SAMSUNG K7S3236T4C

K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
36Mb QDRII+ SRAM Specification
165 FBGA with Pb & Pb-Free
(RoHS compliant)
INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS,
AND IS SUBJECT TO CHANGE WITHOUT NOTICE.
NOTHING IN THIS DOCUMENT SHALL BE CONSTRUED AS GRANTING ANY LICENSE,
EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE,
TO ANY INTELLECTUAL PROPERTY RIGHTS IN SAMSUNG PRODUCTS OR TECHNOLOGY.
ALL INFORMATION IN THIS DOCUMENT IS PROVIDED
ON AS "AS IS" BASIS WITHOUT GUARANTEE OR WARRANTY OF ANY KIND.
1. For updates or additional information about Samsung products, contact your nearest Samsung office.
2. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar applications where Product failure could result in loss of life or personal or physical harm, or any military
or defense application, or any governmental procurement to which special terms or provisions may apply.
* Samsung Electronics reserves the right to change products or specification without notice.
-1-
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
Document Title
1Mx36-bit, 2Mx18-bit QDRTM II+ b4 SRAM
Revision History
Rev. No.
History
Draft Date
Remark
0.0
1. Initial document.
Nov. 2, 2005
Advance
0.1
1. Change the DLL locking time
- Before: 1024 cycle
- After: 2048 cycle
Nov. 25, 2005
Preliminary
0.2
1. Add comment Pb Free and Industrial
Mar. 03, 2006
Preliminary
0.3
1. Change Max of clock cycle time
Mar. 03, 2006
Preliminary
0.4
1. Change DC Characteristics, Pin Capacitance and Thermal Resistance
Apr. 25 2006.
Preliminary
0.5
1. Correct errors
May. 03 2006
Preliminary
0.6
1. Change Samsung JEDEC Code in ID REGISTER DEFINITION
Jun. 05, 2006
Preliminary
1.0
1. Correct typo
Aug. 21, 2006
Final
1.1
1. Change programmable impedence output buffer operation
2. Add AC Timing Characteristics
Jan. 30, 2007
Final
1.2
1. Add AC/DC parameter 450MHz
Mar. 16, 2007
Final
-2-
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
1Mx36-bit, 2Mx18-bit QDRTM II+ b4 SRAM
FEATURES
• 1.8V+0.1V/-0.1V Power Supply.
• DLL circuitry for wide output data valid window and future frequency scaling.
• I/O Supply Voltage 1.5V+0.1V/-0.1V
• Separate independent read and write data ports
with concurrent read and write operation
• HSTL I/O
• Full data coherency, providing most current data .
• Synchronous pipeline read with self timed late write.
• Read latency: 2 clock cycles
• Registered address, control and data input/output.
• DDR(Double Data Rate) Interface on read and write ports.
• Fixed 4-bit burst for both read and write operation.
• Clock-stop supports to reduce current.
• Two input clocks(K and K) for accurate DDR timing at clock
rising edges only.
• Two echo clocks (CQ and CQ) to enhance output data
traceability.
• Data Valid pin(QVLD) supported
• Single address bus.
• Byte write (x18, x36) function.
• Separate read/write control pin(R and W)
• Simple depth expansion with no data contention.
• Programmable output impedance(ZQ).
• JTAG 1149.1 compatible test access port.
• 165FBGA(11x15 ball array) with body size of 15mmx17mm.
Organization
Part
Number
X36
X18
Cycle Access
Unit
Time Time
K7S3236T4C-F(E)C(I)45
2.22
0.45
ns
K7S3236T4C-F(E)C(I)40
2.5
0.45
ns
K7S3236T4C-F(E)C(I)33
3.0
0.45
ns
K7S3236T4C-F(E)C(I)45
2.22
0.45
ns
K7S3218T4C-F(E)C(I)40
2.5
0.45
ns
K7S3218T4C-F(E)C(I)33
3.0
0.45
ns
* -F(E)C(I)
F(E) [Package type] : E-Pb Free, F-Pb
C(I) [Operating Temperature] : C-Commercial, I-Industrial
FUNCTIONAL BLOCK DIAGRAM
K
K
4 (or 2)
WRITE DRIVER
18
(or 19)
1Mx36
(2Mx18)
MEMORY
ARRAY
72
(or 36)
72
(or 36)
144
(or 72)
OUTPUT DRIVER
CTRL
LOGIC
72(or 36)
OUTPUT SELECT
ADD
REG
72(or 36)
OUTPUT REG
R
W
BWX
18 (or 19)
DATA
REG
SENSE AMPS
ADDRESS
36 (or 18)
WRITE/READ DECODE
D(Data in)
QVLD
36 (or 18)
Q(Data Out)
CQ, CQ
(Echo Clock out)
CLK
GEN
Doff
SELECT OUTPUT CONTROL
Notes: 1. Numbers in ( ) are for x18 device
QDR SRAM and Quad Data Rate comprise a new family of products developed by Cypress, Renesas, IDT, NEC and Samsung technology.
