ONSEMI MMSD301T1

ON Semiconductor
MMSD301T1
MMSD701T1
SOD-123 Schottky
Barrier Diodes
The MMSD301T1, and MMSD701T1 devices are spin–offs of our
popular MMBD301LT1, and MMBD701LT1 SOT–23 devices. They
are designed for high–efficiency UHF and VHF detector applications.
Readily available to many other fast switching RF and digital
applications.
• Extremely Low Minority Carrier Lifetime
• Very Low Capacitance
• Low Reverse Leakage
ON Semiconductor Preferred Devices
2
1
CASE 425–04, STYLE 1
SOD–123
MAXIMUM RATINGS
Rating
Symbol
Value
Unit
VR
30
70
Vdc
Forward Power Dissipation
TA = 25°C
PF
225
mW
Junction Temperature
TJ
–55 to +125
°C
Tstg
–55 to +150
°C
Reverse Voltage
MMSD301T1
MMSD701T1
Storage Temperature Range
1
Cathode
2
Anode
DEVICE MARKING
MMSD301T1 = XT, MMSD701T1 = XH
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Characteristic
Reverse Breakdown Voltage
(IR = 10 µA)
Diode Capacitance
(VR = 0, f = 1.0 MHz, Note 1)
Symbol
Typ
Max
30
70
—
—
—
—
—
—
0.9
0.5
1.5
1.0
—
—
0.9
0.5
1.5
1.0
—
—
13
9.0
200
200
—
—
—
—
0.38
0.52
0.42
0.7
0.45
0.6
0.5
1.0
V(BR)R
MMSD301T1
MMSD701T1
MMSD301T1
MMSD701T1
Reverse Leakage
(VR = 25 V)
(VR = 35 V)
MMSD301T1
MMSD701T1
Unit
Volts
CT
MMSD301T1
MMSD701T1
Total Capacitance
(VR = 15 Volts, f = 1.0 MHz)
(VR = 20 Volts, f = 1.0 MHz)
Forward Voltage
(IF = 1.0 mAdc)
(IF = 10 mA)
(IF = 1.0 mAdc)
(IF = 10 mA)
Min
pF
CT
pF
IR
VF
MMSD301T1
MMSD701T1
nAdc
nAdc
Vdc
Preferred devices are ON Semiconductor recommended choices for future use and best overall value.
 Semiconductor Components Industries, LLC, 2001
September, 2001 – Rev. 2
1
Publication Order Number:
MMSD301T1/D
MMSD301T1 MMSD701T1
TYPICAL CHARACTERISTICS
MMSD301T1
MMSD301T1
2.4
500
, MINORITY CARRIER LIFETIME (ps)
CT, TOTAL CAPACITANCE (pF)
2.8
f = 1.0 MHz
2.0
1.6
1.2
0.8
0.4
0
0
3.0
6.0
9.0
12
15
18
21
VR, REVERSE VOLTAGE (VOLTS)
24
27
MMSD301T1
400
KRAKAUER METHOD
300
200
100
0
30
0
Figure 1. Total Capacitance
100
TA = 100°C
TA = 75°C
0
6.0
12
18
VR, REVERSE VOLTAGE (VOLTS)
40
60
30
50
70
IF, FORWARD CURRENT (mA)
80
90
100
MMSD301T1
TA = -40°C
10
TA = 85°C
1.0
TA = 25°C
0.01
0.001
IF, FORWARD CURRENT (mA)
IR, REVERSE LEAKAGE ( A)
MMSD301T1
0.1
20
Figure 2. Minority Carrier Lifetime
10
1.0
10
24
0.1
30
TA = 25°C
0.2
Figure 3. Reverse Leakage
0.4
0.6
0.8
VF, FORWARD VOLTAGE (VOLTS)
Figure 4. Forward Voltage
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2
1.0
1.2
MMSD301T1 MMSD701T1
TYPICAL CHARACTERISTICS
MMSD701T1
MMSD701T1
1.6
500
, MINORITY CARRIER LIFETIME (ps)
CT, TOTAL CAPACITANCE (pF)
2.0
f = 1.0 MHz
1.2
0.8
0.4
0
0
5.0
10
15
20
25
30
35
VR, REVERSE VOLTAGE (VOLTS)
40
45
MMSD701T1
400
KRAKAUER METHOD
300
200
100
0
50
0
10
Figure 5. Total Capacitance
100
MMSD701T1
TA = 100°C
1.0
TA = 75°C
0.1
80
90
100
Figure 6. Minority Carrier Lifetime
IF, FORWARD CURRENT (mA)
IR, REVERSE LEAKAGE ( A)
10
30
50
70
40
60
IF, FORWARD CURRENT (mA)
20
MMSD701T1
10
TA = 85°C
TA = -40°C
1.0
0.01
0.001
TA = 25°C
0
10
20
30
VR, REVERSE VOLTAGE (VOLTS)
40
0.1
50
Figure 7. Reverse Leakage
TA = 25°C
0.2
0.4
0.8
1.2
VF, FORWARD VOLTAGE (VOLTS)
Figure 8. Forward Voltage
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1.6
2.0
MMSD301T1 MMSD701T1
INFORMATION FOR USING THE SOD–123 SURFACE MOUNT PACKAGE
MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the
total design. The footprint for the semiconductor packages
must be the correct size to insure proper solder connection
interface between the board and the package. With the
correct pad geometry, the packages will self align when
subjected to a solder reflow process.
