FREESCALE MRF9002NR2

Freescale Semiconductor
Technical Data
Document Number: MRF9002NR2
Rev. 8, 5/2006
RF Power Field Effect Transistor Array
N - Channel Enhancement - Mode Lateral MOSFET
MRF9002NR2
Designed for broadband commercial and industrial applications with frequencies to 1000 MHz. The high gain and broadband performance of this device
make it ideal for large - signal, common - source amplifier applications in 26 volt
base station equipment. The device is in a PFP - 16 Power Flat Pack package
which gives excellent thermal performances through a solderable backside
contact.
• Typical Performance at 960 MHz, 26 Volts
Output Power — 2 Watts Per Transistor
Power Gain — 18 dB
Efficiency — 50%
• Capable of Handling 10:1 VSWR, @ 26 Vdc, 960 MHz, 2 Watts CW
Output Power
Features
• Designed for Maximum Gain and Insertion Phase Flatness
• Excellent Thermal Stability
• Characterized with Series Equivalent Large - Signal Impedance Parameters
• RoHS Compliant
• In Tape and Reel. R2 Suffix = 1,500 Units per 16 mm, 13 inch Reel.
1000 MHz, 2 W, 26 V
LATERAL N - CHANNEL
BROADBAND
RF POWER MOSFET
16
1
CASE 978 - 03
PLASTIC
PFP - 16
N.C.
N.C.
1
16
DRAIN 1−1
2
15
DRAIN 1−2
GATE1
3
14
DRAIN 2−1
N.C.
4
13
DRAIN 2−2
GATE2
5
12
N.C.
N.C.
6
11
DRAIN 3−1
GATE3
N.C.
7
8
10
9
DRAIN 3−2
N.C.
(Top View)
Note: Exposed backside flag is source
terminal for transistors.
Figure 1. Pin Connections
Table 1. Maximum Ratings
Symbol
Value
Unit
Drain - Source Voltage
Rating
VDSS
- 0.5, +65
Vdc
Gate - Source Voltage
VGS
- 0.5, + 15
Vdc
Total Dissipation Per Transistor @ TC = 25°C
PD
4
W
Storage Temperature Range
Tstg
- 65 to +150
°C
Operating Junction Temperature
TJ
150
°C
Symbol
Value (1)
Unit
RθJC
12
°C/W
Table 2. Thermal Characteristics
Characteristic
Thermal Resistance, Junction to Case, Single Transistor
Table 3. Moisture Sensitivity Level
Test Methodology
Per JESD 22 - A113, IPC/JEDEC J - STD - 020
Rating
Package Peak Temperature
Unit
3
260
°C
1. MTTF calculator available at http://www.freescale.com/rf. Select Tools/Software/Application Software/Calculators to access
the MTTF calculators by product.
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
packaging MOS devices should be observed.
© Freescale Semiconductor, Inc., 2006. All rights reserved.
RF Device Data
Freescale Semiconductor
MRF9002NR2
1
Table 4. Electrical Characteristics (TC = 25°C unless otherwise noted)
Symbol
Min
Typ
Max
Unit
Gate Threshold Voltage
(VDS = 10 Vdc, ID = 20 μAdc)
VGS(th)
2.4
—
4
Vdc
Gate Quiescent Voltage
(VDS = 26 Vdc, ID = 25 mAdc)
VGS(Q)
3
—
5
Vdc
Drain - Source On - Voltage
(VGS = 10 Vdc, ID = 0.1 Adc)
VDS(on)
—
0.3
—
Vdc
Gps
15
18
—
dB
Drain Efficiency @ P1dB
(VDD = 26 Vdc, IDQ = 25 mA, f = 960.0 MHz)
η
35
50
—
%
Input Return Loss @ P1dB
(VDD = 26 Vdc, IDQ = 25 mA, f = 960.0 MHz)
IRL
—
- 15
-9
dB
Power Output, 1 dB Compression Point
(VDD = 26 Vdc, IDQ = 25 mA, f = 960.0 MHz)
P1dB
34
37
—
dBm
Characteristic
On Characteristics
Functional Tests (Per Transistor in Freescale Test Fixture, 50 ohm system)
Common - Source Amplifier Power Gain @ P1dB
(VDD = 26 Vdc, IDQ = 25 mA, f = 960.0 MHz)
MRF9002NR2
2
RF Device Data
Freescale Semiconductor
VGS1
+
C7
Z1
RF1
INPUT
Z2
L1
R1
DUT
VDS1
+
C8
L4
Z4
Z5
Z3
C16
C14
C1
VGS2
Z6
RF2
INPUT
+
C9
Z7
R2
VDS2
+
C10
L5
L2
Z9
Z10
Z8
C18
C4
RF2
OUTPUT
C13
C3
VGS3
Z11
RF3
INPUT
C2
RF1
OUTPUT
+
C11
Z12
L3
R3
VDS3
+
C12
L6
Z14
Z15
Z13
C17
C6
RF3
OUTPUT
C15
C5
Figure 2. MRF9002NR2 Broadband Test Circuit Schematic
