TI TS3DS10224RUKR

TS3DS10224
SCDS318 – JUNE 2011
www.ti.com
High-Speed 2:4 Differential Multiplexer / Demultiplexer
Check for Samples: TS3DS10224
FEATURES
APPLICATIONS
•
•
•
•
•
•
•
16
ENB
OUTA0-
OUTA0+
OUTA1-
1
15
INAINB+
VCC
INBGND
SAO
SAI
SBI
5
11
OUTB0-
OUTB0+
OUTB1-
OUTB1+
6
•
INA+
SBO
10
•
RUK PACKAGE
(TOP VIEW)
ENB
•
Desktop/Notebooks Computers
DisplayPort Auxiliary Channel Multiplexing
USB 2.0 Multiplexing
Netbooks/eBooks/Tablets
OUTA1+
•
•
2:4 Differential Multiplexer/Demultiplexer
Bidirectional Operation
Can be used in
– Single 1:4 Configuration
– Dual 1:2 Configuration
– Fan out 1:2 Configuration
High BW (1.2 GHz Typ)
Low RON and CON:
– 13 Ω RON Typ
– 9 pF CON Typ
ESD Performance (I/O Pins)
– ±8-kV Contact Discharge (IEC61000-4-2)
– 2-kV Human Body Model per
JESD22-A114E (to GND)
ESD Performance (All Pins)
– 2-kV Human Body Model per
JESD22-A114E
Small QFN package (3 x 3 mm, 0.4-mm pitch)
20
1
DESCRIPTION
The TS3DS10224 is a 2:4 bidirectional multiplexer for high-speed differential and single ended signal
applications (up to 720 Mbps). The TS3DS10224 can be used in a 1:4 or dual 1:2 multiplexer/demultiplexer
configuration. The TS3DS10224 offers a high BW of 1.2 GHz with channel RON of 13 Ω (Typ).
The TS3DS10224 can also be used to fan out a differential or single ended signal pair to two ports
simultaneously (fan-out configuration). The BW performance is lower in this configuration.
The TS3DS10224 operates with a 3 to 3.6V power supply. It features ESD protection of up to ±8-kV contact
discharge and 2-kV Human Body Model on its I/O pins.
The TS3DS10224 provides fail-safe protection by isolating the I/O pins with high impedance when the power
supply (VCC) is not present.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2011, Texas Instruments Incorporated
TS3DS10224
SCDS318 – JUNE 2011
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION
PACKAGE (1) (2)
TA
–40°C to 85°C
(1)
(2)
QFN
Tape and Reel
ORDERABLE PART NUMBER
TOP-SIDE MARKING
TS3DS10224RUKR
ZTB
Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
Web site at www.ti.com.
PIN FUNCTIONS
PIN NAME
PIN TYPE
DESCRIPTION
SAI
Input
Control input
SAO
Input
Control input
SBI
Input
Control input
SBO
Input
Control input
ENA
Input
Enable
INA+
I/O
Input A
INA–
I/O
Input A
ENB
Input
Enable
INB+
I/O
Input B
INB-
I/O
Input B
OUTB0–
I/O
Output B0
OUTB0+
I/O
Output B0
OUTB1–
I/O
Output B1
OUTB1+
I/O
Output B1
GND
Ground
Ground
VCC
Power
Power supply
OUTA0–
I/O
Output A0
OUTA0+
I/O
Output A0
OUTA1–
I/O
Output A1
OUTA1+
I/O
Output A1
LOGIC DIAGRAM
ENA
INA +-
1
1
0
0
+ OUTA1
+ OUTA0
SAO
SAI
SBI
SBO
INB +-
0
1
1
0
+ OUTB1
+ OUTB0
-
ENB
2
Copyright © 2011, Texas Instruments Incorporated
TS3DS10224
SCDS318 – JUNE 2011
www.ti.com
Table 1. FUNCTION TABLE
ENA, ENB
OUTA0
OUTA1
OUTB0
OUTB1
00
Hi-Z
Hi-Z
Hi-Z
Hi-Z
01
Hi-Z
Hi-Z
–
–
10
–
–
Hi-Z
Hi-Z
11
–
–
–
–
SAI, SAO, SBI, SBO
OUTA0
OUTA1
OUTB0
OUTB1
0000
INB
–
INA
–
0001
INB
–
–
INA
0010
INB
–
INB
–
0011
INB
–
–
INB
0100
–
INB
INA
–
0101
–
INB
–
INA
0110
–
INB
INB
0111
–
INB
–
1000
INA
–
INA
–
1001
INA
–
–
INA
1010
INA
–
INB
–
1011
INA
–
–
INB
1100
–
INA
INA
–
1101
–
INA
–
INA
1110
–
INA
INB
–
1111
–
INA
–
INB
INB
CONFIGURATIONS
1. Single 1:4 Configuration
In this configuration either INA or INB is not connected and the other input can be multiplexed/demultiplexed
to either of the four outputs.
