bq29440, bq2944L0 bq29449, bq2944L9 www.ti.com SLUSA15B – MARCH 2010 – REVISED JUNE 2010 Voltage Protection for 2-Series, 3-Series, or 4-Series Cell Li-Ion Batteries (Second-Level Protection) Check for Samples: bq29440, bq2944L0, bq29449, bq2944L9 FEATURES APPLICATIONS • • 1 • • • • • 2-Series, 3-Series, or 4-Series Cell Secondary Protection External Capacitor-Controlled Delay Timer Low Power Consumption ICC < 2 µA Typical [VCELL(ALL) < VPROTECT] High-Accuracy Overvoltage Protection: ±25 mV With TA = 0°C to 60°C Fixed Overvoltage Protection Thresholds: 4.30 V, 4.35 V Small 8L QFN Package Second-Level Protection in Li-Ion Battery Packs – Notebook Computers – Power Tools – Portable Equipment and Instrumentation DESCRIPTION The bq2944x is a secondary overvoltage protection IC for 2-series, 3-series, or 4-series cell lithium-ion battery packs that incorporates a high-accuracy precision overvoltage detection circuit. FUNCTION The voltage of each cell in a battery pack is compared to an internal reference voltage. If any cells reach an overvoltage condition, the bq2944x device starts a timer that provides a delay proportional to the capacitance on the CD pin. Upon expiration of the internal timer, the OUT pin changes from a low state to a high state. An optional latch configuration is available that holds the OUT pin in a high state indefinitely after an overvoltage condition has satisfied the specified delay timer period. The latch is released when the CD pin is shorted to GND. T T DRB Package (Top View) VC1 1 8 OUT VC2 2 7 VDD VC3 3 6 CD GND 4 5 VC4 P0012-02 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2010, Texas Instruments Incorporated bq29440, bq2944L0 bq29449, bq2944L9 SLUSA15B – MARCH 2010 – REVISED JUNE 2010 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. ORDERING INFORMATION (1) TA PART NUMBER -40°C to +85°C (1) (2) (3) (4) OUT PIN LATCH OPTION PACKAGE QFN-8 PACKAGE DESIGNATOR DRB PACKAGE MARKING OVP ORDERING INFORMATION (2) TAPE AND REEL (LARGE) (3) TAPE AND REEL (SMALL) (4) BQ29440 No 440 4.35 V BQ29440DRBR BQ29440DRBT BQ2944L0 Yes 44L0 4.35 V BQ2944L0DRBR BQ2944L0DRBT BQ29449 No 449 4.30 V BQ29449DRBR BQ29449DRBT BQ2944L9 Yes 44L9 4.30 V BQ2944L9DRBR BQ2944L9DRBT Example: bq2944L0DRBR is a device with the OUT latch option with a VOV threshold of 4.35 V. Contact Texas Instruments for other VOV threshold options. For the most current package and ordering information, see the Package Addendum at the end of this document, or the TI website at www.ti.com. Large tape and reel quantity is 3,000 units. Small tape and reel quantity is 250 units. THERMAL INFORMATION bq2944x THERMAL METRIC (1) DRB UNITS 8 PINS Junction-to-ambient thermal resistance (2) qJA 50.5 (3) qJC(top) Junction-to-case(top) thermal resistance qJB Junction-to-board thermal resistance yJT Junction-to-top characterization parameter yJB Junction-to-board characterization parameter qJC(bottom) (1) (2) (3) (4) (5) (6) (7) 25.1 (4) 19.3 (5) Junction-to-case(bottom) thermal resistance 0.7 (6) °C/W 18.9 (7) 5.2 For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as specified in JESD51-7, in an environment described in JESD51-2a. The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-standard test exists, but a close description can be found in the ANSI SEMI standard G30-88. The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temperature, as described in JESD51-8. The junction-to-top characterization parameter, yJT, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining qJA, using a procedure described in JESD51-2a (sections 6 and 7). The