LATTICE LA-ISPPAC

®
LA-ispPAC-POWR1014/A
Automotive Family
In-System Programmable Power Supply Supervisor,
Reset Generator and Sequencing Controller
June 2008
Data Sheet DS1018
Features
Application Block Diagram
■ Monitor and Control Multiple Power Supplies
Primary
Supply
• Simultaneously monitors up to 10 power
supplies
• Provides up to 14 output control signals
• Programmable digital and analog circuitry
3.3V
Primary
Supply
■ AEC-Q100 Tested and Qualified
■ Embedded PLD for Sequence Control
1.8V
POL#1
• Four independent timers
• 32µs to 2 second intervals for timing sequences
Primary
Supply
Enables
■ Embedded Programmable Timers
POL#N
■ Analog Input Monitoring
Other Control/Supervisory
Signals
■ High-Voltage FET Drivers
■ 2-Wire (I C/SMBus™ Compatible) Interface
2
•
•
•
•
•
Comparator status monitor
ADC readout
Direct control of inputs and outputs
Power sequence control
Only available with LA-ispPAC-POWR1014A
■ 3.3V Operation, Wide Supply Range 2.8V to
3.96V
• In-system programmable through JTAG
• Automotive temperature range: -40°C to +105°C
• 48-pin TQFP package, lead-free option
12 Digital
Outputs
2 MOSFET
Drivers
Digital Monitoring
10 Analog Inputs
and Voltage Monitors
• 10 independent analog monitor inputs
• Two programmable threshold comparators per
analog input
• Hardware window comparison
• 10-bit ADC for I2C monitoring (LA-ispPACPOWR1014A only)
• Power supply ramp up/down control
• Programmable current and voltage output
• Independently configurable for FET control or
digital output
Voltage
Monitoring
• 24-macrocell CPLD implements both state
machines and combinatorial logic functions
Primary
Supply
Other Board Circuitry
2.5V
Primary
Supply
CPLD
24 Macrocells
53 Inputs
ADC*
4 Timers
4 Digital
Inputs
I2C
Interface
I2C
Bus*
CPU
LA-ispPAC-POWR1014A
*LA-ispPAC-POWR1014A only.
Description
Lattice’s Power Manager II LA-ispPAC-POWR1014/A is
a general-purpose power-supply monitor and sequence
controller, incorporating both in-system programmable
logic and in-system programmable analog functions
implemented in non-volatile E2CMOS® technology. The
LA-ispPAC-POWR1014/A device provides 10 independent analog input channels to monitor up to 10 power
supply test points. Each of these input channels has
two independently programmable comparators to support both high/low and in-bounds/out-of-bounds (window-compare) monitor functions. Four general-purpose
digital inputs are also provided for miscellaneous control functions.
The LA-ispPAC-POWR1014/A provides 14 open-drain
digital outputs that can be used for controlling DC-DC
converters, low-drop-out regulators (LDOs) and optocouplers, as well as for supervisory and general-purpose logic interface functions. Two of these outputs
(HVOUT1-HVOUT2) may be configured as high-voltage
© 2008 Lattice Semiconductor Corp. All Lattice trademarks, registered trademarks, patents, and disclaimers are as listed at www.latticesemi.com/legal. All other
brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without
notice.
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5-1
DS1018_01.1
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
MOSFET drivers. In high-voltage mode these outputs can provide up to 8V for driving the gates of n-channel MOSFETs so that they can be used as high-side power switches controlling the supplies with a programmable ramp rate
for both ramp up and ramp down.
The LA-ispPAC-POWR1014/A incorporates a 24-macrocell CPLD that can be used to implement complex state
machine sequencing for the control of multiple power supplies as well as combinatorial logic functions. The status
of all of the comparators on the analog input channels as well as the general purpose digital inputs are used as
inputs by the CPLD array, and all digital outputs may be controlled by the CPLD. Four independently programmable
timers can create delays and time-outs ranging from 32µs to 2 seconds. The CPLD is programmed using LogiBuilder™, an easy-to-learn language integrated into the PAC-Designer® software. Control sequences are written to
monitor the status of any of the analog input channel comparators or the digital inputs.
The on-chip 10-bit A/D converter is used to monitor the VMON voltage through the I2C bus of the LA-ispPACPOWR1014A device.
The I2C bus/SMBus interface allows an external microcontroller to measure the voltages connected to the VMON
inputs, read back the status of each of the VMON comparator and PLD outputs, control logic signals IN2 to IN4 and
control the output pins (LA-ispPAC-POWR1014A only).
Figure 5-1. LA-ispPAC-POWR1014/A Block Diagram
MEASUREMENT
ADC*
CONTROL LOGIC*
4 DIGITAL
INPUTS
IN1
IN2
IN3
IN4
JTAG LOGIC
CLOCK
OSCILLATOR
TIMERS
(4)
GNDD (2)
GNDA
SDA (POWR1014A only)
5-2
OUT3/(SMBA*)
OUT4
OUT5
OUT6
OUT7
OUT8
OUT9
OUT10
OUT11
OUT12
OUT13
OUT14
I 2C
INTERFACE
SCL (POWR1014A only)
RESETb
PLDCLK
MCLK
ATDI
TDI
TDISEL
TCK
TMS
TDO
VCCJ
VCCPROG
VCCA
VCCD (2)
VCCINP
*LA-ispPAC-POWR1014A only.
HVOUT1
HVOUT2
12 OPEN-DRAIN
DIGITAL OUTPUTS
53 INPUTS
2 FET
DRIVERS
CPLD
24 MACROCELLS
OUTPUT ROUTING
POOL
10 ANALOG INPUTS
AND VOLTAGE MONITORS
VMON1
VMON2
VMON3
VMON4
VMON5
VMON6
VMON7
VMON8
VMON9
VMON10
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Pin Descriptions
Number
Name
Pin Type
Voltage Range
Description
44
IN1
Digital Input
VCCINP1, 2
46
IN2
Digital Input
VCCINP1, 3
PLD Logic Input 2 Registered by MCLK
47
IN3
Digital Input
VCCINP1, 3
PLD Logic Input 3 Registered by MCLK
48
IN4
Digital Input
VCCINP1, 3
PLD Logic Input 1 Registered by MCLK
PLD Logic Input 4 Registered by MCLK
4
25
VMON1
Analog Input
-0.3V to 5.87V
Voltage Monitor 1 Input
26
VMON2
Analog Input
-0.3V to 5.87V4
Voltage Monitor 2 Input
27
VMON3
Analog Input
-0.3V to 5.87V4
Voltage Monitor 3 Input
28
VMON4
Analog Input
-0.3V to 5.87V4
Voltage Monitor 4 Input
4
32
VMON5
Analog Input
-0.3V to 5.87V
Voltage Monitor 5 Input
33
VMON6
Analog Input
-0.3V to 5.87V4
Voltage Monitor 6 Input
4
34
VMON7
Analog Input
-0.3V to 5.87V
Voltage Monitor 7 Input
35
VMON8
Analog Input
-0.3V to 5.87V4
Voltage Monitor 8 Input
36
VMON9
Analog Input
-0.3V to 5.87V4
Voltage Monitor 9 Input
VMON10
Analog Input
4
-0.3V to 5.87V
Voltage Monitor 10 Input
GNDD5
Ground
Ground
Digital Ground
37
7, 31
30
5
Ground
Ground
Analog Ground
6
Power
2.8V to 3.96V
Core VCC, Main Power Supply
6
Power
2.8V to 3.96V
Analog Power Supply
GNDA
41, 23 VCCD
29
VCCA
45
VCCINP
Power
2.25V to 5.5V
VCC for IN[1:4] Inputs
20
VCCJ
Power
2.25V to 3.6V
VCC for JTAG Logic Interface Pins
24
VCCPROG
Power
3.0V to 3.6V
VCC for E2 Programming when the Device is Not
Powered by VCCD and VCCA
Open Drain Output7
0V to 8V
Open-Drain Output 1
Current Source/Sink
12.5µA to 100µA Source
High-voltage FET Gate Driver 1
100µA to 3000µA Sink
Open Drain Output7
0V to 8V
Current Source/Sink
12.5µA to 100µA Source
High-voltage FET Gate Driver 2
100µA to 3000µA Sink
15
HVOUT1
Open-Drain Output 2
14
HVOUT2
13
SMBA_OUT3 Open Drain Output7
0V to 5.5V
Open-Drain Output 3, (SMBUS Alert Active Low,
LA-ispPAC-POWR1014A only).
12
OUT4
Open Drain Output7
0V to 5.5V
Open-Drain Output 4
OUT5
7
0V to 5.5V
Open-Drain Output 5
7
0V to 5.5V
Open-Drain Output 6
7
0V to 5.5V
Open-Drain Output 7
7
11
10
9
OUT6
OUT7
Open Drain Output
Open Drain Output
Open Drain Output
8
OUT8
Open Drain Output
0V to 5.5V
Open-Drain Output 8
6
OUT9
Open Drain Output7
0V to 5.5V
Open-Drain Output 9
7
5
OUT10
Open Drain Output
0V to 5.5V
Open-Drain Output 10
4
OUT11
Open Drain Output7
0V to 5.5V
Open-Drain Output 11
3
OUT12
7
Open Drain Output
0V to 5.5V
Open-Drain Output 12
2
OUT13
Open Drain Output7
0V to 5.5V
Open-Drain Output 13
1
OUT14
7
Open Drain Output
0V to 5.5V
Open-Drain Output 14
40
RESETb8
Digital I/O
0V to 3.96V
Device Reset (Active Low) - Internal pull-up
0V to 3.96V
250kHz PLD Clock Output (Tristate), CMOS
Output - Internal pull-up
42
PLDCLK
Digital Output
5-3
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Pin Descriptions (Cont.)
Number
Name
Pin Type
Voltage Range
Description
43
MCLK
Digital I/O
0V to 3.96V
8MHz Clock I/O (Tristate), CMOS Drive - Internal
Pull-up
21
TDO
Digital Output
0V to 5.5V
JTAG Test Data Out
22
TCK
Digital Input
0V to 5.5V
JTAG Test Clock Input
16
TMS
Digital Input
0V to 5.5V
JTAG Test Mode Select - Internal Pull-up
18
TDI
Digital Input
0V to 5.5V
JTAG Test Data In, TDISEL pin = 1 - Internal
Pull-up
17
ATDI
Digital Input
0V to 5.5V
JTAG Test Data In (Alternate), TDISEL Pin = 0 Internal Pull-up
19
TDISEL
Digital Input
0V to 5.5V
Select TDI/ATDI Input - Internal Pull-up
39
SCL
Digital Input
0V to 5.5V
I2C Serial Clock Input (LA-ispPAC-POWR1014A
Only)
38
SDA9
Digital I/O
0V to 5.5V
I2C Serial Data, Bi-directional Pin, Open Drain
(LA-ispPAC-POWR1014A Only)
9
1. [IN1...IN4] are inputs to the PLD. The thresholds for these pins are referenced by the voltage on VCCINP. Unused INx inputs should be tied
to GNDD.
2. IN1 pin can also be controlled through JTAG interface.
3. [IN2..IN4] can also be controlled through I2C/SMBus interface (LA-ispPAC-POWR1014A only).
4. The VMON inputs can be biased independently from VCCA. Unused VMON inputs should be tied to GNDD.
5. GNDA and GNDD pins must be connected together on the circuit board.
6. VCCD and VCCA pins must be connected together on the circuit board.
7. Open-drain outputs require an external pull-up resistor to a supply.
8. The RESETb pin should only be used for cascading two or more LA-ispPAC-POWR1014/A devices.
9. These pins should be connected to GNDD (LA-ispPAC-POWR1014 device only).
5-4
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Absolute Maximum Ratings
Absolute maximum ratings are shown in the table below. Stresses beyond those listed may cause permanent damage to the device. Functional operation of the device at these or any other conditions beyond those indicated in the
recommended operating conditions of this specification is not implied.
Symbol
Min.
Max.
