LATTICE POWR6AT6

®
ispPAC-POWR6AT6
In-System Programmable Power Supply
Monitoring and Margining Controller
April 2006
Preliminary Data Sheet
Features
Application Block Diagram
■ Power Supply Margin and Trim Functions
Vout
3.3V
Trim and margin up to six power supplies
Dynamic voltage control through I2C
Four hardware selectable voltage profiles
Independent Digital Closed-Loop Trim function
for each output
Trim
Vout
2.5V
Other Board Circuitry
•
•
•
•
Trim
Vout
1.8V
■ Analog Input Monitoring
Trim
• Six analog monitor inputs
• Differential input architecture for accurate
remote ground sensing
• 10-bit ADC for direct voltage measurements
Vout
POL#1
Trim
Vout
POL#2
Trim
■ 2-Wire (I2C/SMBus™ Compatible) Interface
Vout
• Readout of the ADC
• Dynamic trimming/margining control
POL#3
Trim
■ Other Features
•
•
•
•
•
Programmable analog circuitry
Wide supply range, 2.8V to 3.96V
In-system programmable through JTAG
Industrial temperature range: -40°C to +85°C
32-pin QFN package, only 5mm x 5mm, leadfree option
6 Analog
Trim Outputs
6 Analog
Monitor Inputs
ADC
Power Supply
Margin/Trim
Control
Description
Lattice’s Power Manager II ispPAC-POWR6AT6 is a
general-purpose power-supply monitoring and margining controller, incorporating in-system programmable
analog functions implemented in non-volatile E2CMOS®
technology. The ispPAC-POWR6AT6 device provides
six independent analog input channels to monitor up to
six power supply test points. Each of these input channels offers a differential input to support remote ground
sensing.
I2 C
Interface
CPU
I 2C
Bus
ispPAC-POWR6AT6
The on-chip 10-bit A/D converter can both be used to
monitor the VMON voltage through the I2C bus as well as
for implementing digital closed loop mode for maintaining the output voltage of all power supplies controlled by
the monitoring and trimming section of the ispPACPOWR6AT6 device.
The ispPAC-POWR6AT6 incorporates six DACs for generating a trimming voltage to control the output voltage
of a power supply. The trimming voltage can be set to
four hardware selectable preset values (voltage profiles)
or can be dynamically loaded in to the DAC through the
I2C bus. Additionally, each power supply output voltage
can be maintained typically within 0.5% tolerance
across various load conditions using the Digital Closed
Loop Control mode. The operating voltage profile can
be selected using external hardware pins.
The I2C bus/SMBus interface allows an external microcontroller to measure the voltages connected to the
VMON analog monitor inputs and load the DACs for the
generation of the trimming voltages of the external DCDC converters.
© 2006 Lattice Semiconductor Corp. All Lattice trademarks, registered trademarks, patents, and disclaimers are as listed at www.latticesemi.com/legal. All other
brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without
notice.
www.latticesemi.com
1
6at6_01.0
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
VCCA
VCCD
VPS1
VPS0
CLTLOCK/SMBA
CLTENb
Figure 1. ispPAC-POWR6AT6 Block Diagram
VMON1
Decoder
TrimCell 1
DAC
TRIM1
TrimCell 2
DAC
TRIM2
TrimCell 3
DAC
TRIM3
TrimCell 4
DAC
TRIM4
TrimCell 5
DAC
TRIM5
TrimCell 6
DAC
TRIM6
VMON1GS
VMON2
Set Point
Registers
VMON2GS
VMON3
VMON3GS
ADC
Control Logic
VMON4
VMON4GS
OSC
VMON5
VMON5GS
VMON6
VMON6GS
SCL
I 2C Interface
JTAG Interface
SDA
ispPAC-POWR6AT6
TMS
TCK
TDI
TDO
VCCJ
GND
2
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Pin Descriptions
Number
7
8
6
Name
Pin Type
Voltage Range
Description
VPS0
Digital Input
VCCD
VPS1
Digital Input
VCCD
Trim Select Input 1
VCCD
Enables closed loop trim process (asserted
low)
Signals that all TrimCells selected for closedloop trim have reached a trim locked condition. Can be configured to be compliant with
SMBus Alert protocol.2
CLTENb
Digital Input
Trim Select Input 0
9
CLTLOCK/
SMBA
Open Drain Output
0V to 5.5V
15
VMON1
Analog Input
-0.3V to 5.75V
1
3
Voltage Monitor 1 Input
Voltage Monitor 1 Ground Sense
14
VMON1GS
Analog Input
-0.3V to 0.3V
17
VMON2
Analog Input
-0.3V to 5.75V
Voltage Monitor 2 Input
16
VMON2GS
Analog Input
-0.3V to 0.3V3
Voltage Monitor 2 Ground Sense
19
VMON3
Analog Input
-0.3V to 5.75V
Voltage Monitor 3 Input
18
VMON3GS
Analog Input
-0.3V to 0.3V3
Voltage Monitor 3 Ground Sense
21
VMON4
Analog Input
-0.3V to 5.75V
Voltage Monitor 4 Input
20
VMON4GS
Analog Input
-0.3V to 0.3V3
Voltage Monitor 4 Ground Sense
23
VMON5
Analog Input
-0.3V to 5.75V
Voltage Monitor 5 Input
22
VMON5GS
Analog Input
-0.3V to 0.3V3
Voltage Monitor 5 Ground Sense
25
VMON6
Analog Input
-0.3V to 5.75V
Voltage Monitor 6 Input
24
VMON6GS
Analog Input
-0.3V to 0.3V3
Voltage Monitor 6 Ground Sense
32
GND
Ground
Ground
Ground
12
VCCD4
Power
2.8V to 3.96V
Core VCC, Main Power Supply
13
VCCA4
Power
2.8V to 3.96V
Analog Power Supply
2
VCCJ
Power
2.25V to 3.6V
VCC for JTAG Logic Interface Pins
31
TRIM1
Analog Output
-320mV to +320mV
from Programmable
DAC Offset
Trim DAC Output 1
30
TRIM2
Analog Output
-320mV to +320mV
from Programmable
DAC Offset
Trim DAC Output 2
29
TRIM3
Analog Output
-320mV to +320mV
from Programmable
DAC Offset
Trim DAC Output 3
28
TRIM4
Analog Output
-320mV to +320mV
from Programmable
DAC Offset
Trim DAC Output 4
27
TRIM5
Analog Output
-320mV to +320mV
from Programmable
DAC Offset
Trim DAC Output 5
26
TRIM6
Analog Output
-320mV to +320mV
from Programmable
DAC Offset
Trim DAC Output 6
3
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Pin Descriptions (Cont.)
Number
Name
Pin Type
Voltage Range
Description
1
TDO
Digital Output
JTAG Test Data Out
3
TCK
Digital Input
JTAG Test Clock Input
5
TMS
Digital Input
JTAG Test Mode Select; Internal Pullup
4
TDI
Digital Input
JTAG Test Data In; Internal Pullup
10
SCL
Digital Input
I2C Serial Clock Input
11
SDA
Digital I/O
I2C Serial Data, Bi-directional Pin
1. Open-drain outputs require an external pull-up resistor to a supply.
2. Normally asserted low, but can be programmed to assert high (open) if desired.
3. The VMONxGS inputs are the ground sense line for each given VMON pin. The VMON input pins along with the VMONxGS ground sense
pins implement a differential pair for each voltage monitor to allow remote sense at the load. VMONxGS lines must be connected and are
not to exceed -0.3V to +0.3V in reference to the GND pin.
4. VCCA and VCCD pins must be connected together on the circuit board.
4
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Absolute Maximum Ratings
Absolute maximum ratings are shown in the table below. Stresses beyond those listed may cause permanent damage to the device. Functional operation of the device at these or any other conditions beyond those indicated in the
recommended operating conditions of this specification is not implied.
Symbol
Min.
Max.
Units
Core supply
-0.5
4.5
V
VCCA
Analog supply
-0.5
4.5
V
VCCJ
JTAG logic supply
-0.5
6
V
VIN
Digital input voltage (all digital I/O pins)
-0.5
6
V
VMON+
VMON input voltage
-0.5
6
V
VMONGS
VMON input voltage ground sense
-0.5
6
VCCD
Parameter
Conditions
V
TS
Storage temperature
-65
150
o
TA
Ambient temperature
-65
125
o
C
C
Recommended Operating Conditions
Symbol
Min.
Max.
Units
Core supply voltage at pin
2.8
3.96
V
VCCJ
JTAG logic supply voltage at pin
2.25
3.6
V
VIN
Input voltage at digital input pins
-0.3
5.5
V
VMON
Input voltage at VMON pins
-0.3
5.9
V
VMONGS
Input voltage at VMONGS pins
-0.3
0.3
V
-0.3
5.5
-40
85
o
-40
85
o
Typ.
Max.
VCCD, VCCA
Parameter
Conditions
VOUT
Open-drain output voltage
TAPROG
Ambient temperature during programming
TA
CLTLOCK/SMBA
Ambient temperature
Power applied
V
C
C
Analog Specifications
Symbol
Parameter
Conditions
Min.
Units
1
Supply current
10
mA
ICCJ
Supply current
1
mA
ICC
1. Includes currents on VCCD and VCCA supplies.
Analog Voltage Monitor Inputs (VMON)
Symbol
Parameter
RIN
Input resistance
CIN
Input capacitance
Conditions
Input mode = Attenuated1
Input mode = Unattenuated
Min.
Typ.
Max.
