ONSEMI NCV1124DR2G

NCV1124
Dual Variable−Reluctance
Sensor Interface IC
The NCV1124 is a monolithic integrated circuit designed primarily
to condition signals from sensors used to monitor rotating parts.
The NCV1124 is a dual channel device. Each of the two identical
channels interfaces with a variable−reluctance sensor, and
continuously compares the sensor output signal to a
user−programmable internal reference. An alternating input signal of
appropriate amplitude at IN1 or IN2 will result in a rectangular
waveform at the corresponding OUT terminal, suitable for interface to
either standard microprocessors or standard logic families.
A diagnostic input, common to both channels, provides a means to
test for degradation or loss of the physical connector to both sensors.
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8
1
SO−8
CASE 751
Typical Applications
•
•
•
•
Anti−Skid Braking and Traction Control
Vehicle Stability Control
Drive Belt Slippage Detection
Crankshaft/Camshaft Position Sensing
MARKING DIAGRAM
8
V1124
ALYW4
G
Features
•
•
•
•
•
•
Two Independent Channels
Internal Hysteresis
Built−In Diagnostic Mode
Designed to Work from a 5.0 V "10% Supply
Site and Control for Automotive Applications
Pb−Free Packages are Available
1
V1124
A
L
Y
W
G
VCC
VCC VCC VCC
OUT1
To mP
DIAG
R1
RRS
PIN CONNECTIONS
VCC
INP1
INAdj
IN1
+
−
C1
Active
Clamp
8
VCC
IN1
IN2
OUT1
OUT2
GND
DIAG
ORDERING INFORMATION
Variable
Reluctance
Sensor
RRS
1
INAdj
COMP1
VRS
R2
= Device Code
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
VCC
VCC
OUT2
To mP
INP2
See detailed ordering and shipping information in the package
dimensions section on page 3 of this data sheet.
IN2
C2
+
−
Active
Clamp
COMP2
VRS
Variable
Reluctance
Sensor
GND
RAdj
Figure 1. Block Diagram
© Semiconductor Components Industries, LLC, 2006
April, 2006 − Rev. 0
1
Publication Order Number:
NCV1124/D
NCV1124
MAXIMUM RATINGS
Rating
Value
Unit
Storage Temperature Range
−65 to 150
°C
Ambient Operating Temperature
−40 to 125
°C
Supply Voltage Range (continuous)
−0.3 to 7.0
V
Input Voltage Range (at any input, R1 = R2 = 22 k)
−250 to 250
V
Maximum Junction Temperature
150
°C
ESD Susceptibility (Human Body Model)
2.0
kV
240 peak
°C
Lead Temperature Soldering:
Reflow: (SMD styles only) (Note 1)
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. 60 second maximum above 183°C.
ELECTRICAL CHARACTERISTICS (4.5 V < VCC < 5.5 V, −40°C < TA < 125°C, VDIAG = 0; unless otherwise specified.)