Units
Core supply
-0.5
4.5
V
VCCA
Analog supply
-0.5
4.5
V
VCCINP
Digital input supply (IN[1:4])
-0.5
6
V
VCCJ
JTAG logic supply
-0.5
6
V
VCCD
Parameter
Conditions
2
VCCPROG
E programming supply
-0.5
4
V
VIN
Digital input voltage (all digital I/O pins)
-0.5
6
V
VMON
VMON input voltage
-0.5
6
V
HVOUT[1:2]
-0.5
8.8
V
OUT[3:14]
-0.5
VTRI
Voltage applied to tri-stated pins
ISINKMAXTOTAL
Maximum sink current on any output
TS
Storage temperature
-65
150
o
TA
Ambient temperature
-65
125
o
Min.
Max.
Units
2.8
3.96
V
6
V
23
mA
C
C
Recommended Operating Conditions
Symbol
Parameter
Conditions
VCCD, VCCA
Core supply voltage at pin
VCCINP
Digital input supply for IN[1:4] at pin
2.25
5.5
V
VCCJ
JTAG logic supply voltage at pin
2.25
3.6
V
VCCPROG
E2 programming supply at pin
VIN
Input voltage at digital input pins
VMON
Input voltage at VMON pins
During E2 programming
3.0
3.6
V
-0.3
5.5
V
-0.3
5.9
V
OUT[3:14] pins
-0.3
5.5
V
HVOUT[1:2] pins in open-drain
mode
-0.3
8.4
V
-40
85
o
VOUT
Open-drain output voltage
TAPROG
Ambient temperature during
programming
TA
Ambient temperature
Power applied
-40
105
o
TJ
Junction temperature
Power applied
-40
110
o
Typ.
C
C
C
Analog Specifications
Max.
Units
ICC1
Symbol
Core and analog supply current
Parameter
Conditions
20
mA
ICCINP
VCCINP supply current
5
mA
ICCJ
JTAG supply current
1
mA
ICCPROG
Core and analog supply current
20
mA
During programming cycle
1. Includes currents on VCCD and VCCA supplies.
5-5
Min.
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Voltage Monitors
Symbol
Parameter
RIN
Input resistance
Conditions
CIN
Input capacitance
VMON Range
Programmable trip-point range
VZ Sense
Near-ground sense threshold
Min.
Typ.
Max.
Units
55
65
75
kΩ
8
0.075
70
1
VMON Accuracy
Absolute accuracy of any trip-point
HYST
Hysteresis of any trip-point (relative to
setting)
pF
5.867
V
75
80
mV
0.3
1.1
%
1
%
1. Guaranteed by characterization across VCCA range, operating temperature, process.
High Voltage FET Drivers
Symbol
VPP
Parameter
Gate driver output voltage
Conditions
Min.
Typ.
Max.
8V setting
7.6
8
8.4
6V setting
5.7
6
6.3
Units
V
12.5
IOUTSRC
Gate driver source current
(HIGH state)
25
Four settings in software
50
µA
100
FAST OFF mode
IOUTSINK
Gate driver sink current
(LOW state)
1500
3000
100
Controlled ramp settings
250
500
5-6
µA
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
ADC Characteristics1
Symbol
Parameter
Conditions
Min.
ADC resolution
Conversion time
TCONVERT
VIN
Input range full scale
Error due to attenuator
Max.
10
Programmable attenuator = 1
0
Programmable attenuator = 3
Units
Bits
Time from I2C request
100
µs
2.048
V
2
0
V
5.9
Programmable attenuator = 1
ADC Step Size LSB
Eattenuator
Typ.
2
mV
Programmable attenuator = 3
6
mV
Programmable attenuator = 3
+/- 0.1
%
1. LA-ispPAC-POWR1014A only.
2. Maximum voltage is limited by VMONX pin (theoretical maximum is 6.144V).
ADC Error Budget Across Entire Operating Temperature Range1
Symbol
TADC Error
Parameter
Total Measurement Error at
Any Voltage2
Conditions
Min.
Typ.
Max.
Units
Measurement Range 600 mV - 2.048V,
Attenuator =1
-10
+/-4
10
mV
1. LA-ispPAC-POWR1014A only.
2. Total error, guaranteed by characterization, includes INL, DNL, Gain, Offset, and PSR specifications of the ADC.
Power-On Reset
Symbol
Parameter
Conditions
Max.
Units
100
µs
10
µs
500
µs
5
µs
Delay from brown out to reset state.
11
µs
Threshold below which RESETb is LOW1
2.3
V
TRST
Delay from VTH to start-up state
TSTART
Delay from RESETb HIGH to PLDCLK rising
edge
TGOOD
Power-on reset to valid VMON comparator
output and AGOOD is true.
TBRO
Minimum duration brown out required to trigger RESETb
TPOR
VTL
Min.
Typ.
5
1
1
VTH
Threshold above which RESETb is HIGH
2.7
V
VT
Threshold above which RESETb is valid1
0.8
V
CL
Capacitive load on RESETb for master/slave
operation
200
1. Corresponds to VCCA and VCCD supply voltages.
5-7
pF
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Figure 5-2. LA-ispPAC-POWR1014/A Power-On Reset
VTH
VTL
TBRO
VCC
TPOR
RESETb
VT
TRST
Start Up
State
Reset
State
MCLK
PLDCLK
TSTART
Analog Calibration
TGOOD
5-8
AGOOD (Internal)
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
AC/Transient Characteristics
Over Recommended Operating Conditions
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Units
Voltage Monitors
tPD16
Propagation delay input to
output glitch filter OFF
16
µs
tPD64
Propagation delay input to
output glitch filter ON
64
µs
Oscillators
fCLK
Internal master clock
frequency (MCLK)
7.6
fCLKEXT
Externally applied master
clock (MCLK)
7.2
fPLDCLK
PLDCLK output frequency
fCLK = 8MHz
Timeout Range
Range of programmable
timers (128 steps)
fCLK = 8MHz
Resolution
Spacing between available
adjacent timer intervals
Accuracy
Timer accuracy
8
8.4
MHz
8.8
MHz
250
kHz
Timers
0.032
fCLK = 8MHz
-6.67
5-9
1966
ms
13
%
-12.5
%
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Digital Specifications
Over Recommended Operating Conditions
Symbol
IIL,IIH
Parameter
Min.
Output leakage current
IPU
Input pull-up current (TMS, TDI,
TDISEL, ATDI, MCLK, PLDCLK,
RESETb)
Voltage input, logic low1
HVOUT[1:2] in open
drain mode and pulled
up to 8V
35
µA
100
µA
µA
TDI, TMS, ATDI,
TDISEL, 2.5V supply
0.7
V
30% VCCD
30% VCCINP
TDI, TMS, ATDI,
TDISEL, 3.3V supply
2.0
TDI, TMS, ATDI,
TDISEL, 2.5V supply
1.7
IN[1:4]
VOH
+/-10
0.8
SCL, SDA
VOL
Units
TDI, TMS, ATDI,
TDISEL, 3.3V supply
IN[1:4]
Voltage input, logic high1
Max.
70
SCL, SDA
VIH
Typ.
Input leakage, no pull-up/pull-down
IOH-HVOUT
VIL
Conditions
V
70% VCCD
VCCD
70% VCCINP
VCCINP
HVOUT[1:2] (open drain mode),
ISINK = 10mA
OUT[3:14]
ISINK = 20mA
0.8
TDO,MCLK,PLDCLK
ISINK = 4mA
0.4
TDO, MCLK, PLDCLK
ISRC = 4mA
VCCD - 0.4
V
67
mA
ISINKTOTAL2 All digital outputs
0.8
1. IN[1:4] referenced to VCCINP; TDO, TDI, TMS, ATDI, TDISEL referenced to VCCJ; SCL, SDA referenced to VCCD.
2. Sum of maximum current sink from all digital outputs combined. Reliable operation is not guaranteed if this value is exceeded.
5-10
V
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
I2C Port Characteristics1
100KHz
Symbol
Definition
Min.
2
400KHz
Max.
Min.
2
Max.
2
100
FI2C
I C clock/data rate
TSU;STA
After start
THD;STA
After start
4
0.6
us
TSU;DAT
Data setup
250
100
ns
TSU;STO
Stop setup
THD;DAT
Data hold; SCL= Vih_min = 2.1V
0.3
3.45
TLOW
Clock low period
4.7
10
THIGH
Clock high period
4
TF
Fall time; 2.25V to 0.65V
300
300
ns
TR
Rise time; 0.65V to 2.25V
1000
300
ns
TTIMEOUT
Detect clock low timeout
25
35
ms
TPOR
Device must be operational after power-on reset
500
500
ms
TBUF
Bus free time between stop and start condition
4.7
1.3
us
4.7
400
Units
0.6
4
us
0.6
us
0.3
0.9
1.3
10
0.6
35
25
kHz
us
us
us
1. Applies to LA-ispPAC-POWR1014A only.
2. If FI2C is less than 50kHz, then the ADC DONE status bit is not guaranteed to be set after a valid conversion request is completed. In this
case, waiting for the TCONVERT minimum time after a convert request is made is the only way to guarantee a valid conversion is ready for
readout. When FI2C is greater than 50kHz, ADC conversion complete is ensured by waiting for the DONE status bit.
5-11
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Timing for JTAG Operations
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Units
tISPEN
Program enable delay time
10
—
—
µs
tISPDIS
Program disable delay time
30
—
—
µs
tHVDIS
High voltage discharge time, program
30
—
—
µs
tHVDIS
High voltage discharge time, erase
200
—
—
µs
tCEN
Falling edge of TCK to TDO active
—
—
10
ns
tCDIS
Falling edge of TCK to TDO disable
—
—
10
ns
tSU1
Setup time
5
—
—
ns
tH
Hold time
10
—
—
ns
tCKH
TCK clock pulse width, high
20
—
—
ns
tCKL
TCK clock pulse width, low
20
—
—
ns
fMAX
Maximum TCK clock frequency
—
—
25
MHz
tCO
Falling edge of TCK to valid output
—
—
10
ns
tPWV
Verify pulse width
30
—
—
µs
tPWP
Programming pulse width
20
—
—
ms
Figure 5-3. Erase (User Erase or Erase All) Timing Diagram
Clock to Shift-IR state and shift in the Discharge
Instruction, then clock to the Run-Test/Idle state
VIH
TMS
VIL
tSU1
tH
tCKH
VIH
tSU1
tSU1
tH
tH
tGKL
tCKH
TCK
VIL
State
Update-IR
Run-Test/Idle (Erase)
Select-DR Scan
tSU1
tH
tCKH
tSU1
tGKL
tSU1
tH
tCKH
tH
tCKH
tSU2
Specified by the Data Sheet
Run-Test/Idle (Discharge)
Figure 5-4. Programming Timing Diagram
VIL
tSU1
tH
tCKH
VIH
tSU1
tH
tCKL
tSU1
tPWP
tH
tCKH
TCK
VIL
State
Update-IR
Run-Test/Idle (Program)
Select-DR Scan
5-12
Clock to Shift-IR state and shift in the next
Instruction, which will stop the discharge process
VIH
TMS
tSU1
tH
tCKH
tSU1
tCKL
Update-IR
tH
tCKH
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
VIH
TMS
VIL
tSU1
tH
tCKH
tSU1
tH
tSU1
tCKL
tPWV
tH
tCKH
VIH
TCK
VIL
State
Update-IR
Run-Test/Idle (Program)
Select-DR Scan
Clock to Shift-IR state and shift in the next Instruction
Figure 5-5. Verify Timing Diagram
tSU1
tH
tSU1
tCKH
tH
tCKL
tCKH
Update-IR
Figure 5-6. Discharge Timing Diagram
tHVDIS (Actual)
TMS
VIL
tSU1
tH
tCKH
tSU1
tCKL
tH
tSU1
tPWP
tH
tCKH
VIH
TCK
VIL
State
Update-IR
Run-Test/Idle (Erase or Program)
Select-DR Scan
Clock to Shift-IR state and shift in the Verify
Instruction, then clock to the Run-Test/Idle state
VIH
tSU1
tH
tCKH
tSU1
tCKL
tH
tSU1
tCKH
tPWV
tH
tCKH
Actual
tPWV
Specified by the Data Sheet
Run-Test/Idle (Verify)
Theory of Operation
Analog Monitor Inputs
The LA-ispPAC-POWR1014/A provides 10 independently programmable voltage monitor input circuits as shown in
Figure 5-7. Two individually programmable trip-point comparators are connected to an analog monitoring input.