Units
50
65
80
kΩ
10
MΩ
12
pF
1. True for Vmon input voltage from 600mV to 2.048V. Values less than 600mV will see higher input impedance values.
5
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Margin/Trim DAC Output Characteristics
Symbol
Parameter
Conditions
Min
Resolution
FSR
Full scale range
LSB
LSB step size
IOUT
Output source/sink current
VBPZ
C_LOAD
TUPDATEM
TOSE
Max
Units
bits
+/-320
mV
2.5
mV
-125
Bipolar zero output voltage
(code=80h)
TrimCell output voltage settling
time1
TS
Typ
8(7+sign)
125
Offset 1
0.6
Offset 2
0.8
Offset 3
1.0
Offset 4
1.25
V
DAC code changed
from 80H to FFH or
80H to 00H
2.5
Single DAC code
change
ms
256
µs
Maximum load capacitance
2
µA
50
2
Update time through I C port
Total open loop supply voltage
error3
pF
260
Full scale DAC corresponds to ±5% supply
voltage variation
µs
-0.75
+0.75
%
1. To 1% of set value with 50pf load connected to trim pins.
2. Total time required to update a single TRIMx output value by setting the associated DAC through the I 2C port.
3. This is the total resultant error in the trimmed power supply output voltage referred to any DAC code due to the DAC’s INL, DNL, gain, output impedance, offset error and bipolar offset error across the industrial temperature range and the ispPAC-POWR6AT6 operating V CCA
and VCCD ranges.
ADC Characteristics
Symbol
Parameter
Conditions
Min.
ADC resolution
VIN
Input range full scale
TCONVERT
Conversion complete time
ADC Step Size LSB
Eattenuator
Error due to attenuator
Typ.
Max.
10
Units
Bits
Programmable attenuator = 1
0
2.048
V
Programmable attenuator = 3
0
5.751
V
2002
µs
Time from I2C request to complete one
conversion cycle
Programmable attenuator = 1
2
mV
Programmable attenuator = 3
6
mV
Programmable attenuator = 3
+/- 0.1
%
1. Maximum voltage is limited by VMONX pin (theoretical maximum is 6.144V).
2. Minimum time to wait for valid ADC result. Applies when not reading the DONE status bit (via I2C) to determine ADC.
ADC Error Budget Across Entire Operating Temperature Range
Symbol
TADC Error
Parameter
Total Measurement Error at
Any Voltage1
Conditions
Min.
Typ.
Max.
Units
Measurement Range 600 mV to 2.048V,
VMONxGS > -100mV, Attenuator =1
-8
+/-4
8
mV
Measurement Range 600 mV to 2.048V,
VMONxGS > -200mV, Attenuator =1
+/-6
mV
Measurement Range 0 to 2.048V,
VMONxGS > -200mV, Attenuator =1
+/-10
mV
1. Total error, guaranteed by characterization, includes INL, DNL, Gain, Offset, and PSR specs of the ADC.
6
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Digital Specifications
Over Recommended Operating Conditions
Symbol
Parameter
Conditions
IIL,IIH
Input leakage, no pull-up/pull-down
IPU
Input pull-up current (TMS, TDI)
Voltage input, logic low1
VIL
1
VIH
Voltage input, logic high
VOL
CLTLOCK/SMBA
Min.
Typ.
Max.
Units
+/-10
µA
70
µA
VPS[0:1], TDI, TMS,
CLTENb, 3.3V supply
0.8
VPS[0:1], TDI, TMS,
CLTENb, 2.5V supply
0.7
V
VPS[0:1], TDI, TMS,
CLTENb, 3.3V supply
2.0
VPS[0:1], TDI, TMS,
CLTENb, 2.5V supply
1.7
V
ISINK = 20mA
0.8
V
1. CLTENb, VPS[0:1] referenced to VCCD; TDO, TDI, TMS referenced to VCCJ.
I2C Port Characteristics
100KHz
Symbol
Definition
Min.
2
400KHz
Max.
Min.
1
Max.
1
100
FI2C
I C clock/data rate
TSU;STA
After start
THD;STA
After start
4
0.6
us
TSU;DAT
Data setup
250
100
ns
TSU;STO
Stop setup
THD;DAT
Data hold; SCL= Vih_min = 2.1V
0.3
TLOW
Clock low period
4.7
1.3
us
THIGH
Clock high period
4
0.6
us
TF
Fall time; 2.25V to 0.65V
300
300
ns
TR
Rise time; 0.65V to 2.25V
1000
300
ns
TTIMEOUT
Detect clock low timeout
25
35
ms
TPOR
Device must be operational after power-on reset
500
500
ms
TBUF
Bus free time between stop and start condition
4.7
1.3
us
4.7
400
Units
0.6
4
us
0.6
3.45
35
0.3
25
KHz
us
0.9
us
1. If FI2C is less than 50kHz, then the ADC DONE status bit is not guaranteed to be set after a valid conversion request is completed. In this
case, waiting for the TCONVERT minimum time after a convert request is made is the only way to guarantee a valid conversion is ready for
readout. When FI2C is greater than 50kHz, ADC conversion complete is ensured by waiting for the DONE status bit.
7
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Timing for JTAG Operations
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Units
tISPEN
Program enable delay time
10
—
—
µs
tISPDIS
Program disable delay time
30
—
—
µs
tHVDIS
High voltage discharge time, program
30
—
—
µs
tHVDIS
High voltage discharge time, erase
200
—
—
µs
tCEN
Falling edge of TCK to TDO active
—
—
10
ns
tCDIS
Falling edge of TCK to TDO disable
—
—
10
ns
tSU1
Setup time
5
—
—
ns
tH
Hold time
10
—
—
ns
tCKH
TCK clock pulse width, high
20
—
—
ns
tCKL
TCK clock pulse width, low
20
—
—
ns
fMAX
Maximum TCK clock frequency
—
—
25
MHz
tCO
Falling edge of TCK to valid output
—
—
10
ns
tPWV
Verify pulse width
30
—
—
µs
tPWP
Programming pulse width
20
—
—
ms
Figure 2. Erase (User Erase or Erase All) Timing Diagram
Clock to Shift-IR state and shift in the Discharge
Instruction, then clock to the Run-Test/Idle state
VIH
TMS
VIL
tSU1
tH
tCKH
VIH
tSU1
tSU1
tH
tH
tGKL
tCKH
TCK
VIL
State
Update-IR
Run-Test/Idle (Erase)
Select-DR Scan
tSU1
tH
tCKH
tSU1
tGKL
tSU1
tH
tCKH
tH
tCKH
tSU2
Specified by the Data Sheet
Run-Test/Idle (Discharge)
Figure 3. Programming Timing Diagram
VIL
tSU1
tH
tCKH
VIH
tSU1
tH
tCKL
tSU1
tH
tPWP
tCKH
TCK
VIL
State
Update-IR
Run-Test/Idle (Program)
Select-DR Scan
8
Clock to Shift-IR state and shift in the next
Instruction, which will stop the discharge process
VIH
TMS
tSU1
tH
tCKH
tSU1
tCKL
Update-IR
tH
tCKH
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
VIH
TMS
VIL
tSU1
tH
tCKH
tSU1
tH
tSU1
tCKL
tH
tPWV
tCKH
VIH
TCK
VIL
State
Update-IR
Run-Test/Idle (Program)
Select-DR Scan
Clock to Shift-IR state and shift in the next Instruction
Figure 4. Verify Timing Diagram
tSU1
tH
tSU1
tCKH
tH
tCKL
tCKH
Update-IR
Figure 5. Discharge Timing Diagram
tHVDIS (Actual)
TMS
VIL
tSU1
tH
tCKH
tSU1
tCKL
tH
tSU1
tPWP
tH
tCKH
VIH
TCK
VIL
State
Update-IR
Run-Test/Idle (Erase or Program)
Select-DR Scan
9
Clock to Shift-IR state and shift in the Verify
Instruction, then clock to the Run-Test/Idle state
VIH
tSU1
tH
tCKH
tSU1
tCKL
tH
tSU1
tCKH
tPWV
Actual
tPWV
Specified by the Data Sheet
Run-Test/Idle (Verify)
tH
tCKH
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Theory of Operation
Voltage Measurement with the On-chip Analog to Digital Converter (ADC)
The ispPAC-POWR6AT6 has an on-chip analog to digital converter that can be used for measuring the voltages at
the VMON inputs. The ADC is also used in closed loop trimming of DC-DC converters. Close loop trimming is covered later in this document.
Figure 6. ADC Monitoring VMON1 to VMON6
Programmable
Attenuator
VMON 1
VMON 2
VMON 3
+
–
+
–
+
–
÷3 / ÷1
÷3 / ÷1
To Closed
Loop Trim
Circuit
÷3 / ÷1
ADC
MUX
VMON 4
VMON 5
VMON 6
+
–
+
–
+
–
ADC
10
÷3 / ÷1
Internal
VREF2.048V
÷3 / ÷1
To I2C
Readout
Register
÷3 / ÷1
3
From I2C
ADC MUX
Address
From Closed
Loop Trim
Circuit
Figure 6 shows the ADC circuit arrangement within the ispPAC-POWR6AT6 device. The ADC can measure all analog input voltages through the multiplexer, ADC MUX. The programmable attenuator between the ADC mux and
VMON pins can be configured as divided-by-3 or divided-by-1 (no attenuation). The divided-by-3 setting is used to
measure voltages from 0V to 6V range and divided-by-1 setting is used to measure the voltages from 0V to 2V
range.
A microcontroller can place a request for any VMON voltage measurement at any time through the I2C bus. Upon
the receipt of an I2C command, the ADC will be connected to the I2C selected VMON through the ADC MUX. The
ADC output is then latched into the I2C readout registers.
