic DIP, SOIC, SSOP or TSSOP Package)
(Ceramic DIP)
260
300
* Maximum Ratings are those values beyond which damage to the device may occur.
Functional operation should be restricted to the Recommended Operating Conditions.
†Derating — Plastic DIP: – 10 mW/_C from 65_ to 125_C
Ceramic DIP: – 10 mW/_C from 100_ to 125_C
SOIC Package: – 7 mW/_C from 65_ to 125_C
SSOP or TSSOP Package: – 6.1 mW/_C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
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RECOMMENDED OPERATING CONDITIONS
Symbol
VCC
Vin, Vout
Parameter
DC Supply Voltage (Referenced to GND)
DC Input Voltage, Output Voltage (Referenced to GND)
TA
Operating Temperature, All Package Types
tr, tf
Input Rise and Fall Time
(Figure 1)
VCC = 2.0 V
VCC = 4.5 V
VCC = 6.0 V
Min
Max
Unit
2.0
6.0
V
0
VCC
V
– 55
+ 125
_C
0
0
0
1000
500
400
ns
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Symbol
Parameter
Test Conditions
VCC
V
– 55 to
25_C
85_C
125_C
Unit
VIH
Minimum High–Level Input
Voltage
Vout = 0.1 V or VCC – 0.1 V
|Iout|
20 µA
2.0
4.5
6.0
1.5
3.15
4.2
1.5
3.15
4.2
1.5
3.15
4.2
V
VIL
Maximum Low–Level Input
Voltage
Vout = 0.1 V or VCC – 0.1 V
|Iout|
20 µA
2.0
4.5
6.0
0.5
1.35
1.8
0.5
1.35
1.8
0.5
1.35
1.8
V
Minimum High–Level Output
Voltage
Vin = VIH or VIL
|Iout|
20 µA
2.0
4.5
6.0
1.9
4.4
5.9
1.9
4.4
5.9
1.9
4.4
5.9
V
Vin = VIH or VIL
|Iout|
6.0 mA
|Iout|
7.8 mA
4.5
6.0
3.98
5.48
3.84
5.34
3.7
5.2
VOH
MOTOROLA
2
High–Speed CMOS Logic Data
DL129 — Rev 6
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MC54/74HC373A
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
VCC
V
– 55 to
25_C
85_C
125_C
Vout = 0.1 V or VCC – 0.1 V
|Iout|
20 µA
2.0
4.5
6.0
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
Vin = VIH or VIL
|Iout|
6.0 mA
|Iout|
7.8 mA
4.5
6.0
0.26
0.26
0.33
0.33
0.4
0.4
Maximum Input Leakage Current
Vin = VCC or GND
6.0
± 0.1
± 1.0
± 1.0
µA
IOZ
Maximum Three–State
Leakage Current
Output in High–Impedance State
Vin = VIL or VIH
Vout = VCC or GND
6.0
± 0.5
± 5.0
± 10
µA
ICC
Maximum Quiescent Supply
Current (per Package)
Vin = VCC or GND
|Iout| = 0 µA
6.0
4.0
40
160
µA
Symbol
VOL
Iin
Parameter
Test Conditions
Maximum Low–Level Output
Voltage
Unit
V
NOTE: Information on typical parametric values can be found in Chapter 2 of the Motorola High–Speed CMOS Data Book (DL129/D).