Each comparator reference has 372 programmable trip points over the range of 0.672V to 5.867V. Additionally, a
75mV ‘zero-detect’ threshold is selectable which allows the voltage monitors to determine if a monitored signal has
dropped to ground level. This feature is especially useful for determining if a power supply’s output has decayed to
a substantially inactive condition after it has been switched off.
5-13
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Figure 5-7. LA-ispPAC-POWR1014/A Voltage Monitors
LA-ispPAC-POWR1014/A
To ADC
(LA-ispPAC-POWR1014A on
Comp A/Window
Select
Comp A
VMONx
+
MUX
Trip Point A
–
Glitch
Filter
VMONxA
Logic
Signal
PLD
Array
Comp B
+
Trip Point B
Glitch
Filter
–
Analog Input
Window Control
VMONxB
Logic
Signal
Filtering
VMONx Status
I2C Interface
Unit (LA-ispPACPOWR1014A only)
Figure 5-7 shows the functional block diagram of one of the 10 voltage monitor inputs - ‘x’ (where x = 1...10). Each
voltage monitor can be divided into three sections: Analog Input, Window Control, and Filtering.
The voltage input is monitored by two individually programmable trip-point comparators, shown as CompA and
CompB. Table 5-1 shows all trip points and the range to which any comparator’s threshold can be set.
Each comparator outputs a HIGH signal to the PLD array if the voltage at its positive terminal is greater than its programmed trip point setting, otherwise it outputs a LOW signal.
A hysteresis of approximately 1% of the setpoint is provided by the comparators to reduce false triggering as a
result of input noise. The hysteresis provided by the voltage monitor is a function of the input divider setting.
Table 5-3 lists the typical hysteresis versus voltage monitor trip-point.
AGOOD Logic Signal
All the VMON comparators auto-calibrate immediately after a power-on reset event. During this time, the digital
glitch filters are also initialized. This process completion is signalled by an internally generated logic signal:
AGOOD. All logic using the VMON comparator logic signals must wait for the AGOOD signal to become active.
Programmable Over-Voltage and Under-Voltage Thresholds
Figure 5-8 (a) shows the power supply ramp-up and ramp-down voltage waveforms. Because of hysteresis, the
comparator outputs change state at different thresholds depending on the direction of excursion of the monitored
power supply.
5-14
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Monitored Power Supply Votlage
Figure 5-8. (a) Power Supply Voltage Ramp-up and Ramp-down Waveform and the Resulting Comparator
Output, (b) Corresponding to Upper and Lower Trip Points
UTP
LTP
(a)
(b)
Comparator Logic Output
During power supply ramp-up the comparator output changes from logic 0 to 1 when the power supply voltage
crosses the upper trip point (UTP). During ramp down the comparator output changes from logic state 1 to 0 when
the power supply voltage crosses the lower trip point (LTP). To monitor for over voltage fault conditions, the UTP
should be used. To monitor under-voltage fault conditions, the LTP should be used.
Tables 1 and 2 show both the under-voltage and over-voltage trip points, which are automatically selected in software depending on whether the user is monitoring for an over-voltage condition or an under-voltage condition.
5-15
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Table 5-1. Trip Point Table Used For Over-Voltage Detection
Coarse Range Setting
Fine
Range
Setting
1
2
3
4
5
6
7
8
9
10
11
12
1
0.806
0.960
1.143
1.360
1.612
1.923
2.290
2.719
3.223
3.839
4.926
5.867
2
0.802
0.955
1.137
1.353
1.603
1.913
2.278
2.705
3.206
3.819
4.900
5.836
3
0.797
0.950
1.131
1.346
1.595
1.903
2.266
2.691
3.190
3.799
4.875
5.806
4
0.793
0.945
1.125
1.338
1.586
1.893
2.254
2.677
3.173
3.779
4.849
5.775
5
0.789
0.940
1.119
1.331
1.578
1.883
2.242
2.663
3.156
3.759
4.823
5.745
6
0.785
0.935
1.113
1.324
1.570
1.873
2.230
2.649
3.139
3.739
4.798
5.714
7
0.781
0.930
1.107
1.317
1.561
1.863
2.219
2.634
3.122
3.719
4.772
5.683
8
0.776
0.925
1.101
1.310
1.553
1.853
2.207
2.620
3.106
3.699
4.746
5.653
9
0.772
0.920
1.095
1.303
1.544
1.843
2.195
2.606
3.089
3.679
4.721
5.622
10
0.768
0.915
1.089
1.296
1.536
1.833
2.183
2.592
3.072
3.659
4.695
5.592
11
0.764
0.910
1.083
1.289
1.528
1.823
2.171
2.578
3.055
3.639
4.669
5.561
12
0.760
0.905
1.077
1.282
1.519
1.813
2.159
2.564
3.038
3.619
4.644
5.531
13
0.755
0.900
1.071
1.275
1.511
1.803
2.147
2.550
3.022
3.599
4.618
5.500
14
0.751
0.895
1.065
1.268
1.502
1.793
2.135
2.535
3.005
3.579
4.592
5.470
15
0.747
0.890
1.059
1.261
1.494
1.783
2.123
2.521
2.988
3.559
4.567
5.439
16
0.743
0.885
1.053
1.254
1.486
1.773
2.111
2.507
2.971
3.539
4.541
5.408
17
0.739
0.880
1.047
1.246
1.477
1.763
2.099
2.493
2.954
3.519
4.515
5.378
18
0.734
0.875
1.041
1.239
1.469
1.753
2.087
2.479
2.938
3.499
4.490
5.347
19
0.730
0.870
1.035
1.232
1.460
1.743
2.075
2.465
2.921
3.479
4.464
5.317
20
0.726
0.865
1.029
1.225
1.452
1.733
2.063
2.450
2.904
3.459
4.438
5.286
21
0.722
0.860
1.024
1.218
1.444
1.723
2.052
2.436
2.887
3.439
4.413
5.256
22
0.718
0.855
1.018
1.211
1.435
1.713
2.040
2.422
2.871
3.419
4.387
5.225
23
0.713
0.850
1.012
1.204
1.427
1.703
2.028
2.408
2.854
3.399
4.361
5.195
24
0.709
0.845
1.006
1.197
1.418
1.693
2.016
2.394
2.837
3.379
4.336
5.164
25
0.705
0.840
1.000
1.190
1.410
1.683
2.004
2.380
2.820
3.359
4.310
5.133
26
0.701
0.835
0.994
1.183
1.402
1.673
1.992
2.365
2.803
3.339
4.284
5.103
27
0.697
0.830
0.988
1.176
1.393
1.663
1.980
2.351
2.787
3.319
4.259
5.072
28
0.692
0.825
0.982
1.169
1.385
1.653
1.968
2.337
2.770
3.299
4.233
5.042
29
0.688
0.820
0.976
1.161
1.377
1.643
1.956
2.323
2.753
3.279
4.207
5.011
30
0.684
0.815
0.970
1.154
1.368
1.633
1.944
2.309
2.736
3.259
4.182
4.981
31
0.680
0.810
0.964
1.147
—
1.623
1.932
2.295
—
3.239
4.156
4.950
Low-V
Sense
75mV
5-16
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Table 5-2. Trip Point Table Used For Under-Voltage Detection
Fine
Range
Setting
1
2
3
4
5
6
7
8
9
10
11
12
1
0.797
0.950
1.131
1.346
1.595
1.903
2.266
2.691
3.190
3.799
4.875
5.806
2
0.793
0.945
1.125
1.338
1.586
1.893
2.254
2.677
3.173
3.779
4.849
5.775
3
0.789
0.940
1.119
1.331
1.578
1.883
2.242
2.663
3.156
3.759
4.823
5.745
4
0.785
0.935
1.113
1.324
1.570
1.873
2.230
2.649
3.139
3.739
4.798
5.714
5
0.781
0.930
1.107
1.317
1.561
1.863
2.219
2.634
3.122
3.719
4.772
5.683
6
0.776
0.925
1.101
1.310
1.553
1.853
2.207
2.620
3.106
3.699
4.746
5.653
7
0.772
0.920
1.095
1.303
1.544
1.843
2.195
2.606
3.089
3.679
4.721
5.622
8
0.768
0.915
1.089
1.296
1.536
1.833
2.183
2.592
3.072
3.659
4.695
5.592
9
0.764
0.910
1.083
1.289
1.528
1.823
2.171
2.578
3.055
3.639
4.669
5.561
10
0.760
0.905
1.077
1.282
1.519
1.813
2.159
2.564
3.038
3.619
4.644
5.531
11
0.755
0.900
1.071
1.275
1.511
1.803
2.147
2.550
3.022
3.599
4.618
5.500
12
0.751
0.895
1.065
1.268
1.502
1.793
2.135
2.535
3.005
3.579
4.592
5.470
13
0.747
0.890
1.059
1.261
1.494
1.783
2.123
2.521
2.988
3.559
4.567
5.439
14
0.743
0.885
1.053
1.254
1.486
1.773
2.111
2.507
2.971
3.539
4.541
5.408
15
0.739
0.880
1.047
1.246
1.477
1.763
2.099
2.493
2.954
3.519
4.515
5.378
16
0.734
0.875
1.041
1.239
1.469
1.753
2.087
2.479
2.938
3.499
4.490
5.347
17
0.730
0.870
1.035
1.232
1.460
1.743
2.075
2.465
2.921
3.479
4.464
5.317
18
0.726
0.865
1.029
1.225
1.452
1.733
2.063
2.450
2.904
3.459
4.438
5.286
19
0.722
0.860
1.024
1.218
1.444
1.723
2.052
2.436
2.887
3.439
4.413
5.256
20
0.718
0.855
1.018
1.211
1.435
1.713
2.040
2.422
2.871
3.419
4.387
5.225
21
0.713
0.850
1.012
1.204
1.427
1.703
2.028
2.408
2.854
3.399
4.361
5.195
22
0.709
0.845
1.006
1.197
1.418
1.693
2.016
2.394
2.837
3.379
4.336
5.164
23
0.705
0.840
1.000
1.190
1.410
1.683
2.004
2.380
2.820
3.359
4.310
5.133
24
0.701
0.835
0.994
1.183
1.402
1.673
1.992
2.365
2.803
3.339
4.284
5.103
25
0.697
0.830
0.988
1.176
1.393
1.663
1.980
2.351
2.787
3.319
4.259
5.072
26
0.692
0.825
0.982
1.169
1.385
1.653
1.968
2.337
2.770
3.299
4.233
5.042
27
0.688
0.820
0.976
1.161
1.377
1.643
1.956
2.323
2.753
3.279
4.207
5.011
28
0.684
0.815
0.970
1.154
1.368
1.633
1.944
2.309
2.736
3.259
4.182
4.981
29
0.680
0.810
0.964
1.147
1.360
1.623
1.932
2.295
2.719
3.239
4.156
4.950
30
0.676
0.805
0.958
1.140
1.352
1.613
1.920
2.281
2.702
3.219
4.130
4.919
31
0.672
0.800
0.952
1.133
-
1.603
1.908
2.267
-
3.199
4.105
4.889
Low-V
Sense
75mV
5-17
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Table 5-3. Comparator Hysteresis vs. Trip-Point
Trip-point Range (V)
Low Limit
High Limit
Hysteresis (mV)
0.672
0.806
8
0.800
0.960
10
0.952
1.143
12
1.133
1.360
14
1.346
1.612
17
1.603
1.923
20
1.908
2.290
24
2.267
2.719
28
2.691
3.223
34
3.199
3.839
40
4.105
4.926
51
4.889
5.867
75 mV
61
0 (Disabled)
The window control section of the voltage monitor circuit is an AND gate (with inputs: an inverted COMPA “ANDed”
with COMPB signal) and a multiplexer that supports the ability to develop a ‘window’ function without using any of
the PLD’s resources. Through the use of the multiplexer, voltage monitor’s ‘A’ output may be set to report either the
status of the ‘A’ comparator, or the window function of both comparator outputs. The voltage monitor’s ‘A’ output
indicates whether the input signal is between or outside the two comparator thresholds. Important: This windowing
function is only valid in cases where the threshold of the ‘A’ comparator is set to a value higher than that of the ‘B’
comparator. Table 5-4 shows the operation of window function logic.
