Everlight ELST-512SURWA 0.56" triple digit smd display Datasheet

Technical Data Sheet
0.56" Triple Digit SMD Displays
ELST-512SURWA/S530-A3/S290
Features
․Packaged in tape and reel for SMT manufacturing.
․Design flexibility(common cathode or anode).
․Categorized for luminous intensity.
․The thickness is thinness than tradition display.
․Pb free
․The product itself will remain within RoHS
compliant version
Descriptions
․The SMD type is much smaller than tradition
type components, thus enable smaller board
size, higher packing density, reduced storage space
and finally smaller equipment to be obtained.
Applications
․Suitable for indoor use.
․Audio system.
․Set top box.
․Game machine.
․Channel indicator of TV.
Device Selection Guide
Chip
Face Color
Material
Emitted Color
AlGaInP
Hyper Red
Everlight Electronics Co., Ltd.
http://www.everlight.com
Device No.: CDGT-512-003
Prepared date:2005/11/16
Gray
Rev.2
Page 1 of 6
Prepared by: Angel Zhang
ELST-512SURWA/S530-A3/S290
Land Pattern(Recommend)
Package Dimensions
Notes:
․All dimensions are in millimeters, tolerance is 0.25mm unless otherwise noted.
․Above specification may be changed without notice. Supplier will reserve
authority on material change for above specification.
Absolute Maximum Ratings (Ta=25℃)
Parameter
Forward Current
Pulse Forward Current*1
Symbol
IF
IFP
Rating
25
160
Operating Temperature
Topr
-40 ~ +105
Units
mA
mA
℃
Storage Temperature
Tstg
-40 ~ +105
℃
Reflow Temperature
Tref
260
℃
Electrostatic Discharge
Power Dissipation
Reverse Voltage
ESD
Pd
VR
2000
60
5
V
mW
V
Notes: *1:IFP Conditions--Pulse Width≦10msec and Duty≦1/10.
*2:Reflow time≦5 seconds.
Everlight Electronics Co., Ltd.
http://www.everlight.com
Device No.: CDGT-512-003
Prepared date:2005/11/16
Rev.2
Page 2 of 6
Prepared by: Angel Zhang
ELST-512SURWA/S530-A3/S290
Electro-Optical Characteristics (Ta=25℃)
Parameter
Symbol
Min.
Typ.
Max.
Units
Condition
Forward Voltage
VF
--
2.0
2.4
V
IF=20mA
Reverse Current
IR
--
--
10
μA
VR=5V
11.0
21.6
-mcd
IF=10mA
Luminous Per segment
Intensity
Per decimal
point
IV
5.6
9.8
--
Peak Wavelenght
λp
--
632
--
nm
IF=20mA
Dominant Wavelenght
λd
--
624
--
nm
IF=20mA
Spectrum Radiation
Bandwidth
△λ
--
20
--
nm
IF=20mA
Chromaticity Coordinates Specifications for Bin Grading (Unit: mcd)
Rank
Min.
Max.
Rank
Min.
Max.
R
11.0
17.6
U
30.0
48.0
S
15.0
24.0
V
42.0
67.0
T
21.0
34.0
W
59.0
94.0
Everlight Electronics Co., Ltd.
http://www.everlight.com
Device No.: CDGT-512-003
Prepared date:2005/11/16
Rev.2
Page 3 of 6
Prepared by: Angel Zhang
ELST-512SURWA/S530-A3/S290
Typical Electro-Optical Characteristics Curves
Everlight Electronics Co., Ltd.
http://www.everlight.com
Device No.: CDGT-512-003
Prepared date:2005/11/16
Rev.2
Page 4 of 6
Prepared by: Angel Zhang
ELST-512SURWA/S530-A3/S290
■ Reflow Temp. / Time :
■ Soldering Iron :
Basic spec is ≦5 sec when 260℃.If temperature is higher, time should be shorter (+10℃
→ -1sec). Power dissipation of iron should be smaller than 15 W , and temperature should
be controllable. Surface temperature of the device should be under 230 ℃.
■ Rework :
1. Customer must finish rework within 5 sec under 260℃.
2. The head of iron can not touch copper foil.
Everlight Electronics Co., Ltd.
http://www.everlight.com
Device No.: CDGT-512-003
Prepared date:2005/11/16
Rev.2
Page 5 of 6
Prepared by: Angel Zhang
ELST-512SURWA/S530-A3/S290
■ Reliability test items and conditions:
The reliability of products shall be satisfied with items listed below.
Confidence level:97%
LTPD:3%
Failure
Judgment
Criteria
NO
Item
Test
Conditions
Test
Hours/Cycle
Sample
Size
1
Reflow Heat
TEMP:260°C±5°C
10 SEC
76 PCS
0/1
Temperature
Cycle
H:+100°C 15min
∫ 5min
L:-40°C 15min
300 CYCLES
76 PCS
0/1
Thermal
Shock
H:+100°C 5min
∫ 10 sec
L:-10°C 5min
300 CYCLES
76 PCS
0/1
2
3
Iv≦Ivt*0.5
or
Vf≧U
or
Vf≦L
Ac/Re
4
High
Temperature
Storage
TEMP:100°C
1000 HRS
76PCS
5
Low
Temperature
Storage
TEMP:-40°C
1000 HRS
76 PCS
0/1
DC Operating
Life
TEMP:25°C
If=10mA
1000 HRS
76 PCS
0/1
85°C / 85% RH
1000 HRS
76 PCS
0/1
6
7
High
Temperature /
High
Humidity
Note:Ivt:The test Iv value of the chip before the reliablility test
Iv:The test value of the chip that has completed the reliablility test
U:Upper Specification Limit
L: Lower Specification Limit
Everlight Electronics Co., Ltd.
http://www.everlight.com
Device No.: CDGT-512-003
Prepared date:2005/11/16
Rev.2
Page 6 of 6
Prepared by: Angel Zhang
0/1
Similar pages