Table 5. MRF9002NR2 Broadband Test Circuit Component Designations and Values
Designators
Description
C1 - C6
33 pF Chip Capacitors (0805)
C7 - C12
1.0 μF, 35 V Tantalum Capacitors, B Case, Kemet
C13
8.2 pF Chip Capacitor (0805)
C14, C15
10 pF Chip Capacitors (0805)
C16, C17
2.7 pF Chip Capacitors (0805)
C18
3.3 pF Chip Capacitor (0805)
L1 - L6
12 nH Chip Inductors (0805)
R1 - R3
0 W Chip Resistors (0805)
Z1, Z11
1.16 x 28.5 mm Microstrip
Z2, Z7, Z12
0.65 x 5.6 mm Microstrip
Z3, Z8, Z13
0.65 x 2.6 mm Microstrip
Z4, Z14
1.16 x 19.5 mm Microstrip
Z5, Z15
1.16 x 17.5 mm Microstrip
Z6
1.16 x 12.9 mm Microstrip
Z9
1.16 x 27.2 mm Microstrip
Z10
1.16 x 4.3 mm Microstrip
PCB
Etched Circuit Board
Raw PCB Material
Rogers RO4350, 0.020″, 2.5″, x 2.5″, er = 3.5
Bedstead
Copper Heatsink
MRF9002NR2
RF Device Data
Freescale Semiconductor
3
RF1 OUTPUT
RF1 INPUT
C1
C2
VGS1
VDS1
C16
VGS2
VDS2
C8
C7
C10
C9
L4
C14
L1
R1
L2
RF2 INPUT
C3
Pin 1
RF2 OUTPUT
L5
R2
C18
C13
C4
R3
L3
L6
C15
MRF9002
960 MHz
Rev. B
C11
C12
C17
VDS3
VGS3
C5
RF3 INPUT
C6
RF3 OUTPUT
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor
signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have
no impact on form, fit or function of the current product.
Figure 3. MRF9002NR2 Broadband Test Circuit Component Layout
MRF9002NR2
4
RF Device Data
Freescale Semiconductor
TYPICAL CHARACTERISTICS
35
31
19.25
22
18.75
27
18.5
25
18.25
23
18
21
17.75
VDS = 26 Vdc
IDQ = 25 mA
f = 960 MHz
Single−Tone
19
17
15
2
0
4
6
8
10
12
14
75 mA
20
50 mA
19
18
25 mA
17
VDS = 26 Vdc
f = 960 MHz
Single−Tone
16
17.25
15
17
16
15
10
30
40
35
Figure 4. Output Power and Power Gain
versus Input Power
Figure 5. Power Gain versus Output Power
20.2
−29
20.1
−30
IMD
20
−31
Pout = 2 W (PEP)
IDQ = 25 mA
f1 = 960.0 MHz, f2 = 960.1 MHz
19.9
−32
23
24
25
26
27
28
29
−20
−25
−30
−35
−40
−45
25 mA
−50
50 mA
−55
75 mA
VDS = 26 Vdc
f1 = 960.0 MHz, f2 = 960.1 MHz
−60 100 mA
−65
30
5
10
Figure 6. Power Gain and Intermodulation Distortion
versus Supply Voltage
−10
39
Pout , OUTPUT POWER (dBm)
41
−20
3rd Order
−30
−40
5th Order
−50
7th Order
VDS = 26 Vdc
f1 = 960.0 MHz, f2 = 960.1 MHz
−70
15
20
25
30
20
25
30
40
35
Figure 7. Intermodulation Distortion versus
Output Power
0
−60
15
Pout, OUTPUT POWER (dBm) PEP
VDS, DRAIN SOURCE SUPPLY (VOLTS)
IMD, INTERMODULATION DISTORTION (dBc)
25
Pout, OUTPUT POWER (dBm)
−28
10
20
Pin, INPUT POWER (dBm)
Gps
G ps , POWER GAIN (dB)
21
17.5
20.3
22
100 mA
19
Gps
29
G ps , POWER GAIN (dB)
G ps , POWER GAIN (dB)
Pout
23
IMD, INTERMODULATION DISTORTION (dBc)
IMD, INTERMODULATION DISTORTION (dBc)
Pout , OUTPUT POWER (dBm)
33
19.5
35
40
Pin = 20 dBm
37
35
15 dBm
33
VDS = 26 Vdc
IDQ = 25 mA
Single−Tone
31
29
10 dBm
27
25
925
935
945
955
965
975
Pout, OUTPUT POWER (dBm)
f, FREQUENCY (MHz)
Figure 8. Intermodulation Distortion Products
versus Output Power
Figure 9. Output Power versus Frequency
985
MRF9002NR2
RF Device Data
Freescale Semiconductor
5
TYPICAL CHARACTERISTICS
109
12
MTTF FACTOR (HOURS X AMPS2)
11
Ciss
10
C, CAPACITANCE (pF)
9
8
Coss
7
6
5
4
Crss
108
107
3
2
22
23
24
25
26
27
28
29
30
VDS, DRAIN SOURCE SUPPLY (VOLTS)
Figure 10. Capacitance versus Drain Source Voltage
106
90 100 110 120 130 140 150 160 170 180 190 200 210
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours x ampere2
drain current. Life tests at elevated temperatures have correlated to
better than ±10% of the theoretical prediction for metal failure. Divide
MTTF factor by ID2 for MTTF in a particular application.