Table 5-4. Voltage Monitor Windowing Logic
Input Voltage
Comp A
Comp B
Window
(B and Not A)
Comment
VIN < Trip-point B < Trip-point A
0
0
0
Outside window, low
Trip-point B < VIN < Trip-point A
0
1
1
Inside window
Trip-point B < Trip-point A < VIN
1
1
0
Outside window, high
Note that when the ‘A’ output of the voltage monitor circuit is set to windowing mode, the ‘B’ output continues to
monitor the output of the ‘B’ comparator. This can be useful in that the ‘B’ output can be used to augment the windowing function by determining if the input is above or below the windowing range.
The third section in the LA-ispPAC-POWR1014/A’s input voltage monitor is a digital filter. When enabled, the comparator output will be delayed by a filter time constant of 64 µs, and is especially useful for reducing the possibility
of false triggering from noise that may be present on the voltages being monitored. When the filter is disabled, the
comparator output will be delayed by 16µs. In both cases, enabled or disabled, the filters also provide synchronization of the input signals to the PLD clock. This synchronous sampling feature effectively eliminates the possibility of
race conditions from occurring in any subsequent logic that is implemented in the LA-ispPAC-POWR1014/A’s internal PLD logic.
The comparator status can be read from the I2C interface (LA-ispPAC-POWR1014A only). For details on the I2C
interface, please refer to the I2C/SMBUS Interface section of this data sheet.
5-18
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
VMON Voltage Measurement with the On-chip Analog to Digital Converter
(ADC, LA-ispPAC-POWR1014A Only)
The LA-ispPAC-POWR1014A has an on-chip analog to digital converter that can be used for measuring the voltages at the VMON inputs.
Figure 5-9. ADC Monitoring VMON1 to VMON10
VMON1
VMON2
VMON3
Programmable
Digital Multiplier
Programmable Analog
Attenuator
ADC
MUX
÷3 / ÷1
ADC
x3 / x1
10
VMON10
To I2C Readout Register
12 (LA-ispPAC-POWR1014A Only)
Internal
VREF- 2.048V
VDDA
VCCINP
4
1
5
From I 2 C ADC MUX Register
(LA-ispPAC-POWR1014A Only)
Figure 5-9 shows the ADC circuit arrangement within the LA-ispPAC-POWR1014A device. The ADC can measure
all analog input voltages through the multiplexer, ADC MUX. The programmable attenuator between the ADC mux
and the ADC can be configured as divided-by-3 or divided-by-1 (no attenuation). The divided-by-3 setting is used to
measure voltages from 0V to 6V range and divided-by-1 setting is used to measure the voltages from 0V to 2V
range.
A microcontroller can place a request for any VMON voltage measurement at any time through the I2C bus (LA-ispPAC-POWR1014A only). Upon the receipt of an I2C command, the ADC will be connected to the I2C selected
VMON through the ADC MUX. The ADC output is then latched into the I2C readout registers.
Calculation
The algorithm to convert the ADC code to the corresponding voltage takes into consideration the attenuation bit
value. In other words, if the attenuation bit is set, then the 10-bit ADC result is automatically multiplied by 3 to calculate the actual voltage at that VMON input. Thus, the I2C readout register is 12 bits instead of 10 bits. The following formula can always be used to calculate the actual voltage from the ADC code.
Voltage at the VMONx Pins
VMON = I2C Readout Register (12 bits1, converted to decimal) * 2mV
1
Note: ADC_VALUE_HIGH (8 bits), ADC_VALUE_LOW (4 bits) read from I2C/SMBUS interface (LA-ispPAC-POWR1014A only).
5-19
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
PLD Block
Figure 5-10 shows the LA-ispPAC-POWR1014/A PLD architecture, which is derived from the Lattice's ispMACH™
4000 CPLD. The PLD architecture allows the flexibility in designing various state machines and control functions
used for power supply management. The AND array has 53 inputs and generates 123 product terms. These 123
product terms are divided into three groups of 41 for each of the generic logic blocks, GLB1, GLB2, and GLB3.
Each GLB is made up of eight macrocells. In total, there are 24 macrocells in the LA-ispPAC-POWR1014/A device.
The output signals of the LA-ispPAC-POWR1014/A device are derived from GLBs as shown in Figure 5-10. GLB3
generates timer control.
Figure 5-10. LA-ispPAC-POWR1014/A PLD Architecture
Global Reset
(Resetb pin)
AGOOD
41
MCLK
IN[1:4]
4
HVOUT[1..2],
OUT[3..8]
GLB2
Generic Logic Block
8 Macrocell
41 PT
OUT[9..14]
Input
Register
AND Array
53 Inputs
123 PT
VMON[1-10]
20
GLB1
Generic Logic Block
8 Macrocell
41 PT
Input
Register
41
4
Output
Feedback
GLB3
Generic Logic Block
8 Macrocell
41 PT
41
24
Timer0
Timer1
Timer2
Timer3
IRP
Timer Clock
18
PLD Clock
Macrocell Architecture
The macrocell shown in Figure 5-11 is the heart of the PLD. The basic macrocell has five product terms that feed
the OR gate and the flip-flop. The flip-flop in each macrocell is independently configured. It can be programmed to
function as a D-Type or T-Type flip-flop. Combinatorial functions are realized by bypassing the flip-flop. The polarity
control and XOR gates provide additional flexibility for logic synthesis. The flip-flop’s clock is driven from the common PLD clock that is generated by dividing the 8 MHz master clock by 32. The macrocell also supports asynchronous reset and preset functions, derived from either product terms, the global reset input, or the power-on reset
signal. The resources within the macrocells share routing and contain a product term allocation array. The product
term allocation array greatly expands the PLD’s ability to implement complex logical functions by allowing logic to
be shared between adjacent blocks and distributing the product terms to allow for wider decode functions. All the
digital inputs are registered by MCLK and the VMON comparator outputs are registered by the PLD Clock to synchronize them to the PLD logic.
5-20
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Figure 5-11. LA-ispPAC-POWR1014/A Macrocell Block Diagram
Global Reset
Power On Reset
Global Polarity Fuse for
Init Product Term
Block Init Product Term
Product Term Allocation
PT4
PT3
PT2
R
PT1
P
PT0
D/T
To PLD Output
Q
Polarity
CLK
Clock
Macrocell flip-flop provides
D, T, or combinatorial
output with polarity
Clock and Timer Functions
Figure 5-12 shows a block diagram of the LA-ispPAC-POWR1014/A’s internal clock and timer systems. The master
clock operates at a fixed frequency of 8MHz, from which a fixed 250kHz PLD clock is derived.
Figure 5-12. Clock and Timer System
PLD Clock
Timer 0
Internal
Oscillator
8MHz
Timer 1
SW0
To/From
PLD
32
Timer 2
SW1
Timer 3
SW2
MCLK
PLDCLK
The internal oscillator runs at a fixed frequency of 8 MHz. This signal is used as a source for the PLD and timer
clocks. It is also used for clocking the comparator outputs and clocking the digital filters in the voltage monitor cir-
5-21
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
cuits and ADC. The LA-ispPAC-POWR1014/A can be programmed to operate in three modes: Master mode, Standalone mode and Slave mode. Table 5-5 summarizes the operating modes of LA-ispPAC-POWR1014/A.
Table 5-5. LA-ispPAC-POWR1014/A Operating Modes
Timer
Operating Mode
Standalone
Master
Slave
SW0
SW1
Closed
Open
Condition
Comments
When only one LA-ispPAC-POWR1014/A is used.
MCLK pin tristated
Closed
Closed
When more than one LA-ispPAC-POWR1014/A is
used in a board, one of them should be configured MCLK pin outputs 8MHz clock
to operate in this mode.
Open
Closed
When more than one LA-ispPAC-POWR1014/As is
used in a board. Other than the master, the rest of
MCLK pin is input
the LA-ispPAC-POWR1014/As should be programmed as slaves.
A divide-by-32 prescaler divides the internal 8MHz oscillator (or external clock, if selected) down to 250kHz for the
PLD clock and for the programmable timers. This PLD clock may be made available on the PLDCLK pin by closing
SW2. Each of the four timers provides independent timeout intervals ranging from 32µs to 1.96 seconds in 128
steps.
Digital Outputs
The LA-ispPAC-POWR1014/A provides 14 digital outputs, HVOUT[1:2] and OUT[3:14]. Outputs OUT[3:14] are permanently configured as open drain to provide a high degree of flexibility when interfacing to logic signals, LEDs,
opto-couplers, and power supply control inputs. The HVOUT[1:2] pins can be configured as either high voltage FET
drivers or open drain outputs. Each of these outputs may be controlled either from the PLD or from the I2C bus (LAispPAC-POWR1014A only). The determination whether a given output is under PLD or I2C control may be made on
a pin-by-pin basis (see Figure 5-13). For further details on controlling the outputs through I2C, please see the I2C/
SMBUS Interface section of this data sheet.
Figure 5-13. Digital Output Pin Configuration
Digital Control
from PLD
OUTx
Pin
Digital Control from I2C Register
(LA-ispPAC-POWR1014A only)
High-Voltage Outputs
In addition to being usable as digital open-drain outputs, the LA-ispPAC-POWR1014/A’s HVOUT1-HVOUT2 output
pins can be programmed to operate as high-voltage FET drivers. Figure 5-14 shows the details of the HVOUT gate
drivers. Each of these outputs may be controlled from the PLD, or with the LA-ispPAC-POWR1014A, from the I2C
bus (see Figure 5-14). For further details on controlling the outputs through I2C, please see the I2C/SMBUS Interface section of this data sheet.
5-22
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Figure 5-14. Basic Function Diagram for an Output in High Voltage MOSFET Gate Driver Mode
Charge Pump
(6 to 8V)
Digital Control
from PLD
ISOURCE
(12.5 to 100 µA)
+
-
HVOUTx
Pin
ISINK
(100 to 500 µA)
+Fast Turn-off
(3000µA)
Input
Supply
Load
Digital Control from I2C Register
(LA-ispPAC-POWR1014A Only)
Figure 5-14 shows the HVOUT circuitry when programmed as a FET driver. In this mode the output either sources
current from a charge pump or sinks current. The maximum voltage that the output level at the pin will rise to is also
programmable. The HVOUT pin source current, which is programmable between 12.5 µA and 100 µA, is used to
control the FET turn-on rate. Similarly, the HVOUT sink current, which is programmable between 3000 µA and 100
µA, is used to control the turn-off rate.
Programmable Output Voltage Levels for HVOUT1- HVOUT2
The HVOUT output voltage can be programmed to 6V or 8V when in FET driver mode.
RESETb Signal, RESET Command via JTAG or I2C
Activating the RESETb signal (Logic 0 applied to the RESETb pin) or issuing a reset instruction via JTAG, or with
the LA-ispPAC-POWR1014A, I2C will force the outputs to the following states independent of how these outputs
have been configured in the PINS window:
• OUT3-14 will go high-impedance.
• HVOUT pins programmed for open drain operation will go high-impedance.
• HVOUT pins programmed for FET driver mode operation will pull down.
At the conclusion of the RESET event, these outputs will go to the states defined by the PINS window, and if a
sequence has been programmed into the device, it will be re-started at the first step. The analog calibration will be
re-done and consequently, the VMONs, and ADCs will not be operational until 500 microseconds (max.) after the
conclusion of the RESET event.
CAUTION: Activating the RESETb signal or issuing a RESET command through I2C or JTAG during the LA-ispPAC-POWR1014/A device operation, results in the device aborting all operations and returning to the power-on
reset state. The status of the power supplies which are being enabled by the LA-ispPAC-POWR1014/A will be
determined by the state of the outputs shown above.
I2C/SMBUS Interface (LA-ispPAC-POWR1014A Only)
I2C and SMBus are low-speed serial interface protocols designed to enable communications among a number of
devices on a circuit board. The LA-ispPAC-POWR1014A supports a 7-bit addressing of the I2C communications
protocol, as well as SMBTimeout and SMBAlert features of the SMBus, enabling it to easily integrated into many
types of modern power management systems. Figure 5-15 shows a typical I2C configuration, in which one or more
LA-ispPAC-POWR1014As are slaved to a supervisory microcontroller. SDA is used to carry data signals, while
SCL provides a synchronous clock signal. The SMBAlert line is only present in SMBus systems. The 7-bit I2C
address of the POWR1014A is fully programmable through the JTAG port.
