FREESCALE MRF6V10250HSR3

Freescale Semiconductor
Technical Data
Document Number: MRF6V10250HS
Rev. 0, 2/2008
RF Power Field Effect Transistor
N - Channel Enhancement - Mode Lateral MOSFET
MRF6V10250HSR3
RF Power transistor designed for applications operating at frequencies
between 1030 and 1090 MHz, 1% to 20% duty cycle. This device is suitable for
use in pulsed applications.
• Typical Pulsed Performance: VDD = 50 Volts, IDQ = 250 mA,
Pout = 250 Watts Peak, f = 1090 MHz, Pulse Width = 100 μsec,
Duty Cycle = 10%
Power Gain — 21 dB
Drain Efficiency — 60%
• Capable of Handling 10:1 VSWR, @ 50 Vdc, 1090 MHz, 250 Watts Peak
Power
Features
• Characterized with Series Equivalent Large - Signal Impedance Parameters
• Internally Matched for Ease of Use
• Qualified Up to a Maximum of 50 VDD Operation
• Integrated ESD Protection
• Greater Negative Gate - Source Voltage Range for Improved Class C
Operation
• RoHS Compliant
• In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.
1090 MHz, 250 W, 50 V
PULSED
LATERAL N - CHANNEL
RF POWER MOSFET
CASE 465A - 06, STYLE 1
NI - 780S
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Drain - Source Voltage
VDSS
- 0.5, +100
Vdc
Gate - Source Voltage
VGS
- 6.0, +10
Vdc
Storage Temperature Range
Tstg
- 65 to +150
°C
Case Operating Temperature
TC
150
°C
Operating Junction Temperature
TJ
200
°C
Symbol
Value (1,2)
Unit
RθJC
0.10
°C/W
Table 2. Thermal Characteristics
Characteristic
Thermal Resistance, Junction to Case
Case Temperature 79°C, 250 W Pulsed, 100 μsec Pulse Width, 10% Duty Cycle
1. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes - AN1955.
© Freescale Semiconductor, Inc., 2008. All rights reserved.
RF Device Data
Freescale Semiconductor
MRF6V10250HSR3
1
Table 3. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JESD22 - A114)
2 (Minimum)
Machine Model (per EIA/JESD22 - A115)
B (Minimum)
Charge Device Model (per JESD22 - C101)
IV (Minimum)
Table 4. Electrical Characteristics (TC = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
IGSS
—
—
500
nAdc
100
—
—
Vdc
Off Characteristics
Gate - Source Leakage Current
(VGS = 5 Vdc, VDS = 0 Vdc)
Drain - Source Breakdown Voltage
(VGS = 0 Vdc, ID = 100 mA)
V(BR)DSS
Zero Gate Voltage Drain Leakage Current
(VDS = 50 Vdc, VGS = 0 Vdc)
IDSS
—
—
50
μAdc
Zero Gate Voltage Drain Leakage Current
(VDS = 90 Vdc, VGS = 0 Vdc)
IDSS
—
—
2
mA
Gate Threshold Voltage
(VDS = 10 Vdc, ID = 528 μAdc)
VGS(th)
1
1.8
3
Vdc
Gate Quiescent Voltage
(VDD = 50 Vdc, ID = 250 mAdc, Measured in Functional Test)
VGS(Q)
2
2.4
3
Vdc
Drain - Source On - Voltage
(VGS = 10 Vdc, ID = 1.32 Adc)
VDS(on)
—
0.25
—
Vdc
Reverse Transfer Capacitance
(VDS = 50 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Crss
—
0.8
—
pF
Output Capacitance
(VDS = 50 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Coss
—
340
—
pF
Input Capacitance
(VDS = 50 Vdc, VGS = 0 Vdc ± 30 mV(rms)ac @ 1 MHz)
Ciss
—
280
—
pF
On Characteristics
Dynamic Characteristics (1)
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 50 Vdc, IDQ = 250 mA, Pout = 250 W Peak (25 W Avg.), f = 1090 MHz,
