FAIRCHILD FDB039N06_12

FDB039N06
N-Channel PowerTrench® MOSFET
60V, 174A, 3.9mΩ
Features
General Description
• RDS(on) = 2.95mΩ ( Typ.) @ VGS = 10V, ID = 75A
This N-Channel MOSFET is produced using Fairchild
Semiconductor’s advanced PowerTrench process that has been
especially tailored to minimize the on-state resistance and yet
maintain superior switching performance.
• Fast Switching Speed
• Low Gate Charge
• High Performance Trench Technology for Extremely Low
RDS(on)
Application
• High Power and Current Handling Capability
• DC to DC convertors / Synchronous Rectification
• RoHS Compliant
D
D
G
G
S
S
MOSFET Maximum Ratings TC = 25oC unless otherwise noted
Symbol
VDSS
Drain to Source Voltage
VGSS
Gate to Source Voltage
ID
Parameter
Drain Current
IDM
Drain Current
EAS
Single Pulsed Avalanche Energy
dv/dt
Peak Diode Recovery dv/dt
Units
V
±20
V
-Continuous (TC = 25oC, Silicion Limited)
174*
-Continuous (TC = 100oC, Silicion Limited)
123*
-Continuous (TC = 25oC, Package Limited)
120
- Pulsed
(Note 1)
696
A
(Note 2)
872
mJ
7.0
V/ns
(Note 3)
A
(TC = 25oC)
231
W
- Derate above 25oC
1.54
W/oC
PD
Power Dissipation
TJ, TSTG
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
TL
Ratings
60
-55 to +175
o
C
300
o
C
*Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 120A.
Thermal Characteristics
Symbol
RθJC
RθJA
Parameter
Ratings
Thermal Resistance, Junction to Case
Thermal Resistance, Junction to Ambient (minimum pad of 2 oz copper)
2
Thermal Resistance, Junction to Ambient (1 in pad of 2 oz copper)
©2012 Fairchild Semiconductor Corporation
FDB039N06 Rev. C0
Units
0.65
1
62.5
o
C/W
40
www.fairchildsemi.com
FDB039N06 N-Channel PowerTrench® MOSFET
May 2012
Device Marking
FDB039N06
Device
FDB039N06
Package
TO-263
Reel Size
Tube
Tape Width
-
Quantity
50
Electrical Characteristics TC = 25oC unless otherwise noted
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Units
Off Characteristics
BVDSS
ΔBVDSS
ΔTJ
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
ID = 250μA, VGS = 0V, TC= 25oC
60
-
-
V
ID = 250μA, Referenced to 25oC
-
0.04
-
V/oC
IDSS
Zero Gate Voltage Drain Current
VDS = 60V, VGS = 0V
-
-
1
VDS = 60V, VGS = 0V, TC = 150oC
-
-
500
μA
IGSS
Gate to Body Leakage Current
VGS = ±20V, VDS = 0V
-
-
±100
nA
On Characteristics
VGS(th)
RDS(on)
Gate Threshold Voltage
VGS = VDS, ID = 250μA
2.5
3.5
4.5
V
Static Drain to Source On Resistance
VGS = 10V, ID = 75A
-
2.95
3.9
mΩ
gFS
Forward Transconductance
VDS = 10V, ID = 75A
-
169
-
S
VDS = 25V, VGS = 0V
f = 1MHz
-
6190
8235
pF
-
900
1195
pF
-
385
580
pF
-
102
133
nC
-
32
-
nC
-
32
-
nC
-
30
70
ns
-
40
90
ns
-
55
120
ns
-
24
58
ns
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Qg(tot)
Total Gate Charge at 10V
Qgs
Gate to Source Gate Charge
Qgd
Gate to Drain “Miller” Charge
VDS = 48V, ID = 75A
VGS = 10V
(Note 4)
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
VDD = 30V, ID = 75A
VGS = 10V, RGEN = 4.7Ω
(Note 4)
Drain-Source Diode Characteristics