junction-to-board characterization parameter, yJB, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining qJA , using a procedure described in JESD51-2a (sections 6 and 7). The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88. PIN FUNCTIONS 2 PIN NAME PIN NO. CD 6 Connection to external capacitor for programmable delay time DESCRIPTION GND 4 Ground pin OUT 8 Output VC1 1 Sense voltage input for top cell VC2 2 Sense voltage input for second-to-top cell VC3 3 Sense voltage input for third-to-top cell VC4 5 Sense voltage input for fourth-to-top cell (bottom cell) VDD 7 Power supply Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): bq29440 bq2944L0 bq29449 bq2944L9 bq29440, bq2944L0 bq29449, bq2944L9 www.ti.com SLUSA15B – MARCH 2010 – REVISED JUNE 2010 FUNCTIONAL BLOCK DIAGRAM RVD CVD VDD RIN VC1 140 nA CIN RIN VC2 CIN RIN VC3 OUT CIN RIN 1.2 V (typ) VC4 CIN GND CD CCD B0394-01 ABSOLUTE MAXIMUM RATINGS (1) over operating free-air temperature range (unless otherwise noted) VALUE / UNITS Supply voltage range, VMAX Input voltage range, VIN Output voltage range, VOUT VDD–GND –0.3 to 28 V VC1–GND, VC2–GND, VC3–GND –0.3 to 28 V VC1–VC2, VC2–VC3, VC3–VC4, VC4–GND –0.3 to 8 V CD–GND –0.3 to 8 V OUT–GND –0.3 to 28 V Storage temperature range, Tstg (1) –65°C to 150°C Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. RECOMMENDED OPERATING CONDITIONS MIN Supply voltage, VDD NOM MAX UNIT 4 25 V 0 5 V Input voltage range VC1–VC2, VC2–VC3, VC3–VC4, VC4–GND td(CD) delay-time capacitance CCD (See Figure 7.) 0.1 µF Voltage monitor filter resistance RIN (See Figure 7.) 0.1 1 kΩ Voltage monitor filter capacitance CIN (See Figure 7.) 0.01 0.1 µF Supply voltage filter resistance RVD (See Figure 7.) 0.1 Supply voltage filter capacitance CVD (See Figure 7.) Operating ambient temperature range, TA Copyright © 2010, Texas Instruments Incorporated 1 0.1 –40 µF 110 Submit Documentation Feedback Product Folder Link(s): bq29440 bq2944L0 bq29449 bq2944L9 kΩ °C 3 bq29440, bq2944L0 bq29449, bq2944L9 SLUSA15B – MARCH 2010 – REVISED JUNE 2010 www.ti.com ELECTRICAL CHARACTERISTICS Typical values stated where TA = 25°C and VDD = 17 V, MIN/MAX values stated where TA = –40°C to 110°C and VDD = 4 V to 25 V (unless otherwise noted). PARAMETER TEST CONDITION MIN VPROTECT Overvoltage detection voltage VHYS Overvoltage detection hysteresis For non-latch devices only 200 VOA Overvoltage detection accuracy TA = 25°C VOA_DRIFT (1) Overvoltage threshold temperature drift XDELAY Overvoltage delay time scale factor NOM MAX bq29449 4.30 bq29440 4.35 300 UNIT V 400 mV –10 10 mV TA = 0°C to 60°C –0.4 0.4 TA = –40°C to 110°C –0.6 0.6 TA = 0°C to 60°C Note: Does not include external capacitor variation 6.5 8.5 13 TA = –40°C to 110°C Note: Does not include external capacitor variation 6.0 8.5 16 mV/°C s/µF XDELAY_CTM Overvoltage delay time scale factor in Customer Test Mode See CUSTOMER TEST MODE. 0.08 s/µF ICD(CHG) Overvoltage detection charging current (See Figure 1.) 140 nA ICD(DSG) Overvoltage detection discharging current (See Figure 2.) 60 µA VCD Overvoltage detection external capacitor comparator threshold 1.2 V ICC Supply current VOUT (VC1–VC2) = (VC2–VC3) = (VC3–VC4) = (VC4–GND) = 3.5 V (See Figure 3.) OUT pin drive voltage 2 3.5 µA (VC1–VC2), (VC2–VC3), (VC3–VC4) and (VC4–GND) = VPROTECTMAX, VDD = 20V, IOH = 0 to -10 µA 6.5 8.0 9.5 V (VC1–VC2), (VC2–VC3), (VC3–VC4) and (VC4–GND) = VPROTECTMAX, VDD = 4V, IOL = -10 µA, TA = 0°C to 60°C 2.0 3.0 3.5 V 0.1 V (VC1–VC2), (VC2–VC3), (VC3–VC4) and (VC4–GND) = 4 V, IOL = 0 µA IOUT(SHORT) OUT short circuit current OUT = 0 V, (VC1–VC2), (VC2–VC3), (VC3–VC4) or (VC4–GND) > VPROTECT, VDD = 18 V tr(OUT) (1) OUT output rise time CL = 1 nF, VDD = 4 V to 25 V, VOH(OUT) = 0 V to 5 V ZO(OUT) (1) OUT output impedance IIN (1) 4 Input current at VCx pins 4 mA 5 µs 2 kΩ Measured at VC1, (VC1–VC2), (VC2–VC3), (VC3–VC4) and (VC4–GND) = 3.5 V, TA = 0°C to 60°C (See Figure 3.) –0.3 1.5 µA Measured at VC2, VC3 or VC4, (VC1–VC2), (VC2–VC3), (VC3–VC4) and (VC4–GND) = 3.5 V, TA = 0°C to 60°C (See Figure 3.) –0.3 0.3 µA Specified by design. Not 100% tested in production. