STMICROELECTRONICS STB60NE06-16

STB60NE06-16
N - CHANNEL ENHANCEMENT MODE
” SINGLE FEATURE SIZE ” POWER MOSFET
TYPE
STB60NE06-1
■
■
■
■
■
■
■
V DSS
R DS(on)
ID
60 V
< 0.016 Ω
60 A
TYPICAL RDS(on) = 0.013 Ω
EXCEPTIONAL dV/dt CAPABILTY
100% AVALANCHE TESTED
LOW GATE CHARGE 100 oC
HIGH dV/dt CAPABILITY
APPLICATION ORIENTED
CHARACTERIZATION
FOR THROUGH-HOLE VERSION CONTACT
SALES OFFICE
3
1
D2PAK
TO-263
(Suffix ”T4”)
DESCRIPTION
This Power Mosfet is the latest development of
SGS-THOMSON unique ” Single Feature Size ”
strip-based process. The resulting transistor
shows extremely high packing density for low onresistance, rugged avalanche characteristics and
less critical alignment steps therefore a remarkable manufacturing reproducibility.
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■
DC MOTOR CONTROL
■
DC-DC & DC-AC CONVERTERS
■
SYNCHRONOUS RECTIFICATION
ABSOLUTE MAXIMUM RATINGS
Symbol
V DS
Parameter
Value
Uni t
Drain-source Voltage (V GS = 0)
60
V
VDGR
Drain- gate Voltage (R GS = 20 kΩ)
60
V
V GS
Gate-source Voltage
± 20
V
60
A
Drain Current (continuous) at T c = 100 C
42
A
Drain Current (pulsed)
240
A
150
W
1
W/ o C
6
V/ ns
o
ID
Drain Current (continuous) at T c = 25 C
ID
o
I DM (•)
P t ot
o
Total Dissipation at Tc = 25 C
Derating Factor
dV/dt( 1 )
T stg
Tj
Peak Diode Recovery voltage slope
St orage Temperature
Max. Operating Junction Temperature
(•) Pulse width limited by safe operating area
January 1998
-65 to 175
o
C
175
o
C
(1) ISD ≤ 60 A, di/dt ≤ 200 A/µs, VDD ≤ V(BR)DSS, TJ ≤ TJMAX
1/9
STB60NE06-16
THERMAL DATA
R t hj-ca se
Rthj -amb
R thc- si nk
Tl
Thermal Resistance Junction-case
Max
Thermal Resistance Junction-ambient
Max
Thermal Resistance Case-sink
Typ
Maximum Lead Temperature For Soldering Purpose
o
1
62.5
0.5
300
C/W
C/W
oC/W
o
C
o
AVALANCHE CHARACTERISTICS
Symb ol
Parameter
I AR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max, δ < 1%)
E AS
Single Pulse Avalanche Energy
o
(starting Tj = 25 C, I D = IAR , VDD = 25 V)
Max Valu e
Unit
60
A
350
mJ
ELECTRICAL CHARACTERISTICS (Tcase = 25 oC unless otherwise specified)
OFF
Symb ol
V (BR)DSS
I DSS
I GSS
Parameter
Drain-source
Breakdown Voltage
Test Cond ition s
I D = 250 µA
Gate-body Leakage
Current (V DS = 0)
Typ .
Max.
60
V GS = 0
V DS = Max Rating
Zero G ate Voltage
Drain Current (VGS = 0) V DS = Max Rating
o
C
Min.
Un it
V
T c = 125
V GS = ± 20 V
1
10
µA
µA
± 100
nA
ON (∗)
Symb ol
Parameter
Test Cond ition s
ID = 250 µA
V GS(th)
Gate Threshold
Voltage
R DS( on)
Static Drain-source On V GS = 10V
Resistance
ID(o n)
V DS = VGS
Min.
Typ .
Max.
