STMICROELECTRONICS BU931T_03

BU931T
®
HIGH VOLTAGE IGNITION COIL DRIVER
NPN POWER DARLINGTON TRANSISTOR
■
■
VERY RUGGED BIPOLAR TECHNOLOGY
HIGH OPERATING JUNCTION
TEMPERATURE
APPLICATIONS
HIGH RUGGEDNESS ELECTRONIC
IGNITIONS
■
3
1
2
TO-220
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
V CES
Collector-Emitter Voltage (V BE = 0)
500
V
V CEO
Emitter-Base Voltage (I B = 0)
400
V
V EBO
Emitter-Base Voltage (I C = 0)
5
V
Collector Current
10
A
I CM
IB
Collector Peak Current
Base Current
15
1
A
A
IC
I BM
Base Peak Current
P tot
Total Dissipation at T c = 25 o C
T stg
Storage Temperature
Tj
Max. Operating Junction Temperature
October 2003
5
A
125
W
-65 to 175
o
C
175
o
C
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BU931T
THERMAL DATA
R thj-case
Thermal Resistance Junction-case
Max
o
1.2
C/W
ELECTRICAL CHARACTERISTICS (Tcase = 25 oC unless otherwise specified)
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
I CES
Collector Cut-off
Current (V BE = 0)
V CE = 500 V
V CE = 500 V
T C = 125 o C
100
0.5
µA
mA
I CEO
Collector Cut-off
Current (I B = 0)
V CE = 450 V
V CE = 450 V
T C = 125 o C
100
0.5
µA
mA
I EBO
Emitter Cut-off Current
(I C = 0)
V EB = 5 V
20
mA
V CEO(SUS) ∗ Collector-Emitter
Saturation Voltage
(I B = 0)
I C = 100 mA L = 10 mH I B = 0
V CLAMP = 400 V (see fig.4)
400
V
V CE(sat) ∗
Collector-Emitter
Saturation Voltage
IC = 7 A
IC = 8 A
I B = 70 mA
I B = 100 mA
1.6
1.8
V
V
V BE(sat) ∗
Base-Emitter
Saturation Voltage
IC = 7 A
IC = 8 A
I B = 70 mA
I B = 100 mA
2.2
2.4
V
V
DC Current Gain
IC = 5 A
2.5
V
h FE ∗
VF
ts
tf
V CE = 10 V
Diode Forward Voltage I F = 10 A
Functional Test
V CC = 24 V V clamp = 400 V L= 7 mH
(see fig. 1)
INDUCTIVE LOAD
Storage Time
Fall Time
V CC = 12 V V clamp = 300 V L= 7 mH
I C = 7 A I B = 70 mA
R BE = 47 Ω
V BE = 0
(see fig. 3)
∗ Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
Safe Operating Area
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300
DC Current Gain
8
A
15
0.5
µs
µs
BU931T
Collector Emitter Saturation Voltage
Collector Emitter Saturation Voltage
Collector Emitter Saturation Voltage
Base Emitter Saturation Voltage
Base Emitter Saturation Voltage
Switching Time Inductive Load
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BU931T
FIGURE 1: Functional Test Circuit
FIGURE 2: Functional Test Waveforms
FIGURE 3: Switching Time Test Circuit
FIGURE 4: Sustaining Voltage Test Circuit
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BU931T
TO-220 MECHANICAL DATA
DIM.
mm
MIN.
TYP.
inch
MAX.
MIN.
TYP.
MAX.
A
4.40
4.60
0.173
0.181
C
1.23
1.32
0.048
0.052
D
2.40
2.72
0.094
0.107
E
0.49
0.70
0.019
0.027
F
0.61
0.88
0.024
0.034
F1
1.14
1.70
0.044
0.067
F2
1.14
1.70
0.044
0.067
G
4.95
5.15
0.194
0.202
G1
2.40
2.70
0.094
0.106
H2
10.00
10.40
0.394
L2
L4
16.40
13.00
0.409
0.645
14.00
0.511
0.551
0.116
L5
2.65
2.95
0.104
L6
15.25
15.75
0.600
0.620
L7
6.20
6.60
0.244
0.260
L9
3.50
3.93
0.137
0.154
3.85
0.147
M
DIA.
2.60
3.75
0.102
0.151
P011CI
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BU931T
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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© 2003 STMicroelectronics – All Rights reserved
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