2. Dual 1:2 Configuration
In this configuration SAI and SBI are both connected to VCC. SAO and SBO are used to control two separate
1:2 multiplexers/demultiplexers.
3. Fan out 1:2 Configuration
In this configuration either INA or INB can be multiplexed to both OUTAx and OUTBx simultaneously. There
is an impact on the device characteristics.
Copyright © 2011, Texas Instruments Incorporated
3
TS3DS10224
SCDS318 – JUNE 2011
www.ti.com
ABSOLUTE MAXIMUM RATINGS (1)
over operating free-air temperature range (unless otherwise noted)
MIN
MAX
UNIT
VCC
Supply voltage range
–0.3
4.0
V
VI/O
Analog I/O voltage range (2) (3) (4)
–0.3
VCC + 0.3
V
II/O
ON-state switch current (5)
±100
ICC
Continuous current through VCC or GND
±100
VIN
Control input voltage range (2) (3)
θJA
Package thermal impedance (6)
Tstg
Storage temperature range
(1)
(2)
(3)
(4)
(5)
(6)
–0.3
VCC + 0.3
RUK package
–65
mA
V
82.7
°C/W
150
°C
Stresses above these ratings may cause permanent damage. These are stress ratings only, and functional operation of the device at
these or any other conditions beyond the recommended operating conditions is not implied. Exposure to absolute maximum conditions
for extended periods may degrade device reliability.
All voltages are with respect to ground, unless otherwise specified.
The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
VI and VO are used to denote specific conditions for VI/O.
II and IO are used to denote specific conditions for II/O
The package thermal impedance is calculated in accordance with JESD 51-7.
RECOMMENDED OPERATING CONDITIONS (1) (2)
MIN
MAX UNIT
VCC
Supply voltage
3
3.6
V
VIH
High-level control input voltage
0.75 x VCC
VCC
V
VIL
Low-level control input voltage
0
0.6
V
VI/O
Input/Output voltage
0
VCC
V
TA
Operating free-air temperature
–40
85
°C
(1)
(2)
4
All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
It is recommended to pull down to ground unused I/O pins through a 1-kΩ resistor.
Copyright © 2011, Texas Instruments Incorporated
TS3DS10224
SCDS318 – JUNE 2011
www.ti.com
ELECTRICAL CHARACTERISTICS (1)
For Single 1:4 or Dual 1:2 configurations. TA = –40°C to 85°C, Typical values are at VCC = 3.3V, TA = 25°C (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
MIN TYP (2)
UNIT
Digital input clamp voltage
VCC = 3.6 V, II = –18 mA
IIN
Digital input leakage current
VCC = 3.6 V, VIN = 0 to 3.6 V
±2
μA
VCC = 3.6 V, VO = 0 V to 3.6 V, VI = 0 V, Switch OFF
±2
μA
±5
μA
50
100
μA
IOZ (3)
–1.2
MAX
VIK
-0.9
V
IOFF
Power off leakage current
VCC = 0 V, VIN = VCC or GND,VI/O = 0 V to 3.6 V
ICC
Supply current
VCC = 3.6 V, II/O = 0, Switch ON or OFF
CIN
Digital input capacitance
VCC = 3.3 V, VIN = VCC or GND
3
5
pF
CI/O(OFF)
OFF capacitance
VCC = 3.3 V, VI/O = 3.3 V or 0, f = 10 MHz, Switch OFF
6
7
pF
CI/O(ON)
ON capacitance
VCC = 3.3 V, VI/O = 3.3 V or 0, f = 10 MHz, Switch ON
9
10
pF
ron
ON state resistance
VCC = 3.6 V, VI = VCC, IO = –30 mA
13
19
Ω
VCC = 3.3 V, VI = 0.5V, IO = –30 mA
10
Δron
ON state resistance match
between channels
VCC = 3 V, VI = 0 to VCC, IO = –30 mA
2
2.5
Ω
ron(flat)
ON state resistance flatness
VCC = 3 V, VI = 1.5 V and VCC, IO = –30 mA
4
6
Ω
(1)
(2)
(3)
Ω
VIN and IIN refer to control inputs. VI, VO, II, and IO refer to data pins.