10
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Calculation
The algorithm to convert the ADC code to the corresponding voltage takes into consideration the attenuation bit
value. In other words, if the attenuation bit is set, then ADC output logic multiplies the 10-bit ADC code by 3 to calculate the actual voltage at that VMON input. The following formula can always be used to calculate the actual voltage from the ADC code.
Voltage at the VMONx Pins
VMONx = ADC code (12 bits1, converted to decimal) * 2mV
1
Note: ADC_VALUE_HIGH (8 bits), ADC_VALUE_LOW (4 bits) read from I2C/SMBUS interface
Controlling Power Supply Output Voltage with the Margin/ Trim Block
One of the key features of the ispPAC-POWR6AT6 is its ability to make adjustments to the power supplies that it
may also be monitoring. This is accomplished through the Trim and Margin Block of the device. The Trim and Margin Block can adjust voltages of up to six different power supplies through TrimCells as shown in Figure 7. The DCDC blocks in the figure represent virtually any type of DC power supply that has a trim or voltage adjustment input.
This can be an off-the-shelf unit or custom circuit designed around a switching regulator IC.
The interface between the ispPAC-POWR6AT6 and the DC power supply is represented by a single resistor (R1 to
R6) to simplify the diagram. Each of these resistors represents a resistor network.
Other control signals driving the Margin/Trim Block are:
• VPS [1:0] – Control signals from device pins common to all six TrimCells, which are used to select the active
voltage profile for all TrimCells together.
• ADC input – Used to determine the trimmed DC-DC converter voltage.
• CLTENb – Used to enable closed loop trimming of all TrimCells together.
Next to each DC-DC converter, four voltages are shown. These voltages correspond to the operating voltage profile
of the Margin/Trim Block.
When the VPS[1:0] = 00, representing Voltage Profile 0: (Voltage Profile 0 is recommended to be used for the normal circuit operation)
The output voltage of the DC-DC converter controlled by the Trim 1 pin of the ispPAC-POWR6AT6 will be 1V and
that TrimCell is operating in closed loop trim mode. At the same time, the DC-DC converters controlled by Trim 2,
Trim 3 and Trim 6 pins output 1.2V, 1.5V and 3.3V respectively.
When the VPS[1:0] = 01, representing Voltage Profile 1 being active:
The DC-DC output voltage controlled by Trim 1, 2, 3, and 6 pins will be 1.05V, 1.26V, 1.57V, and 3.46V. These supply voltages correspond to 5% above their respective normal operating voltage (also called as margin high).
Similarly, when VPS[1:0] = 11, all DC-DC converters are margined low by 5%.
11
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Figure 7. ispPAC-POWR6AT6 Trim and Margin Block
ispPAC-POWR6AT6
Margin/Trim Block
TrimCell
#1
VIN
DC-DC Output Voltage
Controlled by Profiles
DC-DC
R1*
Trim 1
0
1
1V (CLT) 1.05V
2
0.97V
3
0.95V
1.2V (I2C) 1.26V
1.16V
1.14V
1.5V (I2C) 1.57V
1.45V
1.42V
3.3V (EE) 3.46V
3.20V
3.13V
Trim-in
(Closed Loop)
VIN
VPS[0:1]
Digital Closed Loop
and I2C Interface Control
CLTENb
TrimCell
#2
DC-DC
R2*
Trim 2
Trim-in
(I2C Update)
VIN
TrimCell
#3
DC-DC
R3*
Trim 3
Trim-in
(I2C Update)
VIN
CLTLOCK/SMBA
TrimCell
#6
DC-DC
R6*
Trim 6
Trim-in
(Register 0)
*Indicates resistor network (see Figure 8).
Input From ADC Mux
Read – 10-bit ADC Code
There are six TrimCells in the ispPAC-POWR6AT6 device, enabling simultaneous control of up to six individual
power supplies. Each TrimCell can generate up to four trimming voltages to control the output voltage of the DC-DC
converter.
Figure 8. TrimCell Driving a Typical DC-DC Converter
VOUT
VIN
VOUT
DC-DC
Converter
R3
TrimCell
#N
DAC
R1
Trim
R2
12
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Figure 8 shows the resistor network between the TrimCell #N in the ispPAC-POWR6AT6 and the DC-DC converter.
The values of these resistors depend on the type of DC-DC converter used and its operating voltage range. The
method to calculate the values of the resistors R1, R2, and R3 are described in a separate application note.
Voltage Profile Control
The Margin / Trim Block of ispPAC-POWR6AT6 consists of six TrimCells. Because all six TrimCells in the Margin /
Trim Block are controlled by a common voltage profile control signals, they all operate at the same voltage profile.
The voltage profile control input comes from a pair of device pins: VPS0, VPS1.
TrimCell Architecture
The TrimCell block diagram is shown in Figure 9. The 8-bit DAC at the output provides the trimming voltage
required to set the output voltage of a programmable supply. Each TrimCell can be operated in any one of the four
voltage profiles. In each voltage profile the output trimming voltage can be set to a preset value. There are six 8-bit
registers in each TrimCell that, depending on the operational mode, set the DAC value. Of these, four DAC values
(DAC Register 0 to DAC Register 3) are stored in the E2CMOS memory while the remaining register contents are
stored in volatile registers. Two multiplexers (Mode Mux and Profile Mux) control the routing of the code to the DAC.
The Profile Mux can be controlled by common TrimCell voltage profile control signals.
Figure 9. ispPAC-POWR6AT6 Output TrimCell
TRIMCELL ARCHITECTURE
DAC REGISTER 3
(E2CMOS)
VOLTAGE
PROFILE 2
DAC REGISTER 2
(E2CMOS)
VOLTAGE
PROFILE 1
DAC REGISTER 1
(E2CMOS)
8
8
11
01
00
DAC REGISTER 0
(E2CMOS)
TRIMx
MODE
MUX
FROM CLOSED LOOP
TRIM CIRCUIT
DAC
2
DAC REGISTER
(I2C)
CLOSED LOOP
TRIM REGISTER
8
8
8
8
VOLTAGE
PROFILE 0
10
8
PROFILE
MUX
VOLTAGE
PROFILE 3
8
VOLTAGE PROFILE 0
MODE SELECT
(E2CMOS)
COMMON TrimCell
VOLTAGE PROFILE
CONTROL
Figure 7 shows four power supply voltages next to each DC-DC converter. When the Profile MUX is set to Voltage
Profile 3, the DC supply controlled by Trim 1 will be at 0.95V, the DC supply controlled by Trim 2 will be at 1.14V,
1.42V for Trim 3 and 3.13V for Trim 8. When Voltage Profile 0 is selected, Trim 1 will set the supply to 1V, Trim 2 and
Trim 3 will be set by the values that have been loaded using I2C at 1.2 and 1.5V, and Trim 6 will be set to 3.3V.
The following table summarizes the voltage profile selection and the corresponding DAC output trimming voltage.
The voltage profile selection is common to all six TrimCells.
13
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Table 1. TrimCell Voltage Profile and Operating Modes
VPS[1:0]
Selected Voltage Profile
Selected Mode
Trimming Voltage
is Controlled by
11
Voltage Profile 3
—
DAC Register 3 (E2CMOS)
10
Voltage Profile 2
—
DAC Register 2 (E2CMOS)
01
Voltage Profile 1
—
DAC Register 1 (E2CMOS)
DAC Register 0 Select
00
Voltage Profile 0
2
DAC Register 0 (E2CMOS)
DAC Register I C Select
DAC Register (I2C)
Digital Closed Loop Trim
Closed Loop Trim Register
TrimCell Operation in Voltage Profiles 1, 2 and 3: The output trimming voltage is determined by the code stored
in the DAC Registers 1, 2, and 3 corresponding to the selected Voltage Profile.
TrimCell Operation in Voltage Profile 0: The Voltage Profile 0 has three operating modes. They are DAC Register
0 Select mode, DAC Register I2C Select mode and Closed Loop Trim mode. The mode selection is stored in the
E2CMOS configuration memory. Each of the six TrimCells can be independently set to different operating modes
during Voltage Profile 0 mode of operation.
DAC Register 0 Select Mode: The contents of DAC register 0 are stored in the on-chip E2CMOS memory. When
Voltage Profile 0 is selected, the DAC will be loaded with the value stored in DAC Register 0.
DAC Register I2C Select Mode: This mode is used if the power management arrangement requires an external
microcontroller to control the DC-DC converter output voltage. The microcontroller updates the contents of the DAC
Register I2C on the fly to set the trimming voltage to a desired value. The DAC Register I2C is a volatile register and
is reset to 80H (DAC at Bipolar zero) upon power-on. The external microcontroller writes the correct DAC code in
this DAC Register I2C before enabling the programmable power supply.
Digital Closed Loop Trim Mode
Closed loop trim mode operation can be used when tight control over the DC-DC converter output voltage at a
desired value is required. The closed loop trim mechanism operates by comparing the measured output voltage of
the DC-DC converter with the internally stored voltage setpoint. The difference between the setpoint and the actual
DC-DC converter voltage generates an error voltage. This error voltage adjusts the DC-DC converter output voltage toward the setpoint. This operation iterates until the setpoint and the DC-DC converter voltage are equal.