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr = tf = 6.0 ns)
Guaranteed Limit
Symbol
Parameter
VCC
V
– 55 to
25_C
85_C
125_C
Unit
tPLH
tPHL
Maximum Propagation Delay, Input D to Q
(Figures 1 and 5)
2.0
4.5
6.0
125
25
21
155
31
26
190
38
32
ns
tPLH
tPHL
Maximum Propagation Delay, Latch Enable to Q
(Figures 2 and 5)
2.0
4.5
6.0
140
28
24
175
35
30
210
42
36
ns
tPLZ
tPHZ
Maximum Propagation Delay, Output Enable to Q
(Figures 3 and 6)
2.0
4.5
6.0
150
30
26
190
38
33
225
45
38
ns
tPZL
tPZH
Maximum Propagation Delay, Output Enable to Q
(Figures 3 and 6)
2.0
4.5
6.0
150
30
26
190
38
33
225
45
38
ns
tTLH
tTHL
Maximum Output Transition Time, Any Output
(Figures 1 and 5)
2.0
4.5
6.0
60
12
10
75
15
13
90
18
15
ns
Maximum Input Capacitance
10
10
10
pF
Maximum Three–State Output Capacitance
(Output in High–Impedance State)
15
15
15
pF
Cin
Cout
NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the Motorola High–
Speed CMOS Data Book (DL129/D).
Typical @ 25°C, VCC = 5.0 V
CPD
Power Dissipation Capacitance (Per Enabled Output)*
36
pF
* Used to determine the no–load dynamic power consumption: PD = CPD VCC 2 f + ICC VCC . For load considerations, see Chapter 2 of the
Motorola High–Speed CMOS Data Book (DL129/D).
High–Speed CMOS Logic Data
DL129 — Rev 6
3
MOTOROLA
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MC54/74HC373A
TIMING REQUIREMENTS (CL = 50 pF, Input tr = tf = 6.0 ns)
Guaranteed Limit
Symbol
Parameter
Fig.
– 55 to 25_C
VCC
Volts
Min
85_C
Max
Min
Max
125_C
Min
Max
Unit
tsu
Minimum Setup Time, Input D to Latch Enable
4
2.0
4.5
6.0
25
5.0
5.0
30
6.0
6.0
40
8.0
7.0
ns
th
Minimum Hold Time, Latch Enable to Input D
4
2.0
4.5
6.0
5.0
5.0
5.0
5.0
50
5.0
5.0
5.0
5.0
ns
tw
Minimum Pulse Width, Latch Enable
2
2.0
4.5
6.0
60
12
10
75
15
13
90
18
15
ns
tr, tf
Maximum Input Rise and Fall Times
1
2.0
4.5
6.0
1000
500
400
1000
500
400
1000
500
400
ns
SWITCHING WAVEFORMS
tr
tf
INPUT D
tw
VCC
90%
50%
10%
LATCH ENABLE
GND
tPLH
GND
tPHL
Q
Figure 1.
VCC
GND
tPLZ
VALID
HIGH
IMPEDANCE
50%
tPZH
Q
Figure 2.
50%
tPZL
Q
10%
VOL
90%
VOH
INPUT D
tPHZ
1.3 V
VCC
50%
GND
tsu
th
VCC
LATCH ENABLE
50%
GND
HIGH
IMPEDANCE
Figure 3.
MOTOROLA
50%
tTHL
tTLH
OUTPUT
ENABLE
tPHL
tPLH
90%
50%
10%
Q
VCC
50%
Figure 4.
4
High–Speed CMOS Logic Data
DL129 — Rev 6
MC54/74HC373A
TEST CIRCUITS
TEST POINT
TEST POINT
OUTPUT
DEVICE
UNDER
TEST
DEVICE
UNDER
TEST
CL*
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
1 kΩ
OUTPUT
CL*
* Includes all probe and jig capacitance
* Includes all probe and jig capacitance
Figure 5.
Figure 6.
EXPANDED LOGIC DIAGRAM
D0
3
D1
4
D
Q
D2
7
D
LE
Q
D3
8
D
LE
Q
D4
13
D
LE
Q
D5
14
D
LE
Q
D6
17
D
LE
Q
D7
18
D
LE
Q
D
LE
Q
LE
11
1
2
Q0
High–Speed CMOS Logic Data
DL129 — Rev 6
5
Q1
6
Q2
9
Q3
5
12
Q4
15
Q5
16
Q6
19
Q7
MOTOROLA
MC54/74HC373A
OUTLINE DIMENSIONS
20
11
1
10
J SUFFIX
CERAMIC PACKAGE
CASE 732–03
ISSUE E
NOTES:
1. LEADS WITHIN 0.25 (0.010) DIAMETER, TRUE
POSITION AT SEATING PLANE, AT MAXIMUM
MATERIAL CONDITION.