-3-
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
PIN CONFIGURATIONS(TOP VIEW) K7S3236T4C (1Mx36)
1
2
3
A
CQ
NC/SA*
NC/SA*
B
Q27
Q18
D18
C
D27
Q28
D19
4
5
6
7
W
BW2
K
BW1
SA
BW3
K
BW0
VSS
SA
NC
SA
8
9
10
11
R
SA
NC/SA*
CQ
SA
D17
Q17
Q8
VSS
D16
Q7
D8
D
D28
D20
Q19
VSS
VSS
VSS
VSS
VSS
Q16
D15
D7
E
Q29
D29
Q20
VDDQ
VSS
VSS
VSS
VDDQ
Q15
D6
Q6
F
Q30
Q21
D21
VDDQ
VDD
VSS
VDD
VDDQ
D14
Q14
Q5
G
D30
D22
Q22
VDDQ
VDD
VSS
VDD
VDDQ
Q13
D13
D5
H
Doff
VREF
VDDQ
VDDQ
VDD
VSS
VDD
VDDQ
VDDQ
VREF
ZQ
J
D31
Q31
D23
VDDQ
VDD
VSS
VDD
VDDQ
D12
Q4
D4
K
Q32
D32
Q23
VDDQ
VDD
VSS
VDD
VDDQ
Q12
D3
Q3
L
Q33
Q24
D24
VDDQ
VSS
VSS
VSS
VDDQ
D11
Q11
Q2
M
D33
Q34
D25
VSS
VSS
VSS
VSS
VSS
D10
Q1
D2
N
D34
D26
Q25
VSS
SA
SA
SA
VSS
Q10
D9
D1
P
Q35
D35
Q26
SA
SA
QVLD
SA
SA
Q9
D0
Q0
R
TDO
TCK
SA
SA
SA
NC
SA
SA
SA
TMS
TDI
Notes : 1. * Checked No Connect(NC) pins are reserved for higher density address, i.e. 3A for 72Mb, 10A for 144Mb and 2A for 288Mb.
2. BW0 controls write to D0:D8, BW1 controls write to D9:D17, BW2 controls write to D18:D26 and BW3 controls write to D27:D35.
PIN NAME
SYMBOL
PIN NUMBERS
DESCRIPTION
K, K
6B, 6A
Input Clock
QVLD
6P
Q Valid output
CQ, CQ
11A, 1A
Output Echo Clock
Doff
1H
DLL Disable
SA
9A,4B,8B,5C,7C,5N-7N,4P,5P,7P,8P,3R-5R,7R-9R
Address Inputs
D0-35
10P,11N,11M,10K,11J,11G,10E,11D,11C,10N,9M,9L
9J,10G,9F,10D,9C,9B,3B,3C,2D,3F,2G,3J,3L,3M,2N
1C,1D,2E,1G,1J,2K,1M,1N,2P
Data Inputs
Q0-35
11P,10M,11L,11K,10J,11F,11E,10C,11B,9P,9N,10L
9K,9G,10F,9E,9D,10B,2B,3D,3E,2F,3G,3K,2L,3N
3P,1B,2C,1E,1F,2J,1K,1L,2M,1P
Data Outputs
W
4A
Write Control Pin,active when low
R
8A
Read Control Pin,active when low
BW0, BW1,BW2, BW3
7B,7A,5A,5B
Block Write Control Pin,active when low
VREF
2H,10H
Input Reference Voltage
ZQ
11H
Output Driver Impedance Control Input
VDD
5F,7F,5G,7G,5H,7H,5J,7J,5K,7K
Power Supply (1.8 V)
VDDQ
4E,8E,4F,8F,4G,8G,3H,4H,8H,9H,4J,8J,4K,8K,4L,8L
Output Power Supply (1.5V)
VSS
4C,8C,4D-8D,5E-7E,6F,6G,6H,6J,6K,5L-7L,4M,8M,4N,8N
Ground
TMS
10R
JTAG Test Mode Select
TDI
11R
JTAG Test Data Input
TCK
2R
JTAG Test Clock
TDO
1R
JTAG Test Data Output
NC
2A,3A,10A,6C,6R
No Connect
NOTE
1
2
Notes:
1. When ZQ pin is directly connected to VDD output impedance is set to minimum value and it cannot be connected to ground or left unconnected.
2. Not connected to chip pad internally.
3. K, K can not be set to VREF voltage.
-4-
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
PIN CONFIGURATIONS(TOP VIEW) K7S3218T4C (2Mx18)
1
2
3
4
5
A
CQ
NC/SA*
B
NC
Q9
6
7
8
SA
W
BW1
K
NC
D9
SA
NC
K
BW0
9
10
11
R
SA
NC/SA*
CQ
SA
NC
NC
Q8
C
NC
NC
D10
VSS
SA
NC
SA
VSS
NC
Q7
D8
D
NC
D11
Q10
VSS
VSS
VSS
VSS
VSS
NC
NC
D7
E
NC
NC
Q11
VDDQ
VSS
VSS
VSS
VDDQ
NC
D6
Q6
F
NC
Q12
D12
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
Q5
G
NC
D13
Q13
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
D5
H
Doff
VREF
VDDQ
VDDQ
VDD
VSS
VDD
VDDQ
VDDQ
VREF
ZQ
J
NC
NC
D14
VDDQ
VDD
VSS
VDD
VDDQ
NC
Q4
D4
K
NC
NC
Q14
VDDQ
VDD
VSS
VDD
VDDQ
NC
D3
Q3
L
NC
Q15
D15
VDDQ
VSS
VSS
VSS
VDDQ
NC
NC
Q2
M
NC
NC
D16
VSS
VSS
VSS
VSS
VSS
NC
Q1
D2
N
NC
D17
Q16
VSS
SA
SA
SA
VSS
NC
NC
D1
P
NC
NC
Q17
SA
SA
QVLD
SA
SA
NC
D0
Q0
R
TDO
TCK
SA
SA
SA
NC
SA
SA
SA
TMS
TDI
Notes: 1. * Checked No Connect(NC) pins are reserved for higher density address, i.e. 10A for 72Mb and 2A for 144Mb.