Figure 10 shows the closed loop trim operation of a TrimCell. At regular intervals (as determined by the Update
Rate Control register) the ispPAC-POWR6AT6 device initiates the closed loop power supply voltage correction
cycle through the following blocks:
• Non-volatile Setpoint register stores the desired output voltage
• On-chip ADC is used to measure the voltage of the DC-DC converter
• Three-state comparator is used to compare the measured voltage from the ADC with the Setpoint register contents. The output of the three state comparator can be one of the following:
• +1 if the setpoint voltage is greater than the DC-DC converter voltage
• -1 if the setpoint voltage is less than the DC-DC converter voltage
• 0 if the setpoint voltage is equal to the DC-DC converter voltage
• Channel polarity control determines the polarity of the error signal
• Closed loop trim register is used to compute and store the DAC code corresponding to the error voltage.
The contents of the Closed Loop Trim will be incremented or decremented depending on the channel polarity and the three-state comparator output. If the three-state comparator output is 0, the closed loop trim register contents are left unchanged.
• The DAC in the TrimCell is used to generate the analog error voltage that adjusts the attached DC-DC converter output voltage.
14
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Figure 10. Digital Closed Loop Trim Operation
SETPOINT
(E2CMOS)
CHANNEL
POLARITY
(E2CMOS)
TrimCell
E2CMOS Registers
DAC Register 3
DAC Register 2
DAC Register 1
DAC
TRIMx
DAC Register 0
Three-State
DIGITAL
COMPARE
(+1/0/-1)
+/-1
Profile Control
DAC Register I2C
Closed Loop
Trim Register
UPDATE
RATE
CONTROL
R*
TRIMIN
Profile 0 Mode
Control (E2CMOS)
VMONx
DC-DC
CONVERTER
VOUT
ADC
GND
POWR6AT6
E2CMOS
*Indicates resistor network (see Figure 8).
The closed loop trim cycle interval is programmable and is set by the update rate control register. The following
table lists the programmable update interval that can be selected by the update rate register.
Table 2. Output DAC Update Rate in Digital Closed Loop Mode
Update Rate
Control Value
Update
Interval
00
432 µs
01
1.06 ms
10
8.74 ms
11
16.9 ms
Closed Loop Trim Control Using the CLTENb Pin
There is a one-to-one relationship between the selected TrimCell and the corresponding VMON input for the closed
loop operation. For example, if TrimCell 3 is used to control the power supply in the closed loop trim mode, VMON3
must be used to monitor its output power supply voltage.
The CLTENb enable pin (active low) simultaneously starts the closed loop trimming process for all ispPACPOWR6AT6 trim outputs so configured. Behavior of individual trim output pins is defined using Lattice PACDesigner design software and stored in the ispPAC-POWR6AT6's non-volatile E2CMOS memory. In addition to a
closed-loop trim control option, two other configuration alternatives are available. The first stores a fixed, or static,
value for a given trim output in E2CMOS memory. The second enables dynamic trim adjustments to be made using
an external microcontroller via the ispPAC-POWR6AT6's I2C interface bus. Neither of these options is affected by
the CLTENb pin, however.
When the ispPAC-POWR6AT6's CLTENb pin goes low, closed-loop trimming is enabled. When CLTENb subsequently goes high, there is a brief delay after which closed-loop trimming is suspended. The delay is the time
required for ispPAC-POWR6AT6 control logic to complete a trim update cycle. Table 2 shows typical times for
update cycles based on which of four trim rates is initially chosen in PAC-Designer. When the trim process is
halted, it should also be noted the trim output DACs have constant voltage output levels (corresponding to their last
input code setting). This condition can be safely maintained indefinitely, but resuming closed-loop trimming (by taking CLTENb low) better insures power supplies remain precisely adjusted under all possible conditions. When reenabled, closed-loop trimming restarts where it left off. In this sense, the CLTENb pin can be thought of as a
“pause” control for closed-loop trim.
15
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
It should also be noted that whenever the VPS0 and VPS1 pins are not both low, they effectively stop closed-loop
trim the same way the CLTENb pin does when it goes high. That is, whenever an alternate trim mode (other than
VPS0=0 and VPS1=0) is selected, the trim process is suspended as described above. Assuming the CLTENb pin
is asserted, when both VPS0 and VPS1 are low again, closed-loop trimming will resume where it left off.
It is recommended that the CLTENb pin not be activated until after any necessary power supply sequencing is
completed to prevent an “open loop” condition from occurring. Otherwise, if control of when closed-loop trimming
begins is not critical, the CLTENb pin can be tied to ground. This will cause closed-loop trim to begin immediately
after the initial power on of the ispPAC-POWR6AT6 is completed.
Closed Loop Trim Start-up Behavior
The contents of the closed loop register, upon power-up, will contain a value 80h (Bipolar-zero) value. The DAC
output voltage will be equal to the programmed Offset voltage. Usually under this condition, the power supply output will be close to its nominal voltage. If the power supply trimming should start after reaching its desired output
voltage, the corresponding DAC code can be loaded into the closed loop trim register through I2C (same address
as the DAC register I2C mode) before activating the CLTENb pin.
Details of the Digital to Analog Converter (DAC)
Each TrimCell has an 8-bit bipolar DAC to set the trimming voltage (Figure 11). The full-scale output voltage of the
DAC is +/- 320 mV. A code of 80H results in the DAC output set at its bi-polar zero value.
The voltage output from the DAC is added to a programmable offset value and the resultant voltage is then applied
to the trim output pin. The offset voltage is typically selected to be approximately equal to the DC-DC converter
open circuit trim node voltage. This results in maximizing the DC-DC converter output voltage range.
The programmed offset value can be set to 0.6V, 0.8V, 1.0V or 1.25V. This value selection is stored in E2CMOS
memory and cannot be changed dynamically.
Figure 11. Vbpz Offset Voltage is Added to DAC Output Voltage to Derive Trim Pad Voltage
TrimCell X
8
From
Trim Registers
DAC
7 bits + Sign
(-320mV to +320mV)
TRIMx
Pad
Vbpz Offset
(0.6V,0.8V,1.0V,1.25V)
E2CMOS
RESET Command via JTAG or I2C
Issuing a reset instruction via JTAG or I2C will force all trim outputs selected for digital closed-loop trim control back
to their initial output level (code 80h + Vbpz). After that, assuming the CLTENb is still asserted, digital closed loop
16
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
trim will begin and CLTLOCK/SMBA will only reassert when the trim process is complete. Contents of the I2C
cltlock_status register (0x00), however are not fully reset to initial conditions until the CLTLOCK/SMBA pin achieves
a reasserted state.
CAUTION: Issuing a RESET command through I 2C or JTAG during the ispPAC-POWR6AT6 device operation,
results in the device aborting all operations and returning to the power-on reset state except for the one condition
mentioned above.
I2C/SMBUS Interface
I2C and SMBus are low-speed serial interface protocols designed to enable communications among a number of
devices on a circuit board. The ispPAC-POWR6AT6 supports a 7-bit addressing of the I2C communications protocol, as well as SMBTimeout and SMBAlert features of the SMBus, enabling it to easily integrated into many types
of modern power management systems. Figure 12 shows a typical I2C configuration, in which one or more ispPACPOWR6AT6s are slaved to a supervisory microcontroller. SDA is used to carry data signals, while SCL provides a
synchronous clock signal. The SMBAlert line is only present in SMBus systems. The 7-bit I2C address of the
POWR6AT6 is fully programmable through the JTAG port.
Figure 12. ispPAC-POWR6AT6 in I 2C/SMBUS System
V+
SDA/SMDAT (DATA)
To Other
I2C
Devices
SCL/SMCLK (CLOCK)
SMBALERT
SDA
SCL
INTERRUPT
MICROPROCESSOR
(I2C MASTER)
SDA
SCL
OUT5/
SMBA
ispPAC-POWR6AT6
(I2C SLAVE)
SDA
SCL
OUT5/
SMBA
ispPAC-POWR6AT6
(I2C SLAVE)
In both the I2C and SMBus protocols, the bus is controlled by a single MASTER device at any given time. This master device generates the SCL clock signal and coordinates all data transfers to and from a number of slave devices.
The ispPAC-POWR6AT6 is configured as a slave device, and cannot independently coordinate data transfers.
Each slave device on a given I2C bus is assigned a unique address. The ispPAC-POWR6AT6 implements the 7-bit
addressing portion of the standard. Any 7-bit address can be assigned to the ispPAC-POWR6AT6 device by programming through JTAG. When selecting a device address, one should note that several addresses are reserved
by the I2C and/or SMBus standards, and should not be assigned to ispPAC-POWR6AT6 devices to assure bus
compatibility. Table 3 lists these reserved addresses.
17
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Table 3. I 2C/SMBus Reserved Slave Device Addresses
I2C function Description
Address
R/W bit
SMBus Function
0000 000
0
General Call Address
General Call Address
0000 000
1
Start Byte
Start Byte
0000 001
x
CBUS Address
CBUS Address
0000 010
x
Reserved
Reserved
0000 011
x
Reserved
Reserved
0000 1xx
x
HS-mode master code
HS-mode master code
0001 000
x
NA
SMBus Host
0001 100
x
NA
SMBus Alert Response Address
0101 000
x
NA
Reserved for ACCESS.bus
0110 111
x
NA
Reserved for ACCESS.bus
1100 001
x
NA
SMBus Device Default Address
1111 0xx
x
10-bit addressing
10-bit addressing
1111 1xx
x
Reserved
Reserved
The ispPAC-POWR6AT6’s I2C/SMBus interface allows data to be both written to and read from the device. A data
write transaction (Figure 13) consists of the following operations:
1. Start the bus transaction
2. Transmit the device address (7 bits) along with a low write bit
3. Transmit the address of the register to be written to (8 bits)
4. Transmit the data to be written (8 bits)
5. Stop the bus transaction
To start the transaction, the master device holds the SCL line high while pulling SDA low. Address and data bits are
then transferred on each successive SCL pulse, in three consecutive byte frames of 9 SCL pulses. Address and
data are transferred on the first 8 SCL clocks in each frame, while an acknowledge signal is asserted by the slave
device on the 9th clock in each frame. Both data and addresses are transferred in a most-significant-bit-first format.
