Austin AS8F2M32Q-120/MIL 2m x 32 flash flash memory module Datasheet

AUSTIN SEMICONDUCTOR, INC.
Austin Semiconductor, Inc.
FLASH
AS8F2M32
FIGURE 1: PIN ASSIGNMENT
(Top View)
2M x 32 FLASH
68 Lead CQFP
FLASH MEMORY MODULE
AVAILABLE AS MILITARY
SPECIFICATIONS
• Military Processing (MIL-STD-883C para 1.2.2)
• Temperature Range -55C to 125C
FEATURES
• Fast access times of 90ns, 120ns, and 150ns
• 5.0V ±10%, single power supply operation
• Low power consumption(TYP): 4µA CMOS stand-by
* TYP ICC(active) <120mA for READ/WRITE
• 20 year DATA RETENTION
• Minimum 1,000,000 Program/Erase Cycles per sector
guaranteed
• 32 equal sectors of 64 Kbytes each
• Any combination of Sectors can be Erased
• Group Sector Protection
• Supports FULL Chip Erase
• Compatible with JEDEC standards
• Embedded Erase and Program Algorithms
• Data\ Polling and Toggle bits for detection of program or erase
cycle completion.
• Erase Suspend/Resume
• Hardware Reset pin (RESET\)
• Built in Decoupling Caps and Multiple Ground Pins for Low Noise
Operation
• Separate Power and Ground Planes to improve noise immunity
OPTION
• Timing
90ns
120ns
150ns
GENERAL DESCRIPTION
The Austin Semiconductor, Inc. AS8F2M32 is a 64 Mbit, 5.0 voltonly Flash memory. This device is designed to be programmed insystem with the standard system 5.0 volt VCC supply. The AS8F2M32
offers an access time of 90ns, allowing high-speed microprocessors to
operate without wait states. To eliminate bus contention, the device has
separate chip enable (CE\), write enable (WE\) and output enable (OE\)
controls.
The device requires only a single 5.0 volt power supply for both
read and write functions. internally generated and regulated voltages
are provided for the program and erase operations.
The device is entirely command set compatible with the JEDEC
single-power-supply FLASH standard. Commands are written to the
command register using standard microprocessor write timings.
Register contents serve as input to an internal state-matching that
controls the erase and programming circuitry. Write cycles also
internally latch addresses and data needed for the programming and
erase operations. Reaching data out of the device is similar to reading
from other FLASH or EPROM devices.
Device programming occurs by executing the program command
sequence. This initiates the Embedded Program algorithm - an internal
algorithm that automatically time the program pulse widths and verifies
proper cell margin.
Device erasure occurs by executing the erase command sequence.
This initiates the Embedded Erase algorithm - an internal algorithm that
automatically preprograms the array (if it is not already programmed)
before executing the erase operation. During erase, the device
automatically times the erase pulse widths and verifies proper cell
margin.
The host system can detect whether a program or erase operation is
complete by observing the RY/BY\ pin, or by reading the DQ7 (DATA\
Polling) and DQ6 (toggle) status bits. After a program or erase cycle
has been completed, the device is ready to read array data or accept
another command.
MARKING
-90
-120
-150
• Packages
Ceramic Quad Flat Pack (0.88" sq)
- MAX height .140"
- Stand-off Height .035" min
Q
For more products and information
please visit our web site at
www.austinsemiconductor.com
(continued on page 2)
AS8F2M32
Rev. 2.5 05/09
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
1
AUSTIN SEMICONDUCTOR, INC.
Austin Semiconductor, Inc.
FLASH
AS8F2M32
GENERAL DESCRIPTION (cont.)
The Sector Erase Architecture allows memory sectors to be erased
and reprogrammed without affecting the data contents of other sectors.
The device is fully erased when shipped from the factory.
Hardware Data Protection measures include a low VCC detector
that automatically inhibits write operations during power transitions. The
Hardware Sector Protection feature disables both program and erase
operations in any combinations of the sectors of memory. This can be
achieved via programming equipment.
