STMICROELECTRONICS STP60NE06-16

STP60NE06-16
STP60NE06-16FP
N - CHANNEL ENHANCEMENT MODE
” SINGLE FEATURE SIZE ” POWER MOSFET
TYPE
V DSS
R DS(on)
ID
STP60NE06-16
STP60NE06-16FP
60 V
60 V
< 0.016 Ω
< 0.016 Ω
60 A
35 A
■
■
■
■
■
■
TYPICAL RDS(on) = 0.013 Ω
EXCEPTIONAL dV/dt CAPABILTY
100% AVALANCHE TESTED
LOW GATE CHARGE 100 oC
HIGH dV/dt CAPABILITY
APPLICATION ORIENTED
CHARACTERIZATION
1
DESCRIPTION
This Power Mosfet is the latest development of
SGS-THOMSON unique ”Single Feature Size”
process whereby a single body is implanted on a
strip layout structure. The resulting transistor
shows extremely high packing density for low onresistance, rugged avalanche characteristics and
less critical alignment steps therefore a remarkable manufacturing reproducibility.
2
3
3
2
1
TO-220
TO220FP
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■
DC MOTOR CONTROL
■
DC-DC & DC-AC CONVERTERS
■
SYNCHRONOUS RECTIFICATION
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Valu e
STP60NE06-16
V DS
Unit
STP60NE06-16F P
Drain-source Voltage (V GS = 0)
60
V
V DGR
Drain- gate Voltage (R GS = 20 kΩ)
60
V
V GS
Gate-source Voltage
± 20
o
V
ID
Drain Current (continuous) at T c = 25 C
60
35
A
ID
o
Drain Current (continuous) at T c = 100 C
42
24
A
Drain Current (pulsed)
240
240
A
IDM (•)
P t ot
o
150
40
W
Derating F actor
1
0.3
W/ C
V ISO
Insulation W ithstand Voltage (DC)

2000
V
dV/dt
Peak Diode Recovery voltage slope
T stg
Tj
Total Dissipation at T c = 25 C
Storage Temperature
Max. O perating Junction Temperature
(•) Pulse width limited by safe operating area
December 1997
6
o
V/ns
-65 to 175
o
C
175
o
C
( 1) ISD ≤ 60 A, di/dt ≤ 300 A/µs, VDD ≤ V(BR)DSS, Tj ≤ TJMAX
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STP60NE06-16/FP
THERMAL DATA
R t hj-ca se
R t hj- amb
R thc- si nk
Tl
Thermal Resistance Junction-case
T O-220
T O-220F P
1
3.75
Max
Thermal Resistance Junction-ambient
Max
Thermal Resistance Case-sink
Typ
Maximum Lead Temperature For Soldering Purpose
62.5
0.5
300
o
C/W
o
C/W
C/W
o
C
o
AVALANCHE CHARACTERISTICS
Symb ol
Parameter
I AR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max, δ < 1%)
E AS
Single Pulse Avalanche Energy
o
(starting Tj = 25 C, ID = I AR , V DD = 25 V)
Max Valu e
Unit
60
A
350
mJ
ELECTRICAL CHARACTERISTICS (Tcase = 25 oC unless otherwise specified)
OFF
Symb ol
V (BR)DSS
Parameter
Drain-source
Breakdown Voltage
Test Cond ition s
I D = 250 µA
I DSS
Zero Gate Voltage
V DS = Max Rating
Drain Current (V GS = 0) V DS = Max Rating
I GSS
Gate-body Leakage
Current (V DS = 0)
Min.
Typ .
Max.
60
VGS = 0
Un it
V
T c = 125 o C
V GS = ± 20 V
1
10
µA
µA
± 100
nA
ON (∗)
Symb ol
Parameter
Test Cond ition s
V GS(th)
Gate T hreshold Voltage V DS = VGS
ID = 250 µA
R DS( on)
Static Drain-source On
Resistance
V GS = 10V
I D = 30 A
ID(o n)
On State Drain Current
V DS > I D(on) x R DS(on) max
V GS = 10 V
Min.
Typ .
Max.
Un it
2
3
4
V
0.013
0.016
Ω
60
A
DYNAMIC
Symb ol
g fs (∗)
C iss
C oss
C rss
2/9
Parameter
Test Cond ition s
Forward
Transconductance
V DS > I D(on) x R DS(on) max
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
V DS = 25 V
f = 1 MHz
I D =30 A
VGS = 0
Min.
Typ .
20
35
4600
580
140
Max.
