STMICROELECTRONICS STN3N45K3

STN3N45K3
STQ3N45K3-AP, STU3N45K3
N-channel 450 V, 3.2 Ω, 1.8 A, TO-92, SOT-223, IPAK
SuperMESH3™ Power MOSFET
Preliminary data
Features
Type
VDSS
RDS(on)
max
ID
Pw
STN3N45K3
450 V
< 3.8 Ω
0.6 A
2W
STQ3N45K3-AP
450 V
< 3.8 Ω
0.6 A
2.5 W
STU3N45K3
450 V
< 3.8 Ω
1.8 A
27 W
■
■
3
2
1
TO-92
100% avalanche tested
Extremely high dv/dt capability
1
2
3
SOT-223
■
Gate charge minimized
■
Very low intrinsic capacitance
■
Improved diode reverse recovery
characteristics
■
Zener-protected
Figure 1.
Internal schematic diagram
D(2)
Application
■
IPAK
2
Switching applications
Description
G(1)
The new SuperMESH3™ series is obtained
through the combination of a further fine tuning of
ST's well established strip-based PowerMESH™
layout with a new optimization of the vertical
structure. In addition to reducing on-resistance
significantly versus previous generation, special
attention has been taken to ensure a very good
dv/dt capability and higher margin in breakdown
voltage for the most demanding application.
Table 1.
S(3)
AM01476v1
Device summary
Order codes
Marking
Package
Packaging
STN3N45K3
3N45K3
SOT-223
Tube
STQ3N45K3-AP
3N45K3
TO-92
Ammopak
STU3N45K3
3N45K3
IPAK
Tube
April 2010
Doc ID 17206 Rev 2
This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to
change without notice.
1/12
www.st.com
12
Contents
STN3N45K3, STQ3N45K3-AP, STU3N45K3
Contents
1
Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
2
Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
3
Test circuits
4
Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
5
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
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Doc ID 17206 Rev 2
STN3N45K3, STQ3N45K3-AP, STU3N45K3
1
Electrical ratings
Electrical ratings
Table 2.
Absolute maximum ratings
Value
Symbol
Parameter
Unit
SOT-223
TO-92
IPAK
VDS
Drain-source voltage (VGS = 0)
450
V
VGS
Gate- source voltage
± 30
V
ID
Drain current (continuous) at TC = 25 °C
0.6
1.8
A
ID
Drain current (continuous) at TC = 100 °C
0.38
1
A
Drain current (pulsed)
2.4
7.2
A
27
W
IDM
(1)
PTOT
Total dissipation at TC = 25 °C
Tstg
Storage temperature
Tj
2
Max. operating junction temperature
2.5
-55 to 150
°C
150
°C
1. Pulse width limited by safe operating area.
Table 3.
Symbol
Thermal data
Parameter
Rthj-case
Thermal resistance junction-case max
Rthj-amb
Thermal resistance junction-ambient max
Tl
Maximum lead temperature for soldering
purpose
Table 4.
Symbol
SOT-223
TO-92
IPAK
Unit
62.50
50
4.63
°C/W
100
°C/W
300
°C
Max value
Unit
Avalanche characteristics
Parameter
IAR
Avalanche current, repetitive or notrepetitive (pulse width limited by Tj max)
0.5
A
EAS
Single pulse avalanche energy
(starting Tj = 25°C, ID = IAR, VDD = 50V)
TBD
mJ
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Electrical characteristics
2
STN3N45K3, STQ3N45K3-AP, STU3N45K3
Electrical characteristics
(TC = 25 °C unless otherwise specified)
Table 5.
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source
breakdown voltage
ID = 1 mA, VGS = 0
IDSS
VDS = Max rating
Zero gate voltage
drain current (VGS = 0) VDS = Max rating, TC=125 °C
IGSS
Gate-body leakage
current (VDS = 0)
Gate threshold voltage VDS = VGS, ID = 50 µA
RDS(on
Static drain-source on
resistance
Symbol
Min.
Typ.
Max.
450
3
VGS = 10 V, ID = 0.5 A
Unit
V
1
50
µA
µA
± 10
µA
3.75
4.5
V
3.2
3.8
Ω
VGS = ± 20 V
VGS(th)
Table 6.
Dynamic
Test conditions
Min.
Typ.
Max.
Unit
Input capacitance
Output capacitance
Reverse transfer
capacitance
VDS = 25 V, f = 1 MHz, VGS = 0
-
150
30
6
-
pF
pF
pF
RG
Intrinsic gate
resistance
f = 1 MHz open drain
-
TBD
-
Ω
Qg
Qgs
Qgd
Total gate charge
Gate-source charge
Gate-drain charge
VDD = 360 V, ID = 1.8 A,
VGS = 10 V
(see Figure 3)
-
6
TBD
TBD
-
nC
nC
nC
Min.
Typ.
Max
Unit
-
TBD
TBD
TBD
TBD
-
ns
ns
ns
ns
Ciss
Coss
Crss
Table 7.
Symbol
td(on)
tr
td(off)
tf
4/12
On /off states
Parameter
Switching times
Parameter
Turn-on delay time
Rise time
Turn-off-delay time
Fall time
Test conditions
VDD = 225 V, ID = 0.5 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 2)
Doc ID 17206 Rev 2
STN3N45K3, STQ3N45K3-AP, STU3N45K3
Table 8.