2. BW0 controls write to D0:D8 and BW1 controls write to D9:D17.
PIN NAME
SYMBOL
PIN NUMBERS
DESCRIPTION
K, K
6B, 6A
Input Clock
QVLD
6P
Q Valid output
CQ, CQ
11A, 1A
Output Echo Clock
Doff
1H
DLL Disable
SA
3A,9A,4B,8B,5C,7C,5N-7N,4P,5P,7P,8P,3R-5R,7R-9R
Address Inputs
D0-17
10P,11N,11M,10K,11J,11G,10E,11D,11C,3B,3C,2D
3F,2G,3J,3L,3M,2N
Data Inputs
Q0-17
11P,10M,11L,11K,10J,11F,11E,10C,11B,2B,3D,3E
2F,3G,3K,2L,3N,3P
Data Outputs
W
4A
Write Control Pin,active when low
R
8A
Read Control Pin,active when low
BW0, BW1
7B, 5A
Block Write Control Pin,active when low
VREF
2H,10H
Input Reference Voltage
ZQ
11H
Output Driver Impedance Control Input
VDD
5F,7F,5G,7G,5H,7H,5J,7J,5K,7K
Power Supply (1.8 V)
VDDQ
4E,8E,4F,8F,4G,8G,3H,4H,8H,9H,4J,8J,4K,8K,4L,8L
Output Power Supply (1.5V)
VSS
4C,8C,4D-8D,5E-7E,6F,6G,6H,6J,6K,5L-7L,4M-8M,4N,8N
Ground
TMS
10R
JTAG Test Mode Select
JTAG Test Data Input
TDI
11R
TCK
2R
JTAG Test Clock
TDO
1R
JTAG Test Data Output
NC
2A,7A,10A,1B,5B,9B,10B,1C,2C,6C,9C,1D,9D,10D,1E,2E,9E,1F
9F,10F,1G,9G,10G,1J,2J,9J,1K,2K,9K,1L,9L,10L,1M
2M,9M,1N,9N,10N,1P,2P,9P,6R
No Connect
NOTE
1
2
Notes:
1. When ZQ pin is directly connected to VDD output impedance is set to minimum value and it cannot be connected to ground or left unconnected.
2. Not connected to chip pad internally.
3. K, K can not be set to VREF voltage.
-5-
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
GENERAL DESCRIPTION
The K7S3236T4C and K7S3218T4C are37,748,736-bits QDR(Quad Data Rate) Synchronous Pipelined Burst SRAMs. They are
organized as 1,048,576 words by 36bits for K7S3236T4C and 2,097,152 words by 18 bits for K7S3218T4C.
The QDR operation is possible by supporting DDR read and write operations through separate data output and input ports with the
same cycle. Memory bandwidth is maximized as data can be transferred into and out of SRAM on every rising edge of K and K. And
totally independent read and write ports eliminate the need for high speed bus turn around.
Address for read and write are latched on alternate rising edges of the input clock K. Data inputs, data output, and all control signals
are synchronized to the input clock ( K or K ). Read data are referenced to echo clock ( CQ or CQ ) outputs. Common address bus is
used to access address both for read and write operations. The internal burst counter is fixed to 4-bit sequential for both read and
write operations, requiring two full clock bus cycles. Any request that attempts to interrupt a burst operation in progress is ignored.
Synchronous pipeline read and late write enable high speed operations. Simple depth expansion is accomplished by using R and W
for port selection. Byte write operation is supported with BW0 and BW1 ( BW2 and BW3 ) pins.
IEEE 1149.1 serial boundary scan (JTAG) simplifies monitoring package pads attachment status with system.
The K7S3236T4C and K7S3218T4C are implemented with SAMSUNG's high performance 6T CMOS technology and is available in
165pin FBGA packages. Multiple power and ground pins minimize ground bounce.
Read Operations
Read cycles are initiated by activating R at the rising edge of the positive input clock K. Address is presented and stored in the read
address register synchronized with K clock. For 4-bit burst DDR operation, it will access four 36-bit or 18-bit data words with each
read command.
The first pipelined data is transferred out of the device triggered by K clock rising edge. Next burst data is triggered by the rising edge
of following K clock rising edge. The process continues until all four data are transferred. Continuous read operations are initiated
with K clock rising edge. And pipelined data are transferred out of device on every rising edge of both K and K clocks. Initial read data
latency is 2 clock cycles when DLL is on.
When the R is disabled after a read operation,the K7S3236T4C and K7S3218T4C will first complete burst read operation before
entering into deselect mode at the next K clock rising edge. Then output drivers disabled automatically to high impedance state.
Write Operations
Write cycles are initiated by activating W at the rising edge of the positive input clock K. Address is presented and stored in the write
address register synchronized with K clock. For 4-bit burst DDR operation, it will write four 36-bit or 18-bit data words with each write
command.
The first "late" data is transferred and registered in to the device synchronous with next K clock rising edge. Next burst data is transferred and registered synchronous with following K clock rising edge. The process continues until all four data are transferred and
registered. Continuous write operations are initiated with K rising edge. And "late writed" data is presented to the device on every rising edge of both K and K clocks.
