MA-COM MA4E2544L-1282 Surmounttm schottky diode low barrier cross-over quad chip Datasheet

MA4E2544L-1282
SURMOUNTTM Schottky Diode
Low Barrier Cross-Over Quad Chip
Rev V2
Features
Topview
• Ultra Low Parasitic Capacitance and Inductance
• Surface Mountable in Microwave Circuits , No Wire
bonds Required
• Rugged HMIC Construction with Polyimide Scratch
Protection
• Reliable, Multilayer Metallization with a Diffusion
Barrier, 100% Stabilization Bake (300 °C, 16 hours)
• Lower Susceptibility to ESD Damage
A
B
Description and Applications
The
MA4E2544L-1282
Series
Surmount
Silicon Schottky Cross-Over Quad Diodes are fabricated
with the patented Heterolithic Microwave Integrated Circuit (HMIC) process. HMIC circuits consist of Silicon pedestals which form diodes or via conductors embedded in a
glass dielectric, which acts as the low dispersion, low loss,
microstrip transmission medium. The combination of silicon
and glass allows HMIC devices to have excellent loss and
power dissipation characteristics in a low profile, reliable device.
This Surmount Schottky device is an excellent choice for
circuits requiring the small parasitics of a beam lead device coupled with the superior mechanical performance of a
chip. The Surmount structure employs very low resistance silicon vias to connect the Schottky contacts to the metalized
mounting pads on the bottom surface of the chip. These
devices are reliable, repeatable, and a lower cost performance solution to conventional devices. They have
lower susceptibility to electrostatic discharge than conventional beam lead Schottky diodes.
C
E
D
Case Style 1307
MA4E2544L-1282
Equivalent Circuit
The multi-layer metallization employed in the fabrication of the
Surmount Schottky junctions includes a platinum diffusion
barrier, which permits all devices to be subjected to a 16-hour
non-operating stabilization bake at 300°C.
This device is recommended for use in microwave circuits through Ku-Band frequencies for lower power applications such as mixers, sub-harmonic mixers, detectors
and limiters. The HMIC construction facilitates the direct
replacement of more fragile beam lead diodes with the
corresponding Surmount diode which can be connected
to a hard or soft substrate circuit with solder.
The “0505” outline allows for Surface Mount placement
and multi-functional polarity orientations.
D
Dim
Inches
Millimeters
Min.
Max.
Min.
Max.
B
0.0445
0.0445
0.0465
0.0465
1.130
1.130
1.180
1.180
C
0.0040
0.0080
0.102
0.203
D Sq.
0.0128
0.0148
0.325
0.375
E Sq.
0.0128
0.0148
0.325
0.375
A
1
ADVANCED: Data Sheets contain information regarding a product M/A-COM Technology Solutions
• North America Tel: 800.366.2266 • Europe Tel: +353.21.244.6400
is considering for development. Performance is based on target specifications, simulated results,
• India Tel: +91.80.43537383
• China Tel: +86.21.2407.1588
and/or prototype measurements. Commitment to develop is not guaranteed.
Visit www.macomtech.com for additional data sheets and product information.
PRELIMINARY: Data Sheets contain information regarding a product M/A-COM Technology
Solutions has under development. Performance is based on engineering tests. Specifications are
typical. Mechanical outline has been fixed. Engineering samples and/or test data may be available. M/A-COM Technology Solutions Inc. and its affiliates reserve the right to make
Commitment to produce in volume is not guaranteed.
changes to the product(s) or information contained herein without notice.
MA4E2544L-1282
SURMOUNTTM Schottky Diode
Low Barrier Cross-Over Quad Chip
Rev V2
Electrical Specifications @ + 25 °C (Measured as Single Diodes)
Model
Number
MA4E2544L-1282
Type
Recommended
Frequency Range
Vf @ 1 mA
( mV )
ΔVf @ 1mA
( mV )
Ct @ 0V
( pF )
Rt Slope Resistance
( Vf1–Vf2 ) /
( 10.5mA – 9.5mA )
(Ω)
Low
Barrier
DC - 18 GHz
330 Max
300 Typ
10 Max
0.22 Max
0.15 Typ
16 Typical
20 Max
Rt is the dynamic slope resistance where Rt = Rs + Rj where Rj =26 / Idc ( Idc is in mA ) and Rs is the Ohmic Resistance.
Absolute Maximum Ratings @ 25 °C 1
Die Bonding
Parameter
Absolute Maximum
Operating Temperature
-40 °C to +150 °C
Storage Temperature
-40 °C to +150 °C
Junction Temperature
+175 °C
Forward Current
20 mA
Reverse Voltage l - 10 μ A l
I -5 V I
RF C.W. Incident Power
+20 dBm C.W.
RF & DC Dissipated Power
50 mW
Handling Procedures
All semiconductor chips should be handled with care
to avoid damage or contamination from perspiration
and skin oils. The use of plastic tipped tweezers or
vacuum pickups is strongly recommended for individual
components. The top surface of the die has a protective
polyimide coating to minimize damage.
