ALSC AS7C31024B

March 2004
AS7C31024B
®
3.3V 128K X 8 CMOS SRAM
Features
• Easy memory expansion with CE1, CE2, OE inputs
• TTL/LVTTL-compatible, three-state I/O
• 32-pin JEDEC standard packages
• Industrial and commercial temperatures
• Organization: 131,072 words x 8 bits
• High speed
- 10/12/15/20 ns address access time
- 5, 6, 7, 8 ns output enable access time
• Low power consumption: ACTIVE
-
- 252 mW / max @ 10 ns
300 mil SOJ
400 mil SOJ
8 × 20mm TSOP 1
8 x 13.4mm sTSOP 1
• ESD protection ≥ 2000 volts
• Latch-up current ≥ 200 mA
• Low power consumption: STANDBY
- 18 mW / max CMOS
• 6T 0.18u CMOS technology
Pin arrangement
NC
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O0
I/O1
I/O2
GND
VCC
GND
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
VCC
A15
CE2
WE
A13
A8
A9
A11
OE
A10
CE1
I/O7
I/O6
I/O5
I/O4
I/O3
32-pin (8 x 20mm) TSOP I
32-pin (8 x 13.4mm) sTSOP1
I/O0
A11
A9
A8
A13
WE
CE2
A15
VCC
NC
A16
A14
A12
A7
A6
A5
A4
WE
OE
CE1
CE2
Control
circuit
A9
A10
A11
A12
A13
A14
A15
A16
Column decoder
I/O7
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
AS7C31024B
512 x 256 x 8
Array
(1,048,576)
Sense amp
A0
A1
A2
A3
A4
A5
A6
A7
A8
Row decoder
Input buffer
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
AS7C31024B
32-pin SOJ (300 mil)
32-pin SOJ (400 mil)
Logic block diagram
OE
A10
CE1
I/O7
I/O6
I/O5
I/O4
I/O3
GND
I/O2
I/O1
I/O0
A0
A1
A2
A3
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
Selection guide
Maximum address access time
-10
-12
-15
-20
Unit
10
12
15
20
ns
Maximum output enable access time
5
6
7
8
ns
Maximum operating current
70
65
60
55
mA
Maximum CMOS standby current
5
5
5
5
mA
3/24/04, v.1.2
Alliance Semiconductor
P. 1 of 9
Copyright © 2003 Alliance Semiconductor. All rights reserved.
AS7C31024B
®
Functional description
The AS7C31024B is a high performance CMOS 1,048,576-bit Static Random Access Memory (SRAM) device organized as 131,072 words
x 8 bits. It is designed for memory applications where fast data access, low power, and simple interfacing are desired.
Equal address access and cycle times (tAA, tRC, tWC) of 10/12/15/20 ns with output enable access times (tOE) of 5, 6, 7, 8 ns are ideal for
high performance applications. Active high and low chip enables (CE1, CE2) permit easy memory expansion with multiple-bank systems.
When CE1 is high or CE2 is low, the device enters standby mode. If inputs are still toggling, the device will consume ISB power. If the bus is
static, then full standby power is reached (ISB1). For example, the AS7C31024B is guaranteed not to exceed 18 mW under nominal full
standby conditions.
A write cycle is accomplished by asserting write enable (WE) and both chip enables (CE1, CE2). Data on the input pins I/O0 through I/O7 is
written on the rising edge of WE (write cycle 1) or the active-to-inactive edge of CE1 or CE2 (write cycle 2). To avoid bus contention,
external devices should drive I/O pins only after outputs have been disabled with output enable (OE) or write enable (WE).
A read cycle is accomplished by asserting output enable (OE) and both chip enables (CE1, CE2), with write enable (WE) high. The chip
drives I/O pins with the data word referenced by the input address. When either chip enable or output enable is inactive, or write enable is
active, output drivers stay in high-impedance mode.
Absolute maximum ratings
Symbol
Min
Max
Unit
Voltage on VCC relative to GND
Parameter
Vt1
-0.50
+5.0
V
Voltage on any pin relative to GND
Vt2
–0.50
VCC +0.50
V
Power dissipation
PD
–
1.0
W
Storage temperature (plastic)
Tstg
–65
+150
°C
Ambient temperature with VCC applied
Tbias
–55
+125
°C
DC current into outputs (low)
IOUT
–
20
mA
Note: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure
to absolute maximum rating conditions for extended periods may affect reliability.