The first frame contains the 7-bit device address, with bit 8 held low to indicate a write operation. The second frame
contains the register address to which data will be written, and the final frame contains the actual data to be written. Note that the SDA signal is only allowed to change when the SCL is low, as raising SDA when SCL is high signals the end of the transaction.
Figure 13. I 2C Write Operation
SCL
SDA
START
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
8
9
A6
A5
A4
A3
A2
A1
A0
R/W
ACK
R7
R6
R5
R4
R3
R2
R1
R0
ACK
D7
D6
D5
D4
D3
D2
D1
D0
ACK
DEVICE ADDRESS (7 BITS)
REGISTER ADDRESS (8 BITS)
WRITE DATA (8 BITS)
STOP
Note: Shaded Bits Asserted by Slave
Reading a data byte from the ispPAC-POWR6AT6 requires two separate bus transactions (Figure 14). The first
transaction writes the register address from which a data byte is to be read. Note that since no data is being written
to the device, the transaction is concluded after the second byte frame. The second transaction performs the actual
read. The first frame contains the 7-bit device address with the R/W bit held High. In the second frame the ispPACPOWR6AT6 asserts data out on the bus in response to the SCL signal. Note that the acknowledge signal in the
second frame is asserted by the master device and not the ispPAC-POWR6AT6.
18
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Figure 14. I 2C Read Operation
STEP 1: WRITE REGISTER ADDRESS FOR READ OPERATION
SCL
SDA
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
8
9
A6
A5
A4
A3
A2
A1
A0
R/W
ACK
R7
R6
R5
R4
R3
R2
R1
R0
ACK
START
DEVICE ADDRESS (7 BITS)
REGISTER ADDRESS (8 BITS)
STOP
STEP 2: READ DATA FROM THAT REGISTER
SCL
SDA
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
8
9
A6
A5
A4
A3
A2
A1
A0
R/W
ACK
D7
D6
D5
D4
D3
D2
D1
D0
ACK
START
DEVICE ADDRESS (7 BITS)
READ DATA (8 BITS)
OPTIONAL
STOP
Note: Shaded Bits Asserted by Slave
The ispPAC-POWR6AT6 provides 15 registers that can be accessed through its I2C interface. These registers provide the user with the ability to monitor and control the device’s inputs and outputs, and transfer data to and from
the device. Table 4 provides a summary of these registers.
Table 4. I 2C Control Registers
Register Address
Register Name
Read/Write
Description
Value on POR, RESET
Closed-loop trim status
*bit-6 is RW, all others R only
1100 0000
0x00
cltlock_status
R/W
0x01
adc_value_low
R
ADC D[3:0] and status
0000 1110
0x02
adc_value_high
R
ADC D[11:4]
0000 0000
0x03
adc_mux
R/W
ADC Attenuator and MUX[3:0]
1110 1000
0x04
UES_byte0
R
UES[7:0]
EEEE EEEE
0x05
UES_byte1
R
UES[15:8]
EEEE EEEE
0x06
UES_byte2
R
UES[23:16]
EEEE EEEE
0x07
UES_byte3
R
UES[31:24]
EEEE EEEE
0x08
reset
W
Resets device on write
1111 1111
0x09
trim1_trim
R/W
Trim DAC 1 [7:0]
1000 0000
0x0A
trim2_trim
R/W
Trim DAC 2 [7:0]
1000 0000
0x0B
trim3_trim
R/W
Trim DAC 3 [7:0]
1000 0000
0x0C
trim4_trim
R/W
Trim DAC 4 [7:0]
1000 0000
0x0D
trim5_trim
R/W
Trim DAC 5 [7:0]
1000 0000
0x0E
trim6_trim
R/W
Trim DAC 6 [7:0]
1000 0000
Note: x = unknown, 0 = low, 1 = high, E= E2 memory setting (UES string)
I2C Closed-Loop Trim Register
Figure 15 shows bit assignments for the ispPAC-POWR6AT6 I2C closed-loop trim status register. There are six
read only bits (cltlock_status.in[1:6]) that reflect the present trim status of individual trim output pins. When a closed
loop-trim controlled power supply's output reaches the value specified by its Profile 0 configuration setting, that trim
output's CLTLOCK_status bit is set to a “1”.
The I2C closed-loop trim register has one read/write bit (cltlock_status). When ispPAC-POWR6AT6 is configured in
PAC-Designer to operate in SMBus Alert mode, it is set to a “1” by device control logic to send an SMBus Alert.
Logic then waits for it to be acknowledged by a host I2C processor (when it is addresses the register), completing
19
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
the SMBus Alert cycle. Refer to the CLTLOCK/SMBA pin and SMBus Alert sections of this datasheet for more
information on how the closed-loop trim status in this I2C register is used.
Figure 15. I2C Closed Loop Trim Status Register
0x00 – CLTLOCK_STATUS (b6 = Read/Write; all others Read Only)
X
SMBA
in6
in5
in4
in3
in2
in1
b7
b6
b5
b4
b3
b2
b1
b0
It is possible to read the value of the voltage present on any of the VMON inputs by using the ispPAC-POWR6AT6’s
ADC. Three registers provide the I2C interface to the ADC (Figure 16).
Figure 16. ADC Interface Registers
0x01 - ADC_VALUE_LOW (Read Only)
D3
D2
D1
D0
1
1
1
DONE
b7
b6
b5
b4
b3
b2
b1
b0
0x02 - ADC_VALUE_HIGH (Read Only)
D11
D10
D9
D8
D7
D6
D5
D4
b7
b6
b5
b4
b3
b2
b1
b0
0x03 - ADC_MUX (Read/Write)
X
X
X
ATTEN
X
SEL2
SEL1
SEL0
b7
b6
b5
b4
b3
b2
b1
b0
To perform an A/D conversion, one must set the input attenuator and channel selector. Two input ranges may be
set using the attenuator, 0 - 2.048V and 0 - 6.144V. Table 5 shows the input attenuator settings.
Table 5. ADC Input Attenuator Control
ATTEN (ADC_MUX.4)
Resolution
Full-Scale Range
0
2mV
2.048 V
1
6mV
6.144 V
The input selector may be set to monitor any one of the six VMON inputs or the VCCA input. Table 6 shows the
codes associated with each input selection.
Table 6. VMON Address Selection Table
Select Word
SEL2
(ADC_MUX.2)
SEL1
(ADC_MUX.1)
SEL0
(ADC_MUX.0)
Input Channel
0
0
0
VMON1
0
0
1
VMON2
0
1
0
VMON3
0
1
1
VMON4
1
0
0
VMON5
1
0
1
VMON6
20
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Writing a value to the ADC_MUX register to set the input attenuator and selector will automatically initiate a conversion. When the conversion is in process, the DONE bit (ADC_VALUE_LOW.0) will be reset to 0. When the conversion is complete, this bit will be set to 1. When the conversion is complete, the result may be read out of the ADC by
performing two I2C read operations; one for ADC_VALUE_LOW, and one for ADC_VALUE_HIGH. It is recommended that the I2C master load a second conversion command only after the completion of the current conversion
command (Waiting for the DONE bit to be set to 1). An alternative would be to wait for a minimum specified time
(see Tconvert value in the specifications) and disregard checking the DONE bit.
Note that if the I2C clock rate falls below 50kHz (see FI2C note in specifications), the only way to insure a valid ADC
conversion is to wait the minimum specified time (Tconvert), as the operation of the DONE bit at clock rates lower
than that cannot be guaranteed. In other words, if the I2C clock rate is less than 50kHz, the DONE bit may or may
not assert even when a valid conversion result is available. Erroneous ADC readout results are also possible whenever the I2C clock is less than 50kHz and a second ADC convert is commanded before a full TCONVERT time period
has elapsed. Under these conditions, it is still possible to obtain valid results for the second conversion by reading
out the ADC low and high byte results twice in succession (read ADC_VALUE_LOW, read ADC_VALUE_HIGH,
then repeating the low and high byte reads). Only the second ADC readout value is reliably valid, however.
To insure every ADC conversion result is valid, preferred operation is to clock I2C at more than 50kHz and verify
DONE bit status or wait for the full TCONVERT time period between subsequent ADC convert commands. If an I2C
request is placed before the current conversion is complete, the DONE bit will be set to 1 only after the second
request is complete.
The UES word may also be read through the I2C interface, with the register mapping shown in Figure 17.
Figure 17. I 2C Register Mapping for UES Bits
0x04 - UES_BYTE0 (Read Only)
UES7
UES6
UES5
UES4
UES3
UES2
UES1
UES0
b7
b6
b5
b4
b3
b2
b1
b0
0x05 - UES_BYTE1 (Read Only)
UES15
UES14
UES13
UES12
UES11
UES10
UES9
UES8
b7
b6
b5
b4
b3
b2
b1
b0
0x06 - UES_BYTE2 (Read Only)
UES23
UES22
UES21
UES20
UES19
UES18
UES17
UES16
b7
b6
b5
b4
b3
b2
b1
b0
0x07 - UES_BYTE3 (Read Only)
UES31
UES30
UES29
UES28
UES27
UES26
UES25
UES24
b7
b6
b5
b4
b3
b2
b1
b0
The I2C interface also provides the ability to initiate reset operations. The ispPAC-POWR6AT6 may be reset by issuing a write of any value to the I2C RESET register (Figure 18). Refer to the RESET Command via JTAG or I2C section of this data sheet for further information.