2. DIMENSION L TO CENTER OF LEADS WHEN
FORMED PARALLEL.
3. DIMENSIONS A AND B INCLUDE MENISCUS.
B
A
L
C
F
DIM
A
B
C
D
F
G
H
J
K
L
M
N
N
H
G
D
J
K
M
MILLIMETERS
MIN
MAX
23.88
25.15
6.60
7.49
3.81
5.08
0.38
0.56
1.40
1.65
2.54 BSC
0.51
1.27
0.20
0.30
3.18
4.06
7.62 BSC
0_
15 _
0.25
1.02
INCHES
MIN
MAX
0.940
0.990
0.260
0.295
0.150
0.200
0.015
0.022
0.055
0.065
0.100 BSC
0.020
0.050
0.008
0.012
0.125
0.160
0.300 BSC
0_
15_
0.010
0.040
SEATING
PLANE
N SUFFIX
PLASTIC PACKAGE
CASE 738–03
ISSUE E
–A–
20
11
1
10
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEAD WHEN
FORMED PARALLEL.
4. DIMENSION B DOES NOT INCLUDE MOLD
FLASH.
B
L
C
–T–
K
SEATING
PLANE
M
N
E
G
F
J
D
M
T A
11
–B–
10X
P
0.010 (0.25)
1
M
B
M
10
20X
D
0.010 (0.25)
M
T A
B
S
J
S
F
R X 45 _
C
–T–
18X
G
K
SEATING
PLANE
M
T B
M
M
DW SUFFIX
PLASTIC SOIC PACKAGE
CASE 751D–04
ISSUE E
–A–
20
20 PL
0.25 (0.010)
20 PL
0.25 (0.010)
MOTOROLA
DIM
A
B
C
D
E
F
G
J
K
L
M
N
INCHES
MIN
MAX
1.010
1.070
0.240
0.260
0.150
0.180
0.015
0.022
0.050 BSC
0.050
0.070
0.100 BSC
0.008
0.015
0.110
0.140
0.300 BSC
0_
15 _
0.020
0.040
MILLIMETERS
MIN
MAX
25.66
27.17
6.10
6.60
3.81
4.57
0.39
0.55
1.27 BSC
1.27
1.77
2.54 BSC
0.21
0.38
2.80
3.55
7.62 BSC
0_
15_
0.51
1.01
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.150
(0.006) PER SIDE.
5. DIMENSION D DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.13
(0.005) TOTAL IN EXCESS OF D DIMENSION
AT MAXIMUM MATERIAL CONDITION.
DIM
A
B
C
D
F
G
J
K
M
P
R
MILLIMETERS
MIN
MAX
12.65
12.95
7.40
7.60
2.35
2.65
0.35
0.49
0.50
0.90
1.27 BSC
0.25
0.32
0.10
0.25
0_
7_
10.05
10.55
0.25
0.75
INCHES
MIN
MAX
0.499
0.510
0.292
0.299
0.093
0.104
0.014
0.019
0.020
0.035
0.050 BSC
0.010
0.012
0.004
0.009
0_
7_
0.395
0.415
0.010
0.029
M
6
High–Speed CMOS Logic Data
DL129 — Rev 6
MC54/74HC373A
OUTLINE DIMENSIONS
SD SUFFIX
PLASTIC SSOP PACKAGE
CASE 940C–03
ISSUE B
K REF
0.12 (0.005)
20X
20
L/2
T U
M
S
V
0.25 (0.010)
S
N
M
11
N
B
L
F
ÉÉÉ
ÇÇÇ
ÇÇÇ
ÉÉÉ
ÇÇÇ
ÉÉÉ
ÇÇÇ
ÉÉÉ
DETAIL E
PIN 1
IDENT
1
10
K
–U–
A
–V–
0.20 (0.008)
J
T U
M
J1
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD FLASH,
PROTRUSIONS OR GATE BURRS. MOLD FLASH OR
GATE BURRS SHALL NOT EXCEED 0.15 (0.006) PER
SIDE.