The Erase Suspend feature enables the user to put erase on hold for
any period of time to read data form, or program data to, any sector
that is not selected for erasure. True background erase can thus be
achieved.
The Hardware RESET\ pin terminates any operation in progress
and resets the internal state machine to reading array data. The
RESET\ pin may be tied to the system reset circuitry. A system reset
would thus also reset the device, enabling the system microprocessor to
read the boot-up firmware from the FLASH memory.
The system can place the device into the standby mode. Power
consumption is greatly reduced in this mode.
FIGURE 2: FUNCTIONAL BLOCK DIAGRAM
WE 1\, CS1\
WE 2\, CS2\
WE 3\, CS3\
WE 4\, CS4\
RESET\
OE\
A0 - A20
2M x 8
2M x 8
8
8
I/O0-7
I/O8-15
2M x 8
8
I/O16-23
2M x 8
8
I/O24-31
PIN DESCRIPTION
PIN
I/O0-31
DESCRIPTION
Data Inputs/Outputs
A0-20
Address Inputs
WE\1-4
Write Enables
CS\1-4
Chip Selects
OE\
Output Enable
VCC
Power Supply
GND
Ground
RESET\
Reset
AS8F2M32
Rev. 2.5 05/09
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
2
FLASH
AUSTIN SEMICONDUCTOR, INC.
AS8F2M32
Austin Semiconductor, Inc.
ABSOLUTE MAXIMUM RATINGS*
Voltage on any pin relative to VSS, VT**..............-2.0V to +7.0V
Power Dissipation, PT...............................................................4W
Storage Temperature, Tstg..................................-65°C to +125°C
Short Circuit Output Current, IOS(1 output at a time)......100mA
Endurance - Write/Erase Cycles ....................100,000 min cycles
Data Retention...................................................................20 years
*Stresses greater than those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device. This is
a stress rating only and functional operation of the device at
these or any other conditions above those indicated in the
operation section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
**Junction temperature depends upon package type, cycle
time, loading, ambient temperature and airflow, and humidity
(plastics).
ELECTRICAL CHARACTERISTICS AND RECOMMENDED DC OPERATING CONDITIONS
(4.5V < VCC < 5.5V , -55°C < TA < +125°C)
CONDITIONS
SYMBOL
MIN
MAX
UNITS
Input Leakage Current
DESCRIPTION
VCC = 5.5, VIN = GND to V CC
ILI
-10
10
µA
Output Leakage Current
-10
VCC = 5.5, VIN = GND to V CC
ILOx32
10
µA
VCC Active Current for Read
CS\ = VIL, OE\ = V IH
ICC1
160
mA
VCC Active Current for Program or Erase
CS\ = VIL, OE\ = V IH
ICC2
240
mA
ISB
4
mA
ICC3
8
mA
0.45
V
VCC = 5.5V, All Inputs @ V CC - 0.2V or VSS +0.2V,
VCC CMOS Standby
RESET\ = CS\ 1-4 = VCC -0.2V
VCC Standby Current
VCC = 5.5, CS\ = V IH, RESET\ = V CC ± 0.3V, f=0
Output Low Voltage
IOL = 12.0 mA, V CC = 4.5
VOL
Output High Voltage
IOH = -2.5 mA, V CC = 4.5
VOH
0.85 x VCC
VLKO
3.2
Low VCC Lock-Out Voltage
PARAMETER
SYMBOL
MIN
TYP
MAX
UNIT
Supply Voltage
VCC
4.5
5.0
5.5
V
Ground
VSS
0
0
0
V
Input High Voltage
VIH
2.2
---
VCC + 0.5
V
Input Low Voltage
VIL
-0.5
---
+0.8
V
V
4.2
V
CAPACITANCE (TA = +25°C)*
PARAMETER
SYM
OE\
CONDITIONS
MAX
UNITS
COE
50
pF
WE\ 1-4
CWE
50
pF
CS\1-4
CCS
20
pF
Data I/O
CI/O
20
pF
Address input
CAD
50
pF
VIN = 0V, f = 1.0 MHz
*Parameter is guaranteed, but not tested.