21
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Figure 18. I 2C Reset Register
0x8 - RESET (Write Only)
X
X
X
X
X
X
X
X
b7
b6
b5
b4
b3
b2
b1
b0
The ispPAC-POWR6AT6 also provides the user with the ability to program the trim values over the I2C interface, by
writing the appropriate binary word to the associated trim register (Figure 19).
Figure 19. I 2C Trim Registers
0x9 - TRIM1_TRIM (Read/Write)
D7
D6
D5
D4
D3
D2
D1
D0
b7
b6
b5
b4
b3
b2
b1
b0
0xA - TRIM2_TRIM (Read/Write)
D7
D6
D5
D4
D3
D2
D1
D0
b7
b6
b5
b4
b3
b2
b1
b0
0xB - TRIM3_TRIM (Read/Write)
D7
D6
D5
D4
D3
D2
D1
D0
b7
b6
b5
b4
b3
b2
b1
b0
0xC - TRIM4_TRIM (Read/Write)
D7
D6
D5
D4
D3
D2
D1
D0
b7
b6
b5
b4
b3
b2
b1
b0
0xD - TRIM5_TRIM (Read/Write)
D7
D6
D5
D4
D3
D2
D1
D0
b7
b6
b5
b4
b3
b2
b1
b0
0xE - TRIM6_TRIM (Read/Write)
D7
D6
D5
D4
D3
D2
D1
D0
b7
b6
b5
b4
b3
b2
b1
b0
Monitoring Closed Loop Trim with the CLTLOCK/SMBA Pin
The ispPAC-POWR6AT6 uses a simple algorithm to determine if closed-loop trimming has reached a stable or
locked value. In Figure 20, the flow diagram shows whenever the closed-loop trim enable pin (CLTENb) is asserted
(low) the status of all six trim output pins is tested and updated at periodic intervals (refer to Table 2 for typical cycle
times). If a trim lock condition exists for a given pin, a lock result is set and processing continues. Pins not selected
for closed-loop trim are automatically reported to be in the lock condition, but timing is kept constant to preserve a
constant update rate regardless of how many trim outputs are really involved.
22
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Figure 20. Closed-Loop Trim Lock (CLTLOCK/SMBA) Signal Processing Logic Flow Diagram
Start
Runs when CLTENb
pin is asserted.
Vmon-n ADC
measurement
Determine “Lock”
status of Trim-n
Trim
Locked?
No
Yes
Set “Lock” result
for Trim-n
Clear “Lock” result
for Trim-n
The ispPAC-POWR6AT6 contains trim detection processing circuitry to signal when closed-loop trimming is complete for selected trim output pins. This signal is output on the closed-loop control output pin (CLTLOCK/SMBA)
which has a open drain output and is normally asserted low (pull down). When all closed-loop trim output pins
reach a completion or trim “locked” condition, the CLTLOCK/SMBA output pin pulls low. Afterwards, the CLTLOCK/
SMBA pin also indicates when a trimming fault exists by de-asserting (going high). Finally, the CLTLOCK/SMBA pin
can be configured to work in conjunction with the SMBus Alert protocol to signal when trim lock has been achieved
or lost (see the section on SMBus Alert for details).
Figure 21 shows a simplified diagram of how the state of the CLTLOCK/SMBA output pin is generated. After closed
loop trimming is enabled, the CLTLOCK/SMBA signal processing logic examines the output result from the ADC
going to each TrimCell at the end of each trim update cycle. If it is determined that a trim lock condition exists for
that trim output pin, the trim lock signal is asserted. The status of an individual trim output can be read via the I2C
closed loop trim register (refer to Figure 15). Trim output pins not selected for closed-loop trim operation will automatically indicate a trim locked condition.
Figure 21. Closed-Loop Trim Lock Output Pin (CLTLOCK/SMBA) Functionality
I 2C CLTLOCK/SMBA Status:
Trim1-6 (6-bits); 1 = Locked
CLTLOCK/SMBA Signal
Processing Logic
6
5
Trim1-5
same as
below
5
1
0
CLTLOCK/SMBA
Trim6
1
lock = 1
I2C/
SMBus
Control
Logic
E 2 Configuration
Mask CLTLOCK/SMBA
E 2 Configuration
Default = 0
Next, an individual lock signal is OR'd with an E2CMOS mask bit specific to that trim output pin. There are six masking bits, one for each possible trim output pin. When set, masking bits effectively override the lock determination for
a particular trim output pin. The default setting for all mask bits is cleared (not set). Changes to the device configuration mask bits can be made using PAC-Designer.
23
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Finally, the individual lock status inputs all meet at a common NAND gate. A trim lock condition is generated when
all six trim status inputs are high causing the CLTLOCK/SMBA pin to go low. If the trim lock is lost for any monitored
trim output pin, the CLTLOCK/SMBA pin will de-assert (go open). This could be due to a failed power supply for
example, or if the ispPAC-POWR6AT6 can no longer adjust a controlled supply to specification. Interrogation of the
I2C register determines which trim output pin lost lock. Also, the ADC can be used to measure individual supplies to
further diagnose an underlying fault.
There is an alternative path the CLTLOCK/SMBA signal can take, depending on how the ispPAC-POWR6AT6 has
been configured. Refer to the I2C/SMBus control logic box shown in Figure 21. When the alternative output path is
enabled in PAC-Designer, the trim lock result is first sent to the I2C/SMBus control logic for processing before going
to the CLTLOCK/SMBA output pin. The purpose of this control logic is to make the CLTLOCK/SMBA signal work in
accordance with the SMBus Alert protocol. The main difference between the two output path alternatives is that
SMBus Alert stays set (low) until acknowledged by the host I2C processor. Also, an SMBus Alert is set (pulled low)
when a trim lock condition is achieved, as well as when it is lost. Either condition must be acknowledged or the
SMBus Alert condition will not go away. Note that on initial device power-on, or after an I2C software reset, an
SMBus Alert is blocked (no trim lock). The SMBus master must explicitly set the CLT_LOCK_STATUS bit-6 low to
begin the SMBAlert process.
SMBus SMBAlert Function
The ispPAC-POWR6AT6 provides an SMBus SMBAlert function to request service from the bus master when used
as part of an SMBus system. When the SMBAlert signal mode for closed-loop trimming is chosen in PAC-Designer,
the CLTLOCK/SMBA output pin will go low whenever the trim lock condition status changes. The reason for this is
to report both when all outputs are in trim lock and when one or more trim output pins lose trim lock.
When a selected (unmasked) closed-loop trim output loses its locked status, servicing the resulting SMBus Alert
and interrogating the I2C closed-loop trim register will reveal which trim output pin(s) that are involved. After
acknowledgement by the host I2C processor, the CLTLOCK/SMBA pin will be de-asserted until another change in
CLTLOCK/SMBA trim status occurs.
After initial device turn-on and power-on reset (POR) is complete, the SMBA bit in the I2C register (0x00, bit-6) is
set high or “1”. The SMBAlert function of the ispPAC-POWR6AT6 is effectively suspended until this location has
been overwritten with a low or “0”. The purpose of this is to prevent output to the CLTLOCK/SMBA pin before the
bus master or host processor is ready to process SMBAlerts.
Note that if closed loop trimming is enabled and completes before this action is performed, the initial trim lock indication (as an SMBAlert) will not occur. If this happens, trim status can still be interrogated, however. Reading the
I2C trim status register to see that all trim bits are high (bit-1 to bit-6) is a valid indication that trim lock has been
achieved. Otherwise, the CLTENb pin must be held high until after the I2C SMBA bit is written low and then enabled
afterwards to insure detection of the initial trim lock status with an SMBAlert.
After the SMBA bit has been set low, any subsequent change in trim lock status will be reported with an SMBAlert
output to the CLTLOCK/SMBA pin. To process an SMBAlert, the following steps must be performed to service the
alert and resume monitoring for the next change in trim lock status:
The typical flow for an SMBAlert transaction is as follows (Figure 22):
1. I2C closed loop trim register SMBA bit is forced to high by internal ispPAC-POWR6AT6 control logic whenever the trim lock status changes
2. ispPAC-POWR6AT6 closed-loop trim control logic pulls the CLTLOCK/SMBA pin low
3. Master responds to interrupt from SMBA line
4. Master broadcasts a read operation by sending the SMBus Alert Response Address (ARA, 18h)
5. ispPAC-POWR6AT6 responds to the ARA request by transmitting its device address
24
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
6. If transmitted device address matches ispPAC-POWR6AT6 address, the master completes the cycle by setting the I2C closed loop trim register SMBA bit low again. This releases the CLTLOCK/SMBA pin (it goes
high).
Figure 22. SMBAlert Bus Transaction
SMBA
SCL
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
8
9
SDA
0
0
0
1
1
0
0
R/W
ACK
A6
A5
A4
A3
A2
A1
A0
x
ACK
SLAVE
ASSERTS
SMBA
START
SLAVE ADDRESS (7 BITS)
ALERT RESPONSE ADDRESS
(0001 100)
SLAVE
RELEASES
SMBA
STOP
Note: Shaded Bits Asserted by Slave
After CLTLOCK/SMBA has been released, the bus master (typically a microcontroller) may opt to perform some
service functions in which it may send data to or read data from the ispPAC-POWR6AT6. As part of the service
functions, the bus master will typically need to clear whatever condition initiated the SMBAlert request (power supply malfunction, etc.). For further information on the SMBus functionality, the user should consult the SMBus Standard.