4. DIMENSION B DOES NOT INCLUDE INTERLEAD
FLASH OR PROTRUSION. INTERLEAD FLASH OR
PROTRUSION SHALL NOT EXCEED 0.15 (0.006) PER
SIDE.
5. DIMENSION K DOES NOT INCLUDE DAMBAR
PROTRUSION/INTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.13 (0.005) TOTAL IN
EXCESS OF K DIMENSION AT MAXIMUM MATERIAL
CONDITION. DAMBAR INTRUSION SHALL NOT
REDUCE DIMENSION K BY MORE THAN 0.07 (0.002)
AT LEAST MATERIAL CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR REFERENCE
ONLY.
7. DIMENSION A AND B ARE TO BE DETERMINED AT
DATUM PLANE –W–.
K1
S
DIM
A
B
C
D
F
G
H
J
J1
K
K1
L
M
SECTION N–N
0.076 (0.003)
–T–
SEATING
PLANE
–W–
C
D
G
DETAIL E
H
20X
0.15 (0.006) T U
DT SUFFIX
PLASTIC TSSOP PACKAGE
CASE 948E–02
ISSUE A
K REF
0.10 (0.004)
S
M
T U
S
V
ÍÍÍÍ
ÍÍÍÍ
ÍÍÍÍ
ÍÍÍÍ
S
K
K1
2X
L/2
20
11
J J1
B
–U–
L
PIN 1
IDENT
SECTION N–N
1
10
0.25 (0.010)
N
0.15 (0.006) T U
S
N
F
DETAIL E
–W–
C
D
G
H
DETAIL E
0.100 (0.004)
–T– SEATING
INCHES
MIN
MAX
0.278
0.288
0.205
0.212
0.068
0.078
0.002
0.008
0.024
0.037
0.026 BSC
0.023
0.030
0.003
0.008
0.003
0.006
0.010
0.015
0.010
0.013
0.301
0.311
0_
8_
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD FLASH,
PROTRUSIONS OR GATE BURRS. MOLD FLASH
OR GATE BURRS SHALL NOT EXCEED 0.15
(0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE INTERLEAD
FLASH OR PROTRUSION. INTERLEAD FLASH OR
PROTRUSION SHALL NOT EXCEED 0.25 (0.010)
PER SIDE.
5. DIMENSION K DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.08 (0.003) TOTAL IN
EXCESS OF THE K DIMENSION AT MAXIMUM
MATERIAL CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE DETERMINED
AT DATUM PLANE –W–.
M
A
–V–
MILLIMETERS
MIN
MAX
7.07
7.33
5.20
5.38
1.73
1.99
0.05
0.21
0.63
0.95
0.65 BSC
0.59
0.75
0.09
0.20
0.09
0.16
0.25
0.38
0.25
0.33
7.65
7.90
0_
8_
DIM
A
B
C
D
F
G
H
J
J1
K
K1
L
M
MILLIMETERS
MIN
MAX
6.40
6.60
4.30
4.50
–––
1.20
0.05
0.15
0.50
0.75
0.65 BSC
0.27
0.37
0.09
0.20
0.09
0.16
0.19
0.30
0.19
0.25
6.40 BSC
0_
8_
INCHES
MIN
MAX
0.252
0.260
0.169
0.177
–––
0.047
0.002
0.006
0.020
0.030
0.026 BSC
0.011
0.015
0.004
0.008
0.004
0.006
0.007
0.012
0.007
0.010
0.252 BSC
0_
8_
PLANE
High–Speed CMOS Logic Data
DL129 — Rev 6
7
MOTOROLA
MC54/74HC373A
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the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit,
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MOTOROLA
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*MC54/74HC373A/D*
MC54/74HC373A/D
High–Speed CMOS Logic Data
DL129 — Rev 6