PROCESS CP309 Power Transistor NPN - Low Saturation Transistor Chip PROCESS DETAILS Process EPITAXIAL PLANAR Die Size 41.3 x 41.3 MILS Die Thickness 9.0 MILS Base Bonding Pad Area 9.4 x 9.2 MILS Emitter Bonding Pad Area 12.8 x 10.2 MILS Top Side Metalization Al - 30,000Å Back Side Metalization Ag - 12,000Å GEOMETRY GROSS DIE PER 4 INCH WAFER 6,285 E PRINCIPAL DEVICE TYPES CMPT3090L CXT3090L CZT3090L CMXT3090L B BACKSIDE COLLECTOR R1 R4 (22-March 2010) w w w. c e n t r a l s e m i . c o m PROCESS CP309 Typical Electrical Characteristics R4 (22-March 2010) w w w. c e n t r a l s e m i . c o m