TI SN65LVDS93DGG

SN65LVDS93
LVDS SERDES TRANSMITTER
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
D
D
D
D
D
D
D
D
D
D
D
D
D
D
28:4 Data Channel Compression at up to
1.82 Gigabits per Second Throughput
Suited for Point-to-Point Subsystem
Communication With Very Low EMI
28 Data Channels Plus Clock in
Low-Voltage TTL and 4 Data Channels Plus
Clock Out Low-Voltage Differential
Selectable Rising or Falling Clock Edge
Triggered Inputs
Bus Pins Tolerate 6-kV HBM ESD
Operates From a Single 3.3-V Supply and
250 mW (Typ)
5-V Tolerant Data Inputs
Packaged in Thin Shrink Small-Outline
Package With 20 Mil Terminal Pitch
Consumes <1 mW When Disabled
Wide Phase-Lock Input Frequency Range
20 MHz to 65 MHz
No External Components Required for PLL
Outputs Meet or Exceed the Requirements
of ANSI EIA/TIA-644 Standard
Industrial Temperature Qualified
TA = – 40°C to 85°C
Replacement for the DS90CR285
description
DGG PACKAGE
(TOP VIEW)
VCC
D5
D6
D7
GND
D8
D9
D10
VCC
D11
D12
D13
GND
D14
D15
D16
CLKSEL
D17
D18
D19
GND
D20
D21
D22
D23
VCC
D24
D25
1
56
2
55
3
54
4
53
5
52
6
51
7
50
8
49
9
48
10
47
11
46
12
45
13
44
14
43
15
42
16
41
17
40
18
39
19
38
20
37
21
36
22
35
23
34
24
33
25
32
26
31
27
D4
D3
D2
GND
D1
D0
D27
LVDSGND
Y1M
Y1P
Y2M
Y2P
LVDSVCC
LVDSGND
Y3M
Y3P
CLKOUTM
CLKOUTP
Y4M
Y4P
LVDSGND
PLLGND
PLLVCC
PLLGND
SHTDN
CLKIN
D26
GND
30
The SN65LVDS93 LVDS serdes (serializer/des28
29
erializer) transmitter contains four 7-bit parallelload serial-out shift registers, a 7× clock
synthesizer, and five low-voltage differential signaling (LVDS) drivers in a single integrated circuit. These
functions allow 28 bits of single-ended LVTTL data to be synchronously transmitted over five balanced-pair
conductors for receipt by a compatible receiver, such as the SN65LVDS94.
When transmitting, data bits D0 through D27 are each loaded into registers upon the edge of the input clock
signal (CLKIN). The rising or falling edge of the clock can be selected via the clock select (CLKSEL) pin. The
frequency of CLKIN is multiplied seven times and then used to serially unload the data registers in 7-bit slices.
The four serial streams and a phase-locked clock (CLKOUT) are then output to LVDS output drivers. The
frequency of CLKOUT is the same as the input clock, CLKIN.
The SN65LVDS93 requires no external components and little or no control. The data bus appears the same
at the input to the transmitter and output of the receiver with the data transmission transparent to the user(s).
The only user intervention is selecting a clock rising edge by inputting a high level to CLKSEL or a falling edge
with a low-level input and the possible use of the shutdown/clear (SHTDN). SHTDN is an active-low input to
inhibit the clock and shut off the LVDS output drivers for lower power consumption. A low level on this signal
clears all internal registers at a low level.
