STMICROELECTRONICS STB22NS25Z

STP22NS25Z
STB22NS25Z
N-CHANNEL 250V - 0.13Ω - 22A TO-220/D2PAK
Zener-Protected MESH OVERLAY™ MOSFET
TYPE
STP22NS25Z
STB22NS25Z
■
■
■
VDSS
RDS(on)
ID
250 V
250 V
< 0.15 Ω
< 0.15 Ω
22 A
22 A
TYPICAL RDS(on) = 0.13 Ω
EXTREMELY HIGH dv/dt CAPABILITY
100% AVALANCHE TESTED
3
3
1
1
2
D2PAK
TO-220
DESCRIPTION
Using the latest high voltage MESH OVERLAY™
process, STMicroelectronics has designed an advanced family of power MOSFETs with outstanding
performance. The new patented STrip layout coupled with the Company’s proprietary edge termination structure, makes it suitable in coverters for
lighting applications.
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ HIGH CURRENT, HIGH SPEED SWITCHING
■ SWITH MODE POWER SUPPLIES (SMPS)
■ DC-DC CONVERTERS FOR TELECOM,
INDUSTRIAL, AND LIGHTING EQUIPMENT
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
Value
Unit
Drain-source Voltage (VGS = 0)
Parameter
250
V
Drain-gate Voltage (RGS = 20 kΩ)
250
V
Gate- source Voltage
± 20
V
ID
Drain Current (continuos) at TC = 25°C
22
A
ID
Drain Current (continuos) at TC = 100°C
13.9
A
88
A
Total Dissipation at TC = 25°C
135
W
Derating Factor
1.07
W/°C
Gate source ESD(HBM-C=100pF, R=1.5KΩ)
2500
V
5
V/ns
–55 to 150
°C
IDM (l)
PTOT
VESD(G-S)
dv/dt (1)
Tstg
Tj
Drain Current (pulsed)
Peak Diode Recovery voltage slope
Storage Temperature
Max. Operating Junction Temperature
(•)Pulse width limited by safe operating area
January 2002
(1) ISD ≤22A, di/dt ≤200A/µs, V DD ≤ V(BR)DSS , Tj ≤ TJMAX.
1/10
STP22NS25Z / STB22NS25Z
THERMAL DATA
Rthj-case
Thermal Resistance Junction-case Max
0.93
°C/W
Rthj-amb
Thermal Resistance Junction-ambient Max
62.5
°C/W
Maximum Lead Temperature For Soldering Purpose
300
°C
Tl
AVALANCHE CHARACTERISTICS
Symbol
Max Value
Unit
IAR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max)
Parameter
22
A
EAS
Single Pulse Avalanche Energy
(starting Tj = 25 °C, ID = IAR, VDD = 50 V, Rg = 47 Ohm)
350
mJ
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
IDSS
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
10
µA
VDS = Max Rating, TC = 125 °C
100
µA
IGSS
Gate-body Leakage
Current (VDS = 0)
VGS = ±18V
±10
µA
V(BR)DSS
250
Unit
V
ON (1)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250µA
RDS(on)
Static Drain-source On
Resistance
VGS = 10V, ID = 11 A
Min.
Typ.
Max.
Unit
2
3
4
V
0.13
0.15
Ω
Typ.
Max.
Unit
DYNAMIC
Symbol
gfs (1)
2/10
Parameter
Forward Transconductance
Test Conditions
VDS > ID(on) x RDS(on)max,
ID = 11A
VDS = 25V, f = 1 MHz, VGS = 0
Min.
22
S
Ciss
Input Capacitance
2400
pF
Coss
Output Capacitance
340
pF
Crss
Reverse Transfer
Capacitance
120
pF
STP22NS25Z / STB22NS25Z
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol
td(on)
tr
Parameter
Turn-on Delay Time
Rise Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
Test Conditions
Min.
VDD = 125 V, ID = 11 A
RG = 4.7Ω VGS = 10 V
(see test circuit, Figure 3)
VDD = 200V, ID = 20 A,
VGS = 10V
Typ.
Max.
Unit
20
ns
30
ns
108
151
nC
11
nC
40
nC
SWITCHING OFF
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
td(Voff)
tf
Turn-off- Delay Time
Fall Time
VDD = 125V, ID = 11 A,
RG = 4.7Ω, VGS = 10V
(see test circuit, Figure 3)
100
78
ns
ns
tr(Voff)
tf
tc
Off-voltage Rise Time
Fall Time
Cross-over Time
Vclamp = 200V, ID = 22 A,
RG = 4.7Ω, VGS = 10V
(see test circuit, Figure 5)
37
65
110
ns
ns
ns
SOURCE DRAIN DIODE
Symbol
ISD
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
Source-drain Current
22
A
ISDM (2)
Source-drain Current (pulsed)
88
A
VSD (1)
Forward On Voltage
ISD = 22 A, VGS = 0
1.6
V
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
ISD = 22 A, di/dt = 100A/µs
VDD = 50V, Tj = 150°C
(see test circuit, Figure 5)
IRRM
Reverse Recovery Current
292
ns
3065
nC
21
A
GATE-SOURCE ZENER DIODE
Symbol
BVGSO
Parameter
Gate-Source Breakdown
Voltage
Test Conditions
Igs=± 500µA (Open Drain)
Min.
