ee Fr ad HS t e L Ro plian m Co S33xx Model 8 Pin Dip, 3.3V, HCMOS Frequency Range: Frequency Stability: Temperature Range: Operating: (Option) Storage: Input Voltage: Input Current: Output: Symmetry: Rise/Fall Time: Logic: Clock Oscillator 1.544MHz to 125MHz ±10ppm to ±100ppm Load: Start-Up Time: Jitter: 12KHz~20MHz 0°C to 70°C -40°C to 85°C -55°C to 120°C 3.3V ± 0.3V 40mA Max HCMOS 45/55% Max @ 50% Vdd 4ns Typ, 6ns Max "0" = 10% Vdd Max "1" = 90% Vdd Min 30pF Max 10mSec Max 0.5ps Typ, 1ps Max RMS Aging: <3ppm 1st/yr, 1ppm every year thereafter Pin 8 OUT pin 5 pin 8 Vdd PWR Supply OUT .450 (11.43) Pin 4 .300 (7.62) .260 (6.60) mA M .520 (13.21) .450 (11.43) .520 (13.21) Pin 1 .200 (5.08) .300 (7.62) Designed to meet today's requirements for low jitter applications. The oscillator utilizes fundamental and 3rd overtone crystal technology. No multiplier is used thereby reducing output jitter. Pin 5 CRYSTEK P/N Frequency DC Crystek Part Number Guide Example: S3392-44.736 Example: SE3392-44.736 O/P Load incl Probe Cl OSC. VM GND pin 1 pin 4 High Impedance GND or "LOW" Oscillation OPEN or "HIGH" Tri-State Function Function pin 1 Output pin Open "1" level 2.4V Min "0" level 0.4V Max Active Active High Z Temperature Frequency Stability 0/ 70°C -40/ 85°C S3390 S3392 S3391 S3398 S3397 SE3390 SE3392 SE3391 NA NA Mechanical: Shock: Solderability: Vibration: Solvent Resistance: Resistance to Soldering Heat: Environmental: Thermal Shock: Moisture Resistance: Gross Leak Test: Fine Leak Test: +/- 100ppm +/- 50ppm +/- 25ppm +/- 20ppm +/- 10ppm MIL-STD-883, MIL-STD-883, MIL-STD-883, MIL-STD-202, MIL-STD-202, Method 2002, Condition B Method 2003 Method 2007, Condition A Method 215 Method 210, Condition A,B or C MIL-STD-883, MIL-STD-883, MIL-STD-883, MIL-STD-883, Method Method Method Method Specifications subject to change without notice. 1011, Condition A 1004 1014, Condition A 1014, Condition A2 TD-02065 Rev.C