The SN65LVDS93 is characterized for operation over ambient air temperatures of – 40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright  2000, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1
SN65LVDS93
LVDS SERDES TRANSMITTER
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
functional block diagram
D0, D1, D2, D3,
D4, D6, D7
Parallel-Load 7-Bit
Shift Register
7
A,B, ...G
SHIFT/LOAD
Y0P
Y0M
CLK
D8, D9, D12, D13,
D14, D15, D18
Parallel-Load 7-Bit
Shift Register
7
A,B, ...G
SHIFT/LOAD
Y1P
Y1M
CLK
D5, D10, D11, D16,
D17, D23, D27
A,B, ...G
SHIFT/LOAD
7
Input Bus
D19, D20, D21, D22,
D24, D25, D26
Parallel-Load 7-Bit
Shift Register
7
Y2P
Y2M
CLK
Parallel-Load 7-Bit
Shift Register
A,B, ...G
SHIFT/LOAD
Y3P
Y3M
CLK
Control Logic
SHTDN
7× Clock/PLL
CLKIN
7×CLK
CLKOUTP
CLK
CLKOUTM
CLKINH
CLKSEL
2
RISING/FALLING EDGE
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SN65LVDS93
LVDS SERDES TRANSMITTER
D0
ÉÉÉÉ
ÉÉÉÉ
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
ÉÉÉ
ÉÉÉ
CLKIN
or
CLKIN
ÉÉÉ
ÉÉÉ
CLKOUT
ÇÇ
ÇÇ
ÉÉÉ
ÉÉÉ
Previous Cycle
ÇÇÇ
ÇÇÇ
Next
Cycle
Current Cycle
Y0
D0–1
D7
D6
D4
D3
D2
D1
D0
D7+1
Y1
D8–1
D18
D15
D14
D13
D12
D9
D8
D18+1
Y2
D19–1
D26
D25
D24
D22
D21
D20
D19
D26+1
Y3
D27–1
D23
D17
D16
D11
D10
D5
D27
D23+1
Figure 1. Typical ’LVDS93 Load and Shift Sequences
equivalent input and output schematic diagrams
VCC
VCC
5Ω
Dn or
SHTDN
YnP or YnM
10 kΩ
50 Ω
7V
7V
300 kΩ
INPUT
OUTPUT
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
3
SN65LVDS93
LVDS SERDES TRANSMITTER
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
absolute maximum ratings over operating free-air temperature (unless otherwise noted)†
Supply voltage range, VCC (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 4 V
Voltage range at any output terminal, VO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to VCC + 0.5 V
Voltage range at any input terminal, VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 5.5 V
Electrostatic discharge (see Note 2): Bus Pins (Class 3A) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 KV
Bus Pins (Class 2B) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400 V
Bus Pins (Class 2A) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 KV
Bus Pins (Class 2B) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 200 V
Continuous total power dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See Dissipation Rating Table
Operating free-air temperature range, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 40°C to 85°C
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltage values are with respect to the GND terminals.
2. This rating is measured using MIL-STD-883C Method, 3015.7.
DISSIPATION RATING TABLE
PACKAGE
TA ≤ 25°C
POWER RATING
DERATING FACTOR‡
ABOVE TA = 25°C
TA = 70°C
POWER RATING
TA = 85°C
POWER RATING
DGG
1377 mW
11 mW/°C
882 mW
717 mW
‡ This is the inverse of the junction-to-ambient thermal resistance when board-mounted and with no air flow.
recommended operating conditions
MIN
NOM
MAX
Supply voltage, VCC
3
3.3
3.6
High-level input voltage, VIH
2
Low-level input voltage, VIL
Operating free-air temperature, TA
4
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
V
V
0.8
Differential load impedance, ZL
UNIT
V
90
132
Ω
– 40
85
°C
SN65LVDS93
LVDS SERDES TRANSMITTER
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
VT
|VOD|
Input voltage threshold
∆|VOD|
Change in the steady-state differential output
voltage magnitude between opposite binary states
RL = 100 Ω,
VOC(SS)
VOC(PP)
Steady-state common-mode output voltage
See Figure 3
IIH
IIL
High-level input current
TYP†
MAX
1.4
Differential steady-state output voltage magnitude
247
See Figure 3
1.125
VIH = VCC
VIL = 0 V
IOS
Short circuit output current
Short-circuit
IOZ
High-impedance state output current
454
mV
50
mV
V
150
mV
20
µA
±10
µA
VOY = 0 V
VOD = 0 V
±24
mA
±12
mA
VO = 0 V to VCC
Disabled,
±20
µA
350
µA
120
mA
All inputs at GND
Enabled, RL = 100 Ω (5 places),
Worst-case pattern (see Figure 4),
tc = 15.38 ns
Quiescent current (average)
UNIT
V
1.375
Peak-to-peak common-mode output voltage
Low-level input current
ICC(AVG)
MIN
95
Ci
Input capacitance
† All typical values are at VCC = 3.3 V, TA = 25°C.