Un it
S
6200
800
200
pF
pF
pF
STP60NE06-16/FP
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symb ol
Parameter
Test Cond ition s
t d(on)
tr
Turn-on T ime
Rise Time
V DD = 30 V
R G =4.7 W
Qg
Q gs
Q gd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
V DD = 48 V
Min.
ID = 30 A
V GS = 10 V
ID = 60 A
V GS = 10 V
Typ .
Max.
Un it
40
125
60
180
ns
ns
115
25
40
160
nC
nC
nC
Typ .
Max.
Un it
15
150
180
25
210
260
ns
ns
ns
Typ .
Max.
Un it
60
240
A
A
1.5
V
SWITCHING OFF
Symb ol
t r(Vof f)
tf
tc
Parameter
Off-voltage Rise Time
Fall T ime
Cross-over T ime
Test Cond ition s
Min.
V DD = 48 V I D = 60 A
R G =4.7 Ω VGS = 10 V
SOURCE DRAIN DIODE
Symb ol
Parameter
Test Cond ition s
I SD
I SDM (•)
Source-drain Current
Source-drain Current
(pulsed)
V SD (∗)
Forward O n Voltage
I SD = 60 A
Reverse Recovery
Time
Reverse Recovery
Charge
Reverse Recovery
Current
I SD = 60 A
V DD = 30 V
t rr
Q rr
I RRM
Min.
V GS = 0
di/dt = 100 A/µs
o
Tj = 150 C
100
ns
0.4
µC
8
A
(∗) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
(•) Pulse width limited by safe operating area
Safe Operating Area for TO-220
Safe Operating Area for TO-220FP
3/9
STP60NE06-16/FP
Thermal Impedance for TO-220
Thermal Impedance forTO-220FP
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-Source On Resistance
4/9
STP60NE06-16/FP
Gate Charge vs Gate-Source Voltage
Capacitance Variations
Normalized Gate Threshold Voltage vs
Temperature
Normalized On Resistance vs Temperature
Source-Drain Diode Forward Characteristics
5/9
STP60NE06-16/FP
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
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STP60NE06-16/FP
TO-220 MECHANICAL DATA
mm
DIM.
MIN.
inch
TYP.
MAX.
MIN.
TYP.
MAX.
A
4.40
4.60
0.173
0.181
C
1.23
1.32
0.048
0.051
D
2.40
2.72
0.094
D1
0.107
1.27
0.050
E
0.49
0.70
0.019
0.027
F
0.61
0.88
0.024
0.034
F1
1.14
1.70
0.044
0.067
F2
1.14
1.70
0.044
0.067
G
4.95
5.15
0.194
0.203
G1
2.4
2.7
0.094
0.106
H2
10.0
10.40
0.393
0.409
14.0
0.511
0.551
L2
16.4
L4
0.645
13.0
2.65
2.95
0.104
0.116
L6
15.25
15.75
0.600
0.620
L7
6.2
6.6
0.244
0.260
L9
3.5
3.93
0.137
0.154
DIA.
3.75
3.85
0.147
0.151
D1
C
D
A
E
L5
H2
G
G1
F1
L2
F2
F
Dia.
L5
L9
L7
L6
L4
P011C
7/9
STP60NE06-16/FP
TO-220FP MECHANICAL DATA
mm
DIM.
MIN.
inch
TYP.
MAX.
MIN.
TYP.
MAX.
A
4.4
4.6
0.173
0.181
B
2.5
2.7
0.098
0.106
D
2.5
2.75
0.098
0.108
E
0.45
0.7
0.017
0.027
F
0.75
1
0.030
0.039
F1
1.15
1.7
0.045
0.067
F2
1.15
1.7
0.045
0.067
G
4.95
5.2
0.195
0.204
G1
2.4
2.7
0.094
0.106
H
10
10.4
0.393
0.409
L2
16
0.630
28.6
30.6
1.126
1.204
L4
9.8
10.6
0.385
0.417
L6
15.9
16.4
0.626
0.645
L7
9
9.3
0.354
0.366
Ø
3
3.2
0.118
0.126
B
D
A
E
L3
L3
L6
F
F1
L7
F2
H
G
G1
¯
1 2 3
L2
8/9
L4
STP60NE06-16/FP
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No
license is granted by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned
in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.
SGS-THOMSON Microelectronics products are not authorized for use as critical components in life support devices or systems without express
written approval of SGS-THOMSON Microelectonics.
 1997 SGS-THOMSON Microelectronics - Printed in Italy - All Rights Reserved
SGS-THOMSON Microelectronics GROUP OF COMPANIES
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