5-23
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Figure 5-15. LA-ispPAC-POWR1014A in I 2C/SMBUS System
V+
SDA/SMDAT (DATA)
To Other
I2C
Devices
SCL/SMCLK (CLOCK)
SMBALERT
SDA
SCL
SDA
INTERRUPT
SCL
OUT5/
SMBA
SDA
POWR1014A
(I2C SLAVE)
MICROPROCESSOR
(I2C MASTER)
SCL
OUT5/
SMBA
POWR1014A
(I2C SLAVE)
In both the I2C and SMBus protocols, the bus is controlled by a single MASTER device at any given time. This master device generates the SCL clock signal and coordinates all data transfers to and from a number of slave devices.
The LA-ispPAC-POWR1014A is configured as a slave device, and cannot independently coordinate data transfers.
Each slave device on a given I2C bus is assigned a unique address. The LA-ispPAC-POWR1014A implements the
7-bit addressing portion of the standard. Any 7-bit address can be assigned to the LA-ispPAC-POWR1014A device
by programming through JTAG. When selecting a device address, one should note that several addresses are
reserved by the I2C and/or SMBus standards, and should not be assigned to LA-ispPAC-POWR1014A devices to
assure bus compatibility. Table 5-6 lists these reserved addresses.
Table 5-6. I 2C/SMBus Reserved Slave Device Addresses
I2C function Description
Address
R/W bit
0000 000
0
0000 000
1
Start Byte
Start Byte
0000 001
x
CBUS Address
CBUS Address
0000 010
x
Reserved
Reserved
0000 011
x
Reserved
Reserved
General Call Address
SMBus Function
General Call Address
0000 1xx
x
HS-mode master code
HS-mode master code
0001 000
x
NA
SMBus Host
0001 100
x
NA
SMBus Alert Response Address
0101 000
x
NA
Reserved for ACCESS.bus
0110 111
x
NA
Reserved for ACCESS.bus
1100 001
x
NA
SMBus Device Default Address
1111 0xx
x
10-bit addressing
10-bit addressing
1111 1xx
x
Reserved
Reserved
The LA-ispPAC-POWR1014A’s I2C/SMBus interface allows data to be both written to and read from the device. A
data write transaction (Figure 5-16) consists of the following operations:
1. Start the bus transaction
2. Transmit the device address (7 bits) along with a low write bit
3. Transmit the address of the register to be written to (8 bits)
4. Transmit the data to be written (8 bits)
5. Stop the bus transaction
5-24
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
To start the transaction, the master device holds the SCL line high while pulling SDA low. Address and data bits are
then transferred on each successive SCL pulse, in three consecutive byte frames of 9 SCL pulses. Address and
data are transferred on the first 8 SCL clocks in each frame, while an acknowledge signal is asserted by the slave
device on the 9th clock in each frame. Both data and addresses are transferred in a most-significant-bit-first format.
The first frame contains the 7-bit device address, with bit 8 held low to indicate a write operation. The second frame
contains the register address to which data will be written, and the final frame contains the actual data to be written. Note that the SDA signal is only allowed to change when the SCL is low, as raising SDA when SCL is high signals the end of the transaction.
Figure 5-16. I 2C Write Operation
SCL
SDA
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
8
9
A6
A5
A4
A3
A2
A1
A0
R/W
ACK
R7
R6
R5
R4
R3
R2
R1
R0
ACK
D7
D6
D5
D4
D3
D2
D1
D0
ACK
START
DEVICE ADDRESS (7 BITS)
REGISTER ADDRESS (8 BITS)
WRITE DATA (8 BITS)
STOP
Note: Shaded Bits Asserted by Slave
Reading a data byte from the LA-ispPAC-POWR1014A requires two separate bus transactions (Figure 5-17). The
first transaction writes the register address from which a data byte is to be read. Note that since no data is being
written to the device, the transaction is concluded after the second byte frame. The second transaction performs
the actual read. The first frame contains the 7-bit device address with the R/W bit held High. In the second frame
the LA-ispPAC-POWR1014A asserts data out on the bus in response to the SCL signal. Note that the acknowledge
signal in the second frame is asserted by the master device and not the LA-ispPAC-POWR1014A.
Figure 5-17. I 2C Read Operation
STEP 1: WRITE REGISTER ADDRESS FOR READ OPERATION
SCL
SDA
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
8
9
A6
A5
A4
A3
A2
A1
A0
R/W
ACK
R7
R6
R5
R4
R3
R2
R1
R0
ACK
START
DEVICE ADDRESS (7 BITS)
REGISTER ADDRESS (8 BITS)
STOP
STEP 2: READ DATA FROM THAT REGISTER
SCL
SDA
START
1
2
3
4
5
6
7
8
9
1
2
3
4
5
6
7
8
9
A6
A5
A4
A3
A2
A1
A0
R/W
ACK
D7
D6
D5
D4
D3
D2
D1
D0
ACK
DEVICE ADDRESS (7 BITS)
READ DATA (8 BITS)
OPTIONAL
STOP
Note: Shaded Bits Asserted by Slave
The LA-ispPAC-POWR1014ALA-ispPAC-POWR1014A provides 17 registers that can be accessed through its I2C
interface. These registers provide the user with the ability to monitor and control the device’s inputs and outputs,
and transfer data to and from the device. Table 5-7 provides a summary of these registers.
5-25
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Table 5-7. I 2C Control Registers
Register
Address
Register
Name
Read/Write
0x00
vmon_status0
R
VMON input status Vmon[4:1]
–––– ––––
0x01
vmon_status1
R
VMON input status Vmon[8:5]
–––– ––––
Value After POR1, 2
Description
0x02
vmon_status2
R
VMON input status Vmon[10:9]
XXXX ––––
0x03
output_status0
R
Output status OUT[8:3], HVOUT[2:1]
–––– ––––
0x04
output_status1
R
Output status OUT[14:9]
XX–– ––––
0x06
input_status
R
Input status IN[4:1]
XXXX ––––
0x07
adc_value_low
R
ADC D[3:0] and status
–––– XXX1
0x08
adc_value_high
R
ADC D[9:4]
XX–– ––––
0x09
adc_mux
R/W
ADC Attenuator and MUX[3:0]
XXX– ––––
0x0A
UES_byte0
R
UES[7:0]
–––– ––––
0x0B
UES_byte1
R
UES[15:8]
–––– ––––
0x0C
UES_byte2
R
UES[23:16]
–––– ––––
0x0D
UES_byte3
R
UES[31:24]
–––– ––––
0x0E
gp_output1
R/W
GPOUT[8:1]
0000 0100
0x0F
gp_output2
R/W
GPOUT[14:9]
XX00 0000
0x11
input_value
R/W
PLD Input Register [4:2]
XXXX 000X
0x12
reset
W
Resets device on write
N/A
1. “X” = Non-functional bit (bits read out as 1’s).
2. “–” = State depends on device configuration or input status.
Several registers are provided for monitoring the status of the analog inputs. The three registers
VMON_STATUS[0:2] provide the ability to read the status of the VMON output comparators. The ability to read both
the ‘a’ and ‘b’ comparators from each VMON input is provided through the VMON input registers. Note that if a
VMON input is configured to window comparison mode, then the corresponding VMONxA register bit will reflect the
status of the window comparison.
Figure 5-18. VMON Status Registers
0x00 - VMON_STATUS0 (Read Only)
VMON4B
VMON4A
VMON3B
VMON3A
VMON2B
VMON2A
VMON1B
VMON1A
b7
b6
b5
b4
b3
b2
b1
b0
0x01 - VMON_STATUS1 (Read Only)
VMON8B
VMON8A
VMON7B
VMON7A
VMON6B
VMON6A
VMON5B
VMON5A
b7
b6
b5
b4
b3
b2
b1
b0
0x02 - VMON_STATUS2 (Read Only)
1
1
1
1
VMON10B
VMON10A
VMON9B
VMON9A
b7
b6
b5
b4
b3
b2
b1
b0
It is also possible to directly read the value of the voltage present on any of the VMON inputs by using the LA-ispPAC-POWR1014A’s ADC. Three registers provide the I2C interface to the ADC (Figure 5-19).
5-26
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Figure 5-19. ADC Interface Registers
0x07 - ADC_VALUE_LOW (Read Only)
D3
D2
D1
D0
1
1
1
DONE
b7
b6
b5
b4
b3
b2
b1
b0
0x08 - ADC_VALUE_HIGH (Read Only)
D11
D10
D9
D8
D7
D6
D5
D4
b7
b6
b5
b4
b3
b2
b1
b0
0x09 - ADC_MUX (Read/Write)
X
X
X
ATTEN
SEL3
SEL2
SEL1
SEL0
b7
b6
b5
b4
b3
b2
b1
b0
To perform an A/D conversion, one must set the input attenuator and channel selector. Two input ranges may be
set using the attenuator, 0 - 2.048V and 0 - 6.144V. Table 5-8 shows the input attenuator settings.
Table 5-8. ADC Input Attenuator Control
ATTEN (ADC_MUX.4)
Resolution
Full-Scale Range
0
2mV
2.048 V
1
6mV
6.144 V
The input selector may be set to monitor any one of the ten VMON inputs, the VCCA input, or the VCCINP input.
Table 5-9 shows the codes associated with each input selection.
Table 5-9. VMON Address Selection Table
Select Word
SEL3
(ADC_MUX.3)
SEL2
(ADC_MUX.2)
SEL1
(ADC_MUX.1)
SEL0
(ADC_MUX.0)
Input Channel
0
0
0
0
VMON1
0
0
0
1
VMON2
0
0
1
0
VMON3
0
0
1
1
VMON4
0
1
0
0
VMON5
0
1
0
1
VMON6
0
1
1
0
VMON7
0
1
1
1
VMON8
1
0
0
0
VMON9
1
0
0
1
VMON10
1
1
0
0
VCCA
1
1
0
1
VCCINP
Writing a value to the ADC_MUX register to set the input attenuator and selector will automatically initiate a conversion. When the conversion is in process, the DONE bit (ADC_VALUE_LOW.0) will be reset to 0. When the conversion is complete, this bit will be set to 1. When the conversion is complete, the result may be read out of the ADC by
performing two I2C read operations; one for ADC_VALUE_LOW, and one for ADC_VALUE_HIGH. It is recommended that the I2C master load a second conversion command only after the completion of the current conversion
5-27
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
command (Waiting for the DONE bit to be set to 1). An alternative would be to wait for a minimum specified time
(see TCONVERT value in the specifications) and disregard checking the DONE bit.
Note that if the I2C clock rate falls below 50kHz (see FI2C note in specifications), the only way to insure a valid ADC
conversion is to wait the minimum specified time (TCONVERT), as the operation of the DONE bit at clock rates lower
than that cannot be guaranteed. In other words, if the I2C clock rate is less than 50kHz, the DONE bit may or may
not assert even though a valid conversion result is available.
To insure every ADC conversion result is valid, preferred operation is to clock I2C at more than 50kHz and verify
DONE bit status or wait for the full TCONVERT time period between subsequent ADC convert commands. If an I2C
request is placed before the current conversion is complete, the DONE bit will be set to 1 only after the second
request is complete.
The status of the digital input lines may also be monitored and controlled through I2C commands. Figure 5-20
shows the I2C interface to the IN[1:4] digital input lines. The input status may be monitored by reading the
INPUT_STATUS register, while input values to the PLD array may be set by writing to the INPUT_VALUE register.
To be able to set an input value for the PLD array, the input multiplexer associated with that bit needs to be set to
the I2C register setting in E2CMOS memory otherwise the PLD will receive its input from the INx pin.