3
pF
timing requirements
MIN
NOM
MAX
tc
tw
Input clock period
15.4
tc
50
ns
High-level input clock pulse width duration
0.4tc
Input signal transition time
0.6tc
5
ns
tt
tsu
th
Data hold time, D0 through D27 after CLKIN↓ or CLKIN↑ (See Figure 2)
Data setup time, D0 through D27 before CLKIN↑ or CLKIN↓ (See Figure 2)
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
UNIT
ns
3
ns
1.5
ns
5
SN65LVDS93
LVDS SERDES TRANSMITTER
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
switching characteristics over recommended operating conditions (unless otherwise noted)
PARAMETER
t0
Delay time, CLKOUT↑ to serial bit
position 0
t1
Delay time, CLKOUT↑ to serial bit
position 1
t2
Delay time, CLKOUT↑ serial bit
position 2
t3
Delay time, CLKOUT↑ serial bit
position 3
t4
Delay time, CLKOUT↑ to serial bit
position 4
t5
Delay time, CLKOUT↑ to serial bit
position 5
t6
Delay time, CLKOUT↑ to serial bit
position 6
tsk(o)
Output skew, t n
t7
Delay time, CLKIN↓ or CLKIN↑ to
CLKOUT↑
tc(o)
Output clock period
∆tc(o)
( )
TEST CONDITIONS
MIN
– 0.20
TYP†
MAX
UNIT
0
0.20
ns
* 0.20
2 t * 0.20
7 c
) 0.20
2 t ) 0.20
7 c
3 t ) 0.20
7 c
4 t ) 0.20
7 c
5 t ) 0.20
7 c
1t
7 c
tc = 15.38 ns (±0.2%),
|I
|Input
t clock
l k jitt
jitter|| < 50 ps‡,
1t
7 c
* 0.20
4 t * 0.20
7 c
3t
7 c
See
S Figure
Fi
5
* 0.20
6 t * 0.20
7 c
5t
7 c
* n7 tc
6t
7 c
Output clock cycle-to-cycle
cycle to cycle jitter§
See Figure 5
ns
ns
ns
ns
) 0.20
ns
0.20
ns
– 0.20
tc = 15.38 ns (±0.2%),
|Input clock jitter| < 50 ps‡,
ns
4.2
ns
tc
ps
tc = 15.38 ns + 0.75sin(2π500E3t) ± 0.05 ns,
See Figure 6
± 80
ps
tc = 15.38 ns + 0.75sin(2π3E6t) ± 0.05 ns,
See Figure 6
± 300
ns
4t
7 c
ps
tw
High-level output clock pulse duration
tt
Differential output voltage transition time
(tr or tf)
See Figure 3
ten
Enable time, SHTDN↑ to phase lock
(Yn valid)
See Figure 7
1
ms
tdis
Disable time, SHTDN↓ to off-state
(CLKOUT low)
See Figure 8
250
ns
260
700
† All typical values are at VCC = 3.3 V, TA = 25°C.
‡ Input clock jitter is the magnitude of the charge in the input clock period
§ The output clock jitter is the change in the output clock period from one cycle to the next cycle observed over 15,000 cycles.
6
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1500
ps
SN65LVDS93
LVDS SERDES TRANSMITTER
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
PARAMETER MEASUREMENT INFORMATION
ÉÉÉÉÉ
ÉÉÉÉÉ
Dn
tsu
ÉÉÉÉÉ
ÉÉÉÉÉ
th
CLKSEL LOW
CLKIN
CLKSEL HIGH
NOTE: All input timing is defined at 1.4 V on an input signal with a 10% to 90% rise or fall time of less than 5 ns.