All typical values are at VCC = 3.3 V (unless otherwise noted), TA = 25°C.
For I/O ports, the parameter IOZ includes the input leakage current.
DYNAMIC CHARACTERISTICS
For Single 1:4 or Dual 1:2 configurations. TA = –40°C to 85°C, Typical values are at VCC = 3.3 V ± 10% and TA = 25°C
(unless otherwise noted)
TYP
UNIT
BW
Bandwidth
PARAMETER
RL = 50 Ω, Switch ON
TEST CONDITIONS
1.2
GHz
OISO
OFF Isolation
RL = 50 Ω , f = 250 MHz
–30
dB
XTALK
Crosstalk
RL = 50 Ω , f = 250 MHz
–30
dB
SWITCHING CHARACTERISTICS
For Single 1:4 or Dual 1:2 configurations. Over operating range, TA = –40°C to 85°C, VCC = 3.3 V ±10%, GND = 0 V (unless
otherwise noted)
PARAMETER
tpd
(1)
TEST CONDITIONS
MIN
TYP MAX UNIT
RL = 50 Ω, CL = 2 pF
50
ps
tON
SAI/SAO/SBI/SBO to OUTAx/OUTBx
RL = 50 Ω, CL = 2 pF
40
100
ns
tOFF
SAI/SAO/SBI/SBO to OUTAx/OUTBx
RL = 50 Ω, CL = 2 pF
20
30
ns
RL = 50 Ω, CL = 2 pF
40
ps
RL = 50 Ω, CL = 2 pF
40
ps
tsk(o)
tsk(p)
(1)
(2)
(3)
(2)
(3)
The propagation delay is the calculated RC time constant of the typical ON-State resistance of the switch and the specified load
capacitance when driven by an ideal voltage source (zero output impedance).
Output skew between center channel and any other channel.
Skew between opposite transitions of the same output ( |tPHL – tPLH| ).
Copyright © 2011, Texas Instruments Incorporated
5
TS3DS10224
SCDS318 – JUNE 2011
www.ti.com
ELECTRICAL CHARACTERISTICS (1)
For fan-out 1:2 configurations. TA = –40°C to 85°C, Typical values are at VCC = 3.3V, TA = 25°C (unless otherwise noted)
PARAMETER
MIN TYP (2) MAX
TEST CONDITIONS
UNIT
VIK
Digital input clamp voltage
VCC = 3.6 V, II = –18 mA
IIN
Digital input leakage current
VCC = 3.6 V, VIN = 0 to 3.6 V
±2
μA
IOZ (3)
-1.2
-0.9
V
VCC = 3.6 V, VO = 0 V to 3.6 V, VI = 0 V, Switch OFF
±2
μA
IOFF
Power off leakage current
VCC = 0 V, VIN = VCC or GND, VI/O = 0 V to 3.6 V
±5
μA
ICC
Supply current
VCC = 3.6 V, II/O = 0, Switch ON or OFF
50
100
μA
CIN
Digital input capacitance
VCC = 3.3 V, VIN = VCC or GND
3
5
pF
CI/O(OFF)
OFF capacitance
VCC = 3.3 V, VI/O = 3.3 V or 0, f = 10 MHz, Switch OFF
6
7
pF
CI/O(ON)
ON capacitance
VCC = 3.3 V, VI/O = 3.3 V or 0, f = 10 MHz, Switch ON
12
13
pF
ron
ON state resistance
VCC = 3.6 V, VI = VCC, IO = –30 mA
13
19
Ω
Δron
ON state resistance match
between channels
VCC = 3 V, VI = 0 to VCC, IO = –30 mA
2
2.5
Ω
ron(flat)
ON state resistance flatness
VCC = 3 V, VI = 1.5 V and VCC, IO = –30 mA
4
6
Ω
(1)
(2)
(3)
VIN and IIN refer to control inputs. VI, VO, II, and IO refer to data pins.
