STMICROELECTRONICS H8NA60FI

STW8NA60
STH8NA60FI

N - CHANNEL ENHANCEMENT MODE
FAST POWER MOS TRANSISTOR
TYPE
STW 8NA60
STH8NA60F I
■
■
■
■
■
■
■
V DSS
R DS(on)
ID
600 V
600 V
<1 Ω
<1 Ω
8 A
5 A
TYPICAL RDS(on) = 0.92 Ω
± 30V GATE TO SOURCE VOLTAGE RATING
100% AVALANCHE TESTED
REPETITIVE AVALANCHE DATA AT 100oC
LOW INTRINSIC CAPACITANCES
GATE CHARGE MINIMIZED
REDUCED THRESHOLD VOLTAGE SPREAD
1
2
3
3
2
1
TO-247
APPLICATIONS
■ HIGH CURRENT, HIGH SPEED SWITCHING
■ SWITCH MODE POWER SUPPLIES (SMPS)
■ DC-AC CONVERTERS FOR WELDING
EQUIPMENT AND UNINTERRUPTIBLE
POWER SUPPLIES AND MOTOR DRIVE
ISOWATT218
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Valu e
ST W8NA60
V DS
V DGR
V GS
600
V
Drain- gate Voltage (R GS = 20 kΩ)
600
V
± 30
V
G ate-source Voltage
o
Drain Current (continuous) at Tc = 25 C
ID
o
P tot
V ISO
Ts tg
Tj
STH8NA60FI
Drain-source Voltage (VGS = 0)
ID
I DM (•)
Unit
8
5
Drain Current (continuous) at Tc = 100 C
5.1
3.2
A
Drain Current (pulsed)
32
32
A
T otal Dissipation at Tc = 25 o C
150
60
W
Derating Factor
1.2
0.48
W /o C
Insulation W ithstand Voltage (DC)