The device disregards input data presented on the same cycle W disabled. When the W is disabled after a write operation, the
K7S3236T4C and K7S3218T4C will first complete burst write operation before entering into deselect mode at the next K clock rising
edge.
The K7S3236T4C and K7S3218T4C support byte write operations. With activating BW0 or BW1 ( BW2 or BW3 ) in write cycle, only
one byte of input data is presented. In K7S3218T4C, BW0 controls write operation to D0:D8, BW1 controls write operation to D9:D17.
And in K7S3236T4C, BW2 controls write operation to D18:D26, BW3 controls write operation to D27:D35.
-6-
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
Depth Expansion
Separate input and output ports enables easy depth expansion. Each port can be selected and deselected independently and read
and write operation do not affect each other. Before chip deselected, all read and write pending operations are completed.
Programmable Impedance Output Buffer Operation
The designer can program the SRAM's output buffer impedance by terminating the ZQ pin to VSS through a precision resistor(RQ).
The allowable range of RQ is between 175Ω and 350Ω The value of RQ (within 15% tolerance) is five times the output impedance
desired. For example, 250Ω resistor will give an output impedance of 50Ω.
Impedance updates occur early in cycles that do not activate the outputs, such as deselect cycles. In all cases impedance updates
are transparent to the user and do not produce access time "push-outs" or other anomalous behavior in the SRAM. To guarantee
optimum output driver impedance after power up, the SRAM needs 1024 non-read cycles.
Output Valid Pin (QVLD)
The Q Valid indicates valid output data. QVLD is activated half cycle before the read data for the receiver to be ready for capturing
the data. QVLD is edge aligned with CQ and CQ.
Echo clock operation
To assure the output traceability, the SRAM provides the output Echo clock, pair of compliment clock CQ and CQ, which are synchronized with internal data output. Echo clocks run free during normal operation.
The Echo clock is triggered by internal output clock signal, and transferred to external through same structures as output driver.
Power-Up/Power-Down Supply Voltage Sequencing
The following power-up supply voltage application is recommended: VSS, VDD, VDDQ, VREF, then VIN. VDD and VDDQ can be applied
simultaneously, as long as VDDQ does not exceed VDD by more than 0.5V during power-up. The following power-down supply voltage
removal sequence is recommended: VIN, VREF, VDDQ, VDD, VSS. VDD and VDDQ can be removed simultaneously, as long as VDDQ
does not exceed VDD by more than 0.5V during power-down.
-7-
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
Detail Specification of Power-Up Sequence in QDRII+ SRAM
QDRII+ SRAMs must be powered up and initialized in a predefined manner to prevent undefined operations.
• Power-Up Sequence
1. Apply power and keep Doff at low state (All other inputs may be undefined)
- Apply VDD before VDDQ
- Apply VDDQ before VREF or the same time with VREF
2. Just after the stable power and clock(K,K), take Doff to be high.
3. The additional 2048 cycles of clock input is required to lock the DLL after enabling DLL
* Notes: If you want to tie up the Doff pin to High with unstable clock, then you must stop the clock for a few seconds
(Min. 30ns) to reset the DLL after it become a stable clock status.
• DLL Constraints
1. DLL uses either K clock as its synchronizing input, the input should have low phase jitter which is specified as TK var.
2. The lower end of the frequency at which the DLL can operate is 120MHz.
3. If the incoming clock is unstable and the DLL is enabled, then the DLL may lock onto a wrong frequency
and this may cause the failure in the initial stage.
K,K
Status
Power-Up
~ ~ ~
~ ~ ~
Power up & Initialization Sequence (Doff pin controlled)
2048 cycle
Unstable
CLKstage
DLL Locking Range
Any
Command
Inputs Clock
must be stable
VDD
VDDQ
VREF
Doff
Power-Up
Unstable
CLKstage
Stop Clock
2048 cycle
~
~
Status
~
Min 30ns
~ ~
K,K
~
~ ~
Power up & Initialization Sequence (Doff pin Fixed high, Clock controlled)
DLL Locking Range
Any
Command
Inputs Clock
must be stable
VDD
VDDQ
VREF
* Notes: When the operating frequency is changed, DLL reset should be required again.
After DLL reset again, the minimum 2048 cycles of clock input is needed to lock the DLL.
-8-
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
TRUTH TABLES
SYNCHRONOUS TRUTH TABLE
K
R
W
Stopped
X
↑
D
Q
OPERATION
D(A1)
D(A2)
D(A3)
D(A4)
Q(A1)
Q(A2)
Q(A3)
Q(A4)
X
Previous
state
Previous
state
Previous
state
Previous
state
Previous
state
Previous
state
Previous
state
Previous
state
Clock Stop
H
H
X
X
X
X
High-Z
High-Z
High-Z
High-Z
No Operation
↑
L4
X
X
X
X
X
QOUT
at K(t+2)
QOUT
at K(t+2)
QOUT
at K(t+3)
QOUT
at K(t+3)
Read
↑
H5
L4
Din
at K(t+1)
Din
at K(t+1)
Din
at K(t+2)
Din
at K(t+2)
X
X
X
X
Write
Notes: 1. X means "Don′t Care".
2. The rising edge of clock is symbolized by ( ↑ ).
3. Before enter into clock stop status, all pending read and write operations will be completed.
4. This signal was HIGH on previous K clock rising edge. Initiating consecutive READ or WRITE operations on consecutive K clock rising edges
is not permitted. The device will ignore the second request.
5. If this signal was LOW to initiate the previous cycle, this signal becomes a don′t care for this operation however it is strongly recommended
that this signal is brought HIGH as shown in the truth table.
