CENTRAL CPD71

PROCESS
CPD71
Central
Low Leakage Diode
TM
Semiconductor Corp.
Low Leakage Switching Diode Chip
PROCESS DETAILS
Process
EPITAXIAL PLANAR
Die Size
11 x 11 MILS
Die Thickness
11 MILS
Anode Bonding Pad Area
3.3 x 3.3 MILS
Top Side Metalization
Al - 15,000Å
Back Side Metalization
Au - 18,000Å
GEOMETRY
GROSS DIE PER 4 INCH WAFER
94,130
PRINCIPAL DEVICE TYPES
CMPD6001
BACKSIDE CATHODE
145 Adams Avenue
Hauppauge, NY 11788 USA
Tel: (631) 435-1110
Fax: (631) 435-1824
www.centralsemi.com
R1 (1-August 2002)
Central
TM
Semiconductor Corp.
145 Adams Avenue
Hauppauge, NY 11788 USA
Tel: (631) 435-1110
Fax: (631) 435-1824
www.centralsemi.com
PROCESS
CPD71
Typical Electrical Characteristics
R1 (1-August 2002)