Un it
2
3
4
V
0.013
0.016
Ω
ID = 30 A
60
On State Drain Current V DS > I D(on) x R DS(on) max
V GS = 10 V
A
DYNAMIC
Symb ol
g fs (∗)
C iss
C oss
C rss
2/9
Parameter
Test Cond ition s
Forward
Transconductance
V DS > I D(on) x R DS(on) max
Input Capacitance
Output Capacitance
Reverse T ransfer
Capacitance
V DS = 25 V
f = 1 MHz
I D =30 A
VGS = 0
Min.
Typ .
20
35
4600
580
140
Max.
Un it
S
6200
800
200
pF
pF
pF
STB60NE06-16
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symb ol
t d(on)
tr
(di/dt) on
Qg
Q gs
Q gd
Parameter
Test Cond ition s
Turn-on Time
Rise Time
V DD = 30 V
R G =4.7 Ω
Turn-on Current Slope
V DD = 48 V
R G = 47 Ω
I D = 60 A
VGS =10 V
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
V DD = 48 V
I D = 60 A
Min.
ID = 30 A
VGS = 10 V
Typ .
Max.
Un it
40
125
60
180
ns
ns
280
V GS = 10 V
A/µs
115
25
40
160
nC
nC
nC
Typ .
Max.
Un it
15
150
180
25
210
260
ns
ns
ns
Typ .
Max.
Un it
60
240
A
A
SWITCHING OFF
Symb ol
t r(Vof f)
tf
tc
Parameter
Off-voltage Rise Time
Fall Time
Cross-over Time
Test Cond ition s
Min.
V DD = 48 V I D = 60 A
R G =4.7 Ω VGS = 10 V
SOURCE DRAIN DIODE
Symb ol
I SD
I SDM (•)
V SD (∗)
t rr
Q rr
I RRM
Parameter
Test Cond ition s
Min.
Source-drain Current
Source-drain Current
(pulsed)
Forward On Voltage
I SD = 60 A
Reverse Recovery
Time
Reverse Recovery
Charge
Reverse Recovery
Current
I SD = 60 A
V DD = 30 V
V GS = 0
di/dt = 100 A/µs
o
Tj = 150 C
1.5
V
100
ns
0.4
µC
8
A
(∗) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
(•) Pulse width limited by safe operating area
Safe Operating Area
Thermal Impedance
3/9
STB60NE06-16
Derating Curve
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
4/9
STB60NE06-16
Capacitance Variations
Normalized Gate Threshold Voltage vs
Temperature
Normalized On Resistance vs Temperature
Turn-on Current Slope
Turn-off Drain-source Voltage Slope
Cross-over Time
5/9
STB60NE06-16
Switching Safe Operating Area
Accidental Overload Area
Source-drain Diode Forward Characteristics
Fig. 1: Unclamped Inductive Load Test Circuit
6/9
Fig. 2: Unclamped Inductive Waveform
STB60NE06-16
Fig. 3: Switching Times Test Circuits For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And DIode Recovery Times
7/9
STB60NE06-16
TO-263 (D2PAK) MECHANICAL DATA
mm
DIM.
MIN.
inch
TYP.
MAX.
MIN.
TYP.
MAX.
A
4.3
4.6
0.169
0.181
A1
2.49
2.69
0.098
0.106
B
0.7
0.93
0.027
0.036
B2
1.25
1.4
0.049
0.055
C
0.45
0.6
0.017
0.023
C2
1.21
1.36
0.047
0.053
D
8.95
9.35
0.352
0.368
E
10
10.28
0.393
0.404
G
4.88
5.28
0.192
0.208
L
15
15.85
0.590
0.624
L2
1.27
1.4
0.050
0.055
L3
1.4
1.75
0.055
0.068
E
A
C2
L2
D
L
L3
B2
B
A1
C
G
P011P6/C
8/9
STB60NE06-16
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No
license is granted by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned
in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.
SGS-THOMSON Microelectronics products are not authorized for use as critical components in life support devices or systems without express
written approval of SGS-THOMSON Microelectonics.
 1997 SGS-THOMSON Microelectronics - Printed in Italy - All Rights Reserved
SGS-THOMSON Microelectronics GROUP OF COMPANIES
Australia - Brazil - Canada - China - France - Germany - Italy - Japan - Korea - Malaysia - Malta - Morocco - The Netherlands Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A
...
9/9