Truth table
CE1
CE2
WE
OE
Data
Mode
H
X
X
X
High Z
Standby (ISB, ISB1)
X
L
X
X
High Z
Standby (ISB, ISB1)
L
H
H
H
High Z
Output disable (ICC)
L
H
H
L
DOUT
Read (ICC)
L
H
L
X
DIN
Write (ICC)
Key: X = don’t care, L = low, H = high
3/24/04, v.1.2
Alliance Semiconductor
P. 2 of 9
AS7C31024B
®
Recommended operating conditions
Parameter
Symbol
Min
Nominal
Max
Unit
Supply voltage
VCC
3.0
3.3
3.6
V
Input voltage
VIH
2.0
–
VCC + 0.5
V
VIL
–0.5
–
0.8
V
TA
0
–
70
°C
Ambient operating temperature
commercial
VIL = -1.0V for pulse width less than 5ns
VIH = VCC + 1.5V for pulse width less than 5ns
DC operating characteristics (over the operating range)1
-10
Parameter
-12
-15
-20
Unit
Sym
Test conditions
Min
Max
Min
Max
Min
Max
Min
Max
Input leakage
current
|ILI|
VCC = Max, VIN = GND to VCC
–
1
–
1
–
1
–
1
µA
Output leakage
current
|ILO|
VCC = Max, CE1 = VIH or
CE2 = VIL, VOUT = GND to VCC
–
1
–
1
–
1
–
1
µA
Operating power
supply current
ICC
VCC = Max, CE1 ≤ VIL,
CE2 ≥ VIH, f = fMax,
IOUT = 0 mA
–
70
–
65
–
60
–
55
mA
ISB
VCC = Max, CE1 ≥ VIH and/or
CE2 ≤ VIL, f = fMax
–
30
–
25
–
20
–
20
ISB1
VCC = Max, CE1 ≥ VCC–0.2V and/
or CE2 ≤ 0.2V
VIN ≤ 0.2V or
VIN ≥ VCC –0.2V, f = 0
–
5
–
5
–
5
–
5
VOL
IOL = 8 mA, VCC = Min
–
0.4
–
0.4
–
0.4
–
0.4
V
VOH
IOH = –4 mA, VCC = Min
2.4
–
2.4
–
2.4
–
2.4
–
V
Standby power
supply current
Output voltage
mA
Capacitance (f = 1 MHz, Ta = 25 °C, VCC = NOMINAL)2
Parameter
Symbol
Signals
Test conditions
Max
Unit
Input capacitance
CIN
A, CE1, CE2, WE, OE
VIN = 0V
5
pF
I/O capacitance
CI/O
I/O
VIN = VOUT = 0V
7
pF
3/24/04, v.1.2
Alliance Semiconductor
P. 3 of 9
AS7C31024B
®
Read cycle (over the operating range)3,9,12
-10
Parameter
Symbol Min
Read cycle time
Address access time
-12
-15
-20
Max
Min
Max
Min
Max
Min
tRC
10
–
12
–
15
–
20
Max Unit
Notes
ns
tAA
–
10
–
12
–
15
–
20
ns
3
Chip enable (CE1) access time
tACE1
–
10
–
12
–
15
–
20
ns
3, 12
Chip enable (CE2) access time
tACE2
–
10
–
12
–
15
–
20
ns
3, 12
Output enable (OE) access time
tOE
–
5
–
6
–
7
–
8
ns
tOH
3
–
3
–
3
–
3
–
ns
5
CE1 low to output in low Z
Output hold from address change
tCLZ1
3
–
3
–
3
–
3
–
ns
4, 5, 12
CE2 high to output in low Z
tCLZ2
3
–
3
–
3
–
3
–
ns
4, 5, 12
CE1 high to output in high Z
tCHZ1
–
3
–
3
–
4
–
5
ns
4, 5, 12
CE2 low to output in high Z
tCHZ2
–
3
–
3
–
4
–
5
ns
4, 5, 12
OE low to output in low Z
tOLZ
0
–
0
–
0
–
0
–
ns
4, 5
OE high to output in high Z
tOHZ
–
5
–
6
–
7
–
8
ns
4, 5
Power up time
tPU
0
–
0
–
0
–
0
–
ns
4, 5, 12
Power down time
tPD
–
10
–
12
–
15
–
20
ns
4, 5, 12
Key to switching waveforms
Rising input
Falling input