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): bq29440 bq2944L0 bq29449 bq2944L9 bq29440, bq2944L0 bq29449, bq2944L9 www.ti.com SLUSA15B – MARCH 2010 – REVISED JUNE 2010 TYPICAL CHARACTERISTICS ICD CHARGE CURRENT vs TEMPERATURE ICD DISCHARGE CURRENT vs TEMPERATURE -80 80 -90 75 70 -110 ICD Discharge Current (µA) ICD Charge Current (nA) -100 -120 -130 -140 -150 -160 60 55 50 -170 -180 -40 65 45 -20 0 20 40 60 Temperature (°C) 80 100 40 -40 G001 -20 0 20 40 60 Temperature (°C) 80 100 G002 Figure 1. ICD Charge Current Figure 2. ICD Discharge Current ICC IIN 1 VC1 OUT 8 IIN 2 VC2 VDD 7 IIN 3 VC3 CD 6 4 GND VC4 5 IIN Figure 3. ICC, IIN Measurement APPLICATIONS INFORMATION PROTECTION (OUT) TIMING AND DELAY TIME CAPACITOR SIZING The bq2944x uses an external capacitor to set delay timing during an overvoltage condition. When any of the cells exceed the overvoltage threshold, the bq2944x activates an internal current source of nominally 140 nA, which charges the external capacitor. When the external capacitor charges up to a voltage of nominally 1.2 V, the OUT pin transitions from a low state to a high state, by means of an internal pull-up network, to a regulated voltage of no more than 9.5 V when IOH = 0 mA. Copyright © 2010, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Link(s): bq29440 bq2944L0 bq29449 bq2944L9 5 bq29440, bq2944L0 bq29449, bq2944L9 SLUSA15B – MARCH 2010 – REVISED JUNE 2010 Cell Voltage VC1–VC2 VC2–VC3 VC3–VC4 VC4–GND www.ti.com VPROTECT VPROTECT – VHYS td L OUT H T0461-01 Figure 4. Timing for Overvoltage Sensing Sizing the external capacitor is based on the desired delay time as follows: td c CD= x DELAY Where td is the desired delay time and xDELAY is the overvoltage delay time scale factor, expressed in seconds per microFarad. xDELAY is nominally 8.5 s/µF. For example, if a nominal delay of 3 seconds is desired, the customer should use a CCD capacitor that is 3 s / 8.5 s/µF = 0.35 µF. The delay time is calculated as follows: td = [1.2 V ´ C ] CD ICD If the cell overvoltage condition is removed before the external capacitor reaches the reference voltage, the internal current source is disabled and an internal discharge block is employed to discharge the external capacitor down to 0 V. In this instance, the OUT pin remains in a low state. For latched versions of the bq2944x, if an overvoltage condition has caused the OUT pin to transition to a high state, the external capacitor remains charged even after the overvoltage condition has been removed. In this instance, the OUT pin remains in a high state. For non-latched versions, the OUT pin is allowed to transition back from a high to low state when the overvoltage condition is no longer present, and the external capacitor is discharged down to 0 V. 6 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): bq29440 bq2944L0 bq29449 bq2944L9 bq29440, bq2944L0 bq29449, bq2944L9 www.ti.com SLUSA15B – MARCH 2010 – REVISED JUNE 2010 BATTERY CONNECTION FOR 2-SERIES, 3-SERIES, AND 4-SERIES CELL CONFIGURATIONS Figure 5, Figure 6, and Figure 7 show the 2-series, 3-series, and 4-series cell configurations. RVD 1 VC1 OUT 8 2 VC2 VDD 7 3 VC3 CD 6 4 GND VC4 5 CVD RIN CIN RIN CIN CCD Figure 5. 