STMICROELECTRONICS STT1NF100

STT1NF100
N-CHANNEL 100V - 0.7Ω - 1A SOT23-6L
STripFET™ II POWER MOSFET
PRELIMINARY DATA
TYPE
VDSS
RDS(on)
ID
STT1NF100
100V
<0.8Ω
1A
■
■
■
TYPICAL RDS(on) = 0.7Ω
EXCEPTIONAL dv/dt CAPABILITY
VERY LOW Qg
SOT23-6L
DESCRIPTION
This Power MOSFET is the latest development of STMicroelectronics unique “Single Feature Size™” stripbased process. The resulting transistor shows extremely high packing density for low on-resistance,
rugged avalance characteristics and less critical alignment steps therefore a remarkable manufacturing reproducibility.
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ DC-DC & DC-AC CONVERTERS
■ DC MOTOR CONTROL (DISK DRIVES, etc.)
■ SYNCHRONOUS RECTIFICATION
MARKING
STQ0
■
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
Value
Unit
Drain-source Voltage (VGS = 0)
Parameter
100
V
Drain-gate Voltage (RGS = 20 kΩ)
100
V
Gate- source Voltage
± 20
V
ID
Drain Current (continuous) at TC = 25°C
1
A
ID
Drain Current (continuous) at TC = 100°C
0.6
A
4
A
1.6
W
0.013
W/°C
20
V/ns
– 55 to 150
°C
IDM ()
PTOT
Drain Current (pulsed)
Total Dissipation at TC = 25°C
Derating Factor
dv/dt(1)
Tstg
Tj
Peak Diode Recovery voltage slope
Storage Temperature
Max. Operating Junction Temperature
(● ) Pulse width limited by safe operating area
September 2002
(1) ISD ≤1A, di/dt ≤350A/µs, VDD ≤ V(BR)DSS, Tj ≤ TJMAX.
1/6
STT1NF100
THERMAL DATA
Rthj-amb(*)
Tl
Thermal Resistance Junction-ambient Max
78
°C/W
Maximum Lead Temperature For Soldering Purpose
260
°C
(*) When mounted on FR-4 board of 1inch² pad, 0.5oz Cu
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
V(BR)DSS
IDSS
IGSS
Parameter
Test Conditions
Min.
Typ.
Max.
100
Unit
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
V
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
1
µA
VDS = Max Rating, TC = 125 °C
10
µA
Gate-body Leakage
Current (VDS = 0)
VGS = ± 20V
±100
nA
Typ.
Max.
Unit
0.7
0.8
Ω
Typ.
Max.
Unit
ON (1)
Symbol
VGS(th)
RDS(on)
Parameter
Test Conditions
Gate Threshold Voltage
VDS = VGS, ID = 250µA
Static Drain-source On
Resistance
VGS = 10V, ID = 0.5 A
Min.
2
V
DYNAMIC
Symbol
gfs (1)
2/6
Parameter
Forward Transconductance
Test Conditions
VDS =15V , ID =1A
VDS = 25V, f = 1 MHz, VGS = 0
Min.
1
S
105
pF
Ciss
Input Capacitance
Coss
Output Capacitance
20
pF
Crss
Reverse Transfer
Capacitance
9
pF
STT1NF100
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol
td(on)
tr
Qg
Qgs
Qgd
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
4
ns
Rise Time
VDD = 50V, ID = 0.5A
RG = 4.7Ω VGS = 10V
(see test circuit, Figure 1)
5.5
ns
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
VDD = 50V, ID = 1A,
VGS = 10V
(see test circuit, Figure 2)
4
1
1.5
6
nC
nC
nC
Typ.
Max.
Unit
Turn-on Delay Time
SWITCHING OFF
Symbol
td(off)
tf
Parameter
Turn-off-Delay Time
Fall Time
Test Conditions
Min.
13
6.5
VDD = 50V, ID = 0.5A,
RG = 4.7Ω, VGS = 10V
(see test circuit, Figure 1)
ns
ns
SOURCE DRAIN DIODE
Symbol
ISD
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
Source-drain Current
1
A
ISDM (2)
Source-drain Current (pulsed)
4
A
VSD (1)
Forward On Voltage
ISD = 1A, VGS = 0
1.2
V
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 1A, di/dt = 100A/µs,
VDD = 20V, Tj = 150°C
(see test circuit, Figure 3)
trr
Qrr
IRRM
45
60
2.7
ns
nC
A
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
3/6
STT1NF100
Fig. 1: Switching Times Test Circuit For
Resistive Load
Fig. 3: Test Circuit For Diode Recovery Behaviour
4/6
Fig. 2: Gate Charge test Circuit
STT1NF100
TSOP-6 MECHANICAL DATA
mm
DIM.
MIN.
mils
TYP.
MAX.
MIN.
TYP.
MAX.
A
0.90
1.45
0.035
0.057
A1
0.00
0.15
0.000
0.006
A2
0.90
1.30
0.035
0.051
b
0.25
0.50
0.010
0.020
C
0.09
0.20
0.004
0.008
D
2.80
3.10
0.110
0.122
E
2.60
3.00
0.102
0.118
E1
1.50
1.75
0.059
0.069
L
0.35
0.55
0.014
0.022
e
0.95
0.037
e1
1.90
0.075
A A2
e
A1 b
L
c
E
e1
D
E1
5/6
STT1NF100
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or
systems without express written approval of STMicroelectronics.
© The ST logo is a registered trademark of STMicroelectronics
© 2002 STMicroelectronics - Printed in Italy - All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco
Singapore - Spain - Sweden - Switzerland - United Kingdom - United States.
© http://www.st.com
6/6