STMICROELECTRONICS STP30NS15LFP

STP30NS15LFP
N-CHANNEL 150V - 0.085 Ω - 10A TO-220FP
MESH OVERLAY™ POWER MOSFET
TYPE
STP30NS15LFP
■
■
■
VDSS
RDS(on)
ID
150 V
<0.1Ω
10 A
TYPICAL RDS(on) = 0.085Ω
EXTREMELY HIGH dv/dt CAPABILITY
100% AVALANCHE TESTED
DESCRIPTION
Using the latest high voltage MESH OVERLAY™
process, STMicroelectronics has designed an advanced
family
of
power MOSFETs
with
outstanding
performances. The new patent pending strip layout
coupled with the Company’s proprietary edge termination
structure, gives the lowest RDS(on) per area,
exceptional avalanche and dv/dt capabilities and
unrivalled gate charge and switching characteristics.
3
1
2
TO-220FP
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ SWITCHING “S” CAPACITOR
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
Parameter
Drain-source Voltage (VGS = 0)
Unit
150
V
Drain-gate Voltage (RGS = 20 kΩ)
150
V
Gate- source Voltage
± 15
V
ID
Drain Current (continuous) at TC = 25°C
10
A
ID
Drain Current (continuous) at TC = 100°C
7
A
IDM(•)
Ptot
EAS(1)
dv/dt (2)
Tstg
Tj
Drain Current (pulsed)
40
A
Total Dissipation at TC = 25°C
30
W
Derating Factor
0.2
W/°C
Single Pulse Avalanche Energy
300
mJ
Peak Diode Recovery voltage slope
2.4
V/ns
-55 to 175
°C
Storage Temperature
Operating Junction Temperature
(•) Pulse width limited by safe operating area.
July 2003
.
Value
(1) Starting T j = 25 oC, ID = 15A, VDD= 75V
(2) ISD ≤35A, di/dt ≤300A/µs, VDD ≤ V(BR)DSS, Tj ≤ TJMAX.
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STP30NS15LFP
THERMAL DATA
Rthj-case
Rthj-amb
Tl
Thermal Resistance Junction-case
Thermal Resistance Junction-ambient
Maximum Lead Temperature For Soldering Purpose
Max
Max
Typ
5
62.5
300
°C/W
°C/W
°C
ELECTRICAL CHARACTERISTICS (Tcase = 25 °C unless otherwise specified)
OFF
Symbol
Parameter
Test Conditions
V(BR)DSS
Drain-source Breakdown
Voltage
ID = 250 µA, VGS = 0
IDSS
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
VDS = Max Rating TC = 125°C
IGSS
Gate-body Leakage
Current (VDS = 0)
VGS = ± 15V
Min.
Typ.
Max.
150
Unit
V
1
10
µA
µA
±100
nA
ON (1)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS
RDS(on)
Static Drain-source On
Resistance
VGS = 10 V
VGS = 5 V
ID = 250 µA
Min.
Typ.
Max.
Unit
1
2
3
V
0.085
0.1
0.1
0.112
Ω
Ω
Typ.
Max.
Unit
ID = 5 A
ID = 5 A
DYNAMIC
Symbol
2/9
Parameter
Test Conditions
gfs (*)
Forward Transconductance
VDS = 20 V
Ciss
Coss
Crss
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
VDS = 25V, f = 1 MHz, VGS = 0
ID = 7 A
Min.
6
S
1080
170
105
pF
pF
pF
STP30NS15LFP
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
td(on)
tr
Turn-on Delay Time
Rise Time
ID = 5 A
VDD = 75 V
RG = 4.7 Ω
VGS = 4.5 V
(Resistive Load, Figure 1)
25
95
Qg
Qgs
Qgd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
VDD=120V ID=10A VGS=5V
(see test circuit, Figure 2)
40
7.5
20
54
nC
nC
nC
Typ.
Max.