Characteristic
Test Conditions
Min
Typ
Max
Unit
VCC = 5.0 V
−
−
5.0
mA
Input Threshold − Positive
VDIAG = Low
VDIAG = High
135
135
160
160
185
185
mV
mV
Input Threshold − Negative
VDIAG = Low
VDIAG = High
−185
135
−160
160
−135
185
mV
mV
Input Bias Current (INP1, INP2)
VIN = 0.336 V
−16
−11
−6.0
mA
Input Bias Current (DIAG)
VDIAG = 0 V
−
−
1.0
mA
Input Bias Current Factor (KI)
(INAdj = INP × KI)
VIN = 0.336 V, VDIAG = Low
VIN = 0.336 V, VDIAG = High
−
152
100
155
−
157
%INP
%INP
Bias Current Matching
INP1 or INP2 to INAdj, VIN = 0.336 V
−1.0
0
1.0
mA
Input Clamp − Negative
IIN = −50 mA
IIN = −12 mA
−0.5
−0.5
−0.25
−0.30
0
0
V
V
Input Clamp − Positive
IIN = +12 mA
5.0
7.0
9.8
V
Output Low Voltage
IOUT = 1.6 mA
−
0.2
0.4
V
Output High Voltage
IOUT = −1.6 mA
VCC − 0.5
VCC − 0.2
−
V
0
−
20
ms
VCC SUPPLY
Operating Current Supply
Sensor Inputs
Mode Change Time Delay
−
Input to Output Delay
IOUT = 1.0 mA
−
1.0
20
ms
Output Rise Time
CLOAD = 30 pF
−
0.5
2.0
ms
Output Fall Time
CLOAD = 30 pF
−
0.05
2.0
ms
Open−Sensor Positive Threshold
VDIAG = High, RIN(Adj) = 40 k. Note 2
29.4
54
86.9
kW
DIAG Input Low Threshold
−
−
−
0.2 × VCC
V
DIAG Input High Threshold
−
0.7 × VCC
−
−
V
8.0
8.0
22
22
70
70
kW
kW
Logic Inputs
DIAG Input Resistance
VIN = 0.3 × VCC , VCC = 5.0 V
VIN = VCC, VCC = 5.0 V
2. This parameter is guaranteed by design, but not parametrically tested in production.
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2
NCV1124
PACKAGE PIN DESCRIPTION
PIN #
SO−8
PIN SYMBOL
FUNCTION
1
INAdj
External resistor to ground that sets the trip levels of both channels. Functions for both diagnostic
and normal mode
2
IN1
Input to channel 1
3
IN2
Input to channel 2
4
GND
Ground
5
DIAG
Diagnostic mode switch. Normal mode is low
6
OUT2
Output of channel 2
7
OUT1
Output of channel 1
8
VCC
Positive 5.0 volt supply input
ORDERING INFORMATION
Device
Shipping †
Package
NCV1124DG
SO−8 NB
(Pb−Free)
98 Units / Rail
NCV1124DR2G
SO−8 NB
(Pb−Free)
2500 Units / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
VCC
VCC
VCC
VCC
VCC
INP1
DIAG
R1
RRS
VRS
OUT1
To mP
INAdj
IN1
C1
+
−
Active
Clamp
COMP1
Variable
Reluctance
Sensor
GND
RAdj
Figure 2. Application Diagram
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NCV1124
THEORY OF OPERATION
INP1 + INAdj
NORMAL OPERATION
Figure 2 shows one channel of the NCV1124 along with
the necessary external components. Both channels share the
INAdj pin as the negative input to a comparator. A brief
description of the components is as follows:
VRS − Ideal sinusoidal, ground referenced, sensor output
− amplitude usually increases with frequency, depending on
loading.
RRS − Source impedance of sensor.
R1/RAdj − External resistors for current limiting and
biasing.
INP1/INAdj − Internal current sources that determine trip
points via R1/RAdj.
COMP1 − Internal comparator with built−in hysteresis
set at 160 mV.
OUT1 − Output 0 V − 5.0 V square wave with the same
frequency as VRS.
By inspection, the voltage at the (+) and (−) terminals of
COMP1 with VRS = 0V are:
V+ + INP1(R1 ) RRS)
V− + INAdj
(9)
We can now re−write equation (7) as:
VRS(+TR) u INP1(RAdj * R1 * RRS) ) VHYS (10)
By making
RAdj + R1 ) RRS
(11)
you can detect signals with as little amplitude as VHYS.
A design example is given in the applications section.
OPEN SENSOR PROTECTION
The NCV1124 has a DIAG pin that when pulled high (5.0
V), will increase the INAdj current source by roughly 50%.