Software-Based Design Environment
Designers can configure the ispPAC-POWR6AT6 using PAC-Designer, an easy to use, Microsoft Windows compatible program. Circuit designs are entered graphically and then verified, all within the PAC-Designer environment.
Full device programming is supported using PC parallel port I/O operations and a download cable connected to the
serial programming interface pins of the ispPAC-POWR6AT6. A library of configurations is included with basic solutions and examples of advanced circuit techniques are available on the Lattice web site for downloading. In addition, comprehensive on-line and printed documentation is provided that covers all aspects of PAC-Designer
operation. The PAC-Designer schematic window, shown in Figure 23, provides access to all configurable ispPACPOWR6AT6 elements via its graphical user interface. All analog input and output pins are represented. Static or
non-configurable pins such as power, ground, and the serial digital interface are omitted for clarity. Any element in
the schematic window can be accessed via mouse operations as well as menu commands. When completed, configurations can be saved, simulated, and downloaded to devices.
Figure 23. PAC-Designer ispPAC-POWR6AT6 Design Entry Screen
25
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
In-System Programming
The ispPAC-POWR6AT6 is an in-system programmable device. This is accomplished by integrating all E2 configuration memory and SRAM control logic on-chip. Programming is performed through a 4-wire, IEEE 1149.1 compliant serial JTAG interface at normal logic levels. Once a device is programmed, all configuration information is
stored on-chip, in non-volatile E2CMOS memory cells. The specifics of the IEEE 1149.1 serial interface and all ispPAC-POWR6AT6 instructions are described in the JTAG interface section of this data sheet.
User Electronic Signature
A user electronic signature (UES) feature is included in the E2CMOS memory of the ispPAC-POWR6AT6. This consists of 32 bits that can be configured by the user to store unique data such as ID codes, revision numbers or inventory control data. The specifics of this feature are discussed in the IEEE 1149.1 serial interface section of this data
sheet.
Electronic Security
An electronic security “fuse” (ESF) bit is provided in every ispPAC-POWR6AT6 device to prevent unauthorized
readout of the E2CMOS configuration bit patterns. Once programmed, this cell prevents further access to the functional user bits in the device. This cell can only be erased by reprogramming the device, so the original configuration cannot be examined once programmed. Usage of this feature is optional. The specifics of this feature are
discussed in the IEEE 1149.1 serial interface section of this data sheet.
Production Programming Support
Once a final configuration is determined, an ASCII format JEDEC file can be created using the PAC-Designer software. Devices can then be ordered through the usual supply channels with the user’s specific configuration already
preloaded into the devices. By virtue of its standard interface, compatibility is maintained with existing production
programming equipment, giving customers a wide degree of freedom and flexibility in production planning.
Evaluation Fixture
The Design Kit for the ispPAC-POWR1220AT8, a larger device that contains all the same functions as the ispPACPOWR6AT6, can be used to evaluate the ispPAC-POWR6AT6. Included in the basic ispPAC-POWR1220AT8
Design Kit is an engineering prototype board that can be connected to the parallel port of a PC using a Lattice
download cable. It demonstrates proper layout techniques for the ispPAC-POWR1220AT8 which also apply to the
ispPAC-POWR6AT6 and can be used in real time to check circuit operation as part of the design process. Input and
output connections are provided to aid in the evaluation of either device for a given application. (Figure 24).
Figure 24. Download from a PC
PAC-Designer
Software
Other
System
Circuitry
ispDOWNLOAD
Cable (6')
4
ispPAC-POWR
1220AT8
Device
IEEE Standard 1149.1 Interface (JTAG)
Serial Port Programming Interface Communication with the ispPAC-POWR6AT6 is facilitated via an IEEE 1149.1
test access port (TAP). It is used by the ispPAC-POWR6AT6 as a serial programming interface. A brief description
26
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
of the ispPAC-POWR6AT6 JTAG interface follows. For complete details of the reference specification, refer to the
publication, Standard Test Access Port and Boundary-Scan Architecture, IEEE Std 1149.1-1990 (which now
includes IEEE Std 1149.1a-1993).
Overview
An IEEE 1149.1 test access port (TAP) provides the control interface for serially accessing the digital I/O of the ispPAC-POWR6AT6. The TAP controller is a state machine driven with mode and clock inputs. Given in the correct
sequence, instructions are shifted into an instruction register, which then determines subsequent data input, data
output, and related operations. Device programming is performed by addressing the configuration register, shifting
data in, and then executing a program configuration instruction, after which the data is transferred to internal
E2CMOS cells. It is these non-volatile cells that store the configuration or the ispPAC-POWR6AT6. A set of instructions are defined that access all data registers and perform other internal control operations. For compatibility
between compliant devices, two data registers are mandated by the IEEE 1149.1 specification. Others are functionally specified, but inclusion is strictly optional. Finally, there are provisions for optional data registers defined by
the manufacturer. The two required registers are the bypass and boundary-scan registers. Figure 25 shows how
the instruction and various data registers are organized in an ispPAC-POWR6AT6.
Figure 25. ispPAC-POWR6AT6 TAP Registers
CFG_DATA REGISTER (56 BITS)
E2CMOS
NON-VOLATILE
MEMORY
MULTIPLEXER
CFG_ADDRESS REGISTER (5 BITS)
UES REGISTER (32 BITS)
IDCODE REGISTER (32 BITS)
BYPASS REGISTER (1 BIT)
INSTRUCTION REGISTER (8 BITS)
TEST ACCESS PORT (TAP)
LOGIC
TDI
TCK
TMS
OUTPUT
LATCH
TDO
TAP Controller Specifics
The TAP is controlled by the Test Clock (TCK) and Test Mode Select (TMS) inputs. These inputs determine whether
an Instruction Register or Data Register operation is performed. Driven by the TCK input, the TAP consists of a
small 16-state controller design. In a given state, the controller responds according to the level on the TMS input as
shown in Figure 26. Test Data In (TDI) and TMS are latched on the rising edge of TCK, with Test Data Out (TDO)
becoming valid on the falling edge of TCK. There are six steady states within the controller: Test-Logic-Reset, RunTest/Idle, Shift-Data-Register, Pause-Data-Register, Shift-Instruction-Register and Pause-Instruction-Register. But
there is only one steady state for the condition when TMS is set high: the Test-Logic-Reset state. This allows a
reset of the test logic within five TCKs or less by keeping the TMS input high. Test-Logic-Reset is the power-on
default state.
27
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Figure 26. TAP States
1
Test-Logic-Rst
0
0
Run-Test/Idle
1
Select-DR-Scan
1
1
0
Capture-DR
Select-IR-Scan
1
0
Capture-IR
0
0
0
Shift-DR
1
1
1
Exit1-IR
0
0
Pause-DR
1
0
Pause-IR
Exit2-IR
1
Update-DR
0
0
1
0
Exit2-DR
1
0
Shift-IR
1
Exit1-DR
0
1
1
Update-IR
1
0
Note: The value shown adjacent to each state transition in this figure
represents the signal present at TMS at the time of a rising edge at TCK.
When the correct logic sequence is applied to the TMS and TCK inputs, the TAP will exit the Test-Logic-Reset state
and move to the desired state. The next state after Test-Logic-Reset is Run-Test/Idle. Until a data or instruction shift
is performed, no action will occur in Run-Test/Idle (steady state = idle). After Run-Test/Idle, either a data or instruction shift is performed. The states of the Data and Instruction Register blocks are identical to each other differing
only in their entry points. When either block is entered, the first action is a capture operation. For the Data Registers, the Capture-DR state is very simple: it captures (parallel loads) data onto the selected serial data path (previously chosen with the appropriate instruction). For the Instruction Register, the Capture-IR state will always load
the IDCODE instruction. It will always enable the ID Register for readout if no other instruction is loaded prior to a
Shift-DR operation. This, in conjunction with mandated bit codes, allows a “blind” interrogation of any device in a
compliant IEEE 1149.1 serial chain. From the Capture state, the TAP transitions to either the Shift or Exit1 state.
Normally the Shift state follows the Capture state so that test data or status information can be shifted out or new
data shifted in. Following the Shift state, the TAP either returns to the Run-Test/Idle state via the Exit1 and Update
states or enters the Pause state via Exit1. The Pause state is used to temporarily suspend the shifting of data
through either the Data or Instruction Register while an external operation is performed. From the Pause state,
shifting can resume by reentering the Shift state via the Exit2 state or be terminated by entering the Run-Test/Idle
state via the Exit2 and Update states. If the proper instruction is shifted in during a Shift-IR operation, the next entry
into Run-Test/Idle initiates the test mode (steady state = test). This is when the device is actually programmed,
erased or verified. All other instructions are executed in the Update state.