All typical values are at VCC = 3.3 V (unless otherwise noted), TA = 25°C.
For I/O ports, the parameter IOZ includes the input leakage current.
DYNAMIC CHARACTERISTICS
For fan-out 1:2 configurations. TA = –40°C to 85°C, Typical values are at VCC = 3.3 V ± 10% and TA = 25°C (unless otherwise
noted)
TYP
UNIT
BW
Bandwidth
PARAMETER
RL = 50 Ω, Switch ON
TEST CONDITIONS
500
MHz
OISO
OFF Isolation
RL = 50 Ω , f = 250 MHz
–30
dB
XTALK
Crosstalk
RL = 50 Ω , f = 250 MHz
–30
dB
SWITCHING CHARACTERISTICS
For fan-0ut 1:2 configurations. Over operating range, TA = –40°C to 85°C, VCC = 3.3 V ±10%, GND = 0 V (unless otherwise
noted)
PARAMETER
tpd
(1)
TEST CONDITIONS
MIN
TYP MAX UNIT
RL = 50 Ω, CL = 2 pF
140
ps
tON
SAI/SAO/SBI/SBO to OUTAx/OUTBx
R = 50 Ω, CL = 2 pF
40
100
ns
tOFF
SAI/SAO/SBI/SBO to OUTAx/OUTBx
RLL = 50 Ω, CL = 2 pF
20
30
ns
RL = 50 Ω, CL = 2 pF
60
ps
RL = 50 Ω, CL = 2 pF
60
ps
tsk(o)
tsk(p)
(1)
(2)
(3)
6
(2)
(3)
The propagation delay is the calculated RC time constant of the typical ON-State resistance of the switch and the specified load
capacitance when driven by an ideal voltage source (zero output impedance).
Output skew between center channel and any other channel.
Skew between opposite transitions of the same output ( |tPHL – tPLH| ).
Copyright © 2011, Texas Instruments Incorporated
TS3DS10224
SCDS318 – JUNE 2011
www.ti.com
TYPICAL CHARACTERISTICS (Single 1:4 or Dual 1:2 configurations)
0
12
Single 1:4
-2
Dual 1:2
-4
Insertion Loss - dB
10
Ron - Ω
8
6
4
-6
-8
-10
2
-12
0
0
1
2
3
-14
1.00E+05
Vin - V
Figure 1. ON-Resistance vs. Vout
Figure 2. Insertion loss vs. Frequency
0
0
-10
-10
-20
-20
-30
-30
Crosstalk - dB
OFFISOLATION - dB
1.00E+10
f - Frequency - MHz
-40
-50
-60
-40
-50
-60
-70
-70
-80
-80
-90
1.00E+05
1.00E+10
f - Frequency - MHz
Figure 3. Off Isolation vs. Frequency
Copyright © 2011, Texas Instruments Incorporated
-90
1.00E+05
1.00E+09
f - Frequency - MHz
Figure 4. Crosstalk vs. Frequency
7
TS3DS10224
SCDS318 – JUNE 2011
www.ti.com
TYPICAL CHARACTERISTICS (Fan out 1:2 configurations)
0
12
-2
10
Insertion Loss - dB
-4
Ron - Ω
8
6
4
-6
-8
-10
2
-12
-14
1.00E+06
0
0
0.5
1
1.5
Vin - V
2
2.5
3
Figure 5. ON-Resistance vs. Vout
1.00E+08
1.00E+09
1.00E+07
f - Frequency - MHz
1.00E+10
Figure 6. Insertion loss vs. Frequency