Source drain diode
Symbol
Parameter
ISD
ISDM (1)
Source-drain current
Source-drain current (pulsed)
VSD (2)
Forward on voltage
trr
Qrr
IRRM
trr
Qrr
IRRM
Electrical characteristics
Test conditions
Min.
Typ.
Max. Unit
-
1.8
7.2
A
A
ISD = 1.8 A, VGS = 0
-
TBD
V
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD = 1.8 A, di/dt = 100 A/µs
VDD = 100 V (see Figure 7)
-
TBD
TBD
TBD
ns
nC
A
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD = 1.8 A, di/dt = 100 A/µs
VDD = 100 V, Tj = 150 °C
(see Figure 7)
-
TBD
TBD
TBD
ns
nC
A
Min
Typ
1. Pulse width limited by safe operating area.
2. Pulsed: Pulse duration = 300 µs, duty cycle 1.5%.
Table 9.
Symbol
BVGSO
Gate-source Zener diode
Parameter
Test conditions
Gate-source breakdown
voltage
Igs=± 1 mA (open drain)
30
Max Unit
-
V
The built-in back-to-back Zener diodes have specifically been designed to enhance not only
the device’s ESD capability, but also to make them safely absorb possible voltage transients
that may occasionally be applied from gate to source. In this respect the Zener voltage is
appropriate to achieve an efficient and cost-effective intervention to protect the device’s
integrity. These integrated Zener diodes thus avoid the usage of external components.
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Test circuits
STN3N45K3, STQ3N45K3-AP, STU3N45K3
3
Test circuits
Figure 2.
Switching times test circuit for
resistive load
Figure 3.
Gate charge test circuit
VDD
12V
47kΩ
1kΩ
100nF
3.3
µF
2200
RL
µF
VGS
IG=CONST
VDD
100Ω
Vi=20V=VGMAX
VD
RG
2200
µF
D.U.T.
D.U.T.
VG
2.7kΩ
PW
47kΩ
1kΩ
PW
AM01468v1
Figure 4.
AM01469v1
Test circuit for inductive load
Figure 5.
switching and diode recovery times
A
A
D.U.T.
FAST
DIODE
B
B
Unclamped Inductive load test
circuit
L
A
D
G
VD
L=100µH
S
3.3
µF
B
25 Ω
1000
µF
D
VDD
2200
µF
3.3
µF
VDD
ID
G
RG
S
Vi
D.U.T.
Pw
AM01470v1
Figure 6.
Unclamped inductive waveform
AM01471v1
Figure 7.
Switching time waveform
ton
V(BR)DSS
tdon
VD
toff
tr
tdoff
tf
90%
90%
IDM
10%
ID
VDD
10%
0
VDD
VDS
90%
VGS
AM01472v1
6/12
0
Doc ID 17206 Rev 2
10%
AM01473v1
STN3N45K3, STQ3N45K3-AP, STU3N45K3
4
Package mechanical data
Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at: www.st.com. ECOPACK
is an ST trademark.
Doc ID 17206 Rev 2
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Package mechanical data
STN3N45K3, STQ3N45K3-AP, STU3N45K3
SOT-223 mechanical data
mm.
DIM.
min.
typ
A
max.
1.80
A1
0.02
0.1
B
0.60
0.70
0.85
B1
2.90
3.00
3.15
c
0.24
0.26
0.35
D
6.30
6.50
6.70
e
2.30
e1
4.60
E
3.30
3.50
3.70
H
6.70
7.00
7.30
10 o
V
0046067_L
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Doc ID 17206 Rev 2
STN3N45K3, STQ3N45K3-AP, STU3N45K3
Table 10.
Package mechanical data
TO-92 mechanical data
mm
Dim.
Min.
Typ.
Max.
A
4.32
4.95
b
0.36
0.51
D
4.45
4.95
E
3.30
3.94
e
2.41
2.67
e1
1.14
1.40
L
12.70
15.49
R
2.16
2.41
S1
0.92
1.52
W
0.41
0.56
V
Figure 8.
5°
TO-92 drawing
0102782 D
Doc ID 17206 Rev 2
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Package mechanical data
STN3N45K3, STQ3N45K3-AP, STU3N45K3
TO-251 (IPAK) mechanical data
mm.
DIM.
min.
typ
max.
A
2.20
2.40
A1
0.90
1.10
b
0.64
0.90
b2
0.95
b4
5.20
5.40
c
0.45
0.60
c2
0.48
0.60
D
6.00
6.20
E
6.40
6.60
e
e1
2.28
4.40
4.60
H
16.10
L
9.00
9.40
(L1)
0.80
1.20
L2
0.80
V1
10 o
0068771_H
10/12
Doc ID 17206 Rev 2
STN3N45K3, STQ3N45K3-AP, STU3N45K3
5
Revision history
Revision history
Table 11.
Document revision history
Date
Revision
Changes
02-Mar-2010
1
First release
23-Apr-2010
2
Changed root part number
Doc ID 17206 Rev 2
11/12
STN3N45K3, STQ3N45K3-AP, STU3N45K3
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