Test Instructions
Like data registers, the IEEE 1149.1 standard also mandates the inclusion of certain instructions. It outlines the
function of three required and six optional instructions. Any additional instructions are left exclusively for the manufacturer to determine. The instruction word length is not mandated other than to be a minimum of two bits, with only
the BYPASS and EXTEST instruction code patterns being specifically called out (all ones and all zeroes respectively). The ispPAC-POWR6AT6 contains the required minimum instruction set as well as one from the optional
instruction set. In addition, there are several proprietary instructions that allow the device to be configured and verified. Table 7 lists the instructions supported by the ispPAC-POWR6AT6 JTAG Test Access Port (TAP) controller:
28
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Table 7. ispPAC-POWR6AT6 TAP Instruction Table
Instruction
Command Code
Comments
EXTEST
0000 0000
External Test - Defaults to BYPASS
BULK_ERASE
0000 0011
Bulk erase device
PROGRAM_SECURITY
0000 1001
Program security fuse
DISCHARGE
0001 0100
Fast VPP discharge
PROGRAM_ENABLE
0001 0101
Enable program mode
IDCODE
0001 0110
Read contents of manufacturer ID code (32 bits)
UES_READ
0001 0111
Read contents of UES register from E2CMOS (32 bits)
UES_PROGRAM
0001 1010
Program UES bits into E2CMOS
SAMPLE
0001 1100
Sample/Preload - Defaults to BYPASS
PROGRAM_DISABLE
0001 1110
Disable program mode
RESET
0010 0010
Resets device (refer to reset command via JTAG or I2C section of this data
sheet)
ERASE_DONE_BIT
0010 0100
Erases the DONE bit only
CFG_VERIFY
0010 1000
Verify the configuration data
CFG_ERASE
0010 1001
Erase just the configuration data
CFG_ADDRESS
0010 1011
Select the configuration address register (4 bits)
CFG_DATA_SHIFT
0010 1101
Configuration data shift (56 bits)
CFG_PROGRAM
0010 1110
Program configuration data
PROGRAM_DONE_BIT
0010 1111
Programs the DONE bit
BYPASS
1111 1111
Bypass - Connect TDO to TDI
BYPASS is one of the three required JTAG instructions. It selects the Bypass Register to be connected between
TDI and TDO and allows serial data to be transferred through the device without affecting the operation of the
ispPACPOWR6AT6.
The IEEE 1149.1 standard defines the bit code of this instruction to be all ones (111111). The required SAMPLE/
PRELOAD instruction dictates the Boundary-Scan Register be connected between TDI and TDO. The ispPACPOWR6AT6 has no boundary scan register, so for compatibility it defaults to the BYPASS mode whenever this
instruction is received. The bit code for this instruction is defined by Lattice as shown in Table 7.
The EXTEST (external test) instruction is required and would normally place the device into an external boundary
test mode while also enabling the boundary scan register to be connected between TDI and TDO. Again, since the
ispPAC-POWR6AT6 has no boundary scan logic, the device is put in the BYPASS mode to ensure specification
compatibility. The bit code of this instruction is defined by the 1149.1 standard to be all zeros (000000).
The optional IDCODE (identification code) instruction is incorporated in the ispPAC-POWR6AT6 and leaves it in its
functional mode when executed. It selects the Device Identification Register to be connected between TDI and
TDO. The Identification Register is a 32-bit shift register containing information regarding the IC manufacturer,
device type and version code (Figure 27). Access to the Identification Register is immediately available, via a TAP
data scan operation, after power-up of the device, or by issuing a Test-Logic-Reset instruction. The bit code for this
instruction is defined by Lattice as shown in Table 7.
29
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Figure 27. ispPAC-POWR6AT6 ID Code
MSB
LSB
XXXX / 0000 0001 1000 0000 / 0000 0100 001 / 1
Part Number
(16 bits)
0180h = ispPAC-POWR6AT6
Version
(4 bits)
E 2 Configured
JEDEC Manufacturer
Identity Code for
Lattice Semiconductor
(11 bits)
Constant 1
(1 bit)
per 1149.1-1990
ispPAC-POWR6AT6 Specific Instructions
There are 15 unique instructions specified by Lattice for the ispPAC-POWR6AT6. These instructions are primarily
used to interface to the various user registers and the E2CMOS non-volatile memory. Additional instructions are
used to control or monitor other features of the device. A brief description of each unique instruction is provided in
detail below, and the bit codes are found in Table 7.
BULK_ERASE - This instruction will bulk erase the ispPAC-POWR6AT6. The action occurs at the second rising
edge of TCK in Run-Test-Idle JTAG state. The device must already be in programming mode
(PROGRAM_ENABLE instruction).
PROGRAM_SECURITY - This instruction is used to program the electronic security fuse (ESF) bit. Programming
the ESF bit protects proprietary designs from being read out. The programming occurs at the second rising edge of
the TCK in Run-Test-Idle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE
instruction).
DISCHARGE - This instruction is used to discharge the internal programming supply voltage after an erase or programming cycle and prepares ispPAC-POWR6AT6 for a read cycle.
PROGRAM_ENABLE - This instruction enables the programming mode of the ispPAC-POWR6AT6.
IDCODE - This instruction connects the output of the Identification Code Data Shift (IDCODE) Register to TDO
(Figure 28), to support reading out the identification code.
Figure 28. IDCODE Register
TDO
Bit
31
Bit
30
Bit
29
Bit
28
Bit
27
Bit
4
Bit
3
Bit
2
Bit
1
Bit
0
UES_READ - This instruction both reads the E2CMOS bits in the UES register and places the UES register
between the TDI and TDO pins (as shown in Figure 29), to support programming or reading of the user electronic
signature bits.
Figure 29. UES Register
TDO
Bit
15
Bit
14
Bit
13
Bit
12
Bit
11
Bit
4
Bit
3
Bit
2
Bit
1
Bit
0
UES_PROG - This instruction will program the content of the UES Register into the UES E2CMOS memory. The
device must already be in programming mode (PROGRAM_ ENABLE instruction).
PROGRAM_DISABLE - This instruction disables the programming mode of the ispPAC-POWR6A6. The TestLogic-Reset JTAG state can also be used to cancel the programming mode of the ispPAC-POWR6A6.
30
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
RESET - This command resets the ispPAC-POWR6AT6 to a condition near that of the power-on reset state (refer to
reset command via JTAG or I2C section of this data sheet for more details and known exceptions).
ERASE_DONE_BIT - This instruction erases the ispPAC-POWR6A6 DONE bit.
CFG_VERIFY - This instruction is used to verify the contents of the selected configuration array column. This specific column is preselected by using CFG_ADDRESS instruction.
CFG_ERASE - This instruction will bulk erase the configuration array. The action occurs at the second rising edge
of TCK in Run-Test-Idle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE
instruction).
CFG_ADDRESS - This instruction is used to set the address of the configuration array for subsequent program or
read operations.
CFG_DATA_SHIFT - This instruction is used to shift data into the configuration register prior to programming or
reading.
CFG_PROGRAM - This instruction programs the selected configuration array column. This specific column is preselected by using CFG_ADDRESS instruction. The programming occurs at the second rising edge of the TCK in
Run-Test-Idle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE instruction).
PROGRAM_DONE_BIT - This instruction programs the ispPAC-POWR6A6 DONE bit.
Note: Before any of the above programming instructions are executed, the respective E2CMOS bits need to be
erased using the corresponding erase instruction
31
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Package Diagram
32-Pin QFN
Dimensions in millimeters
2X
0.25 C
A
4
5.00
A
b
4.75
0.10
M
C A B
D2
PIN #1 ID FIDUCIAL
LOCATED IN THIS AREA
2X
0.25 C
N
N
B
1
3
1
PIN 1 ID
4.75
E2
5.00
L
0.20 C
32X
B
2X
e
B
3
TOP VIEW
0.20 C
A
3.5
2X
4X
0
BOTTOM VIEW
A2
A
5
C
0.08 C
SIDE VIEW
A3
A1
SEATING
PLANE
Note: If soldered to the circuit board for thermal considerations, insure the thermal pad is connected electrically to ground. Otherwise,
the thermal pad should not be connected electrically (must be left "floating").
For important information on the preferred mounting of QFN packages, refer to the following application note at:
http://www.amkor.com/products/notes_papers/MLFAppNote.pdf.
SYMBOL
NOTES: UNLESS OTHERWISE SPECIFIED
2.
DIMENSIONS AND TOLERANCES
PER ANSI Y14.5M.
4
5
MAX.
0.85
1.00
A1
0.00
0.01
0.05
A2
0.00
0.65
1.00
ALL DIMENSIONS ARE IN MILLIMETERS.
0.20 REF
A3
3
NOM.
-
A
1.
MIN.
EXACT SHAPE AND SIZE OF THIS
FEATURE IS OPTIONAL.
D2
1.25
E2
1.25
2.70
3.25
2.70
3.25
DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.20 AND 0.25 mm FROM TERMINAL TIP.
b
0.18
0.24
0.30
APPLIES TO EXPOSED PORTION OF TERMINALS.
L
0.30
0.40
0.50
0
-
e
32
0.50 BSC
-
12
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
Part Number Description
ispPAC-POWR6AT6 - 01XX32X
Device Family
Operating Temperature Range
I = Industrial (-40oC to +85oC)
Device Number
Package
N = 32-pin QFN
NN = Lead-Free 32-pin QFN*
Performance Grade
01 = Standard
*Contact factory for package availability.
Ordering Information
Conventional Packaging
Part Number
ispPAC-POWR6AT6-01N32I
Package
Pins
QFN
32
Package
Pins
QFN
32
Lead-Free Packaging
Part Number
ispPAC-POWR6AT6-01NN32I
33
Lattice Semiconductor
ispPAC-POWR6AT6 Data Sheet
GND
TRIM1
TRIM2
TRIM3
TRIM4
TRIM5
TRIM6
VMON6
Package Options
32
31
30
29
28
27
26
25
TDO
1
24 VMON6GS
VCCJ
2
23 VMON5
TCK
3
22 VMON5GS
TDI
4
21 VMON4
ispPAC-POWR6AT6
32-Pin QFN
20 VMON4GS
VPS1
8
17 VMON2
9
10
11
12
13
14
15
16
VMON2GS
18 VMON3GS
VMON1
7
VMON1GS
VPS0
VCCA
19 VMON3
VCCD
6
SDA
CLTENb
SCL
5
CLTLOCK/SMBA
TMS
34