WRITE TRUTH TABLE(x18)
K
K
↑
↑
↑
↑
BW0
BW1
OPERATION
L
L
WRITE ALL BYTEs ( K↑ )
L
L
WRITE ALL BYTEs ( K↑ )
L
H
WRITE BYTE 0 ( K↑ )
L
H
WRITE BYTE 0 ( K↑ )
H
L
WRITE BYTE 1 ( K↑ )
↑
H
L
WRITE BYTE 1 ( K↑ )
H
H
WRITE NOTHING ( K↑ )
↑
H
H
WRITE NOTHING ( K↑ )
↑
↑
Notes: 1. X means "Don′t Care".
2. All inputs in this table must meet setup and hold time around the rising edge of input clock K or K ( ↑ ).
3. Assumes a WRITE cycle was initiated.
WRITE TRUTH TABLE(x36)
K
K
↑
↑
↑
↑
BW0
BW1
BW2
BW3
OPERATION
L
L
L
L
WRITE ALL BYTEs ( K↑ )
L
L
L
L
WRITE ALL BYTEs ( K↑ )
L
H
H
H
WRITE BYTE 0 ( K↑ )
L
H
H
H
WRITE BYTE 0 ( K↑ )
H
L
H
H
WRITE BYTE 1 ( K↑ )
↑
H
L
H
H
WRITE BYTE 1 ( K↑ )
H
H
L
L
WRITE BYTE 2 and BYTE 3 ( K↑ )
↑
H
H
L
L
WRITE BYTE 2 and BYTE 3 ( K↑ )
H
H
H
H
WRITE NOTHING ( K↑ )
H
H
H
H
WRITE NOTHING ( K↑ )
↑
↑
↑
↑
Notes: 1. X means "Don′t Care".
2. All inputs in this table must meet setup and hold time around the rising edge of input clock K or K ( ↑ ).
3. Assumes a WRITE cycle was initiated.
-9-
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
ABSOLUTE MAXIMUM RATINGS
SYMBOL
RATING
UNIT
Voltage on VDD Supply Relative to VSS
PARAMETER
VDD
-0.5 to 2.9
V
Voltage on VDDQ Supply Relative to VSS
VDDQ
-0.5 to VDD
V
VIN
-0.5 to VDD+0.3
V
Voltage on Input Pin Relative to VSS
Storage Temperature
Operating Temperature
Commercial / Industrial
Storage Temperature Range Under Bias
TSTG
-65 to 150
°C
TOPR
0 to 70 / -40 to 85
°C
TBIAS
-10 to 85
°C
Note: 1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification
is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
OPERATING CONDITIONS (0°C ≤ TA ≤ 70°C)
PARAMETER
Supply Voltage
SYMBOL
MIN
TYP
MAX
UNIT
VDD
1.7
1.8
1.9
V
VDDQ
1.4
1.5
1.6
V
VREF
0.7
0.75
0.8
V
2,3)
VIL(DC)
-0.3
-
VREF - 0.1
V
Input High Voltage(DC) 2,4)
VIH(DC)
VREF + 0.1
-
VDDQ + 0.3
V
VIL(AC)
-
-
VREF - 0.2
V
VIH(AC)
VREF + 0.2
-
-
V
Reference Voltage
Input Low Voltage(DC)
Input Low Voltage(AC)
6,7)
Input Highj Voltage(AC)
6,7)
Note: 1. VDDQ must not exceed VDD during normal operation.
2. These are DC test criteria. DC design criteria is VREF±50mV. The AC VIH/VIL levels are defined separately for measuring
timing parameters.
3. VIL (Min)DC=-0.3V, VIL (Min)AC=-1.5V(pulse width ≤ 3ns).
4. VIH (Max)DC=VDDQ+0.3V, VIH (Max)AC=VDDQ+0.85V(pulse width ≤ 3ns).
5. Overshoot : VIH (AC) ≤ VDDQ+0.5V for t ≤ 50% tKHKH(MIN).
Undershoot: VIL (AC) ≤ VSS-0.5V for t ≤ 50% tKHKH(MIN).
6. This condition is for AC function test only, not for AC parameter test.
7. To maintain a valid level, the transiting edge of the input must:
a) Sustain a constant slew rate from the current AC level through the target AC level, VIL(AC) or VIH(AC)
b) Reach at least the target AC level
c) After the AC target level is reached, continue to maintain at least the target DC level, VIL(DC) or VIH(DC)
- 10 -
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
DC ELECTRICAL CHARACTERISTICS (VDD=1.8V ±0.1V, TA=0°C to +70°C)
PARAMETER
SYMBOL
TEST CONDITIONS
Input Leakage Current
IIL
VDD=Max ; VIN=VSS to VDDQ
Output Leakage Current
IOL
Output Disabled,
Operating Current (x36): QDR
Operating Current (x18): QDR
Standby Current(NOP): QDR
Output High Voltage
ICC
ICC
ISB1
VDD=Max , IOUT=0mA
Cycle Time ≥ tKHKH Min
VDD=Max , IOUT=0mA
Cycle Time ≥ tKHKH Min
Device deselected, IOUT=0mA, f=Max,
All Inputs≤0.2V or ≥ VDD-0.2V
VOH1
MIN
MAX
-2
+2
µA
µA
-2
+2
-45
-
1050
-40
-
950
-33
-
850
-45
-
900
-40
-
850
-33
-
750
-45
-
400
-40
-
350
-33
-
300
UNIT NOTES
mA
1,4
mA
1,4
mA
1,5
VDDQ/2-0.12 VDDQ/2+0.12
V
2,6
VDDQ/2-0.12 VDDQ/2+0.12
Output Low Voltage
VOL1
V
2,6
Output High Voltage
VOH2
IOH=-1.0mA
VDDQ-0.2
VDDQ
V
3
Output Low Voltage
VOL2
IOL=1.0mA
VSS
0.2
V
3
Notes: 1. Minimum cycle. IOUT=0mA.