Figure 11. MTTF Factor versus Junction Temperature
MRF9002NR2
6
RF Device Data
Freescale Semiconductor
TRANSISTORS 1 and 2
TRANSISTOR 3
Zo = 50 Ω
Zo = 50 Ω
T3
T2
T1
T2
985 MHz
f = 925 MHz
985 MHz
f = 925 MHz
985 MHz
Zsource
Zload
Zsource
Zsource
985 MHz
f = 925 MHz
f = 925 MHz
T1
985 MHz
985 MHz
Zload
Zload
T3
f = 925 MHz
f = 925 MHz
VDD = 26 V, IDQ = 25 mA, Pout = 2 W PEP
f
MHz
Zsource
Ω
925
4.5 + j13.3
23.4 + j9.2
960
4.3 + j15.3
23.2 + j10.4
985
4.1 + j15.8
23.0 + j11.1
Zload
Ω
Transistor 1
VDD = 26 V, IDQ = 25 mA, Pout = 2 W PEP
f
MHz
Zsource
Ω
925
6.0 + j12.3
19.7 + j27.8
960
5.9 + j14.3
22.0 + j23.9
985
5.8 + j16.5
22.5 + j25.4
Zload
Ω
Transistor 2
Zsource = Test circuit impedance as measured from
gate to ground.
Zload
= Test circuit impedance as measured
from drain to ground.
Output
Matching
Network
Device
Under Test
Input
Matching
Network
VDD = 26 V, IDQ = 25 mA, Pout = 2 W PEP
f
MHz
Zsource
Ω
925
4.3 + j12.2
23.1 + j6.5
960
4.3 + j14.0
22.8 + j8.4
985
3.9 + j15.9
22.6 + j9.3
Zload
Ω
Z
source
Z
load
Transistor 3
Figure 12. Series Equivalent Source and Load Impedance
MRF9002NR2
RF Device Data
Freescale Semiconductor
7
NOTES
MRF9002NR2
8
RF Device Data
Freescale Semiconductor
NOTES
MRF9002NR2
RF Device Data
Freescale Semiconductor
9
NOTES
MRF9002NR2
10
RF Device Data
Freescale Semiconductor
PACKAGE DIMENSIONS
h X 45 _
A
E2
1
14 x e
16
D
e/2
D1
8
9
E1
8X
bbb
M
B
BOTTOM VIEW
E
C B
S
ÉÉ
ÇÇÇ
ÇÇÇ
ÉÉ
b1
Y
c
A A2
c1
b
DATUM
PLANE
SEATING
PLANE
H
M
ccc C
q
W
GAUGE
PLANE
W
L
C A
SECT W - W
L1
C
aaa
A1
S
NOTES:
1. CONTROLLING DIMENSION: MILLIMETER.
2. DIMENSIONS AND TOLERANCES PER ASME
Y14.5M, 1994.
3. DATUM PLANE −H− IS LOCATED AT BOTTOM OF
LEAD AND IS COINCIDENT WITH THE LEAD
WHERE THE LEAD EXITS THE PLASTIC BODY AT
THE BOTTOM OF THE PARTING LINE.
4. DIMENSIONS D AND E1 DO NOT INCLUDE MOLD
PROTRUSION. ALLOWABLE PROTRUSION IS
0.250 PER SIDE. DIMENSIONS D AND E1 DO
INCLUDE MOLD MISMATCH AND ARE
DETERMINED AT DATUM PLANE −H−.
5. DIMENSION b DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION IS 0.127 TOTAL IN EXCESS OF THE
b DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. DATUMS −A− AND −B− TO BE DETERMINED AT
DATUM PLANE −H−.
DIM
A
A1
A2
D
D1
E
E1
E2
L
L1
b
b1
c
c1
e
h
q
aaa
bbb
ccc
MILLIMETERS
MIN
MAX
2.000
2.300
0.025
0.100
1.950
2.100
6.950
7.100
4.372
5.180
8.850
9.150
6.950
7.100
4.372
5.180
0.466
0.720
0.250 BSC
0.300
0.432
0.300
0.375
0.180
0.279
0.180
0.230
0.800 BSC
−−−
0.600
0_
7_
0.200
0.200
0.100
1.000
0.039
DETAIL Y
CASE 978 - 03
ISSUE C
PLASTIC
PFP - 16
MRF9002NR2
RF Device Data
Freescale Semiconductor
11
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MRF9002NR2
Document Number: MRF9002NR2
Rev. 8, 5/2006
12
RF Device Data
Freescale Semiconductor