FREESCALE MCZ33290EF/R2

Freescale Semiconductor
Technical Data
Document Number: MC33290
Rev 8.0, 8/2008
ISO K Line Serial Link Interface
33290
The 33290 is a serial link bus interface device designed to provide
bi-directional half-duplex communication interfacing in automotive
diagnostic applications. It is designed to interface between the
vehicle’s on-board microcontroller and systems off-board the vehicle
via the special ISO K line. The 33290 is designed to meet the
Diagnostic Systems ISO9141 specification. The device’s K line bus
driver’s output is fully protected against bus shorts and
overtemperature conditions.
The 33290 derives its robustness to temperature and voltage
extremes by being built on a SMARTMOS process, incorporating
CMOS logic, bipolar/MOS analog circuitry, and DMOS power FETs.
Although the 33290 was principally designed for automotive
applications, it is suited for other serial communication applications.
It is parametrically specified over an ambient temperature range of
-40ºC ≤ TA ≤ 125ºC and 8.0 V ≤ VBB ≤ 18 V supply. The economical
SO-8 surface-mount plastic package makes the 33290 very cost
effective.
ISO9141 PHYSICAL INTERFACE
D SUFFIX
EF SUFFIX (PB-FREE)
98ASB42564B
8-PIN SOICN
ORDERING INFORMATION
Features
•
•
•
•
•
•
•
•
•
•
•
Device
Operates Over Wide Supply Voltage of 8.0 to 18V
Operating Temperature of -40 to 125°C
MC33290D/R2
Interfaces Directly to Standard CMOS Microprocessors
MCZ33290EF/R2
ISO K Line Pin Protected Against Shorts to Ground
Thermal Shutdown with Hysteresis
ISO K Line Pin Capable of High Currents
ISO K Line Can Be Driven with up to 10 nF of Parasitic
Capacitance
8.0 kV ESD Protection Attainable with Few Additional Components
Standby Mode: No VBat Current Drain with VDD at 5.0 V
Low Current Drain During Operation with VDD at 5.0 V
Pb-Free Packaging Designated by Suffix Code EF
Temperature
Range (TA)
Package
-40 to 125°C
8-SOICN
+VBAT
VDD
33290
VDD
VDD
VBB
CEN
RX
TX
ISO
MCU
Dx
SCIRx D
SCITx D
ISO K-Line
GND
Figure 1. 33290 Simplified Application Diagram
Freescale Semiconductor, Inc. reserves the right to change the detail specifications, as
may be required, to permit improvements in the design of its products.
© Freescale Semiconductor, Inc., 2006-2008. All rights reserved.
T xD
R xD
INTERNAL BLOCK DIAGRAM
INTERNAL BLOCK DIAGRAM
VBB
1
3.0 kΩ
50 V
20 V
200 Ω
10 V
10 V
RX
6
ISO
4
RHys
Master
Bias
CEN
8
VDD
7
TX
5
40 V
125 kΩ
Thermal
Shutdown
125 kΩ
GND
2.0 kΩ
10 V
3
10 V
Figure 2. 33290 Simplified Block Diagram
33290
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Analog Integrated Circuit Device Data
Freescale Semiconductor
PIN CONNECTIONS
PIN CONNECTIONS
VBB
11
88
NC
22
77
CEN
VDD
GND
33
66
RX
ISO
44
55
TX
Figure 3. 33290 Pin Connections
Table 1. 33290 Pin Definitions
Pin Number
Pin Name
1
VBB
Battery power through external resistor and diode.
Definition
2
NC
Not to be connected. (1)
3
GND
Common signal and power return.
4
ISO
Bus connection.
5
TX
Logic level input for data to be transmitted on the bus.
6
RX
Logic output of data received on the bus.
7
VDD
Logic power source input.
8
CEN
Chip enable. Logic “1” for active state. Logic “0” for sleep state.