20
Typ.
Max.
Unit
V
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be
applied from gate to souce. In this respect the Zener voltage is appropriate to achieve an efficient and costeffective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the usage
of external components.
3/10
STP22NS25Z / STB22NS25Z
Safe Operating Area
Thermal Impedance
Output Characteristics
Transfer Characteristics
Transconductance
4/10
Static Drain-source On Resistance
STP22NS25Z / STB22NS25Z
Gate Charge vs Gate-source Voltage
Capacitance Variations
Normalized Gate Thereshold Voltage vs Temp.
Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
5/10
STP22NS25Z / STB22NS25Z
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/10
STP22NS25Z / STB22NS25Z
TO-220 MECHANICAL DATA
mm
DIM.
MIN.
inch
TYP.
MAX.
MIN.
TYP.
MAX.
A
4.40
4.60
0.173
0.181
C
1.23
1.32
0.048
0.051
D
2.40
2.72
0.094
D1
0.107
1.27
0.050
E
0.49
0.70
0.019
0.027
F
0.61
0.88
0.024
0.034
F1
1.14
1.70
0.044
0.067
F2
1.14
1.70
0.044
0.067
G
4.95
5.15
0.194
0.203
G1
2.4
2.7
0.094
0.106
H2
10.0
10.40
0.393
0.409
L2
16.4
0.645
13.0
14.0
0.511
0.551
L5
2.65
2.95
0.104
0.116
L6
15.25
15.75
0.600
0.620
L7
6.2
6.6
0.244
0.260
L9
3.5
3.93
0.137
0.154
DIA.
3.75
3.85
0.147
0.151
D1
C
D
A
E
L4
H2
G
G1
F1
L2
F2
F
Dia.
L5
L9
L7
L6
L4
P011C
7/10
STP22NS25Z / STB22NS25Z
D2PAK MECHANICAL DATA
mm.
inch
DIM.
MIN.
TYP
MAX.
MIN.
TYP.
MAX.
A
4.4
4.6
0.173
0.181
A1
2.49
2.69
0.098
0.106
A2
0.03
0.23
0.001
0.009
B
0.7
0.93
0.027
0.036
B2
1.14
1.7
0.044
0.067
C
0.45
0.6
0.017
0.023
C2
1.23
1.36
0.048
0.053
D
8.95
9.35
0.352
0.368
D1
E
8
0.315
10
E1
10.4
0.393
8.5
0.334
G
4.88
5.28
0.192
0.208
L
15
15.85
0.590
0.625
L2
1.27
1.4
0.050
0.055
L3
1.4
1.75
0.055
0.068
M
2.4
3.2
0.094
0.126
R
0.015
0º
8º
3
V2
0.4
8/10
1
STP22NS25Z / STB22NS25Z
D2PAK FOOTPRINT
TUBE SHIPMENT (no suffix)*
TAPE AND REEL SHIPMENT (suffix ”T4”)*
REEL MECHANICAL DATA
DIM.
mm
MIN.
A
B
1.5
C
12.8
D
20.2
G
24.4
N
100
T
TAPE MECHANICAL DATA
DIM.
mm
inch
MIN.
MAX.
MIN.
A0
10.5
10.7
0.413 0.421
B0
15.7
15.9
0.618 0.626
D
1.5
1.6
0.059 0.063
D1
1.59
1.61
0.062 0.063
E
1.65
1.85
0.065 0.073
F
11.4
11.6
0.449 0.456
K0
4.8
5.0
0.189 0.197
MAX.
MIN.
MAX.
330
12.992
13.2
0.504 0.520
0.059
0795
26.4
0.960 1.039
3.937
30.4
1.197
BASE QTY
BULK QTY
1000
1000
MAX.
P0
3.9
4.1
0.153 0.161
P1
11.9
12.1
0.468 0.476
P2
1.9
2.1
0.075 0.082
R
50
1.574
T
0.25
0.35 0.0098 0.0137
W
23.7
24.3
* on sales type
inch
0.933 0.956
9/10
STP22NS25Z / STB22NS25Z
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a trademark of STMicroelectronics
© 2001 STMicroelectronics – Printed in Italy – All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - China - Finland - France - Germany - Hong Kong - India - Italy - Japan - Malaysia - Malta - Morocco Singapore - Spain - Sweden - Switzerland - United Kingdom - U.S.A.
http://www.st.com
10/10