4000
Storage Temperature
Max. Operating Junction Temperature
A
V
-65 to 150
o
C
150
o
C
(•) Pulse width limited by safe operating area
October 1998
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STW8NA60-STH8NA60FI
THERMAL DATA
R thj -case
R thj -amb
R thc-sink
Tl
Thermal Resistance Junction-case
Max
TO-247
ISOWATT 218
0.83
2.08
Thermal Resistance Junction-ambient
Max
Thermal Resistance Case-sink
Typ
Maximum Lead Temperature F or Soldering Purpose
30
0.1
300
o
C/W
o
C/W
C/W
o
C
o
AVALANCHE CHARACTERISTICS
Symbo l
Parameter
IAR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max, δ < 1%)
E AS
Single Pulse Avalanche Energy
(starting Tj = 25 o C, ID = IAR , V DD = 50 V)
Max Value
Unit
8
A
480
mJ
ELECTRICAL CHARACTERISTICS (Tcase = 25 oC unless otherwise specified)
OFF
Symbo l
V (BR)DSS
Parameter
Drain-source
Breakdown Voltage
Test Con ditions
I D = 250 µA
V GS = 0
I DSS
V DS = Max Rating
Zero Gate Voltage
Drain Current (V GS = 0) V DS = Max Rating
IGSS
Gate-body Leakage
Current (VDS = 0)
Min.
Typ.
Max.
600
Unit
V
T c = 100 oC
V GS = ± 30 V
25
250
µA
µA
± 100
nA
ON (∗)
Symbo l
Parameter
Test Con ditions
V GS(th)
Gate Threshold Voltage V DS = V GS
ID = 250 µA
R DS(on)
Static Drain-source On
Resistance
V GS = 10V
ID = 4 A
I D(o n)
On State Drain Current
V DS > ID(o n) x R DS(on )ma x
V GS = 10 V
Min.
Typ.
Max.
Unit
2.25
3
3.75
V
0.92
1
Ω
8
A
DYNAMIC
Symbo l
g f s (∗)
C iss
C os s
C rss
2/10
Parameter
Test Con ditions
Forward
Transconductance
V DS > ID(o n) x R DS(on )ma x
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
V DS = 25 V
f = 1 MHz
ID = 4 A
V GS = 0
Min.
Typ.
4.5
6.6
1350
175
45
Max.
Unit
S
1690
230
60
pF
pF
pF
STW8NA60-STH8NA60FI
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbo l
t d(on)
tr
(di/dt) on
Qg
Q gs
Q gd
Typ.
Max.
Unit
Turn-on Time
Rise Time
Parameter
V DD = 300 V I D = 4 A
R G = 4.7 Ω
V GS = 10 V
(see test circuit, figure 3)
Test Con ditions
20
35
28
35
ns
ns
Turn-on Current Slope
V DD = 480 V I D = 8 A
VGS = 10 V
R G = 47 Ω
(see test circuit, figure 5)
200
Total G ate Charge
Gate-Source Charge
Gate-Drain Charge
V DD = 480 V
58
9
27
82
nC
nC
nC
Typ.
Max.
Unit
16
16
26
23
23
37
ns
ns
ns
Typ.
Max.
Unit
8
32
A
A
1.6
V
ID = 8 A
Min.
VGS = 10 V
A/µs
SWITCHING OFF
Symbo l
tr (Voff)
tf
tc
Parameter
Off-voltage Rise T ime
Fall T ime
Cross-over Time
Test Con ditions
Min.
V DD = 640 V I D = 8 A
R G = 4.7 Ω VGS = 10 V
(see test circuit, figure 5)
SOURCE DRAIN DIODE
Symbo l
Parameter
Test Con ditions
ISD
I SDM (•)
Source-drain Current
Source-drain Current
(pulsed)
V SD (∗)
Forward On Voltage
I SD = 8 A
Reverse Recovery
Time
Reverse Recovery
Charge
Reverse Recovery
Current
I SD = 8 A di/dt = 100 A/µs
T j = 150 o C
V DD = 100 V
(see test circuit, figure 5)
t rr
Q rr
I RRM
Min.
V GS = 0
600
ns
10
µC
33
A
(∗) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
(•) Pulse width limited by safe operating area
Safe Operating Area for TO-247
Safe Operating Area for ISOWATT218
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STW8NA60-STH8NA60FI
Thermal Impedance for TO-247
Thermal Impedance for ISOWATT218
Derating Curve for TO-247
Derating Curve for ISOWATT218
Output Characteristics
Transfer Characteristics
4/10
STW8NA60-STH8NA60FI
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
Normalized Gate Threshold Voltage vs
Temperature
Normalized On Resistance vs Temperature
5/10
STW8NA60-STH8NA60FI
Turn-on Current Slope
Turn-off Drain-source Voltage Slope
Cross-over Time
Switching Safe Operating Area
Accidental Overload Area
Source-drain Diode Forward Characteristics
6/10
STW8NA60-STH8NA60FI
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
7/10
STW8NA60-STH8NA60FI
TO-247 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
inch
MAX.
MIN.
TYP.
MAX.
A
4.7
5.3
0.185
0.209
D
2.2
2.6
0.087
0.102
E
0.4
0.8
0.016
0.031
F
1
1.4
0.039
0.055
F3
2
2.4
0.079
0.094
F4
3
3.4
0.118
0.134
G
10.9
0.429
H
15.3
15.9
0.602
0.626
L
19.7
20.3
0.776
0.779
L3
14.2
14.8
0.559
0.413
L4
34.6
1.362
L5
5.5
0.217
0.582
M
2
3
0.079
0.118
Dia
3.55
3.65
0.140
0.144
P025P
8/10
STW8NA60-STH8NA60FI
ISOWATT218 MECHANICAL DATA
mm
DIM.
MIN.
inch
MAX.
MIN.
A
5.35
TYP.
5.65
0.210
TYP.
MAX.
0.222
C
3.3
3.8
0.130
0.149
D
2.9
3.1
0.114
0.122
D1
1.88
2.08
0.074
0.081
E
0.75
1
0.029
0.039
F
1.05
1.25
0.041
0.049
G
10.8
11.2
0.425
0.441
H
15.8
16.2
0.622
0.637
L1
20.8
21.2
0.818
0.834
L2
19.1
19.9
0.752
0.783
L3
22.8
23.6
0.897
0.929
L4
40.5
42.5
1.594
1.673
L5
4.85
5.25
0.190
0.206
L6
20.25
20.75
0.797
0.817
M
3.5
3.7
0.137
0.145
N
2.1
2.3
0.082
0.090
U
4.6
0.181
L3
C
D1
D
A
E
N
L2
L6
F
L5
H
G
U
M
1
2
3
L1
L4
P025C
9/10
STW8NA60-STH8NA60FI
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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 1998 STMicroelectronics – Printed in Italy – All Rights Reserved
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