Equation (7) shows that a larger VRS(+TRP) voltage will be
needed to trip comparator COMP1. However, if no VRS
signal is present, then we can use equations 1, 2, and 4
(equation 5 does not apply in this mode) to get:
INP1(R1 ) RRS) u INP1
KI
RAdj ) VHYS (12)
(1)
RAdj
Since RRS is the only unknown variable we can solve for
RRS,
(2)
As VRS begins to rise and fall, it will be superimposed on
the DC biased voltage at V+.
RRS +
INP1
KI
RAdj ) VHYS
* R1
INP1
(13)
To get comparator COMP1 to trip, the following
condition is needed when crossing in the positive direction,
Equation (13) shows that if the output switches states
when entering the diag mode with VRS = 0, the sensor
impedance must be greater than the above calculated value.
This can be very useful in diagnosing intermittent sensor.
V+ u V− ) VHYS
INPUT PROTECTION
V+ + INP1(R1 ) RRS) ) VRS
(3)
(4)
(VHYS is the built−in hysteresis set to 160 mV), or when
crossing in the negative direction,
V+ t V− * VHYS
As shown in Figure 2, an active clamp is provided on each
input to limit the voltage on the input pin and prevent
substrate current injection. The clamp is specified to handle
±12 mA. This puts an upper limit on the amplitude of the
sensor output. For example, if R1 = 20 k, then
(5)
Combining equations 2, 3, and 4, we get:
INP1(R1 ) RRS) ) VRS u INAdj
RAdj ) VHYS
VRS(MAX) + 20 k
(6)
Therefore, the VRS(pk−pk) voltage can be as high as 480 V.
The NCV1124 will typically run at a frequency up to 1.8
MHz if the input signal does not activate the positive or
negative input clamps. Frequency performance will be
lower when the positive or negative clamps are active.
Typical performance will be up to a frequency of 680 kHz
with the clamps active.
therefore,
VRS(+TRP) t INAdj
RAdj * INP1(R1 ) RRS) ) VHYS
(7)
It should be evident that tripping on the negative side is:
VRS(−TRP) t INAdj
12 mA + 240 V
RAdj * INP1(R1 ) RRS) * VHYS
(8)
In normal mode,
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NCV1124
CIRCUIT DESCRIPTION
Figure 3 shows the part operating near the minimum input
thresholds. As the sin wave input threshold is increased, the
low side clamps become active (Figure 4). Increasing the
amplitude further (Figure 5), the high−side clamp becomes
active. These internal clamps allow for voltages up to −250 V
and 250 V on the sensor side of the setup (with R1 = R2 =
22 k) (reference the diagram page 1).
Figure 6 shows the effect using the diagnostic (DIAG)
function has on the circuit. The input threshold (negative) is
switched from a threshold of −160 mV to +160 mV when
DIAG goes from a low to a high. There is no hysteresis when
DIAG is high.
OUT1, 2.0 V/div
IN1, 5.0 V/div
20 ms/div
Figure 5. Low− and High−Side Clamps
IN1, 200 mV/div
DIAG
5.0 V/div
OUT1, 2.0 V/div
IN1
1.0 V/div
OUT1
5.0 V/div
20 ms/div
Figure 3. Minimum Threshold Operation
20 ms/div
OUT1, 2.0 V/div
Figure 6. Diagnostic Operation
IN1, 5.0 V/div
20 ms/div
Figure 4. Low−Side Clamp
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5
NCV1124
APPLICATION INFORMATION
5. Calculate C1 for low pass filtering
Referring to Figure 2, the following will be a design
example given these system requirements:
Since the sensor guarantees 40 Vpk−pk @ 10 kHz, a low
pass filter using R1 and C1 can be used to eliminate high
frequency noise without affecting system performance.
RRS + 1.5 kW (u 12 kW is considered open)
VRS(MAX) + 120 Vpk
Gain Reduction + 0.29 V + 0.0145 + *36.7 dB
20 V
VRS(MIN) + 250 mVpk
Therefore, a cut−off frequency, fC, of 145 Hz could be
used.