AS8F2M32
Rev. 2.5 05/09
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
3
FLASH
AUSTIN SEMICONDUCTOR, INC.
AS8F2M32
Austin Semiconductor, Inc.
ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS
(VCC = 5.0V, -55°C < TA < +125°C)
PARAMETER
SYM
MIN
WE\ CONTROLLED (WRITE/ERASE/PROGRAM OPERATIONS)
Write Cycle Time
tAVAV
-90
MAX
90
tWC
-120
MIN MAX
-150
UNITS
MIN MAX
120
150
ns
Chip Select Setup Time
tELWL
tCS
0
0
0
ns
Write Enable Pulse Width
tWLWH
tWP
45
50
50
ns
Address Setup Time
tAVWL
tAS
0
0
0
ns
Data Setup Time
tDVWH
tDS
45
50
50
ns
Data Hold Time
tWHDX
tDH
0
0
0
ns
Address Hold Time
tWLAX
tAH
45
50
50
ns
tWHWL
tWPH
20
20
20
ns
Write Enable Pulse Width High
1
Duration of Byte Progreamming Operation
2
Sector Erase
Read Recovery Time before Write
VCC Setup Time
tWHWH1
300
300
300
µs
tWHWH2
15
15
15
sec
tGHWL
0
0
0
µs
tVCS
50
50
50
µs
3
Chip Programming Time
4
Chip Erase Time
5
Output Enable Hold Time
RESET\ Pulse Width
44
44
44
sec
256
256
256
sec
tOEH
10
10
10
ns
tRP
500
500
500
ns
90
READ-ONLY OPERATIONS
Read Cycle Time
tAVAV
tRC
Address Access Time
tAVQV
tACC
90
120
150
ns
tELQV
tCE
90
120
150
ns
Chip Select Access Time
Output Enable to Output Valid
6
Chip Select High to Output High
6
Output Enable High to Output High
Output Hold from Adresses, CS\ or
OE\ Change, whichever is First
120
150
ns
tGLQV
tOE
40
50
55
ns
tEHQZ
tDF
20
30
35
ns
tGHQZ
tDF
20
30
35
ns
tAXQX
tOH
0
6
0
20
tReady
RST Low to Read Mode
CS\ CONTROLLED (WRITE/ERASE/PROGRAM OPERATIONS)
0
20
ns
20
µs
Write Cycle Time
tAVAV
tWC
Write Enable Setup Time
tWLEL
tWS
0
0
0
ns
Chip Select Pulse Width
tELEH
tCP
45
50
50
ns
90
120
150
ns
Address Setup Time
tAVEL
tAS
0
0
0
ns
Data Setup Time
tDVEH
tDS
45
50
50
ns
Data Hold Time
tEHDX
tDH
0
0
0
ns
Address Hold Time
tELAX
tAH
45
50
50
ns
Chip Select Pulse Width High
tEHEL
tCPH
20
20
20
ns
1
Duration of Byte Progreamming Operation
2
Sector Erase Time
Read Recovery Time
tWHWH1
300
300
300
µs
tWHWH2
15
15
15
sec
44
sec
256
sec
0
tGHEL
3
4
5
Output Enable Hold Time
10
tOEH
0
44
256
Chip Erase Time
AS8F2M32
Rev. 2.5 05/09
0
44
Chip Programming Time
256
10
10
µs
ns
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
4
AUSTIN SEMICONDUCTOR, INC.
Austin Semiconductor, Inc.
FLASH
AS8F2M32
NOTES:
1.
2.
3.
4.
5.
6.
Typical value for tWHWH1 is 7µs.
Typical value for tWHWH2 is 1 sec.
Typical value for Chip Programming is 14 sec.
Typical value for Chip Erase Time is 32 sec.
For Toggle an Data Polling.
This parameter is guaranteed, but not tested.
