FAIRCHILD MURP810

MUR8100E, RURP8100
Data Sheet
December 2002
8A, 1000V Ultrafast Diodes
Features
The MUR8100E and RUR8100 are ultrafast diodes
(trr < 75ns) with soft recovery characteristics. They have a
low forward voltage drop and are of planar, silicon nitride
passivated, ion-implanted, epitaxial construction.
• Ultrafast with Soft Recovery . . . . . . . . . . . . . . . . . . <75ns
These devices are intended for use as energy steering/
clamping diodes and rectifiers in a variety of switching power
supplies and other power switching applications. Their low
stored charge and ultrafast recovery with soft recovery
characteristics minimize ringing and electrical noise in many
power switching circuits, thus reducing power loss in the
switching transistor.
• Avalanche Energy Rated
Applications
Formerly developmental type TA09617.
• General Purpose
Ordering Information
Packaging
PART NUMBER
PACKAGE
• Operating Temperature . . . . . . . . . . . . . . . . . . . . . .175oC
• Reverse Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . .1000V
• Planar Construction
• Switching Power Supply
• Power Switching Circuits
JEDEC TO-220AC
BRAND
MUR8100E
TO-220AC
MU8100
RURP8100
TO-220AC
RURP8100
NOTE: When ordering, use entire part number.
ANODE
CATHODE
CATHODE
(FLANGE)
Symbol
K
A
Absolute Maximum Ratings
TC = 25oC, Unless Otherwise Specified
MUR8100E
RURP8100
UNITS
Peak Repetitive Reverse Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VRRM
1000
V
Working Peak Reverse Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VRWM
1000
V
DC Blocking Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .VR
1000
V
Average Rectified Forward Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IF(AV)
(TC = 155oC)
8
A
Repetitive Peak Surge Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IFRM
(Square Wave 20kHz)
16
A
Nonrepetitive Peak Surge Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IFSM
(Halfwave 1 Phase 60Hz)
100
A
Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .PD
75
W
Avalanche Energy (See Figures 10 and 11) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . EAVL
20
mJ
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .TSTG, TJ
-55 to 175
oC
©2002 Fairchild Semiconductor Corporation
MUR8100E, RURP8100 Rev. B1
MUR8100E, RURP8100
Electrical Specifications
TC = 25oC, Unless Otherwise Specified.
SYMBOL
TEST CONDITION
MIN
TYP
MAX
UNITS
IF = 8A
-
-
1.8
V
IF = 8A, TC = 150oC
-
-
1.5
V
VR = 1000V
-
-
100
µA
VR = 1000V, TC = 150oC
-
-
500
µA
IF = 1A
-
-
85
ns
IF = 8A, dIF/dt = 200A/µs
-
-
100
ns
ta
IF = 8A, dIF/dt = 200A/µs
-
50
-
ns
tb
IF = 8A, dIF/dt = 200A/µs
-
30
-
ns
QRR
IF = 8A, dIF/dt = 200A/µs
-
500
-
nC
VR = 10V, IF = 0A
-
30
-
pF
-
-
2.0
oC/W
VF
IR
trr
CJ
RθJC
DEFINITIONS
VF = Instantaneous forward voltage (pw = 300µs, D = 2%).
IR = Instantaneous reverse current.
trr = Reverse recovery time at dIF/dt = 100A/µs (See Figure 9), summation of ta + tb .
ta = Time to reach peak reverse current at dIF/dt = 100A/µs (See Figure 9).
tb = Time from peak IRM to projected zero crossing of IRM based on a straight line from peak IRM through 25% of IRM (See Figure 9).
QRR = Reverse recovery charge.
CJ = Junction Capacitance.
RθJC = Thermal resistance junction to case.
pw = Pulse width.
D = Duty cycle.
Typical Performance Curves
200
IR , REVERSE CURRENT (µA)
IF, FORWARD CURRENT (A)
40
175oC
10
100oC
25oC
1
0.5
175oC
10
100oC
1
0.1
25oC
0.01
0.001
0
0.5
1
1.5
2
2.5
VF, FORWARD VOLTAGE (V)
FIGURE 1. FORWARD CURRENT vs FORWARD VOLTAGE
©2002 Fairchild Semiconductor Corporation
3
0
200
400
600
800
1000
VR , REVERSE VOLTAGE (V)
FIGURE 2. REVERSE CURRENT vs REVERSE VOLTAGE
MUR8100E, RURP8100 Rev. B1
MUR8100E, RURP8100
Typical Performance Curves
(Continued)
100
125
TC = 100oC, dIF/dt = 200A/µs
t, RECOVERY TIMES (ns)
t, RECOVERY TIMES (ns)
TC = 25oC, dIF/dt = 200A/µs
80
60
trr
40
ta
20
100
75
trr
50
ta
25
tb
tb
0
0.5
4
1
0
0.5
8
IF(AV) , AVERAGE FORWARD CURRENT (A)
FIGURE 4. trr, ta AND tb CURVES vs FORWARD CURRENT
150
t, RECOVERY TIMES (ns)
TC = 175oC, dIF/dt = 200A/µs
125
trr
75
ta
50
tb
25
0
0.5
1
8
IF, FORWARD CURRENT (A)
FIGURE 3. trr, ta AND tb CURVES vs FORWARD CURRENT
100
4
1
IF, FORWARD CURRENT (A)
4
8
8
DC
6
SQ. WAVE
4
2
0
140
145
150
155
160
165
170
175
TC , CASE TEMPERATURE (oC)
IF, FORWARD CURRENT (A)
FIGURE 5. trr, ta AND tb CURVES vs FORWARD CURRENT
FIGURE 6. CURRENT DERATING CURVE
CJ , JUNCTION CAPACITANCE (pF)
100
80
60
40
20
0
0
50
100
150
200
VR , REVERSE VOLTAGE (V)
FIGURE 7. JUNCTION CAPACITANCE vs REVERSE VOLTAGE
©2002 Fairchild Semiconductor Corporation
MUR8100E, RURP8100 Rev. B1
MUR8100E, RURP8100
Test Circuits and Waveforms
VGE AMPLITUDE AND
RG CONTROL dIF/dt
t1 AND t2 CONTROL IF
L
DUT
CURRENT
SENSE
RG
IF
+
VGE
-
IGBT
t1
VDD
dIF
trr
dt
ta
tb
0
0.25 IRM
t2
IRM
FIGURE 8. trr TEST CIRCUIT
FIGURE 9. trr WAVEFORMS AND DEFINITIONS
I = 1A
L = 40mH
R < 0.1Ω
EAVL = 1/2LI2 [VR(AVL) /(VR(AVL) - VDD)]
Q1 = IGBT (BVCES > DUT VR(AVL))
VAVL
L
CURRENT
SENSE
R
+
VDD
IL
IL
I V
Q1
VDD
DUT
t0
FIGURE 10. AVALANCHE ENERGY TEST CIRCUIT
©2002 Fairchild Semiconductor Corporation
t1
t2
t
FIGURE 11. AVALANCHE CURRENT AND VOLTAGE
WAVEFORMS
MUR8100E, RURP8100 Rev. B1
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NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
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RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
2. A critical component is any component of a life
1. Life support devices or systems are devices or
support device or system whose failure to perform can
systems which, (a) are intended for surgical implant into
be reasonably expected to cause the failure of the life
the body, or (b) support or sustain life, or (c) whose
support device or system, or to affect its safety or
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I1