Figure 2. Setup and Hold Time Definition
49.9 Ω ± 1% (2 Places)
YP
VOD
VOC
YM
CL = 10 pF Max
(2 Places)
NOTE A: The lumped instrumentation capacitance for any
single-ended voltage measurement is less than or equal
to 10 pF. When making measurements at YP or YM, the
complementary output is similarly loaded.
(a) SCHEMATIC
100%
80%
VOD(H)
0V
VOD(L)
20%
0%
tf
tr
VOC(PP)
VOC(SS)
VOC(SS)
0V
(b) WAVEFORMS
Figure 3. Test Load and Voltage Definitions for LVDS Outputs
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
7
SN65LVDS93
LVDS SERDES TRANSMITTER
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
PARAMETER MEASUREMENT INFORMATION
tc
CLKIN
Even Dn
Odd Dn
NOTE A: The worst-case test pattern produces nearly the maximum switching frequency for all of the LVDS outputs. Pattern with
CLKSEL low shown.
Figure 4. Worst-Case Test Pattern (CLKSEL low shown)
t7
CLKIN
CLKOUT
t6
t5
t4
t3
t2
t1
t0
Yn
≈ 2.5 V
CLKIN
VOD(H)
CLKOUT
or
Yn
1.4 V
0.00 V
≈ 0.5 V
VOD(L)
td7
td0 – td6
Figure 5. Timing Definitions
8
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SN65LVDS93
LVDS SERDES TRANSMITTER
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
Reference
+
∑
Device
Under
Test
VCO
+
Modulation
V(t) = A sin (2 π f(mod) t)
HP8656B
Signal Generator
0.1 MHz – 990 MHz
HP8665A
Synthesized Signal
Generator
0.1 MHz – 4200 MHz
Device Under Test
CLKIN
OUTPUT
RF Output
CLKOUT
DTS2070C
Digital Time Scope
Input
Modulation Input
Figure 6. Output Clock Jitter Test Setup
CLKIN
Dn
ten
SHTDN
Yn
ÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉ
ÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉÉ
Invalid
Valid
Figure 7. Enable Time Waveforms (CLKSEL low shown)
CLKIN
tdis
SHTDN
CLKOUT
Figure 8. Disable Time Waveforms (CLKSEL low shown)
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
9
SN65LVDS93
LVDS SERDES TRANSMITTER
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
TYPICAL CHARACTERISTICS
WORST-CASE SUPPLY CURRENT
vs
FREQUENCY
120
VCC = 3.6 V
I CC – Supply Current – mA
100
ÁÁ
ÁÁ
80
VCC = 3 V
60
VCC = 3.3 V
40
20
0
30
40
50
60
f – Frequency – MHz
Figure 9
10
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
70
SN65LVDS93
LVDS SERDES TRANSMITTER
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
APPLICATION INFORMATION
16-bit bus extension
In a 16-bit bus application (Figure 10), TTL data and clock coming from bus transceivers that interface the
backplane bus arrive at the Tx parallel inputs of the LVDS serdes transmitter. The clock associated with the bus
is also connected to the device. The on-chip PLL synchronizes this clock with the parallel data at the input. The
data is then multiplexed into three different line drivers which perform the TTL to LVDS conversion. The clock
is also converted to LVDS and presented to a separate driver. This synchronized LVDS data and clock at the
receiver, which recovers the LVDS data and clock, performs a conversion back to TTL. Data is then
demultiplexed into a parallel format. An on-chip PLL synchronizes the received clock with the parallel data, and
then all are presented to the parallel output port of the receiver.
16-Bit
BTL Bus
Interface
SN74FB2032
SN74FB2032
CLK
TTL
Interface
LVDS
Interface
0 To 10 Meters
(Media Dependent)
SN65LVDS93
SN65LVDS94
TTL
Interface
D0–D7 8
8
D8–D15 8
8 D8–D15
D0–D7
16-Bit
BTL Bus
Interface
SN74FB2032
SN74FB2032
XMIT Clock
RCV Clock
CLK
Backplane
Bus
Backplane
Bus
Figure 10. 16-Bit Bus Extension
16-bit bus extension with parity
In the previous application we did not have a checking bit that would provide assurance that the data crosses
the link. If we add a parity bit to the previous example, we would have a diagram similar to the one in Figure 11.