Pulsed, 100 μsec Pulse Width, 10% Duty Cycle
Power Gain
Gps
19
21
23
dB
Drain Efficiency
ηD
55
60
—
%
Input Return Loss
IRL
—
- 12
-9
dB
1. Part internally matched both on input and output.
MRF6V10250HSR3
2
RF Device Data
Freescale Semiconductor
C12
C7
R2
C15
VSUPPLY
+
+
C13
C14
L1
VBIAS
L2
C6
R1
RF
INPUT
Z1
Z2
Z3
Z6
Z4
Z7
Z8
C8
C2
Z1
Z2*, Z9*
Z3*, Z8*
Z4, Z7
C3
C4
0.40″
1.29″
0.22″
0.22″
x 0.080″
x 0.080″
x 0.480″
x 0.625″
C5
Microstrip
Microstrip
Microstrip
x 0.220″ Taper
Z10
C10
Z5
C1
Z9
RF
OUTPUT
C9
C11
DUT
Z5, Z6
Z10
PCB
0.625″ x 0.300″ Microstrip
0.430″ x 0.080″ Microstrip
Arlon CuClad 250GX - 0300 - 55 - 22, 0.030″, εr = 2.55
* Line length includes microstrip bends
Figure 1. MRF6V10250HSR3 Test Circuit Schematic
Table 5. MRF6V10250HSR3 Test Circuit Component Designations and Values
Part
Description
Part Number
Manufacturer
C1
240 pF Chip Capacitor
ATC100B241JT500XT
ATC
C2, C9, C11
1.8 pF Chip Capacitors
ATC100B1R8CT500XT
ATC
C3
3.3 pF Chip Capacitor
ATC100B3R3CT500XT
ATC
C4, C5
5.1 pF Chip Capacitors
ATC100B5R1CT500XT
ATC
C6, C10, C12
39 pF Chip Capacitors
ATC100B390JT500XT
ATC
C7, C15
2.2 μF, 50 V Chip Capacitors
C1825C225J5RAC
Kemet
C8
4.7 pF Chip Capacitor
ATC100B4R7CT500XT
ATC
C13, C14
470 μF, 63 V Electrolytic Capacitors
EKME633ELL471MK25S
Multicomp
L1
5 nH, 2 Turn Inductor
A02TKLC
Coilcraft
L2
7 nH, Hand Wound
2T, 18awg
Freescale
R1
10 Ω, 1/4 W Chip Resistor
CRCW120610R0FKEA
Vishay
R2
20 Ω, 1 W Chip Resistor
CRCW251220R0FKEA
Vishay
MRF6V10250HSR3
RF Device Data
Freescale Semiconductor
3
C7
R2
C6
C13
C14
C15
L1
C12
R1
C1
C10
C5
C2
C3
C4
C8
C9
CUT OUT AREA
L2
C11
MRF6V10250H Rev. 3
Figure 2. MRF6V10250HSR3 Test Circuit Component Layout
MRF6V10250HSR3
4
RF Device Data
Freescale Semiconductor
TYPICAL CHARACTERISTICS
1000
50
Coss
ID, DRAIN CURRENT (AMPS)
C, CAPACITANCE (pF)
Ciss
100
Measured with ±30 mV(rms)ac @ 1 MHz
VGS = 0 Vdc
10
Crss
1
10
TJ = 150°C
TJ = 175°C
TJ = 200°C
TC = 25°C
0.1
1
0
10
20
30
40
50
1
Figure 3. Capacitance versus Drain - Source Voltage
Figure 4. DC Safe Operating Area
Gps
20
50
ηD
40
18
VDD = 50 Vdc, IDQ = 250 mA, f = 1090 MHz
Pulse Width = 100 μsec, Duty Cycle = 10%
16
50
Pout, OUTPUT POWER (dBm)
60
ηD, DRAIN EFFICIENCY (%)
22
56
P3dB = 54.94 dBm (311 W)
55
Actual
54
53
52
51
50
48
26
400
Ideal
P1dB = 54.55 dBm (285 W)
VDD = 50 Vdc, IDQ = 250 mA, f = 1090 MHz
Pulse Width = 100 μsec, Duty Cycle = 10%
49
30
100
300
58
70
57
Gps, POWER GAIN (dB)
100
VDS, DRAIN−SOURCE VOLTAGE (VOLTS)
24
28
30
32
34
36
Pout, OUTPUT POWER (WATTS) PULSED
Pin, INPUT POWER (dBm) PULSED
Figure 5. Pulsed Power Gain and Drain Efficiency
versus Output Power
Figure 6. Pulsed Output Power versus
Input Power
23
38
22
IDQ = 1 A
22
21
750 mA
500 mA
Gps, POWER GAIN (dB)
Gps, POWER GAIN (dB)
10
VDS, DRAIN−SOURCE VOLTAGE (VOLTS)
21
250 mA
20
19
VDD = 50 Vdc, f = 1090 MHz
Pulse Width = 100 μsec, Duty Cycle = 10%
18
100
19
45 V
40 V
17
35 V
16
VDD = 30 V
400
50 V
18
15
17
50
20
14
50
IDQ = 250 mA, f = 1090 MHz
Pulse Width = 100 μsec
Duty Cycle = 10%
100
400
Pout, OUTPUT POWER (WATTS) PULSED
Pout, OUTPUT POWER (WATTS) PULSED
Figure 7. Pulsed Power Gain versus
Output Power
Figure 8. Pulsed Power Gain versus
Output Power
MRF6V10250HSR3
RF Device Data
Freescale Semiconductor
5
TYPICAL CHARACTERISTICS
24
70
25_C
300
85_C
200
VDD = 50 Vdc
IDQ = 250 mA
f = 1090 MHz
Pulse Width = 100 μsec
Duty Cycle = 10%
100
0
1
2
3
4
5
6
60
25_C
20
50
85_C
55_C
ηD
40
18
VDD = 50 Vdc, IDQ = 250 mA, f = 1090 MHz
Pulse Width = 100 μsec, Duty Cycle = 10%
18
50
0
Gps
TC = −30_C
22
ηD, DRAIN EFFICIENCY (%)
TC = −30_C
Gps, POWER GAIN (dB)
Pout, OUTPUT POWER (WATTS) PULSED
400
30
400
100
Pin, INPUT POWER (WATTS) PULSED
Pout, OUTPUT POWER (WATTS) PULSED
Figure 9. Pulsed Power Output versus
Power Input
Figure 10. Pulsed Power Gain and Drain Efficiency
versus Output Power
107
MTTF (HOURS)
106
105
104
103
90
110
130
150
170
190
210
230
250
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours when the device
is operated at VDD = 50 Vdc, Pout = 250 W Peak, Pulse Width = 100 μsec,
Duty Cycle = 10%, and ηD = 60%.