Figure 5-20. I 2C Digital Input Interface
PLD Output/Input_Value Register Select
(E2 Configuration)
3
IN1
MUX
USERJTAG
Bit
2
PLD
Array
3
IN[2..4]
MUX
3
3
Input_Value
Input_Status
I2C Interface Unit
0x06 - INPUT_STATUS (Read Only)
1
1
1
1
IN4
IN3
IN2
IN1
b7
b6
b5
b4
b3
b2
b1
b0
0x11 - INPUT_VALUE (Read/Write)
X
X
X
X
I4
I3
I2
X
b7
b6
b5
b4
b3
b2
b1
b0
The digital outputs may also be monitored and controlled through the I2C interface, as shown in Figure 5-21. The
status of any given digital output may be read by reading the contents of the associated OUTPUT_STATUS[1:0]
register. Note that in the case of the outputs, the status reflected by these registers reflects the logic signal used to
drive the pin, and does not sample the actual level present on the output pin. For example, if an output is set high
5-28
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
but is not pulled up, the output status bit corresponding with that pin will read ‘1’, but a high output signal will not
appear on the pin.
Digital outputs may also be optionally controlled directly by the I2C bus instead of by the PLD array. The outputs
may be driven either from the PLD output or from the contents of the GP_OUTPUT[1:0] registers with the choice
user-settable in E2CMOS memory. Each output may be independently set to output from the PLD or from the
GP_OUTPUT registers.
Figure 5-21. I 2C Output Monitor and Control Logic
PLD Output/GP_Output Register Select
(E2 Configuration)
PLD
Output
Routing
Pool
14
14
14
MUX
HVOUT[1..2]
OUT[3..14]
14
14
GP_Output1
Output_Status0
GP_Output2
Output_Status1
I2C Interface Unit
0x03 - OUTPUT_STATUS0 (Read Only)
OUT8
OUT7
OUT6
OUT5
OUT4
OUT3
HVOUT2
HVOUT1
b7
b6
b5
b4
b3
b2
b1
b0
0x04 - OUTPUT_STATUS1 (Read Only)
1
1
OUT14
OUT13
OUT12
OUT11
OUT10
OUT9
b7
b6
b5
b4
b3
b2
b1
b0
0x0E - GP_OUTPUT1 (Read/Write)
GP8
GP7
GP6
GP5
GP4
GP3_ENb
GP2
GP1
b7
b6
b5
b4
b3
b2
b1
b0
0x0F - GP_OUTPUT2 (Read/Write)
X
X
GP14
GP13
GP12
GP11
GP10
GP9
b7
b6
b5
b4
b3
b2
b1
b0
The UES word may also be read through the I2C interface, with the register mapping shown in Figure 5-22.
5-29
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Figure 5-22. I 2C Register Mapping for UES Bits
0x0A - UES_BYTE0 (Read Only)
UES7
UES6
UES5
UES4
UES3
UES2
UES1
UES0
b7
b6
b5
b4
b3
b2
b1
b0
0x0B - UES_BYTE1 (Read Only)
UES15
UES14
UES13
UES12
UES11
UES10
UES9
UES8
b7
b6
b5
b4
b3
b2
b1
b0
0x0C - UES_BYTE2 (Read Only)
UES23
UES22
UES21
UES20
UES19
UES18
UES17
UES16
b7
b6
b5
b4
b3
b2
b1
b0
0x0D - UES_BYTE3 (Read Only)
UES31
UES30
UES29
UES28
UES27
UES26
UES25
UES24
b7
b6
b5
b4
b3
b2
b1
b0
The I2C interface also provides the ability to initiate reset operations. The LA-ispPAC-POWR1014A may be reset by
issuing a write of any value to the I2C RESET register (Figure 5-23). Note: The execution of the I2C reset command
is equivalent to toggling the Resetb pin of the chip. Refer to the Resetb Signal, RESET Command via JTAG or I2C
section of this data sheet for further information.
Figure 5-23. I 2C Reset Register
0x12 - RESET (Write Only)
X
X
X
X
X
X
X
X
b7
b6
b5
b4
b3
b2
b1
b0
5-30
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
SMBus SMBAlert Function
The LA-ispPAC-POWR1014A provides an SMBus SMBAlert function so that it can request service from the bus
master when it is used as part of an SMBus system. This feature is supported as an alternate function of OUT3.
When the SMBAlert feature is enabled, OUT3 is controlled by a combination of the PLD output and the GP3_ENb
bit (Figure 5-24). Note: To enable the SMBAlert feature, the SMB_Mode (EECMOS bit) should be set in software.
Figure 5-24. LA-ispPAC-POWR1014/A SMBAlert Logic
PLD Output/GP_Output Register Select
(E2 Configuration)
OUT3/SMBA Mode Select
(E2 Configuration)
PLD
Output
Routing
Pool
MUX
OUT3/SMBA
MUX
GP3_ENb
SMBAlert
Logic
I2C Interface Unit
The typical flow for an SMBAlert transaction is as follows (Figure 5-24):
1. GP3_ENb bit is forced (Via I2C write) to Low
2. LA-ispPAC-POWR1014A PLD Logic pulls OUT3/SMBA Low
3. Master responds to interrupt from SMBA line
4. Master broadcasts a read operation using the SMBus Alert Response Address (ARA)
5. LA-ispPAC-POWR1014A responds to read request by transmitting its device address
6. If transmitted device address matches LA-ispPAC-POWR1014A address, it sets GP3_ENb bit high.
This releases OUT3/SMBA.
Figure 5-25. SMBAlert Bus Transaction
SMBA
SCL
1
2
3
4
5
6
7
SDA
0
0
0
1
1
0
0
SLAVE
ASSERTS
SMBA
START
8
9
1
2
3
4
5
6
7
8
9
R/W
ACK
A6
A5
A4
A3
A2
A1
A0
x
ACK
SLAVE ADDRESS (7 BITS)
ALERT RESPONSE ADDRESS
(0001 100)
SLAVE
RELEASES
SMBA
STOP
Note: Shaded Bits Asserted by Slave
After OUT3/SMBA has been released, the bus master (typically a microcontroller) may opt to perform some service
functions in which it may send data to or read data from the LA-ispPAC-POWR1014A. As part of the service functions, the bus master will typically need to clear whatever condition initiated the SMBAlert request, and will also
need to reset GP3_ENb to re-enable the SMBAlert function. For further information on the SMBus, the user should
consult the SMBus Standard.
5-31
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Software-Based Design Environment
Designers can configure the LA-ispPAC-POWR1014/A using PAC-Designer, an easy to use, Microsoft Windows
compatible program. Circuit designs are entered graphically and then verified, all within the PAC-Designer environment. Full device programming is supported using PC parallel port I/O operations and a download cable connected
to the serial programming interface pins of the LA-ispPAC-POWR1014/A. A library of configurations is included with
basic solutions and examples of advanced circuit techniques are available on the Lattice web site for downloading.
In addition, comprehensive on-line and printed documentation is provided that covers all aspects of PAC-Designer
operation. The PAC-Designer schematic window, shown in Figure 5-26, provides access to all configurable LA-ispPAC-POWR1014/A elements via its graphical user interface. All analog input and output pins are represented.
Static or non-configurable pins such as power, ground, and the serial digital interface are omitted for clarity. Any
element in the schematic window can be accessed via mouse operations as well as menu commands. When completed, configurations can be saved, simulated, and downloaded to devices.
Figure 5-26. PAC-Designer LA-ispPAC-POWR1014/A Design Entry Screen
In-System Programming
The LA-ispPAC-POWR1014/A is an in-system programmable device. This is accomplished by integrating all E2
configuration memory and control logic on-chip. Programming is performed through a 4-wire, IEEE 1149.1 compliant serial JTAG interface at normal logic levels. Once a device is programmed, all configuration information is
stored on-chip, in non-volatile E2CMOS memory cells. The specifics of the IEEE 1149.1 serial interface and all LAispPAC-POWR1014/A instructions are described in the JTAG interface section of this data sheet.
Programming LA-ispPAC-POWR1014/A: Alternate Method
Some applications require that the LA-ispPAC-POWR1014/A be programmed before turning the power on to the
entire circuit board. To meet such application needs, the LA-ispPAC-POWR1014/A provides an alternate programming method which enables the programming of the LA-ispPAC-POWR1014/A device through the JTAG chain with
a separate power supply applied just to the programming section of the LA-ispPAC-POWR1014/A device with the
main power supply of the board turned off.
5-32
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Three special purpose pins, VCCPROG, ATDI and TDISEL, enable programming of the un-programmed LA-ispPAC-POWR1014/A under such circumstances. The VCCPROG pin powers just the programming circuitry of the
LA-ispPAC-POWR1014/A device. The ATDI pin provides an alternate connection to the JTAG header while bypassing all the un-powered devices in the JTAG chain. TDISEL pin enables switching between the ATDI and the standard JTAG signal TDI. When the internally pulled-up TDISEL = 1, standard TDI pin is enabled and when the
TDISEL = 0, ATDI is enabled.
In order to use this feature the JTAG signals of the LA-ispPAC-POWR1014/A are connected to the header as
shown in Figure 5-27. Note: The LA-ispPAC-POWR1014/A should be the last device in the JTAG chain.
Figure 5-27. LA-ispPAC-POWR1014/A Alternate TDI Configuration Diagram
2. Initial Power
Supply Turn-On
3. Sequenced Power
Supply Turn-on
Other JTAG
Device(s)
TDI
TDO
TDI
VCCPROG
VCCJ
VCC
VCCIO
TDI
VCCJ
VCC
JTAG Signal
Connector
1. Power for
Programming
POWR1014A
LA-ispPAC-POWR
1014A
TDO
ATDI
TDISEL
TMS
TCK
TMS
TCK
TCK
TMS
TDO
TDISEL
Alternate TDI Selection Via JTAG Command
When the TDISEL pin held high and four consecutive IDCODE instructions are issued, LA-ispPAC-POWR1014/A
responds by making its active JTAG data input the ATDI pin. When ATDI is selected, data on its TDI pin is ignored
until the JTAG state machine returns to the Test-Logic-Reset state.
This method of selecting ATDI takes advantage of the fact that a JTAG device with an IDCODE register will automatically load its unique IDCODE instruction into the Instruction Register after a Test-Logic-Reset. This JTAG capability permits blind interrogation of devices so that their location in a serial chain can be identified without having to
know anything about them in advance. A blind interrogation can be made using only the TMS and TCLK control
pins, which means TDI and TDO are not required for performing the operation. Figure 5-28 illustrates the logic for
selecting whether the TDI or ATDI pin is the active data input to LA-ispPAC-POWR1014/A.
5-33
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Figure 5-28. LA-ispPAC-POWR1014/A TDI/ATDI Pin Selection Diagram
TMS
TDI
TCK
1
TDO
JTAG
ATDI
0
Test-Logic-Reset
4 Consecutive
IDCODE Instructions
Loaded at Update-IR
SET
Q
CLR
TDISEL
LA-ispPAC-POWR1014/A
Table 5-10 shows in truth table form the same conditions required to select either TDI or ATDI as in the logic diagram found in Figure 5-28.
Table 5-10. LA-ispPAC-POWR1014/A ATDI/TDI Selection Table
TDISEL Pin
JTAG State Machine
Test-Logic-Reset
Four Consecutive
IDCODE Commands
Loaded at Update-IR
Active JTAG
Data Input Pin
H
No
Yes
ATDI (TDI Disabled)
H
Yes
No
TDI (ATDI Disabled)
L
X
X
ATDI (TDI Disabled)
Please refer to the Lattice application note AN6068, Programming the ispPAC-POWR1220AT8 in a JTAG Chain
Using ATDI. The application note includes specific SVF code examples and information on the use of Lattice
design tools to verify device operation in alternate TDI mode.
VCCPROG Power Supply Pin
Because the VCCPROG pin directly powers the on-chip programming circuitry, the LA-ispPAC-POWR1014/A
device can be programmed by applying power to the VCCPROG pin (without powering the entire chip though the
VCCD and VCCA pins). In addition, to enable the on-chip JTAG interface circuitry, power should be applied to the
VCCJ pin.
When the LA-ispPAC-POWR1014/A is using the VCCPROG pin, its VCCD and VCCA pins can be open or pulled
low. Additionally, other than JTAG I/O pins, all digital output pins are in Hi-Z state, HVOUT pins configured as MOSFET driver are driven low, and all other inputs are ignored.
To switch the power supply back to VCCD and VCCA pins, one should turn the VCCPROG supply and VCCJ off
before turning the regular supplies on. When VCCD and VCCA are turned back on for normal operation,
VCCPROG should be left floating.