2-Series Cell Configuration RVD RIN 1 VC1 OUT 8 2 VC2 VDD 7 3 VC3 CD 6 4 GND VC4 5 CIN RIN CIN RIN CIN CVD CCD Figure 6. 3-Series Cell Configuration RVD RIN CIN RIN CIN RIN CIN RIN CIN 1 VC1 OUT 8 2 VC2 VDD 7 3 VC3 CD 6 4 GND VC4 5 CVD CCD Figure 7. 4-Series Cell Configuration Copyright © 2010, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Link(s): bq29440 bq2944L0 bq29449 bq2944L9 7 bq29440, bq2944L0 bq29449, bq2944L9 SLUSA15B – MARCH 2010 – REVISED JUNE 2010 www.ti.com CELL CONNECTION SEQUENCE The recommended cell connection sequence begins from the bottom of the stack, as follows: 1. GND 2. VC4 3. VC3 4. VC2 5. VC1 While not advised, connecting the cells in a sequence other than that described above does not result in errant activity on the OUT pin. For example: 1. GND 2. VC4, VC3, VC2, or VC1 3. Remaining VCx pin 4. Remaining VCx pin 5. Remaining VCx pin It is also recommended that the overvoltage delay timing capacitor, CCD, be propagated before connecting the cells. CUSTOMER TEST MODE Customer Test Mode (CTM) helps to greatly reduce the overvoltage detection delay time and enable quicker customer production testing. This mode is intended for quick-pass board-level verification tests, and, as such, individual cell overvoltage levels may deviate slightly from the specifications (VPROTECT, VOA). If accurate overvoltage thresholds are to be tested, use the standard delay settings that are intended for normal use. To enter CTM, VDD should be set to approximately 9.5 V higher than VC1. When CTM is entered, the device switches from the normal overvoltage delay time scale factor, xDELAY, to a significantly reduced factor, xDELAY_CTM, thereby reducing the delay time during an overvoltage condition. The CTM overvoltage delay time is similar to the equation presented in PROTECTION (OUT) TIMING AND DELAY TIME CAPACITOR SIZING with the substitution of xDELAY_CTM in place of xDELAY: t d _ CTM = CCD ´ xDELAY _ CTM CAUTION Avoid exceeding any Absolute Maximum Voltages on any pins when placing the part into Customer Test Mode. Also, avoid exceeding Absolute Maximum Voltages for the individual cell voltages (VC1–VC2), (VC2–VC3), (VC3–VC4), and (VC4–GND). Stressing the pins beyond the rated limits may cause permanent damage to the device. To exit CTM, the device should be powered off before being powered back on. For latched versions of the bq2944x, the external CCD capacitor must be externally discharged if any overvoltage functionality is exercised during protection testing. This can be accomplished by shorting the CD pin to GND. If the CCD capacitor is not explicitly discharged, a residual charge may cause the overvoltage delay time to be inaccurate. Space 8 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): bq29440 bq2944L0 bq29449 bq2944L9 bq29440, bq2944L0 bq29449, bq2944L9 www.ti.com SLUSA15B – MARCH 2010 – REVISED JUNE 2010 REVISION HISTORY Changes from Original (March 2010) to Revision A • Page Changed VOUT first Test Condition - From: VDD = 25V To: VDD = 20V. MAX value From: 9.0 To 9.5 .................................. 4 Changes from Revision A (March 2010) to Revision B Page • Changed the low power consumption value from 3 µA to 2 µA Typical ............................................................................... 1 • Changed the Ordering Information ....................................................................................................................................... 