AC TEST CONDITIONS
PARAMETER
Input Pulse Levels
TYP
UNIT
V
VIL = 0, VIH = 3.0
Input Rise and Fall
5
Input and Output Reference Level
1.5
Output Timing Reference Level
1.5
ns
V
V
FIGURE 3: AC TEST CURRENT
FIGURE 4: RESET Timing Diagram
AS8F2M32
Rev. 2.5 05/09
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
5
AUSTIN SEMICONDUCTOR, INC.
Austin Semiconductor, Inc.
FLASH
AS8F2M32
FIGURE 5: AC Waveforms for READ Operations
FIGURE 6: WE\ Controlled, WRITE/ERASE/PROGRAM Operation
NOTES:
1.
2.
3.
4.
5.
PA is the address of the memory location to be programmed.
PD is the data to be programmed at byte address.
D7\ is the output of the complement of the data written to each chip.
DOUT is the output of the data written to the device.
Figure indicates last two bus cycles of four bus cycle sequence.
AS8F2M32
Rev. 2.5 05/09
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
6
AUSTIN SEMICONDUCTOR, INC.
Austin Semiconductor, Inc.
FLASH
AS8F2M32
FIGURE 7: AC Waveforms Chip/Sector ERASE Operations
NOTES:
1. SA is the sector address for Sector ERASE.
FIGURE 8: AC Waveforms for DATA\ Polling During Embedded
Algorithm Operations
AS8F2M32
Rev. 2.5 05/09
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
7
AUSTIN SEMICONDUCTOR, INC.
Austin Semiconductor, Inc.
FLASH
AS8F2M32
FIGURE 9: Alternate CS\ Controlled Programming Operation Timings
NOTES:
1.
2.
3.
4.
5.
PA is the address of the memory location to be programmed.
PD is the data to be programmed at byte address.
D7\ is the output of the complement of the data written to each chip.
DOUT is the output of the data written to the device.
Figure indicates last two bus cycles of four bus cycle sequence.
AS8F2M32
Rev. 2.5 05/09
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
8
AUSTIN SEMICONDUCTOR, INC.
Austin Semiconductor, Inc.
FLASH
AS8F2M32
MECHANICAL DEFINITION
ASI Case #703 (Package Designator QW)
NOTES:
1. Dimensions are shown as millimeters(inches).
AS8F2M32
Rev. 2.5 05/09
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
9
AUSTIN SEMICONDUCTOR, INC.
Austin Semiconductor, Inc.
FLASH
AS8F2M32
MECHANICAL DEFINITIONS*
(Package Designator QT)
AS8F2M32
Rev. 2.5 05/09
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
10
FLASH
AUSTIN SEMICONDUCTOR, INC.
AS8F2M32
Austin Semiconductor, Inc.
ORDERING INFORMATION
EXAMPLE: AS8F2M32QW-120/XT
Device Number
Package
Type
Speed ns
Process
AS8F2M32
QW
- 90
/*
AS8F2M32
QW
- 120
/*
AS8F2M32
QW
- 150
/*
EXAMPLE: AS8F2M32QT-90/MIL
Device Number
Package
Type
Speed ns
Process
AS8F2M32
Q
- 90
/*
AS8F2M32
Q
- 120
/*
AS8F2M32
Q
- 150
/*
*AVAILABLE PROCESSES
IT = Industrial Temperature Range
XT = Extended Temperature Range
MIL = MIL-STD-883C para 1.2.2 Processing
Temperature
-40oC to +85oC
-55oC to +125oC
-55oC to +125oC
NOTE: QW package is planned future offering
AS8F2M32
Rev. 2.5 05/09
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
11
AUSTIN SEMICONDUCTOR, INC.
Austin Semiconductor, Inc.
FLASH
AS8F2M32
DOCUMENT TITLE
64Mb, 2M x 32 Flash Memory Module
REVISION HISTORY
Rev #
2.5
AS8F2M32
Rev. 2.5 05/09
History
Updated Order Chart (QT to Q)
Release Date
May 2009
Status
Release
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
12
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