FVRS + 10 kHz @ VRS(MIN) + 40 Vpk−pk
C1 v
1. Determine tradeoff between R1 value and power
rating. (use 1/2 watt package)
PD +
ǒ Ǔ
120 2
Ǹ2
R1
Set C1 = 0.047 mF.
6. Calculate the minimum RRS that will be indicated as
an open circuit. (DIAG = 5.0 V)
Rearranging equation (7) gives
t 1ń2 W
ƪ
VHYS ) [INP1
* VRS(+TRP)
Set R1 = 15 k. (The clamp current will then be 120/15 k
= 8.0 mA, which is less than the 12 mA limit.)
RRS +
2. Determine RAdj
KI
RAdj]
ƫ
* R1
INP1
But, VRS = 0 during this test, so it drops out.
Using the following as worst case Low and High:
Set RAdj as close to R1 + RRS as possible.
Therefore, RAdj = 17 k.
3. Determine VRS(+TRP) using equation (7).
VRS(+TRP) + 11mA
1
v 0.07 mF
2pfCR1
INAdj
17 k * 11mA(15 k ) 1.5 k) ) 160 m
VRS(+TRP) + 166 mV typical
(easily meets 250 mV minimum)
Worst Case Low (RRS)
Worst Case High (RRS)
23.6 mA = 15 mA × 1.57
10.7 mA = 7.0 mA × 1.53
RAdj
16.15 k
17.85 k
VHYS
135 mV
185 mV
16 mA
6.0 mA
R1
15.75 k
14.25 k
KI
1.57
1.53
INP1
4. Calculate worst case VRS(+TRP)
Examination of equation (7) and the spec reveals the worst
case trip voltage will occur when:
VHYS = 180 mV
INAdj = 16 mA
INP1 = 15 mA
R1 = 14.25 k (5% low)
RAdj = 17.85 k (5% High)
135 mV ) 23.6 mA
16 mA
+ 16.5 k
RRS +
16.15 k
* 15.75 k
Therefore,
RRS(MIN) + 16.5 k (meets 12 k system spec)
VRS(+)MAX + 16 mA(17.85 k)
* 15mA(14.25 k ) 1.5 k) ) 180 mV
+ 229 mV
and,
185 mV ) 10.7 mA
6.0mA
+ 48.4 k
RRS(MAX) +
which is still less than the 250 mV minimum amplitude of
the input.
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6
17.85 k
* 14.25 k
NCV1124
PACKAGE DIMENSIONS
SO−8 NB
CASE 751−07
ISSUE AG
−X−
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
6. 751−01 THRU 751−06 ARE OBSOLETE. NEW
STANDARD IS 751−07.
A
8
5
0.25 (0.010)
S
B
1
M
Y
M
4
K
−Y−
G
C
N
DIM
A
B
C
D
G
H
J
K
M
N
S
X 45 _
SEATING
PLANE
−Z−
0.10 (0.004)
H
D
0.25 (0.010)
M
Z Y
S
X
M
J
S
MILLIMETERS
MIN
MAX
4.80
5.00
3.80
4.00
1.35
1.75
0.33
0.51
1.27 BSC
0.10
0.25
0.19
0.25
0.40
1.27
0_
8_
0.25
0.50
5.80
6.20
SOLDERING FOOTPRINT*
1.52
0.060
7.0
0.275
4.0
0.155
0.6
0.024
1.270
0.050
SCALE 6:1
mm Ǔ
ǒinches
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
PACKAGE THERMAL DATA
Parameter
SO−8NB
Unit
RqJC
Typical
45
°C/W
RqJA
Typical
165
°C/W
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7
INCHES
MIN
MAX
0.189
0.197
0.150
0.157
0.053
0.069
0.013
0.020
0.050 BSC
0.004
0.010
0.007
0.010
0.016
0.050
0 _
8 _
0.010
0.020
0.228
0.244
NCV1124
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer
purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
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Email: [email protected]
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For additional information, please contact your
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NCV1124/D