5-34
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
User Electronic Signature
A user electronic signature (UES) feature is included in the E2CMOS memory of the LA-ispPAC-POWR1014/A.
This consists of 32 bits that can be configured by the user to store unique data such as ID codes, revision numbers
or inventory control data. The specifics of this feature are discussed in the IEEE 1149.1 serial interface section of
this data sheet.
Electronic Security
An electronic security “fuse” (ESF) bit is provided in every LA-ispPAC-POWR1014/A device to prevent unauthorized readout of the E2CMOS configuration bit patterns. Once programmed, this cell prevents further access to the
functional user bits in the device. This cell can only be erased by reprogramming the device, so the original configuration cannot be examined once programmed. Usage of this feature is optional. The specifics of this feature are
discussed in the IEEE 1149.1 serial interface section of this data sheet.
Production Programming Support
Once a final configuration is determined, an ASCII format JEDEC file can be created using the PAC-Designer software. Devices can then be ordered through the usual supply channels with the user’s specific configuration already
preloaded into the devices. By virtue of its standard interface, compatibility is maintained with existing production
programming equipment, giving customers a wide degree of freedom and flexibility in production planning.
Evaluation Fixture
Because the features of an LA-ispPAC-POWR1014/A are all included in the larger ispPAC-POWR1220AT8 device,
designs implemented in an LA-ispPAC-POWR1014/A can be verified using an ispPAC-POWR1220AT8 engineering
prototype board connected to the parallel port of a PC with a Lattice ispDOWNLOAD® cable. The board demonstrates proper layout techniques and can be used in real time to check circuit operation as part of the design process. Input and output connections are provided to aid in the evaluation of the functionality implemented in LAispPAC-POWR1014/A for a given application. (Figure 5-29).
Figure 5-29. Download from a PC
PAC-Designer
Software
Other
System
Circuitry
ispDOWNLOAD
Cable (6')
4
LA-ispPACPOWR1220AT8
Device
IEEE Standard 1149.1 Interface (JTAG)
Serial Port Programming Interface Communication with the LA-ispPAC-POWR1014/A is facilitated via an IEEE
1149.1 test access port (TAP). It is used by the LA-ispPAC-POWR1014/A as a serial programming interface. A brief
description of the LA-ispPAC-POWR1014/A JTAG interface follows. For complete details of the reference specification, refer to the publication, Standard Test Access Port and Boundary-Scan Architecture, IEEE Std 1149.1-1990
(which now includes IEEE Std 1149.1a-1993).
Overview
An IEEE 1149.1 test access port (TAP) provides the control interface for serially accessing the digital I/O of the LAispPAC-POWR1014/A. The TAP controller is a state machine driven with mode and clock inputs. Given in the correct sequence, instructions are shifted into an instruction register, which then determines subsequent data input,
data output, and related operations. Device programming is performed by addressing the configuration register,
5-35
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
shifting data in, and then executing a program configuration instruction, after which the data is transferred to internal E2CMOS cells. It is these non-volatile cells that store the configuration or the LA-ispPAC-POWR1014/A. A set of
instructions are defined that access all data registers and perform other internal control operations. For compatibility between compliant devices, two data registers are mandated by the IEEE 1149.1 specification. Others are functionally specified, but inclusion is strictly optional. Finally, there are provisions for optional data registers defined by
the manufacturer. The two required registers are the bypass and boundary-scan registers. Figure 5-30 shows how
the instruction and various data registers are organized in an LA-ispPAC-POWR1014/A.
Figure 5-30. LA-ispPAC-POWR1014/A TAP Registers
DATA REGISTER (123 BITS)
E2CMOS
NON-VOLATILE
MEMORY
ADDRESS REGISTER (109 BITS)
MULTIPLEXER
UES REGISTER (32 BITS)
IDCODE REGISTER (32 BITS)
CFG ADDRESS REGISTER (12 BITS)
CFG DATA REGISTER (56 BITS)
BYPASS REGISTER (1 BIT)
INSTRUCTION REGISTER (8 BITS)
TEST ACCESS PORT (TAP)
LOGIC
TDI
TCK
TMS
OUTPUT
LATCH
TDO
TAP Controller Specifics
The TAP is controlled by the Test Clock (TCK) and Test Mode Select (TMS) inputs. These inputs determine whether
an Instruction Register or Data Register operation is performed. Driven by the TCK input, the TAP consists of a
small 16-state controller design. In a given state, the controller responds according to the level on the TMS input as
shown in Figure 5-31. Test Data In (TDI) and TMS are latched on the rising edge of TCK, with Test Data Out (TDO)
becoming valid on the falling edge of TCK. There are six steady states within the controller: Test-Logic-Reset, RunTest/Idle, Shift-Data-Register, Pause-Data-Register, Shift-Instruction-Register and Pause-Instruction-Register. But
there is only one steady state for the condition when TMS is set high: the Test-Logic-Reset state. This allows a
reset of the test logic within five TCKs or less by keeping the TMS input high. Test-Logic-Reset is the power-on
default state.
5-36
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Figure 5-31. TAP States
1
Test-Logic-Rst
0
0
Run-Test/Idle
1
Select-DR-Scan
1
1
0
Capture-DR
Select-IR-Scan
1
0
Capture-IR
0
0
0
Shift-DR
1
1
1
Exit1-IR
0
0
Pause-DR
1
0
Pause-IR
Exit2-IR
1
Update-DR
0
0
1
0
Exit2-DR
1
0
Shift-IR
1
Exit1-DR
0
1
1
Update-IR
1
0
Note: The value shown adjacent to each state transition in this figure
represents the signal present at TMS at the time of a rising edge at TCK.
When the correct logic sequence is applied to the TMS and TCK inputs, the TAP will exit the Test-Logic-Reset state
and move to the desired state. The next state after Test-Logic-Reset is Run-Test/Idle. Until a data or instruction shift
is performed, no action will occur in Run-Test/Idle (steady state = idle). After Run-Test/Idle, either a data or instruction shift is performed. The states of the Data and Instruction Register blocks are identical to each other differing
only in their entry points. When either block is entered, the first action is a capture operation. For the Data Registers, the Capture-DR state is very simple: it captures (parallel loads) data onto the selected serial data path (previously chosen with the appropriate instruction). For the Instruction Register, the Capture-IR state will always load
the IDCODE instruction. It will always enable the ID Register for readout if no other instruction is loaded prior to a
Shift-DR operation. This, in conjunction with mandated bit codes, allows a “blind” interrogation of any device in a
compliant IEEE 1149.1 serial chain. From the Capture state, the TAP transitions to either the Shift or Exit1 state.
Normally the Shift state follows the Capture state so that test data or status information can be shifted out or new
data shifted in. Following the Shift state, the TAP either returns to the Run-Test/Idle state via the Exit1 and Update
states or enters the Pause state via Exit1. The Pause state is used to temporarily suspend the shifting of data
through either the Data or Instruction Register while an external operation is performed. From the Pause state,
shifting can resume by reentering the Shift state via the Exit2 state or be terminated by entering the Run-Test/Idle
state via the Exit2 and Update states. If the proper instruction is shifted in during a Shift-IR operation, the next entry
into Run-Test/Idle initiates the test mode (steady state = test). This is when the device is actually programmed,
erased or verified. All other instructions are executed in the Update state.
Test Instructions
Like data registers, the IEEE 1149.1 standard also mandates the inclusion of certain instructions. It outlines the
function of three required and six optional instructions. Any additional instructions are left exclusively for the manufacturer to determine. The instruction word length is not mandated other than to be a minimum of two bits, with only
the BYPASS and EXTEST instruction code patterns being specifically called out (all ones and all zeroes respectively). The LA-ispPAC-POWR1014/A contains the required minimum instruction set as well as one from the
optional instruction set. In addition, there are several proprietary instructions that allow the device to be configured
5-37
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
and verified. Table 5-11 lists the instructions supported by the LA-ispPAC-POWR1014/A JTAG Test Access Port
(TAP) controller:
Table 5-11. LA-ispPAC-POWR1014/A TAP Instruction Table
Instruction
Command
Code
Comments
BULK_ERASE
0000 0011
Bulk erase device
BYPASS
1111 1111
Bypass - connect TDO to TDI
DISCHARGE
0001 0100
Fast VPP discharge
ERASE_DONE_BIT
0010 0100
Erases ‘Done’ bit only
EXTEST
0000 0000
Bypass - connect TDO to TDI
IDCODE
0001 0110
Read contents of manufacturer ID code (32 bits)
OUTPUTS_HIGHZ
0001 1000
Force all outputs to High-Z state, FET outputs pulled low
SAMPLE/PRELOAD
00011100
Sample/Preload. Default to bypass.
PROGRAM_DISABLE
0001 1110
Disable program mode
PROGRAM_DONE_BIT
0010 1111
Programs the Done bit
PROGRAM_ENABLE
0001 0101
Enable program mode
PROGRAM_SECURITY
0000 1001
Program security fuse
RESET
0010 0010
Resets device (refer to the RESETb Signal, RESET Command via
JTAG or I2C section of this data sheet)
IN1_RESET_JTAG_BIT
0001 0010
Reset the JTAG bit associated with IN1 pin to 0
IN1_SET_JTAG_BIT
0001 0011
Set the JTAG bit associated with IN1 pin to 1
CFG_ADDRESS
0010 1011
Select non-PLD address register
CFG_DATA_SHIFT
0010 1101
Non-PLD data shift
CFG_ERASE
0010 1001
ERASE Just the Non PLD configuration
CFG_PROGRAM
0010 1110
Non-PLD program
CFG_VERIFY
0010 1000
VRIFY non-PLD fusemap data
PLD_ADDRESS_SHIFT
0000 0001
PLD_Address register (109 bits)
PLD_DATA_SHIFT
0000 0010
PLD_Data register (123 Bits)
PLD_INIT_ADDR_FOR_PROG_INCR
0010 0001
Initialize the address register for auto increment
PLD_PROG_INCR
0010 0111
Program column register to E2 and auto increment address register
PLD_PROGRAM
0000 0111
Program PLD data register to E2
PLD_VERIFY
0000 1010
Verifies PLD column data
PLD_VERIFY_INCR
0010 1010
Load column register from E2 and auto increment address register
UES_PROGRAM
0001 1010
Program UES bits into E2
UES_READ
0001 0111
Read contents of UES register from E2 (32 bits)
BYPASS is one of the three required instructions. It selects the Bypass Register to be connected between TDI and
TDO and allows serial data to be transferred through the device without affecting the operation of the LA-ispPACPOWR1014/A. The IEEE 1149.1 standard defines the bit code of this instruction to be all ones (11111111).
The required SAMPLE/PRELOAD instruction dictates the Boundary-Scan Register be connected between TDI
and TDO. The LA-ispPAC-POWR1014/A has no boundary scan register, so for compatibility it defaults to the
BYPASS mode whenever this instruction is received. The bit code for this instruction is defined by Lattice as shown
in Table 5-11.
The EXTEST (external test) instruction is required and would normally place the device into an external boundary
test mode while also enabling the boundary scan register to be connected between TDI and TDO. Again, since the
5-38
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
LA-ispPAC-POWR1014/A has no boundary scan logic, the device is put in the BYPASS mode to ensure specification compatibility. The bit code of this instruction is defined by the 1149.1 standard to be all zeros (00000000).
The optional IDCODE (identification code) instruction is incorporated in the LA-ispPAC-POWR1014/A and leaves it
in its functional mode when executed. It selects the Device Identification Register to be connected between TDI
and TDO. The Identification Register is a 32-bit shift register containing information regarding the IC manufacturer,
device type and version code (Figure 5-32). Access to the Identification Register is immediately available, via a
TAP data scan operation, after power-up of the device, or by issuing a Test-Logic-Reset instruction. The bit code for
this instruction is defined by Lattice as shown in Table 5-11.