2 • Changed the Functional Block Diagram ............................................................................................................................... 3 • Changed the Electrical Characteristics ................................................................................................................................. 4 • Changed the Protection (Out) Timing Section to Protection (Out) Timing and Delay Time Capacitor Sizing ...................... 5 • Added the 2-series and 3-series cell configurations ............................................................................................................. 7 • Added the Cell Connection Sequence Section ..................................................................................................................... 8 • Changed the Test Mode Section .......................................................................................................................................... 8 Copyright © 2010, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Link(s): bq29440 bq2944L0 bq29449 bq2944L9 9 PACKAGE OPTION ADDENDUM www.ti.com 14-Jun-2010 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Qty Eco Plan (2) Lead/ Ball Finish MSL Peak Temp (3) Samples (Requires Login) BQ29440DRBR ACTIVE SON DRB 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR Request Free Samples BQ29440DRBT ACTIVE SON DRB 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR Purchase Samples BQ29449DRBR ACTIVE SON DRB 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR Request Free Samples BQ29449DRBT ACTIVE SON DRB 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR Purchase Samples BQ2944L0DRBR ACTIVE SON DRB 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR Request Free Samples BQ2944L0DRBT ACTIVE SON DRB 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR Purchase Samples BQ2944L9DRBR ACTIVE SON DRB 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR Request Free Samples BQ2944L9DRBT ACTIVE SON DRB 8 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR Purchase Samples (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. Addendum-Page 1 PACKAGE OPTION ADDENDUM www.ti.com 14-Jun-2010 Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. 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Addendum-Page 2 PACKAGE MATERIALS INFORMATION www.ti.com 20-Jul-2010 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing BQ29440DRBR SON DRB 8 SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant 3000 330.0 12.4 3.3 3.3 1.1 8.0 12.0 Q2 BQ29440DRBT SON DRB 8 250 180.0 12.4 3.3 3.3 1.1 8.0 12.0 Q2 BQ29449DRBR SON DRB 8 3000 330.0 12.4 3.3 3.3 1.1 8.0 12.0 Q2 BQ29449DRBT SON DRB 8 250 180.0 12.4 3.3 3.3 1.1 8.0 12.0 Q2 BQ2944L0DRBR SON DRB 8 3000 330.0 12.4 3.3 3.3 1.1 8.0 12.0 Q2 BQ2944L0DRBT SON DRB 8 250 180.0 12.4 3.3 3.3 1.1 8.0 12.0 Q2 BQ2944L9DRBR SON DRB 8 3000 330.0 12.4 3.3 3.3 1.1 8.0 12.0 Q2 BQ2944L9DRBT SON DRB 8 250 180.0 12.4 3.3 3.3 1.1 8.0 12.0 Q2 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 20-Jul-2010 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) BQ29440DRBR SON DRB 8 3000 346.0 346.0 29.0 BQ29440DRBT SON DRB 8 250 190.5 212.7 31.8 BQ29449DRBR SON DRB 8 3000 346.0 346.0 29.0 BQ29449DRBT SON DRB 8 250 190.5 212.7 31.8 BQ2944L0DRBR SON DRB 8 3000 346.0 346.0 29.0 BQ2944L0DRBT SON DRB 8 250 190.5 212.7 31.8 BQ2944L9DRBR SON DRB 8 3000 346.0 346.0 29.0 BQ2944L9DRBT SON DRB 8 250 190.5 212.7 31.8 Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. 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