Undefined / don’t care
Read waveform 1 (address controlled)3,6,7,9,12
tRC
Address
tAA
tOH
DOUT
Data valid
Read waveform 2 (CE1, CE2, and OE controlled)3,6,8,9,12
tRC1
CE1
CE2
tOE
OE
DOUT
Supply
current
3/24/04, v.1.2
tOHZ
tCHZ1, tCHZ2
tOLZ
tACE1, tACE2
tCLZ1, tCLZ2
tPU
Data valid
tPD
50%
Alliance Semiconductor
50%
ICC
ISB
P. 4 of 9
AS7C31024B
®
Write cycle (over the operating range)11, 12
-10
Parameter
-12
-15
-20
Symbol
Min
Max
Min
Max
Min
Max
Min
Max Unit Notes
Write cycle time
tWC
10
–
12
–
15
–
20
–
ns
Chip enable (CE1) to write end
tCW1
8
–
9
–
10
–
12
–
ns
12
Chip enable (CE2) to write end
tCW2
8
–
9
–
10
–
12
–
ns
12
Address setup to write end
tAW
8
–
9
–
10
–
12
–
ns
Address setup time
tAS
0
–
0
–
0
–
0
–
ns
Write pulse width
tWP
7
–
8
–
9
–
12
–
ns
Write recovery time
tWR
0
–
0
–
0
–
0
–
ns
Address hold from end of write
tAH
0
–
0
–
0
–
0
–
ns
Data valid to write end
tDW
5
–
6
–
8
–
10
–
ns
Data hold time
tDH
0
–
0
–
0
–
0
–
ns
4, 5
Write enable to output in high Z
tWZ
–
5
–
6
–
7
–
8
ns
4, 5
Output active from write end
tOW
1
–
1
–
1
–
1
–
ns
4, 5
12
Write waveform 1 (WE controlled)10,11,12
tWC
tWR
tAH
tAW
Address
tWP
WE
tAS
tDW
DIN
tDH
Data valid
tWZ
tOW
DOUT
3/24/04, v.1.2
Alliance Semiconductor
P. 5 of 9
AS7C31024B
®
Write waveform 2 (CE1 and CE2 controlled)10,11,12
tAW
tWC
tAH
tWR
Address
tAS
tCW1, tCW2
CE1
CE2
tWP
WE
tWZ
DIN
tDW
tDH
Data valid
DOUT
AC test conditions
–
–
–
–
Output load: see Figure B.
Input pulse level: GND to 3.0V. See Figure A.
Input rise and fall times: 2 ns. See Figure A.
Input and output timing reference levels: 1.5V.
Thevenin equivalent:
168Ω
DOUT
+1.728V
+3.0V
DOUT
255Ω
+3.3V
320Ω
GND
90%
10%
90%
2 ns
10%
C13
GND
Figure B: 3.3V Output load
Figure A: Input pulse
Notes
1
2
3
4
5
6
7
8
9
10
11
12
13
14
During VCC power-up, a pull-up resistor to VCC on CE1 is required to meet ISB specification.
This parameter is sampled and not 100% tested.
For test conditions, see AC Test Conditions, Figures A, and B.
tCLZ and tCHZ are specified with CL = 5pF, as in Figure C. Transition is measured ±500 mV from steady-state voltage.
This parameter is guaranteed, but not 100% tested.
WE is high for read cycle.
CE1 and OE are low and CE2 is high for read cycle.
Address valid prior to or coincident with CE1 transition Low.
All read cycle timings are referenced from the last valid address to the first transitioning address.
N/A
All write cycle timings are referenced from the last valid address to the first transitioning address.
CE1 and CE2 have identical timing.
C = 30 pF, except all high Z and low Z parameters where C = 5 pF.