The rugged construction of these Surmount devices
allows the use of standard handling and die attach
techniques. It is important to note that industry standard
electrostatic discharge (ESD) control is required at
all times, due to the sensitive nature of Schottky
junctions. Bulk handling should insure that abrasion
and mechanical shock are minimized.
Die attach for these devices is made simple
through the use of surface mount die attach technology. Mounting pads are conveniently located on the
bottom surface of these devices, and are opposite
the active junction. The devices are well suited for
high temperature solder attachment onto hard
substrates. 80Au/20Sn and 63/Pb36 solders are
acceptable for usage.
For Hard substrates, we recommend utilizing a
vacuum tip and force of 60 to 100 grams applied
uniformly to the top surface of the device, using a
hot gas bonder with equal heat applied across the
bottom mounting pads of the device. When soldering to soft substrates, it is recommended to use a
lead-tin interface at the circuit board mounting
pads. Position the die so that its mounting pads are
aligned with the circuit board mounting pads. Reflow the solder paste by applying equal heat to the
circuit at both die-mounting pads. The solder joint
must Not be made one at a time, creating un-equal
heat flow and thermal stress. Solder reflow should
not be performed by causing heat to flow through
the top surface of the die. Since the HMIC glass
is transparent, the edges of the mounting pads can
be visually inspected through the die after die attach is completed.
2
ADVANCED: Data Sheets contain information regarding a product M/A-COM Technology Solutions
• North America Tel: 800.366.2266 • Europe Tel: +353.21.244.6400
is considering for development. Performance is based on target specifications, simulated results,
• India Tel: +91.80.43537383
• China Tel: +86.21.2407.1588
and/or prototype measurements. Commitment to develop is not guaranteed.
Visit www.macomtech.com for additional data sheets and product information.
PRELIMINARY: Data Sheets contain information regarding a product M/A-COM Technology
Solutions has under development. Performance is based on engineering tests. Specifications are
typical. Mechanical outline has been fixed. Engineering samples and/or test data may be available. M/A-COM Technology Solutions Inc. and its affiliates reserve the right to make
Commitment to produce in volume is not guaranteed.
changes to the product(s) or information contained herein without notice.
MA4E2544L-1282
SURMOUNTTM Schottky Diode
Low Barrier Cross-Over Quad Chip
Rev V2
MA4E2544L-1282 Low Barrier SPICE PARAMETERS ( PER DIODE )*
Is
( nA )
26
Rs
(W)
12.8
N
Cj0
( pF )
1.0 E-2
1.20
M
0.5
Ik
( mA )
14
Cjpar
( pF )
9.0E-2
Vj
(V)
8.0 E-2
FC
0.5
BV
(V)
5.0
IBV
( mA )
1.0E-2
* Spice parameters ( PER DIODE ) are based on the MA4E2502 SERIES datasheet.
Circuit Mounting Dimensions ( Inches )
0.020
0.020
0.020
0.020
0.013
0.013
0.020
0.020
Ordering Information
Part Number
Package
MA4E2544L-1282
Wafer in Carrier
3
ADVANCED: Data Sheets contain information regarding a product M/A-COM Technology Solutions
• North America Tel: 800.366.2266 • Europe Tel: +353.21.244.6400
is considering for development. Performance is based on target specifications, simulated results,
• India Tel: +91.80.43537383
• China Tel: +86.21.2407.1588
and/or prototype measurements. Commitment to develop is not guaranteed.
Visit www.macomtech.com for additional data sheets and product information.
PRELIMINARY: Data Sheets contain information regarding a product M/A-COM Technology
Solutions has under development. Performance is based on engineering tests. Specifications are
typical. Mechanical outline has been fixed. Engineering samples and/or test data may be available. M/A-COM Technology Solutions Inc. and its affiliates reserve the right to make
Commitment to produce in volume is not guaranteed.
changes to the product(s) or information contained herein without notice.
MA4E2544L-1282
SURMOUNTTM Schottky Diode
Low Barrier Cross-Over Quad Chip
Rev V2
MA4E2544L-1282 Schematic Per Diode
Ct
Ls
Rs
Rj
Average Schematic Values per Diode
Model
Number
MA4E2544L-1282
Ls ( nH )
Rs ( Ω )
Rj ( Ω )
Ct ( pF )
0.2
12.8
26 / Idc
0.15
4
ADVANCED: Data Sheets contain information regarding a product M/A-COM Technology Solutions
• North America Tel: 800.366.2266 • Europe Tel: +353.21.244.6400
is considering for development. Performance is based on target specifications, simulated results,
• India Tel: +91.80.43537383
• China Tel: +86.21.2407.1588
and/or prototype measurements. Commitment to develop is not guaranteed.
Visit www.macomtech.com for additional data sheets and product information.
PRELIMINARY: Data Sheets contain information regarding a product M/A-COM Technology
Solutions has under development. Performance is based on engineering tests. Specifications are
typical. Mechanical outline has been fixed. Engineering samples and/or test data may be available. M/A-COM Technology Solutions Inc. and its affiliates reserve the right to make
Commitment to produce in volume is not guaranteed.
changes to the product(s) or information contained herein without notice.
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