TI SN74ALS992NT

SN74ALS992
9-BIT D-TYPE TRANSPARENT READ-BACK LATCH
WITH 3-STATE OUTPUTS
SDAS028B – APRIL 1984 – REVISED JANUARY 1995
•
•
•
•
•
DW OR NT PACKAGE
(TOP VIEW)
3-State I/O-Type Read-Back Inputs
Bus-Structured Pinout
True Logic Outputs
Designed With Nine Bits for Parity
Applications
Package Options Include Plastic
Small-Outline (DW) Packages and Standard
Plastic (NT) 300-mil DIPs
OERB
1D
2D
3D
4D
5D
6D
7D
8D
9D
CLR
GND
description
This 9-bit latch is designed specifically for storing
the contents of the input data bus and providing
the capability of reading back the stored data onto
the input data bus. In addition, this device provides
a 3-state buffer-type output and is easily
implemented in parity applications.
1
24
2
23
3
22
4
21
5
20
6
19
7
18
8
17
9
16
10
15
11
14
12
13
VCC
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
9Q
OEQ
LE
The nine latches are transparent D-type latches. While the latch-enable (LE) input is high, the Q outputs follow
the data (D) inputs. The Q outputs are in the 3-state condition when the output-enable (OEQ) input is high.
Read back is provided through the output-enable (OERB) input. When OERB is taken low, the data present at
the output of the data latches is allowed to pass back onto the input data bus. When OERB is taken high, the
output of the data latches is isolated from the D inputs. OERB does not affect the internal operation of the latches;
however, precautions should be taken not to create a bus conflict.
The SN74ALS992 is characterized for operation from 0°C to 70°C.
logic symbol†
OEQ
14
1
OERB
11
CLR
LE
1D
13
2
EN3
EN2
R
C1
1D
2
2D
3D
4D
5D
6D
7D
8D
9D
23
3
3
22
4
21
5
20
6
19
7
18
8
17
9
16
10
15
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
9Q
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Copyright  1995, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1
SN74ALS992
9-BIT D-TYPE TRANSPARENT READ-BACK LATCH
WITH 3-STATE OUTPUTS
SDAS028B – APRIL 1984 – REVISED JANUARY 1995
logic diagram (positive logic)
OEQ
OERB
CLR
LE
1D
14
1
11
13
2
23
1D
1Q
C1
R
To Eight Other Channels
timing diagram
Data Bus
Input Data
tsu
Read Back
Input Data
th
LE
tsu†
tdis
OERB
tpd
tpd
Q
CLR = H, OEQ = L
† This setup time ensures that the read-back circuit will not create a conflict on the input data bus.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)‡
Supply voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Input voltage, VI (OERB, OEQ, CLR, and LE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Voltage applied to D inputs and to disabled 3-state outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5.5 V
Operating free-air temperature range, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C
‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SN74ALS992
9-BIT D-TYPE TRANSPARENT READ-BACK LATCH
WITH 3-STATE OUTPUTS
SDAS028B – APRIL 1984 – REVISED JANUARY 1995
recommended operating conditions
MIN
NOM
MAX
4.5
5
5.5
VCC
VIH
Supply voltage
VIL
Low-level input voltage
IOH
High level output current
High-level
IOL
Low level output current
Low-level
tw
Pulse duration
tsu
Setup time
th
TA
Hold time, data after LE↓
5
Operating free-air temperature
0
High-level input voltage
2
Q
– 2.6
D
– 0.4
Q
24
D
8
10
CLR low
10
Data before LE↓
10
Data before OERB↓
10
V
V
0.8
LE high
UNIT
V
mA
mA
ns
ns
ns
70
°C
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
VIK
VOH
TEST CONDITIONS
All outputs
VCC = 4.5 V,
VCC = 4.5 V to 5.5 V,
II = – 18 mA
IOH = – 0.4 mA
Q
VCC = 4.5 V,
D
VCC = 4
4.5
5V
IOH = – 2.6 mA
IOL = 4 mA
VOL
IOZH
IOZL
II
Q
5V
VCC = 4
4.5
Q
VCC = 5.5 V,
VCC = 5.5 V,
Q
D inputs
All others
D inputs‡
VCC = 5
5.5
5V
V
V
3.2
0.4
0.5
0.25
0.4
IOL = 24 mA
VO = 2.7 V
0.35
0.5
VO = 0.4 V
VI = 5.5 V
IO§
VCC = 5.5 V,
VO = 2.25 V
Outputs high
ICC
55V
VCC = 5.5
V,
OERB high
20
µA
µA
0.1
20
20
– 0.1
– 0.1
– 30
V
– 20
0.1
VI = 7 V
VI = 0
0.4
4V
All others
UNIT
– 1.2
0.35
VCC = 5
5.5
5V
V,
IIL
MAX
0.25
VI = 2
2.7
7V
All others
D inputs‡
VCC – 2
2.4
TYP†
IOL = 8 mA
IOL = 12 mA
VCC = 5
5.5
5V
V,
IIH
MIN
–112
30
50
Outputs low
50
80
Outputs disabled
35
55
mA
µA
mA
mA
mA
† All typical values are at VCC = 5 V, TA = 25°C.