The device following the SN74FB2032 is a low-cost parity generator. Each transmit-side transceiver/parity
generator takes the LVTTL data from the corresponding transceiver, performs a parity calculation over the byte,
and then passes the bits with its calculated parity value on the parallel input of the LVDS serdes transmitter.
Again, the on-chip PLL synchronizes this transmit clock with the eighteen parallel bits (16 data + 2 parity) at the
input. The synchronized LVDS data/parity and clock arrive at the receiver.
The receiver performs the conversion from LVDS to LVTTL and the transceiver/parity generator performs the
parity calculations. These devices compare their corresponding input bytes with the value received on the parity
bit. The transceiver/parity generator will assert its parity error output if a mismatch is detected.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
11
SN65LVDS93
LVDS SERDES TRANSMITTER
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
APPLICATION INFORMATION
16-Bit
BTL Bus
Interface
LVDS
Interface
0 To 10 Meters
(Media Dependent)
TTL
Interface
W/Parity
TTL
Interface
SN65LVDS93
SN74FB2032
9 Bit Latchable
Transceiver/ With
Parity Generator
8
Parity
9 Bit Latchable
Transceiver/ With
Parity Generator
D0–D7
9 Bit Latchable
Transceiver/ With
Parity Generator
Parity
8
D8–D15
SN74FB2032
TTL
Interface
16-Bit
BTL Bus
Interface
SN65LVDS94
8
D0–D7
TTL
Interface
W/Parity
8
Parity
SN74FB2032
D8–D15
9 Bit Latchable
Transceiver/ With
Parity Generator
Parity
SN74FB2032
Parity
Error
CLK
XMIT Clock
CLK
RCV Clock
Backplane
Bus
Backplane
Bus
Figure 11. 16-Bit Bus Extension With Parity
low cost virtual backplane transceiver
Figure 12 represents LVDS serdes in an application as a virtual backplane transceiver (VBT). The concept of
a VBT can be achieved by implementing individual LVDS serdes chipsets in both directions of subsystem
serialized links.
Depending on the application, the designer will face varying choices when implementing a VBT. In addition to
the devices shown in Figure 12, functions such as parity and delay lines for control signals could be included.
Using additional circuitry, half-duplex or full-duplex operation can be achieved by configuring the clock and
control lines properly.
The designer may choose to implement an independent clock oscillator at each end of the link and then use
a PLL to synchronize LVDS serdes’s parallel I/O to the backplane bus. Resynchronizing FIFOs may also be
required.
Bus
Transceivers
LVDS Serdes
Transmitter
TTL
Inputs
Up To
21 or 28
Bits
Backplane
Bus
Bus
Transceivers
LVDS Serdes
Receiver
TTL
Outputs
Up To
21 or 28
Bits
LVDS
Serial Links
4 or 5
Pairs
LVDS Serdes
Transmitter
Bus
Transceivers
LVDS Serdes
Receiver
Figure 12. Virtual Backplane Transceiver
12
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
Backplane
Bus
Bus
Transceivers
SN65LVDS93
LVDS SERDES TRANSMITTER
SLLS302F – MAY 1998 – REVISED FEBRUARY 2000
MECHANICAL DATA
DGG (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
48 PIN SHOWN
0,27
0,17
0,50
48
0,08 M
25
6,20
6,00
8,30
7,90
0,15 NOM
Gage Plane
1
0,25
24
0°– 8°
A
0,75
0,50
Seating Plane
0,15
0,05
1,20 MAX
PINS **
0,10
48
56
64
A MAX
12,60
14,10
17,10
A MIN
12,40
13,90
16,90
DIM
4040078 / F 12/97
NOTES: A.
B.
C.
D.
All linear dimensions are in millimeters.
This drawing is subject to change without notice.
Body dimensions do not include mold protrusion not to exceed 0,15.
Falls within JEDEC MO-153
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
13
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright  2000, Texas Instruments Incorporated