IRCTT CMH

Thick Film High Voltage/
High Reliability MIL-Approved
Metal Glaze™ Resistors
Diamond spiraled
thick film element
CMH Series
•
•
•
•
•
Heat conducting
ceramic substrate
1/4 watt to 5 watt
TCR of ±100 ppm/°C
Qualified to MIL-R-49462
330K ohm to 1G ohm range
±1%, ±2%, or ±5% tolerance
Epoxy coated body
High conductivity plated on
nickel termination
All welded cap and lead construction
Tin Lead electroplated leads
Electrical Data
IRC Type
MIL
Type³
Power
Rating @
70°C (watts)¹
Voltage
Rating
(volts)²
Resistance Range
(ohms)4
CMH - 1/4
RHV30
1/4
750
330K - 100M
CMH - 1/2
RHV31
1/2
1,500
330K - 392M
CMH - 1
RHV32
1
3,000
330K - 499M
CMH - 2
RHV33
2
5,000
330K - 499M
CMH - 3
RHV34
3
10,000
330K - 1000M
CMH - 5
RHV35
5
20,000
330K - 1000M
Tolerance
(±%)
Maximum
TCR
(±ppm/°C)4
VCR (ppm/V)
1, 2, 5
100
0 to -5
Notes:
1. For power rating above 70C, see derating curve.
2. Voltage rating shown is the rated DC continuous working voltage or the sine-wave RMS absolute maximum voltage at commercial line frequency.
3. Marked per MIL-R-49462
4. Values greater than 100 meg and less than 500 meg, ±200ppm; values greater than or equal to 500 meg, ±500ppm.
Environmental Data
Maximum ∆R
(±3σ)
Typical ∆R
Thermal Shock
±0.25%
±0.10%
Solder Effect
±0.15%
±0.05%
Terminal Strength
±0.20%
±0.10%
Moisture Resistance
±0.50%
±0.20%
Load Life (1000 Hours at 25°C)
±1.00%
±0.25%
Shelf Life (1 year at 25°C)
±0.10%
±0.03%
Low-Temperature Operation
±0.15%
±0.05%
Shock
±0.35%
±0.10%
Vibration
±0.35%
±0.10%
Test Condition*
Dielectric Strength
Insulation Resistance at 500 VDC
±0.15%
±0.05%
±109Ω min
5 x 1012Ω typ
Notes:
*Test per MIL-R-49462 and MIL-STD-202
General Note
IRC reserves the right to make changes in product specification without notice or liability.
All information is subject to IRC’s own data and is considered accurate at time of going to print.
Wire and Film Technologies Division • 4222 South Staples Street • Corpus Christi Texas 78411 USA
Telephone: 361 992 7900 • Facsimile: 361 992 3377 • Website: www.irctt.com
A subsidiary of
TT electronics plc
CMH Series Issue September 2008 Sheet 1 of 3
Thick Film High Voltage/
High Reliability MIL-Approved
Metal Glaze™ Resistors
IRC Advanced Film Division
Physical Data
1.50 ± 0.125
(38.1 ± 3.2)
BL
0.032 (0.81) DIA.*
BD
CL
*CMH 1/4 leads are
0.025 (0.64) in diameter
Dimensions (Inches and (mm))
Body Length - BL
Body Diameter - BD
Clean Lead to Clean Lead - CL
CMH - 1/4
0.275 ± 0.031 (6.98 ± 0.79)
0.088 ± 0.010 (2.22 ± 0.25)
0.400 (10.16)
CMH - 1/2
0.400 ± 0.031 (10.16 ± 0.79)
0.138 ± 0.016 (3.51 ± 0.41)
0.525 (13.34)
CMH - 1
0.690 ± 0.062 (17.53 ± 1.57)
0.297 ± 0.031 (7.54 ± 0.79)
0.900 (22.86)
CMH - 2
1.062 ± 0.062 (26.97 ± 1.57)
0.297 ± 0.031 (7.54 ± 0.79)
1.250 (31.75)
CMH - 3
2.062 ± 0.062 (52.37 ± 1.57)
0.297 ± 0.031 (7.54 ± 0.79)
2.250 (57.15)
CMH - 5
3.062 ± 0.062 (77.77 ± 1.57)
0.297 ± 0.031 (7.54 ± 0.79)
3.250 (82.55)
IRC Type
Temperature Rise Chart
100
100
90
90
80
80
% of Rated Power
% of Rated Power
Power Derating Curve
70
60
50
40
30
140
160
180
Ambient Temperature (°C)
Wire and Film Technologies Division • 4222 South Staples Street • Corpus Christi Texas 78411 USA
Telephone: 361 992 7900 • Facsimile: 361 992 3377 • Website: www.irctt.com
CMH 1
40
30
10
120
CMH 5
50
20
100
CMH 1/2
60
10
80
CMH 2-3
70
20
0
CMH 1/4
0
0
10
20
30
40
50
60
70
80
90
Temperature Rise (°C)
CMH Series Issue September 2008 Sheet 2 of 3
Thick Film High Voltage/
High Reliability MIL-Approved
Metal Glaze™ Resistors
IRC Advanced Film Division
Ordering Data
Sample Part No.
CMH 3 - 100 - 2206 - F
IRC Type
CMH 1/4, CMH 1/2, CMH 1, CMH 2, CMH 3, CMH 5
Temperature Coefficient
±100 ppm/°C
Resistance
(≥100Ω - First 3 significant digits plus 4th digit multiplier)
Example: 100Ω = 1000; 1000Ω = 1001, 150,000Ω = 1503
(>100Ω - "R" is used to designate decimal)
Example: 51Ω = 51R0; 1Ω = 1R00; 0.25Ω = R250
Tolerance
F = ±1%
G = ±2%
J = ±5%
Wire and Film Technologies Division • 4222 South Staples Street • Corpus Christi Texas 78411 USA
Telephone: 361 992 7900 • Facsimile: 361 992 3377 • Website: www.irctt.com
CMH Series Issue September 2008 Sheet 3 of 3