IS
Maximum Continuous Drain to Source Diode Forward Current
-
-
174
A
ISM
Maximum Pulsed Drain to Source Diode Forward Current
-
-
696
A
VSD
Drain to Source Diode Forward Voltage
VGS = 0V, ISD = 75A
-
-
1.3
V
trr
Reverse Recovery Time
-
41
-
ns
Qrr
Reverse Recovery Charge
VGS = 0V, ISD = 75A
dIF/dt = 100A/μs
-
47
-
nC
Notes:
1: Repetitive Rating: Pulse width limited by maximum junction temperature
2: L = 0.31mH, IAS = 75A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C
3: ISD ≤ 75A, di/dt ≤ 200A/μs, VDD ≤ BVDSS, Starting TJ = 25°C
4: Essentially Independent of Operating Temperature Typical Characteristics
FDB039N06 Rev. C0
2
www.fairchildsemi.com
FDB039N06 N-Channel PowerTrench® MOSFET
Package Marking and Ordering Information
Figure 1. On-Region Characteristics
VGS = 15.0V
10.0V
8.0 V
7.0 V
6.5 V
6.0 V
5.5 V
*Notes:
1. VDS = 10V
2. 250μs Pulse Test
ID,Drain Current[A]
100
ID,Drain Current[A]
Figure 2. Transfer Characteristics
1000
1000
10
100
o
175 C
o
25 C
10
1
o
-55 C
*Notes:
1. 250μs Pulse Test
o
2. TC = 25 C
0.1
0.01
1
2
6
0.1
1
VDS,Drain-Source Voltage[V]
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
4
5
6
7
VGS,Gate-Source Voltage[V]
1000
IS, Reverse Drain Current [A]
3.2
VGS = 10V
2.8
VGS = 20V
o
175 C
100
o
25 C
10
*Notes:
1. VGS = 0V
o
2. 250μs Pulse Test
*Note: TC = 25 C
2.4
0
60
120
180
240
ID, Drain Current [A]
300
1
0.2
360
Figure 5. Capacitance Characteristics
1.2
10
VGS, Gate-Source Voltage [V]
Ciss
1000
Coss
*Note:
1. VGS = 0V
2. f = 1MHz
Crss
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
100
0.1
FDB039N06 Rev. C0
0.4
0.6
0.8
1.0
VSD, Body Diode Forward Voltage [V]
Figure 6. Gate Charge Characteristics
10000
Capacitances [pF]
8
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
3.6
RDS(ON) [mΩ],
Drain-Source On-Resistance
3
VDS = 12V
VDS = 30V
VDS = 48V
8
6
4
2
*Note: ID = 75A
0
1
10
VDS, Drain-Source Voltage [V]
0
30
3
20
40
60
80
100
Qg, Total Gate Charge [nC]
120
www.fairchildsemi.com
FDB039N06 N-Channel PowerTrench® MOSFET
Typical Performance Characteristics
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
2.4
RDS(on), [Normalized]
Drain-Source On-Resistance
BVDSS, [Normalized]
Drain-Source Breakdown Voltage
1.2
1.1
1.0
0.9
*Notes:
1. VGS = 0V
2. ID = 10mA
0.8
-80
-40
0
40
80
120 160
o
TJ, Junction Temperature [ C]
1.2
0.8
*Notes:
1. VGS = 10V
2. ID = 75A
-25
25
75
125
175
o
TJ, Junction Temperature [ C]
225
Figure 10. Maximum Drain Current
vs. Case Temperature
200
1000
100μs
160
100
ID, Drain Current [A]
ID, Drain Current [A]
1.6
0.4
-75
200
Figure 9. Maximum Safe Operating Area
1ms
10
2.0
10ms
100ms
Operation in This Area
is Limited by R DS(on)
1s
SINGLE PULSE
o
1
TC = 25 C
120
Limited by package
80
40
o
TJ = 175 C
o
RθJC = 0.65 C/W
0.1
0.1
1
10
VDS, Drain-Source Voltage [V]
0
25
100
50
75
100
125
150
o
TC, Case Temperature [ C]
175
Figure 11. Transient Thermal Response Curve
Thermal Response [ZθJC]
1
0.5
0.1
0.2
0.1
t1
0.02
0.01
t2
0.01
*Notes:
Single pulse
o
1. ZθJC(t) = 0.65 C/W Max.
2. Duty Factor, D= t1/t2
3. TJM - TC = PDM * ZθJC(t)
0.001
-5
10
FDB039N06 Rev. C0
PDM
0.05
-4
10
-3
-2
-1
10
10
10
Rectangular Pulse Duration [sec]
4
1
10
www.fairchildsemi.com
FDB039N06 N-Channel PowerTrench® MOSFET
Typical Performance Characteristics (Continued)
FDB039N06 N-Channel PowerTrench® MOSFET
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
FDB039N06 Rev. C0
5
www.fairchildsemi.com
FDB039N06 N-Channel PowerTrench® MOSFET
Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
+
VDS
_
I SD
L
Driver
RG
VGS
VGS
( Driver )
Same Type
as DUT
VDD
• dv/dt controlled by RG
• ISD controlled by pulse period
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
I SD
( DUT )
di/dt
IRM
Body Diode Reverse Current
VDS
( DUT )
Body Diode Recovery dv/dt
VDD
VSD
Body Diode
Forward Voltage Drop
FDB039N06 Rev. C0
6
www.fairchildsemi.com
FDB039N06 N-Channel PowerTrench® MOSFET
Mechanical Dimensions
D2PAK
Dimensions in Millimeters
FDB039N06 Rev. C0
7
www.fairchildsemi.com
tm
tm
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY
PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY
THEREIN, WHICH COVERS THESE PRODUCTS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE
EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used here in:
1. Life support devices or systems are devices or systems which, (a) are
intended for surgical implant into the body or (b) support or sustain life,
and (c) whose failure to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably
expected to result in a significant injury of the user.
2.
A critical component in any component of a life support, device, or
system whose failure to perform can be reasonably expected to cause
the failure of the life support device or system, or to affect its safety or
effectiveness.
ANTI-COUNTERFEITING POLICY
Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website,
www.Fairchildsemi.com, under Sales Support.
Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of their
parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed
application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the
proliferation of counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild
Distributors who are listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild
Distributors are genuine parts, have full traceability, meet Fairchild’s quality standards for handing and storage and provide access to Fairchild’s full range of
up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and
warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is
committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative / In Design
Datasheet contains the design specifications for product development. Specifications
may change in any manner without notice.
Preliminary
First Production
Datasheet contains preliminary data; supplementary data will be published at a later
date. Fairchild Semiconductor reserves the right to make changes at any time without
notice to improve design.
No Identification Needed
Full Production
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve the design.
Obsolete
Not In Production
Datasheet contains specifications on a product that is discontinued by Fairchild
Semiconductor. The datasheet is for reference information only.
Rev. I61
FDB039N06 Rev. C0
8
www.fairchildsemi.com
FDB039N06 N-Channel PowerTrench® MOSFET
TRADEMARKS
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not
intended to be an exhaustive list of all such trademarks.
The Power Franchise®
F-PFS™
2Cool™
PowerTrench®
®
FRFET®
PowerXS™
AccuPower™
Global Power ResourceSM
Programmable Active Droop™
AX-CAP™*
®
®
Green Bridge™
QFET
BitSiC
TinyBoost™
Build it Now™
QS™
Green FPS™
TinyBuck™
CorePLUS™
Quiet Series™
Green FPS™ e-Series™
TinyCalc™
CorePOWER™
RapidConfigure™
Gmax™
TinyLogic®
CROSSVOLT™
GTO™
™
TINYOPTO™
CTL™
IntelliMAX™
TinyPower™
Current Transfer Logic™
ISOPLANAR™
Saving our world, 1mW/W/kW at a time™
TinyPWM™
DEUXPEED®
Marking Small Speakers Sound Louder SignalWise™
TinyWire™
Dual Cool™
and Better™
SmartMax™
TranSiC®
EcoSPARK®
MegaBuck™
SMART START™
TriFault Detect™
EfficentMax™
MICROCOUPLER™
Solutions for Your Success™
TRUECURRENT®*
ESBC™
MicroFET™
SPM®
μSerDes™
STEALTH™
MicroPak™
®
SuperFET®
MicroPak2™
SuperSOT™-3
MillerDrive™
Fairchild®
UHC®
SuperSOT™-6
MotionMax™
Fairchild Semiconductor®
Ultra FRFET™
SuperSOT™-8
Motion-SPM™
FACT Quiet Series™
UniFET™
SupreMOS®
mWSaver™
FACT®
VCX™
SyncFET™
OptoHiT™
FAST®
VisualMax™
Sync-Lock™
OPTOLOGIC®
FastvCore™
VoltagePlus™
OPTOPLANAR®
®*
FETBench™
XS™
FlashWriter® *
®
FPS™