Unit
ns
ns
SWITCHING OFF
Symbol
Parameter
Test Conditions
Min.
td(off)
tf
Turn-off Delay Time
Fall Time
ID = 5 A
VDD = 75 V
RG = 4.7Ω,
VGS = 5 V
(Resistive Load, Figure 1)
55
30
ns
ns
tr(Voff)
tf
tc
Off-voltage Rise Time
Fall Time
Cross-over Time
ID = 10 A
Vclamp = 120 V
RG = 4.7Ω,
VGS = 4.5 V
(Inductive Load, Figure 3)
15
30
50
ns
ns
ns
SOURCE DRAIN DIODE
Symbol
Parameter
ISD
ISDM (•)
Source-drain Current
Source-drain Current (pulsed)
VSD (*)
Forward On Voltage
ISD = 10 A
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
di/dt = 100A/µs
ISD = 10 A
Vr = 30 V
Tj = 150°C
(Inductive Load, Figure 3)
trr
Qrr
IRRM
Test Conditions
Min.
Typ.
VGS = 0
160
950
12
Max.
Unit
10
40
A
A
1.3
V
ns
nC
A
(*)Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
(•)Pulse width limited by safe operating area.
Safe Operating Area
Thermal Impedance
3/9
STP30NS15LFP
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/9
STP30NS15LFP
Normalized Gate Threshold Voltage vs Temperature
Normalized on Resistance vs Temperature
Source-drain Diode Forward Characteristics
Normalized Breakdown Voltage vs Temperature
.
.
5/9
STP30NS15LFP
Fig. 1: Switching Times Test Circuits For Resistive
Load
Fig. 3: Test Circuit For Diode Recovery Behaviour
6/9
Fig. 2: Gate Charge test Circuit
STP30NS15LFP
TO-220FP MECHANICAL DATA
mm
DIM.
MIN.
inch
TYP.
MAX.
MIN.
TYP.
MAX.
A
4.4
4.6
0.173
0.181
B
2.5
2.7
0.098
0.106
D
2.5
2.75
0.098
0.108
E
0.45
0.7
0.017
0.027
F
0.75
1
0.030
0.039
F1
1.15
1.7
0.045
0.067
F2
1.15
1.7
0.045
0.067
G
4.95
5.2
0.195
0.204
G1
2.4
2.7
0.094
0.106
H
10
10.4
0.393
0.409
L2
16
0.630
28.6
30.6
1.126
1.204
L4
9.8
10.6
0.385
0.417
L6
15.9
16.4
0.626
0.645
L7
9
9.3
0.354
0.366
Ø
3
3.2
0.118
0.126
B
D
A
E
L3
L3
L6
F2
H
G
G1
¯
F
F1
L7
1 2 3
L2
L4
7/9
STP30NS15LFP
TO-220FP(023Y) MECHANICAL DATA
DIM.
A
B
C
D
E
F
F1
F2
G
G1
H
L1
L2
L3
L4
L5
L6
L7
L8
M
N
Dia
8/9
MIN.
4.4
2.5
1
2.4
0.4
0.75
1.15
1.15
4.68
2.24
10
18.4
mm.
TYP
MAX.
4.6
2.7
1.4
2.75
0.7
1
1.7
1.7
5.48
2.84
10.4
19.2
MIN.
0.173
0.009
0.039
0.094
0.015
0.029
0.045
0.045
0.184
0.088
0.393
0.724
16
29
15.3
MAX.
0.181
0.106
0.055
0.108
0.027
0.039
0.066
0.066
0.215
0.111
0.409
0.755
0.629
30
16.1
1.14
0.60
16.4
9.3
23.6
5.4
3.29
3.2
0.625
0.354
0.885
0.181
0.090
3.4
15.9
9
22.5
4.6
2.29
3
inch
TYP.
1.18
0.63
0.133
0.665
0.366
0.929
0.212
0.129
STP30NS15LFP
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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