0.91
0.036
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
2.36
0.093
4.19
0.165
1.22
0.048
mm
inches
SOD–123
SOD–123 POWER DISSIPATION
SOLDERING PRECAUTIONS
The power dissipation of the SOD–123 is a function of
the pad size. This can vary from the minimum pad size for
soldering to a pad size given for maximum power dissipation. Power dissipation for a surface mount device is determined by TJ(max), the maximum rated junction temperature
of the die, RθJA, the thermal resistance from the device
junction to ambient, and the operating temperature, TA.
Using the values provided on the data sheet for the
SOD–123 package, PD can be calculated as follows:
PD =
The melting temperature of solder is higher than the
rated temperature of the device. When the entire device is
heated to a high temperature, failure to complete soldering
within a short time could result in device failure. Therefore, the following items should always be observed in
order to minimize the thermal stress to which the devices
are subjected.
• Always preheat the device.
• The delta temperature between the preheat and
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C.
• The soldering temperature and time shall not exceed
260°C for more than 10 seconds.
• When shifting from preheating to soldering, the
maximum temperature gradient shall be 5°C or less.
• After soldering has been completed, the device should
be allowed to cool naturally for at least three minutes.
Gradual cooling should be used as the use of forced
cooling will increase the temperature gradient and
result in latent failure due to mechanical stress.
• Mechanical stress or shock should not be applied
during cooling.
* Soldering a device without preheating can cause excessive thermal shock and stress which can result in damage
to the device.
TJ(max) – TA
RθJA
The values for the equation are found in the maximum
ratings table on the data sheet. Substituting these values
into the equation for an ambient temperature TA of 25°C,
one can calculate the power dissipation of the device which
in this case is 225 milliwatts.
PD =
150°C – 25°C
556°C/W
= 225 milliwatts
The 556°C/W for the SOD–123 package assumes the use
of the recommended footprint on a glass epoxy printed
circuit board to achieve a power dissipation of 225 milliwatts. There are other alternatives to achieving higher
power dissipation from the SOD–123 package. Another
alternative would be to use a ceramic substrate or an
aluminum core board such as Thermal Clad. Using a
board material such as Thermal Clad, an aluminum core
board, the power dissipation can be doubled using the same
footprint.
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MMSD301T1 MMSD701T1
PACKAGE DIMENSIONS
SOD–123
CASE 425–04
ISSUE C
A
ÂÂÂ
ÂÂÂ
C
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
H
1
K
DIM
A
B
C
D
E
H
J
K
B
E
2
D
J
STYLE 1:
PIN 1. CATHODE
2. ANODE
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5
INCHES
MIN
MAX
0.055
0.071
0.100
0.112
0.037
0.053
0.020
0.028
0.01
--0.000
0.004
--0.006
0.140
0.152
MILLIMETERS
MIN
MAX
1.40
1.80
2.55
2.85
0.95
1.35
0.50
0.70
0.25
--0.00
0.10
--0.15
3.55
3.85
MMSD301T1 MMSD701T1
Notes
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MMSD301T1 MMSD701T1
Notes
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MMSD301T1 MMSD701T1
Thermal Clad is a trademark of the Bergquist Company.
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes
without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular
purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability,
including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be
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alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer.
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MMSD301T1/D