2. |IOH|=(VDDQ/2)/(RQ/5)±15% for 175Ω ≤ RQ ≤ 350Ω. |IOL|=(VDDQ/2)/(RQ/5)±15% for 175Ω ≤ RQ ≤ 350Ω.
3. Minimum Impedance Mode when ZQ pin is connected to VDD.
4. Operating current is calculated with 50% read cycles and 50% write cycles.
5. Standby Current is only after all pending read and write burst operations are completed.
6. Programmable Impedance Mode.
- 11 -
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
AC TIMING CHARACTERISTICS (VDD=1.8V±0.1V, TA=0°C to +70°C)
PARAMETER
SYMBOL
-45
-40
-33
MIN
MAX
MIN
MAX
MIN
MAX
2.22
8.4
2.5
8.4
3.0
8.4
UNIT NOTE
Clock
Clock Cycle Time (K, K)
tKHKH
Clock Phase Jitter (K, K)
tK var
Clock High Time (K, K)
tKHKL
0.20
0.4
0.20
0.4
0.20
ns
ns
0.4
ns
ns
Clock Low Time (K, K)
tKLKH
0.4
0.4
0.4
Clock to Clock (K↑ → K↑)
tKHKH
0.95
1.06
1.3
ns
DLL Lock Time (K)
tK lock
2048
2048
2048
cycle
K Static to DLL reset
tK reset
30
30
30
ns
4
5
Output Times
K, K High to Output Valid
tKHQV
K, K High to Output Hold
tKHQX
K, K High to Echo Clock Valid
tKHCQV
K, K High to Echo Clock Hold
tKHCQX
CQ, CQ High to Output Valid
tCQHQV
0.45
-0.45
0.45
-0.45
0.45
-0.45
0.45
-0.45
0.45
-0.45
0.2
0.45
-0.45
0.2
ns
ns
ns
ns
0.2
ns
CQ, CQ High to Output Hold
tCQHQX
-0.2
-0.2
-0.2
ns
CQ High to CQ High
tCQHCQH
0.75
0.86
1.1
ns
K, K High to Output High-Z
K, K High to Output Low-Z
tKHZ
0.45
0.45
ns
0.2
ns
tKLZ
-0.45
tQVLD
-0.2
Address valid to K rising edge
tAVKH
0.40
0.40
0.40
ns
Control inputs valid to K rising edge
tIVKH
0.40
0.40
0.40
ns
Data-in valid to K, K rising edge
tDVKH
0.28
0.28
0.28
ns
K rising edge to address hold
tKHAX
0.40
0.40
0.40
ns
K rising edge to control inputs hold
tKHIX
0.40
0.40
0.40
ns
K, K rising edge to data-in hold
tKHDX
0.28
0.28
0.28
ns
CQ, CQ High to QVLD Valid
-0.45
0.45
0.2
-0.2
-0.45
0.2
-0.2
6
ns
Setup Times
2
Hold Times
Notes: 1. All address inputs must meet the specified setup and hold times for all latching clock edges.
2. Control singles are R, W.
However BWx does not apply to this parameters. BWx signals obey the data setup and hold times.
3. To avoid bus contention, at a given voltage and temperature tKLZ is bigger than tKHZ.
The specs as shown do not imply bus contention because tKLZ is a MIN parameter that is worst case at totally different test conditions
(0°C, 1.9V) than tKHZ, which is a MAX parameter(worst case at 70°C, 1.7V)
It is not possible for two SRAMs on the same board to be at such different voltage and temperature.
4. Clock phase jitter is the variance from clock rising edge to the next expected clock rising edge.
5. Vdd slew rate must be less than 0.1V DC per 50 ns for DLL lock retention. DLL lock time begins once Vdd and input clock are stable.
6. This parameter is extrapolated from the input timing parameters (tKHKH - 200ps where 200ps is the internal jitter.) This parameter is only
guaranteed by design and not tested in production.
- 12 -
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
THERMAL RESISTANCE
SYMBOL
TYP
Unit
Junction to Ambient
PRMETER
θJA
20.8
°C/W
Junction to Case
θJC
2.3
°C/W
Junction to Pins
θJB
4.3
°C/W
NOTES
Note: Junction temperature is a function of on-chip power dissipation, package thermal impedance, mounting site temperature and mounting site
thermal impedance. TJ=TA + PD x θJA
PIN CAPACITANCE
PRMETER
SYMBOL
TESTCONDITION
TYP
MAX
Unit
CIN
VIN=0V
3.5
4
pF
Input and Output Capacitance
COUT
VOUT=0V
4
5
pF
Clock Capacitance
CCLK
-
3
4
pF
Address Control Input Capacitance
NOTES
Note: 1. Parameters are tested with RQ=250Ω and VDDQ=1.5V.