‡ For I/O ports (QA thru QH), the parameters IIH and IIL include the off-state output current.
§ The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
3
SN74ALS992
9-BIT D-TYPE TRANSPARENT READ-BACK LATCH
WITH 3-STATE OUTPUTS
SDAS028B – APRIL 1984 – REVISED JANUARY 1995
switching characteristics (see Figure 1)
PARAMETER
FROM
((INPUT))
TO
(OUTPUT)
(
)
VCC = 4.5 V to 5.5 V,
CL = 50 pF,
TA = MIN to MAX†
MIN
MAX
3
14
4
16
6
20
8
25
Q
6
20
D
8
26
4
21
2
14
4
18
1
14
tPLH
tPHL
D
Q
tPLH
tPHL
LE
Q
tPHL
CLR
ten‡
tdis§
OERB
D
ten‡
tdis§
OEQ
Q
† For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
‡ ten = tPZH or tPZL
§ tdis = tPHZ or tPLZ
4
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
UNIT
ns
ns
ns
ns
ns
SN74ALS992
9-BIT D-TYPE TRANSPARENT READ-BACK LATCH
WITH 3-STATE OUTPUTS
SDAS028B – APRIL 1984 – REVISED JANUARY 1995
PARAMETER MEASUREMENT INFORMATION
7V
7V
S1
S1
500 Ω
1 kΩ
Test
Point
From Output
Under Test
CL
(see Note A)
CL
(see Note A)
500 Ω
LOAD CIRCUIT FOR Q OUTPUTS
1 kΩ
LOAD CIRCUIT FOR D OUTPUTS
3.5 V
Timing
Input
Test
Point
From Output
Under Test
1.3 V
3.5 V
High-Level
Pulse
1.3 V
1.3 V
0.3 V
0.3 V
tw
th
tsu
3.5 V
Data
Input
1.3 V
1.3 V
0.3 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.3 V
0.3 V
3.5 V
Output
Control
(low-level
enabling)
1.3 V
tPHL
tPLH
VOH
1.3 V
1.3 V
tPHL
Out-of-Phase
Output
(see Note B)
Waveform 1
S1 Closed
(see Note C)
VOL
tPLH
VOH
1.3 V
1.3 V
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
1.3 V
0.3 V
tPZL
1.3 V
tPLZ
0.3 V
In-Phase
Output
1.3 V
VOLTAGE WAVEFORMS
PULSE DURATIONS
3.5 V
1.3 V
Input
3.5 V
Low-Level
Pulse
[3.5 V
1.3 V
tPHZ
tPZH
Waveform 2
S1 Open
(see Note C)
VOL
0.3 V
VOH
1.3 V
0.3 V
[0 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
NOTES: A. CL includes probe and jig capacitance.
B. When measuring propagation delay times of 3-state outputs, switch S1 is open.
C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%.
Figure 1. Load Circuits and Voltage Waveforms
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
5
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright  1998, Texas Instruments Incorporated