Figure 5-32. LA-ispPAC-POWR1014/A ID Code
MSB
LSB
0001 0000 0001 0100 0101 / 0000 0100 001 / 1
(LA-ispPAC-POWR1014)
0000 0000 0001 0100 0101 / 0000 0100 001 / 1
(LA-ispPAC-POWR1014A)
Part Number
(20 bits)
00145h = LA-ispPAC-POWR1014A
10145h = LA-ispPAC-POWR1014
JEDEC Manufacturer
Identity Code for
Lattice Semiconductor
(11 bits)
Constant 1
(1 bit)
per 1149.1-1990
LA-ispPAC-POWR1014/A Specific Instructions
There are 25 unique instructions specified by Lattice for the LA-ispPAC-POWR1014/A. These instructions are primarily used to interface to the various user registers and the E2CMOS non-volatile memory. Additional instructions
are used to control or monitor other features of the device. A brief description of each unique instruction is provided
in detail below, and the bit codes are found in Table 5-11.
PLD_ADDRESS_SHIFT – This instruction is used to set the address of the PLD AND/ARCH arrays for subsequent
program or read operations. This instruction also forces the outputs into the OUTPUTS_HIGHZ.
PLD_DATA_SHIFT – This instruction is used to shift PLD data into the register prior to programming or reading.
This instruction also forces the outputs into the OUTPUTS_HIGHZ.
PLD_INIT_ADDR_FOR_PROG_INCR – This instruction prepares the PLD address register for subsequent
PLD_PROG_INCR or PLD_VERIFY_INCR instructions.
PLD_PROG_INCR – This instruction programs the PLD data register for the current address and increments the
address register for the next set of data.
PLD_PROGRAM – This instruction programs the selected PLD AND/ARCH array column. The specific column is
preselected by using PLD_ADDRESS_SHIFT instruction. The programming occurs at the second rising edge of
the TCK in Run-Test-Idle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE
instruction). This instruction also forces the outputs into the OUTPUTS_HIGHZ.
PROGRAM_SECURITY – This instruction is used to program the electronic security fuse (ESF) bit. Programming
the ESF bit protects proprietary designs from being read out. The programming occurs at the second rising edge of
the TCK in Run-Test-Idle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE
instruction). This instruction also forces the outputs into the OUTPUTS_HIGHZ.
PLD_VERIFY – This instruction is used to read the content of the selected PLD AND/ARCH array column. This
specific column is preselected by using PLD_ADDRESS_SHIFT instruction. This instruction also forces the outputs
into the OUTPUTS_HIGHZ.
5-39
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
DISCHARGE – This instruction is used to discharge the internal programming supply voltage after an erase or programming cycle and prepares LA-ispPAC-POWR1014/A for a read cycle. This instruction also forces the outputs
into the OUTPUTS_HIGHZ.
CFG_ADDRESS – This instruction is used to set the address of the CFG array for subsequent program or read
operations. This instruction also forces the outputs into the OUTPUTS_HIGHZ.
CFG_DATA_SHIFT – This instruction is used to shift data into the CFG register prior to programming or reading.
This instruction also forces the outputs into the OUTPUTS_HIGHZ.
CFG_ERASE – This instruction will bulk erase the CFG array. The action occurs at the second rising edge of TCK
in Run-Test-Idle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE instruction).
This instruction also forces the outputs into the OUTPUTS_HIGHZ.
CFG_PROGRAM – This instruction programs the selected CFG array column. This specific column is preselected
by using CFG_ADDRESS instruction. The programming occurs at the second rising edge of the TCK in Run-TestIdle JTAG state. The device must already be in programming mode (PROGRAM_ENABLE instruction). This
instruction also forces the outputs into the OUTPUTS_HIGHZ.
CFG_VERIFY – This instruction is used to read the content of the selected CFG array column. This specific column
is preselected by using CFG_ADDRESS instruction. This instruction also forces the outputs into the
OUTPUTS_HIGHZ.
BULK_ERASE – This instruction will bulk erase all E2CMOS bits (CFG, PLD, UES, and ESF) in the LA-ispPACPOWR1014/A. The device must already be in programming mode (PROGRAM_ENABLE instruction). This instruction also forces the outputs into the OUTPUTS_HIGHZ.
OUTPUTS_HIGHZ – This instruction turns off all of the open-drain output transistors. Pins that are programmed as
FET drivers will be placed in the active low state. This instruction is effective after Update-Instruction-Register
JTAG state.
PROGRAM_ENABLE – This instruction enables the programming mode of the LA-ispPAC-POWR1014/A. This
instruction also forces the outputs into the OUTPUTS_HIGHZ.
IDCODE – This instruction connects the output of the Identification Code Data Shift (IDCODE) Register to TDO
(Figure 5-33), to support reading out the identification code.
Figure 5-33. IDCODE Register
TDO
Bit
31
Bit
30
Bit
29
Bit
28
Bit
27
Bit
4
Bit
3
Bit
2
Bit
1
Bit
0
PROGRAM_DISABLE – This instruction disables the programming mode of the LA-ispPAC-POWR1014/A. The
Test-Logic-Reset JTAG state can also be used to cancel the programming mode of the LA-ispPAC-POWR1014/A.
UES_READ – This instruction both reads the E2CMOS bits into the UES register and places the UES register
between the TDI and TDO pins (as shown in Figure 5-30), to support programming or reading of the user electronic
signature bits.
Figure 5-34. UES Register
TDO
Bit
15
Bit
14
Bit
13
Bit
12
Bit
11
Bit
10
Bit
9
Bit
8
Bit
7
5-40
Bit
6
Bit
5
Bit
4
Bit
3
Bit
2
Bit
1
Bit
0
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
UES_PROGRAM – This instruction will program the content of the UES Register into the UES E2CMOS memory.
The device must already be in programming mode (PROGRAM_ENABLE instruction). This instruction also forces
the outputs into the OUTPUTS_HIGHZ.
ERASE_DONE_BIT – This instruction clears the ‘Done’ bit, which prevents the LA-ispPAC-POWR1014/A
sequence from starting.
PROGRAM_DONE_BIT – This instruction sets the ‘Done’ bit, which enables the LA-ispPAC-POWR1014/A
sequence to start.
RESET – This instruction resets the PLD sequence and output macrocells.
IN1_RESET_JTAG_BIT – This instruction clears the JTAG Register logic input ‘IN1.’ The PLD input has to be configured to take input from the JTAG Register in order for this command to have effect on the sequence.
IN1_SET_JTAG_BIT – This instruction sets the JTAG Register logic input ‘IN1.’ The PLD input has to be configured
to take input from the JTAG Register in order for this command to have effect on the sequence.
PLD_VERIFY_INCR – This instruction reads out the PLD data register for the current address and increments the
address register for the next read.
Notes:
In all of the descriptions above, OUTPUTS_HIGHZ refers both to the instruction and the state of the digital output
pins, in which the open-drains are tri-stated and the FET drivers are pulled low.
Before any of the above programming instructions are executed, the respective E2CMOS bits need to be erased
using the corresponding erase instruction.
5-41
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Package Diagrams
48-Pin TQFP (Dimensions in Millimeters)
PIN 1 INDICATOR
0.20 H A-B D
0.20 C A-B D
D1
D
N
3. A
1
E1
E
B
e
D
8. 4X
3.
3.
SEE DETAIL "A"
H
b
0.08
C
A
SEATING PLANE
GAUGE PLANE
0.25
A2
B
M C A -B D
0.08 C
LEAD FINISH
A1
B
0.20 MIN.
0-7∞
b
L
1.00 REF.
c
c1
b
DETAIL "A"
1
BASE METAL
SECTION B - B
NOTES:
1.
DIMENSIONING AND TOLERANCING PER ANSI Y14.5 - 1982.
2.
ALL DIMENSIONS ARE IN MILLIMETERS.
3.
DATUMS A, B AND D TO BE DETERMINED AT DATUM PLANE H.
4.
DIMENSIONS D1 AND E1 DO NOT INCLUDE MOLD PROTRUSION.
ALLOWABLE MOLD PROTRUSION IS 0.254 MM ON D1 AND E1
DIMENSIONS.
7.
8.
MIN.
NOM.
MAX.
A
-
-
1.60
A1
0.05
-
0.15
A2
1.35
1.40
1.45
D
9.00 BSC
D1
7.00 BSC
E
9.00 BSC
E1
L
5. THE TOP OF PACKAGE MAY BE SMALLER THAN THE BOTTOM
OF THE PACKAGE BY 0.15 MM.
6.
SYMBOL
SECTION B-B:
THESE DIMENSIONS APPLY TO THE FLAT SECTION OF THE
LEAD BETWEEN 0.10 AND 0.25 MM FROM THE LEAD TIP.
A1 IS DEFINED AS THE DISTANCE FROM THE SEATING PLANE
TO THE LOWEST POINT ON THE PACKAGE BODY.
EXACT SHAPE OF EACH CORNER IS OPTIONAL.
5-42
7.00 BSC
0.45
0.60
N
48
e
0.50 BSC
0.22
0.75
b
0.17
0.27
b1
0.17
0.20
0.23
c
0.09
0.15
0.20
c1
0.09
0.13
0.16
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Part Number Description
LA-ispPAC-POWR1014X - 01TN48E
Device Family
Operating Temperature Range
E = Automotive (-40oC to +105oC TA)
Device Number
Package
TN = Lead-Free 48-pin TQFP
ADC Support
A = ADC present
Performance Grade
01 = Standard
LA-ispPAC-POWR1014/A Ordering Information
Lead-Free Packaging
Part Number
Package
Pins
LA-ispPAC-POWR1014A-01TN48E
Lead-Free TQFP
48
LA-ispPAC-POWR1014-01TN48E
Lead-Free TQFP
48
SDA
VMON10
37
SCL
RESETB
VCCD
PLDCLK
41
40
39
38
MCLK
IN1
IN3
47
46
45
VCCINP
IN4
48
44
43
42
5-43
24
VCCPROG
VCCD
TCK
TDO
20
21
22
23
OUT4
VMON3
VCCJ
OUT5
27
26
25
10
11
12
TDISEL
OUT6
GNDA
7
8
9
TDI
OUT7
30
29
28
LA-ispPAC-POWR1014A
48-Pin TQFP
17
18
19
OUT8
VMON6
ATDI
GNDD
33
32
31
TMS
OUT9
4
5
6
HVOUT1
OUT10
VMON9
14
15
16
OUT11
36
35
34
13
OUT12
1
2
3
HVOUT2
OUT13
SMBA_OUT3
OUT14
IN2
Package Options
VMON8
VMON7
VMON5
GNDD
VCCA
VMON4
VMON2
VMON1
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
VMON8
VMON7
VMON5
GNDD
VCCA
VMON4
VMON2
GNDD
VMON10
GNDD
IN1
RESETB
VCCINP
44
43
42
VCCD
IN2
45
PLDCLK
IN3
47
46
MCLK
IN4
48
37
24
VMON1
VCCPROG
VCCD
TCK
TDO
20
21
22
23
OUT4
VMON3
VCCJ
OUT5
27
26
25
10
11
12
TDISEL
OUT6
GNDA
7
8
9
TDI
OUT7
30
29
28
LA-ispPAC-POWR1014
48-Pin TQFP
17
18
19
OUT8
VMON6
ATDI
GNDD
33
32
31
TMS
OUT9
4
5
6
HVOUT1
OUT10
VMON9
14
15
16
OUT11
36
35
34
13
OUT12
1
2
3
HVOUT2
OUT13
SMBA_OUT3
OUT14
41
40
39
38
Package Options (Cont.)
Automotive Disclaimer
Products are not designed, intended or warranted to be fail-safe and are not designed, intended or warranted for
use in applications related to the deployment of airbags. Further, products are not intended to be used, designed or
warranted for use in applications that affect the control of the vehicle unless there is a fail-safe or redundancy feature and also a warning signal to the operator of the vehicle upon failure. Use of products in such applications is
fully at the risk of the customer, subject to applicable laws and regulations governing limitations on product liability.
Technical Support Assistance
Hotline: 1-800-LATTICE (North America)
+1-503-268-8001 (Outside North America)
e-mail: [email protected]
Internet: www.latticesemi.com
5-44
Lattice Semiconductor
LA-ispPAC-POWR1014/A Automotive Family Data Sheet
Revision History
Date
Version
January 2008
01.0
June 2008
01.1
Change Summary
Initial release.
Added timing diagram and timing parameters to "Power-On Reset" specifications.
Modified PLD Architecture figure to show input registers.
Updated I2C Control Registers table.
VCCPROG pin usage clarification added.
Added automotive disclaimer text section.
5-45