2. Periodically sampled and not 100% tested.
AC TEST CONDITIONS
AC TEST OUTPUT LOAD
Symbol
Value
Unit
Core Power Supply Voltage
VDD
1.7~1.9
V
Output Power Supply Voltage
VDDQ
1.4~1.6
V
Input High/Low Level
VIH/VIL
1.25/0.25
V
Input Reference Level
VREF
0.75
V
Input Rise/Fall Time
TR/TF
0.3/0.3
ns
VDDQ/2
V
Parameter
Output Timing Reference Level
VREF 0.75V
VDDQ/2
50Ω
SRAM
Zo=50Ω
ZQ
250Ω
Note: Parameters are tested with RQ=250Ω
- 13 -
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
APPLICATION INRORMATION
SRAM#1
Vt
D
SA
R
R=250Ω
ZQ R=250Ω
R W BW0 BW1
Data In
Data Out
Address
R
W
BW
CQ
CQ
Q
K K
SRAM#4
D
SA
R
RW BW0 BW1
ZQ
ZQ
CQ
CQ
Q
K K
Vt
Vt
MEMORY
CONTROLLER
Return CLK
Source CLK
Return CLK
Source CLK
Vt
Vt
R=50Ω Vt=VREF
SRAM1 Input CQ
SRAM1 Input CQ
SRAM4 Input CQ
SRAM4 Input CQ
- 14 -
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
TIMING WAVE FORMS OF READ AND NOP
READ
READ
tKHK
K
NOP
NOP
tKLKH
tKHKH
tKHKL
K
tAVKH tKHAX
A1
SA
A2
tIVKH tKHIX
R
tQVLD
QVLD
tKHQV
Q1-1
Q
(Data Out)
tQVLD
tKHQX
tKHCQV
Q1-2
tKHCQX
Q1-3
Q1-4
tCQHQV
Q2-1
Q2-2
Q2-3
Q2-4
tCQHQX
CQ
CQ
Don′t Care
Undefined
Note: 1. Q1-1 refers to output from address A1+0, Q1-2 refers to output from address A1+1 i.e. the next internal burst address following A1+0.
2. Outputs are disabled one cycle after a NOP.
TIMING WAVE FORMS OF WRITE AND NOP
WRITE
WRITE
tKHKH
K
NOP
NOP
tKLKH
tKHKH
tKHKL
K
tAVKH tKHAX
A1
SA
A2
tIVKH tKHIX
tKHIX
W
D(Data In)
D1-1
D1-2
D1-3
D1-4
D2-1
tDVKH
D2-2
D2-3
D2-4
tKHDX
Don′t Care
Undefined
Note: 1. D1-1 refers to input to address A1+0, D1-2 refers to input to address A1+1, i.e the next internal burst address following A1+0.
2. BWx assumed active.
- 15 -
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
TIMING WAVE FORMS OF READ, WRITE AND NOP
READ
WRITE
READ
WRITE
NOP
NOP
K
K
A1
SA
A2
A3
A4
W
R
D2-1
D(Data In)
D2-2
D2-3
D2-4
D4-1
D4-2
D4-3
tQVLD
QVLD
tKHQV
Q
(Data Out)
tKHQX
Q1-1
tKHCQV
Q1-2
tKHCQX
Q1-3
Q1-4
tCQHQV
Q3-1
Q3-2
tCQHQX
CQ
CQ
Don′t Care
Undefined
Note: 1. If address A3=A2, data Q3-1=D2-1, data Q3-2=D2-2, data Q3-3=D2-3, data Q3-4=D2-4
Write data is forwarded immediately as read results.
2.BWx assumed active.
- 16 -
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
IEEE 1149.1 TEST ACCESS PORT AND BOUNDARY SCAN-JTAG
This part contains an IEEE standard 1149.1 Compatible Test Access Port(TAP). The package pads are monitored by the Serial Scan
circuitry when in test mode. This is to support connectivity testing during manufacturing and system diagnostics. Internal data is not
driven out of the SRAM under JTAG control. In conformance with IEEE 1149.1, the SRAM contains a TAP controller, Instruction Register, Bypass Register and ID register. The TAP controller has a standard 16-state machine that resets internally upon power-up,
therefore, TRST signal is not required. It is possible to use this device without utilizing the TAP. To disable the TAP controller without
interfacing with normal operation of the SRAM, TCK must be tied to VSS to preclude mid level input. TMS and TDI are designed so an
undriven input will produce a response identical to the application of a logic 1, and may be left unconnected. But they may also be
tied to VDD through a resistor. TDO should be left unconnected.
JTAG Block Diagram
JTAG Instruction Coding
IR2 IR1 IR0
0
0
0
TDO Output
Notes
EXTEST
Instruction
Boundary Scan Register
1
0
0
1
IDCODE
Identification Register
3
0
1
0
SAMPLE-Z
Boundary Scan Register
2
A,D
0
1
1
RESERVED
Do Not Use
6
K,K
1
0
0
SAMPLE
Boundary Scan Register
5
1
0
1
RESERVED
Do Not Use
6
1
1
0
RESERVED
Do Not Use
6
1
1
1
BYPASS
Bypass Register
4
C,C
SRAM
CORE
Q
CQ
CQ
TDI
BYPASS Reg.
TDO
Identification Reg.
Instruction Reg.
Control Signals
TMS
TCK
TAP Controller
NOTE:
1. Places DQs in Hi-Z in order to sample all input data regardless of other
SRAM inputs. This instruction is not IEEE 1149.1 compliant.
2. Places DQs in Hi-Z in order to sample all input data regardless of other
SRAM inputs.