Notes
1. NC pins should not have any connections made to them. NC pins are not guaranteed to be open circuits.
33290
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3
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 2. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Rating
Symbol
Value
Unit
VDD
-0.3 to 7.0
V
VBB(LD)
45
V
VISO
40
V
IISO(LIM)
1.0
A
Human Body Model (4)
VESD1
±2000
Machine Model (4)
VESD2
±200
ISO Clamp Energy (5)
Eclamp
10
mJ
Storage Temperature
Tstg
-55 to +150
°C
Operating Case Temperature
TC
-40 to +125
°C
Operating Junction Temperature
TJ
-40 to +150
°C
Power Dissipation
PD
VDD DC Supply Voltage
VBB Load Dump Peak Voltage
ISO Pin Load Dump Peak Voltage
(2)
ISO Short Circuit Current Limit
ESD Voltage
(3)
V
TA = 25°C
Peak Package Reflow Temperature During Reflow
Thermal Resistance
Junction-to-Ambient
W
0.8
(6) (7)
,
TPPRT
Note 7.
°C
°C/W
RθJA
150
Notes
2. Device will survive double battery jump start conditions in typical applications for 10 minutes duration, but is not guaranteed to remain
within specified parametric limits during this duration.
3. ESD data available upon request.
4. ESD1 testing is performed in accordance with the Human Body Model (CZAP = 100 pF, RZAP = 1500 Ω), ESD2 testing is performed in
accordance with the Machine Model (CZAP = 200 pF, RZAP = 0 Ω).
5.
6.
7.
Nonrepetitive clamping capability at 25°C.
Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may
cause malfunction or permanent damage to the device.
Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow
Temperature and Moisture Sensitivity Levels (MSL),
Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all orderable parts. (i.e.
MC33xxxD enter 33xxx), and review parametrics.
33290
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ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 3. Static Electrical Characteristics
Characteristics noted under conditions of 4.75 V ≤ VDD ≤ 5.25 V, 8.0 V ≤ VBB ≤ 18 V, -40°C ≤ TC ≤ 125°C, unless otherwise
noted.
Characteristic
Symbol
Min
Typ
Max
Unit
POWER AND CONTROL
VDD Sleep State Current
IDD(SS)
mA
–
Tx = 0.8 VDD, CEN = 0.3 VDD
VDD Quiescent Operating Current
0.1
IDD(Q)
mA
–
Tx = 0.2 VDD, CEN = 0.7 VDD
VBB Sleep State Current
–
–
1.0
IBB(SS)
µA
–
VBB = 16 V, Tx = 0.8 VDD, CEN = 0.3 VDD
VBB Quiescent Operating Current
–
50
IBB(Q)
mA
–
TX = 0.2 VDD, CEN = 0.7 VDD
–
1.0
Chip Enable
V
Input High-Voltage Threshold
(8)
VIH(CEN)
0.7 VDD
–
–
Input Low-Voltage Threshold
(9)
VIL(CEN)
–
–
0.3 VDD
Chip Enable Pull-Down Current (10)
IPD(CEN)
2.0
–
40
–
–
0.3 x VDD
0.7 x VDD
–
–
-40
–
-2.0
–
–
0.2 VDD
0.8 VDD
–
–
150
170
–
TX Input Low-Voltage Threshold
VIL(Tx)
V
RISO = 510 Ω (11)
TX Input High-Voltage Threshold
RISO = 510 Ω
VIH(Tx)
(12)
TX Pull-Up Current (13)
IPU(Tx)
RX Output Low-Voltage Threshold
VOL(Rx)
V
VOH(Rx)
RISO = 510 Ω, TX = 0.8 VDD, RX Sourcing 250 µA
Thermal Shutdown (14)
µA
V
RISO = 510 Ω, TX = 0.2 VDD, Rx Sinking 1.0 mA
RX Output High-Voltage Threshold
µA
V
TLIM
°C
Notes
8. When IBB transitions to >100 µA.
9. When IBB transitions to <100 µA.
10. Enable pin has an internal current pull-down. Pull-down current is measured with CEN pin at 0.3 VDD.
11.
Measured by ramping TX down from 0.7 VDD and noting TX value at which ISO falls below 0.2 VBB.
12.
Measured by ramping TX up from 0.3 VDD and noting the value at which ISO rises above 0.9 VBB.
13.
Tx pin has internal current pull-up. Pull-up current is measured with TX pin at 0.7 VDD.
14.
Thermal Shutdown performance (TLIM) is guaranteed by design but not production tested.
33290
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5
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 3. Static Electrical Characteristics (Continued)
Characteristics noted under conditions of 4.75 V ≤ VDD ≤ 5.25 V, 8.0 V ≤ VBB ≤ 18 V, -40°C ≤ TC ≤ 125°C, unless otherwise
noted.