N/A
3/24/04, v.1.2
Alliance Semiconductor
P. 6 of 9
AS7C31024B
®
Package dimensions
D
32-pin SOJ 300
mil
e
E1E2
B
Pin 1
c
A
A1
A2
b
Seating
Plane
E
Min
Max
Min
Max
A
0.128
0.145
0.132
0.146
A1
0.025
-
0.025
-
A2
0.095
0.105
0.105
0.115
B
0.026
0.032
0.026
0.032
b
0.016
0.020
0.015
0.020
c
0.007
0.010
0.007
0.013
D
0.820
0.830
0.820
0.830
E
0.255
0.275
0.354
0.378
E1
0.295
0.305
0.395
0.405
E2
0.330
0.340
0.435
0.445
e
b
0.050 BSC
0.050 BSC
32-pin TSOP 8×20 mm
e
Min
α
c
D Hd
A2
L
pin 1
E
3/24/04, v.1.2
32-pin SOJ 400
mil
pin 16
A A1
pin 32
pin 17
Alliance Semiconductor
Max
A
–
1.20
A1
0.05
0.15
A2
0.95
1.05
b
0.17
0.27
c
0.10
0.21
D
18.30
18.50
e
0.50 nominal
E
7.90
8.10
Hd
19.80
20.20
L
0.50
0.70
α
0°
5°
P. 7 of 9
AS7C31024B
®
Ordering codes
Package \ Access time
Temp
10 ns
Plastic SOJ, 300 mil
Commercial AS7C31024B-10TJC
Plastic SOJ, 400 mil
Commercial
TSOP1 8×20 mm
sTSOP1 8 x 13.4mm
12 ns
15 ns
20 ns
AS7C31024B-12TJC
AS7C31024B-15TJC
AS7C31024B-20TJC
AS7C31024B-10JC
AS7C31024B-12JC
AS7C31024B-15JC
AS7C31024B-20JC
Commercial AS7C31024B-10TC
AS7C31024B-12TC
AS7C31024B-15TC
AS7C31024B-20TC
Commercial AS7C31024B-10STC AS7C31024B-12STC AS7C31024B-15STC AS7C31024B-20STC
Note:
Add suffix ‘N’ to the above part number for lead free parts (Ex. AS7C31024B-10TJCN)
Part numbering system
AS7C
X
1024B
–XX
SRAM
Device Access
3 = 3.3 V CMOS
prefix
number time
3/24/04, v.1.2
X
X
X
Package:
T = TSOP1 8×20 mm
ST = sTSOP1 8 x 13.4 mm
J = SOJ 400 mil
TJ = SOJ 300 mil
Temperature range
C = Commercial, 0° C to
70° C
N=Lead Free Part
Alliance Semiconductor
P. 8 of 9
AS7C31024B
®
®
Alliance Semiconductor Corporation
Copyright © Alliance Semiconductor
2575, Augustine Drive,
All Rights Reserved
Santa Clara, CA 95054
Part Number: AS7C31024B
Tel: 408 - 855 - 4900
Document Version: v.1.2
Fax: 408 - 855 - 4999
www.alsc.com
© Copyright 2003 Alliance Semiconductor Corporation. All rights reserved. Our three-point logo, our name and Intelliwatt are trademarks or registered
trademarks of Alliance. All other brand and product names may be the trademarks of their respective companies. Alliance reserves the right to make
changes to this document and its products at any time without notice. Alliance assumes no responsibility for any errors that may appear in this document.
The data contained herein represents Alliance's best data and/or estimates at the time of issuance. Alliance reserves the right to change or correct this
data at any time, without notice. If the product described herein is under development, significant changes to these specifications are possible. The
information in this product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate
as, or provide, any guarantee or warrantee to any user or customer. Alliance does not assume any responsibility or liability arising out of the application
or use of any product described herein, and disclaims any express or implied warranties related to the sale and/or use of Alliance products including
liability or warranties related to fitness for a particular purpose, merchantability, or infringement of any intellectual property rights, except as express
agreed to in Alliance's Terms and Conditions of Sale (which are available from Alliance). All sales of Alliance products are made exclusively according
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components in life-supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the
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