3. TDI is sampled as an input to the first ID register to allow for the serial shift
of the external TDI data.
4. Bypass register is initiated to VSS when BYPASS instruction is invoked. The
Bypass Register also holds serially loaded TDI when exiting the Shift DR
states.
5. SAMPLE instruction dose not places DQs in Hi-Z.
6. This instruction is reserved for future use.
TAP Controller State Diagram
1
Test Logic Reset
0
0
Run Test Idle
1
1
1
Select DR
0
1
Capture DR
0
Shift DR
1
Exit2 DR
1
Update DR
0
- 17 -
Select IR
0
1
Capture IR
0
0
1
Exit1 DR
0
Pause DR
1
1
1
0
0
Shift IR
1
0
Exit1 IR
0
Pause IR
1
Exit2 IR
1
Update IR
1
0
0
0
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
SCAN REGISTER DEFINITION
Part
Instruction Register
Bypass Register
ID Register
Boundary Scan
1Mx36
3 bits
1 bit
32 bits
109 bits
2Mx18
3 bits
1 bit
32 bits
109 bits
ID REGISTER DEFINITION
Part
Revision Number
(31:29)
Part Configuration
(28:12)
Samsung JEDEC Code
(11: 1)
Start Bit(0)
1Mx36
000
00def0wx0t0q0b0s0
00011001110
1
2Mx18
000
00def0wx0t0q0b0s0
00011001110
1
Note : Part Configuration
/def=010 for 36Mb, /wx=11 for x36, 10 for x18
/t=1 for DLL Ver., 0 for non-DLL Ver. /q=1 for QDR, 0 for DDR /b=1 for 4Bit Burst, 0 for 2Bit Burst /s=1 for Separate I/O, 0 for Common I/O
BOUNDARY SCAN EXIT ORDER
ORDER
PIN ID
ORDER
PIN ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
6R
6P
6N
7P
7N
7R
8R
8P
9R
11P
10P
10N
9P
10M
11N
9M
9N
11L
11M
9L
10L
11K
10K
9J
9K
10J
11J
11H
10G
9G
11F
11G
9F
10F
11E
10E
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
10D
9E
10C
11D
9C
9D
11B
11C
9B
10B
11A
10A
9A
8B
7C
6C
8A
7A
7B
6B
6A
5B
5A
4A
5C
4B
3A
2A
1A
2B
3B
1C
1B
3D
3C
1D
Note: 1. NC pins are read as "X" (i.e. don′t care.)
- 18 -
ORDER
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
109
PIN ID
2C
3E
2D
2E
1E
2F
3F
1G
1F
3G
2G
1H
1J
2J
3K
3J
2K
1K
2L
3L
1M
1L
3N
3M
1N
2M
3P
2N
2P
1P
3R
4R
4P
5P
5N
5R
Internal
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
JTAG DC OPERATING CONDITIONS
Parameter
Symbol
Min
Typ
Max
Unit
V
Power Supply Voltage
VDD
1.7
1.8
1.9
Input High Level
VIH
1.3
-
VDD+0.3
V
Input Low Level
VIL
-0.3
-
0.5
V
Output High Voltage(IOH=-2mA)
VOH
1.4
-
VDD
V
Output Low Voltage(IOL=2mA)
VOL
VSS
-
0.4
V
Note
Note: 1. The input level of SRAM pin is to follow the SRAM DC specification.
JTAG AC TEST CONDITIONS
Symbol
Min
Unit
Input High/Low Level
Parameter
VIH/VIL
1.8/0.0
V
Input Rise/Fall Time
TR/TF
1.0/1.0
ns
0.9
V
Input and Output Timing Reference Level
Note
1
Note: 1. See SRAM AC test output load.
JTAG AC Characteristics
Parameter
Symbol
Min
Max
Unit
TCK Cycle Time
tCHCH
50
-
ns
TCK High Pulse Width
tCHCL
20
-
ns
TCK Low Pulse Width
tCLCH
20
-
ns
TMS Input Setup Time
tMVCH
5
-
ns
TMS Input Hold Time
tCHMX
5
-
ns
TDI Input Setup Time
tDVCH
5
-
ns
TDI Input Hold Time
tCHDX
5
-
ns
SRAM Input Setup Time
tSVCH
5
-
ns
SRAM Input Hold Time
tCHSX
5
-
ns
Clock Low to Output Valid
tCLQV
0
10
ns
Note
JTAG TIMING DIAGRAM
TCK
tCHCH
tCHCL
tMVCH
tCHMX
tDVCH
tCHDX
tSVCH
tCHSX
tCLCH
TMS
TDI
PI
(SRAM)
tCLQV
TDO
- 19 -
Rev. 1.2 March 2007
K7S3236T4C
K7S3218T4C
1Mx36 & 2Mx18 QDRTM II+ b4 SRAM
165 FBGA PACKAGE DIMENSIONS
15mm x 17mm Body, 1.0mm Bump Pitch, 11x15 Ball Array
B
Top View
A
Side View
C
D
A
G
E
B
F
Bottom View
∅H
E
Symbol
Value
Units
Note
Symbol
A
15 ± 0.1
mm
E
1.0
mm
B
17 ± 0.1
mm
F
14.0
mm
C
1.3 ± 0.1
mm
G
10.0
mm
D
0.35 ± 0.05
mm
H
0.5 ± 0.05
mm
- 20 -
Value
Units
Note
Rev. 1.2 March 2007