Characteristic
Symbol
Min
Typ
Max
Unit
ISO I/O
Input Low Voltage Threshold
RISO = 0 Ω, TX = 0.8 VDD
VIL(ISO)
(15)
Input High Voltage Threshold
Internal Pull-Up Current
VHys(ISO)
RISO = ∞ Ω, TX = 0.8 VDD
0.7 x VBB
–
–
0.05 x VBB
–
0.1 x VBB
-5.0
–
-140
50
–
1000
–
–
0.1 x VBB
0.95 x VBB
–
–
V
V
µA
mA
VOL(ISO)
RISO = 510 Ω, TX = 0.2 VDD
Output High Voltage
0.4 x VBB
ISC(ISO)
RISO = 0 Ω, TX = 0.4 VDD, VISO = VBB
Output Low Voltage
–
IPU(ISO)
RISO = ∞ Ω, TX = 0.8 VDD, VISO = 9.0 V, VBB = 18 V
Short Circuit Current Limit (18)
–
VIH(ISO)
RISO = 0 Ω, TX = 0.8 VDD (16)
Input Hysteresis (17)
V
V
VOH(ISO)
V
Notes
15. ISO ramped from 0.8 VBB to 0.4 VBB, Monitor RX, Value of ISO voltage at which RX transitions to 0.3 VDD.
16.
ISO ramped from 0.4 VBB to 0.8 VBB, Monitor RX, Value of ISO voltage at which RX transitions to 0.7 VDD.
17.
Input Hysteresis, VHys(ISO) = VIH(ISO) - VIL(ISO).
18.
ISO has internal current limiting.
33290
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ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 4. Dynamic Electrical Characteristics
Characteristics noted under conditions of 4.75 V ≤ VDD ≤ 5.25 V, 8.0 V ≤ VBB ≤ 18 V, -40°C ≤ TC ≤ 125°C, unless otherwise
noted.
Characteristic
Fall Time (19)
Symbol
High to Low: RISO = 510 Ω, CISO = 500 pF (21)
Low to High: RISO = 510 Ω, CISO = 500 pF (22)
Typ
Max
–
–
2.0
tfall(ISO)
RISO = 510 Ω to VBB, CISO = 10 nF to Ground
ISO Propagation Delay (20)
Min
Unit
µs
tPD(ISO)
µs
–
–
2.0
–
–
2.0
Notes
19. Time required ISO voltage to transition from 0.8 VBB to 0.2 VBB.
20.
Changes in the value of CISO affect the rise and fall time but have minimal effect on Propagation Delay.
21.
Step TX voltage from 0.2 VDD to 0.8 VDD. Time measured from VIH(ISO) until VISO reaches 0.3 VBB.
22.
Step TX voltage from 0.8 VDD to 0.2 VDD. Time measured from VIL(ISO) until VISO reaches 0.7 VBB.
33290
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ELECTRICAL CHARACTERISTICS
ELECTRICAL PERFORMANCE CURVES
0.6
VIH; VDD = 5.25 V, VBB =
18 V
VIH; VDD = 4.75 V, VBB =
8.0 V
0.575
0.55
0.525
0.5
0.475
-50
VIL; VDD = 5.25 V, VBB =
18 V
VIL; VDD = 4.75 V, VBB =
8.0 V
0
50
100
150
TA, AMBIENT TEMPERATURE (°C)
VOL and VOH, ISO OUTPUT (RATIO)
VIL and VIH, INPUT THRESHOLD (RA-
ELECTRICAL PERFORMANCE CURVES
1.2
0.8
0.4
0.2
VOL
0
-50
VDD = 5.25 V, VBB = 18 V
0.85
0.8
0.75
VDD = 4.75 V, VBB = 8.0 V
0.7
0.65
-50
0
50
100
TA, AMBIENT TEMPERATURE (°C)
Figure 5. ISO Output/VBB vs. Temperature
150
0
50
100
150
TA, AMBIENT TEMPERATURE (°C)
Figure 6. ISO Fall Time vs. Temperature
tPD(ISO), PROPAGATION DELAY (µs)
tfall(ISO), ISO FALL TIME (µs)
0.9
VDD = 4.75 V, VBB = 8.0 V
and
VDD = 5.25 V, VBB = 18 V
0.6
Figure 4. ISO Input Threshold/VBB vs. Temperature
0.95
VOH
1.0
0.7
VDD = 5.25 V, VBB = 18 V
PdH-L
0.6
VDD = 4.75 V, VBB = 8.0 V
0.5
0.4
0.3
0.2
-50
VDD = 5.25 V, VBB = 18 V
PdL-H
VDD = 4.75 V, VBB = 8.0 V
0
50
100
150
TA, AMBIENT TEMPERATURE (°C)
Figure 7. ISO Propagation Delay vs. Temperature
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Freescale Semiconductor
TYPICAL APPLICATIONS
INTRODUCTION
TYPICAL APPLICATIONS
INTRODUCTION
The 33290 is a serial link bus interface device conforming
to the ISO 9141 physical bus specification. The device was
designed for automotive environment usage compliant with
On-Board Diagnostic (OBD) requirements set forth by the
California Air Resources Board (CARB) using the ISO K line.
