FAIRCHILD KST5551MTF

KST5551
KST5551
Amplifier Transistor
• Collector-Emitter Voltage: VCEO=160V
• Collector Power Dissipation: PC (max)=350mW
3
2
1
SOT-23
Mark: G1
1. Base 2. Emitter 3. Collector
NPN Epitaxial Silicon Transistor
Absolute Maximum Ratings Ta=25°C unless otherwise noted
Symbol
VCBO
Collector-Base Voltage
Parameter
VCEO
Collector-Emitter Voltage
VEBO
Emitter-Base Voltage
IC
Value
180
Units
V
160
V
6
V
Collector Current
600
mA
PC
Collector Power Dissipation
350
mW
TJ
Junction Temperature
150
°C
TSTG
Storage Temperature
-55 ~ 150
°C
• Refer to 2N5551 for graphs
Electrical Characteristics Ta=25°C unless otherwise noted
Symbol
BVCBO
Parameter
Collector-Base Breakdown Voltage
Test Condition
IC=100µA, IE=0
Min.
180
Max.
Units
V
BVCEO
Collector-Emitter Breakdown Voltage
IC=1mA, IB=0
160
V
BVEBO
Emitter-Base Breakdown Voltage
IE=10µA, IC=0
6
V
ICBO
Collector Cut-off Current
VCB=120V, IE=0
50
nA
IEBO
Emitter Cut-off Current
VEB=4V, IC=0
50
nA
hFE
DC Current Gain
VCE=5V, IC=1mA
VCE=5V, IC=10mA
VCE=5V, IC=50mA
80
80
30
250
VCE (sat)
Collector-Emitter Saturation Voltage
IC=10mA, IB=1mA
IC=50mA, IB=5mA
0.15
0.2
V
V
VBE (sat)
Base-Emitter Saturation Voltage
IC=10mA, IB=1mA
IC=50mA, IB=5mA
1
1
V
V
fT
Current Gain Bandwidth Product
VCE=10V, IC=10mA,
f=100MHz
300
MHz
100
Cob
Output Capacitance
VCB=10V, IE=0, f=1MHz
6
pF
NF
Noise Figure
VCE=5V, IC=250µA, RS=1KΩ,
f=10Hz to 15.7KMz
8
dB
* Pulse Test: Pulse Width=300µs, Duty Cycle=2%
©2003 Fairchild Semiconductor Corporation
Rev. B2, February 2003
KST5551
Package Dimensions
±0.10
±0.10
2.40
0.40 ±0.03
1.30
0.45~0.60
0.20 MIN
SOT-23
0.03~0.10
0.38 REF
0.40 ±0.03
+0.05
0.12 –0.023
0.96~1.14
0.97REF
2.90 ±0.10
0.95 ±0.03 0.95 ±0.03
1.90 ±0.03
0.508REF
Dimensions in Millimeters
©2003 Fairchild Semiconductor Corporation
Rev. B2, February 2003
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR
CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body,
or (b) support or sustain life, or (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
2. A critical component is any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or In
Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
©2003 Fairchild Semiconductor Corporation
Rev. I2