MTTF calculator available at http:/www.freescale.com/rf. Select
Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
Figure 11. MTTF versus Junction Temperature
MRF6V10250HSR3
6
RF Device Data
Freescale Semiconductor
Zo = 10 Ω
Zload
f = 1090 MHz
f = 978 MHz
f = 978 MHz
Zsource
f = 1090 MHz
VDD = 50 Vdc, IDQ = 250 mA, Pout = 250 W Peak
f
MHz
Zsource
W
Zload
W
978
1.67 - j2.04
4.3 - j2.72
1030
2.39 - j2.23
5.66 - j2.42
1090
3.26 - j3.72
5.85 - j2.39
Zsource = Test circuit impedance as measured from
gate to ground.
Zload
= Test circuit impedance as measured
from drain to ground.
Output
Matching
Network
Device
Under
Test
Input
Matching
Network
Z
source
Z
load
Figure 12. Series Equivalent Source and Load Impedance
MRF6V10250HSR3
RF Device Data
Freescale Semiconductor
7
PACKAGE DIMENSIONS
4X U
(FLANGE)
4X Z
(LID)
B
1
K
2X
2
B
(FLANGE)
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M−1994.
2. CONTROLLING DIMENSION: INCH.
3. DELETED
4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY
FROM PACKAGE BODY.
D
bbb
M
T A
M
B
M
N
ccc
M
R
(LID)
M
T A
M
B
M
ccc
M
T A
M
M
B
M
aaa
M
T A
M
S
(INSULATOR)
bbb
M
T A
(LID)
B
M
(INSULATOR)
B
M
H
C
3
E
A
A
F
T
SEATING
PLANE
DIM
A
B
C
D
E
F
H
K
M
N
R
S
U
Z
aaa
bbb
ccc
INCHES
MIN
MAX
0.805
0.815
0.380
0.390
0.125
0.170
0.495
0.505
0.035
0.045
0.003
0.006
0.057
0.067
0.170
0.210
0.774
0.786
0.772
0.788
0.365
0.375
0.365
0.375
−−− 0.040
−−− 0.030
0.005 REF
0.010 REF
0.015 REF
MILLIMETERS
MIN
MAX
20.45
20.70
9.65
9.91
3.18
4.32
12.57
12.83
0.89
1.14
0.08
0.15
1.45
1.70
4.32
5.33
19.61
20.02
19.61
20.02
9.27
9.53
9.27
9.52
−−−
1.02
−−−
0.76
0.127 REF
0.254 REF
0.381 REF
STYLE 1:
PIN 1. DRAIN
2. GATE
5. SOURCE
(FLANGE)
CASE 465A - 06
ISSUE H
NI - 780S
MRF6V10250HSR3
8
RF Device Data
Freescale Semiconductor
PRODUCT DOCUMENTATION
Refer to the following documents to aid your design process.
Application Notes
• AN1955: Thermal Measurement Methodology of RF Power Amplifiers
Engineering Bulletins
• EB212: Using Data Sheet Impedances for RF LDMOS Devices
REVISION HISTORY
The following table summarizes revisions to this document.
Revision
Date
0
Feb. 2008
Description
• Initial Release of Data Sheet
MRF6V10250HSR3
RF Device Data
Freescale Semiconductor
9
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MRF6V10250HSR3
Document Number: MRF6V10250HS
Rev. 0, 2/2008
10
RF Device Data
Freescale Semiconductor