The device does not incorporate an ISO L line. It provides bidirectional half-duplex communications interfacing from a
microcontroller to the communication bus. The 33290
incorporates circuitry to interface the digital translations from
5.0 V microcontroller logic levels to battery level logic and
from battery level logic to 5.0 V logic levels. The 33290 is built
using Freescale Semiconductor’s SMARTMOS process and
is packaged in an 8-pin plastic SOIC.
FUNCTIONAL DESCRIPTION
The 33290 transforms 5.0 V microcontroller logic signals
to battery level logic signals and visa versa. The maximum
data rate is set by the fall time and the rise time. The fall time
is set by the output driver. The rise time is set by the bus
capacitance and the pull-up resistors on the bus. The fall time
of the 33290 allows data rates up to 150 kbps using a 30
percent maximum bit time transition value. The serial link
interface will remain fully functional over a battery voltage
range of 6.0 to 18 V. The device is parametrically specified
over a dynamic VBB voltage range of 8.0 to 18 V.
Required input levels from the microcontroller are ratiometric with the VDD voltage normally used to power the
microcontroller. This enhances the 33290’s ability to remain
in harmony with the RX and TX control input signals of the
microcontroller. The RX and TX control inputs are compatible
with standard 5.0 V CMOS circuitry. For fault-tolerant
purposes the TX input from the microcontroller has an internal
passive pull-up to VDD, while the CEN input has an internal
passive pull-down to ground.
A pull-up to battery is internally provided as well as an
active data pull-down. The internal active pull-down is
current-limit-protected against shorts to battery and further
protected by thermal shutdown. Typical applications have
reverse battery protection by the incorporation of an external
510 Ω pull-up resistor and diode to battery.
Reverse battery protection of the device is provided by
using a reverse battery blocking diode (“D” in the Simplified
Application Diagram on page 1). Battery line transient
protection of the device is provided for by using a 45 V zener
and a 500 Ω resistor connected to the VBB source as shown
in the same diagram. Device ESD protection from the
communication lines exiting the module is through the use of
the capacitor connected to the VBB device pin and the
capacitor used in conjunction with the 27 V zener connected
to the ISO pin.
33290
Analog Integrated Circuit Device Data
Freescale Semiconductor
9
PACKAGING
PACKAGE DIMENSIONS
PACKAGING
PACKAGE DIMENSIONS
For the most current package revision, visit www.freescale.com and perform a keyword search using the “98A” listed below.
D SUFFIX
EF SUFFIX (PB-FREE)
8-PIN
PLASTIC PACKAGE
98ASB42564B
REV. U
33290
10
Analog Integrated Circuit Device Data
Freescale Semiconductor
REVISION HISTORY
REVISION HISTORY
REVISION
DATE
6.0
7/2006
7.0
10/2006
8.0
8/2008
DESCRIPTION OF CHANGES
•
•
•
•
Implemented Revision History page
Converted to Freescale format and updated to the prevailing for and style
Added Pb-free suffix EF
Removed MC33290EG/R2 and replaced with MCZ33290EG/R2 in the Ordering
Information block
• Removed Peak Package Reflow Temperature During Reflow (solder reflow) parameter
from Maximum Ratings on page 4. Added note with instructions to obtain this information
from www.freescale.com.
• Corrected the Document header information.
• Updated to the current Freescale form and style.
33290
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11
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MC33290
Rev 8.0
8/2008
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