0
0
-10
-20
-40
-30
Crosstalk - dB
Off Isolation - dB
-20
-60
-80
-40
-50
-60
-70
-100
-80
-120
1.00E+06
1.00E+08
1.00E+09
1.00E+07
f - Frequency - MHz
Figure 7. Off Isolation vs. Frequency
8
1.00E+10
-90
1.00E+05
1.00E+11
f - Frequency - MHz
Figure 8. Crosstalk vs. Frequency
Copyright © 2011, Texas Instruments Incorporated
TS3DS10224
SCDS318 – JUNE 2011
www.ti.com
PARAMETER MEASUREMENT INFORMATION
VCC
Input Generator
VIN
50 Ω
50 Ω
VG1
TEST CIRCUIT
DUT
2 × VCC
Input Generator
S1
RL
VO
VI
50 Ω
CL
(see Note A)
50 Ω
VG2
RL
TEST
VCC
S1
RL
Vin
CL
V∆
t PLZ/t PZL
3.3 V ± 0.3 V
2 × VCC
50 Ω
GND
2 pF
0.3 V
t PHZ/t PZH
3.3 V ± 0.3 V
GND
50 Ω
VCC
2 pF
0.3 V
VSEL
VO
VCC
Output Control
(VIN)
VCC/2
VCC/2
0V
Output
Waveform 1
S1 at 2 x VCC
(see Note B)
t PZL
t PLZ
VOH
VCC/2
t PZH
VO
Open
GND
Output
Waveform 2
S1 at GND
(see Note B)
VOL + 0.3 V
VOL
t PHZ
VCC/2
VOH - 0.3 V
VOH
VOL
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics:PRR ≤10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
E. tPLZ and tPHZ are the same as tOFF.
F. tPZL and tPZH are the same as tON.
Figure 9. Test Circuit and Voltage Waveforms
Copyright © 2011, Texas Instruments Incorporated
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TS3DS10224
SCDS318 – JUNE 2011
www.ti.com
PARAMETER MEASUREMENT INFORMATION (continued)
VCC
Input Generator
VIN
50 Ω
50 Ω
VG1
TEST CIRCUIT
DUT
2 × VCC
Input Generator
50 Ω
RL
S1
RL
Vin
CL
t sk(o)
3.3 V ± 0.3 V
Open
50 Ω
VCC or GND
2 pF
t sk(p)
3.3 V ± 0.3V
Open
50 Ω
VCC or GND
2 pF
VCC
3.0 V
1.5 V
0V
Data In at
Ax or Ay
t PLHx
t PHLx
VOH
(VOH + VOL)/2
VOL
Data Out at
XB 1 or XB 2
t sk(o)
VO
CL
(see Note A)
50 Ω
TEST
VO
Open
GND
VG2
VI
RL
VO
VI
S1
VOH
(VOH + VOL)/2
VOL
t PHLy
t sk(o) = t PLHy − tPLHx or t PHLy − tPHLx
VOLTAGE WAVEFORMS
OUTPUT SKEW (t sk(o))
Input
t sk(o)
Data Out at
YB 1 or YB 2
t PLHy
3.0 V
1.5 V
0V
t PLH
t PHL
VOH
(VOH + VOL)/2
VOL
Output
t sk(p) = t PHL − tPLH
VOLTAGE WAVEFORMS
PULSE SKEW [t sk(p)]
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
Figure 10. Test Circuit and Voltage Waveforms
10
Copyright © 2011, Texas Instruments Incorporated
TS3DS10224
SCDS318 – JUNE 2011
www.ti.com
PARAMETER MEASUREMENT INFORMATION (continued)
Network Analyzer
P2
50Ω
P1
50Ω
VDD
ENA
OUTA1+
OUTA1-
INA+
OUTA0+
INA-
OUTA0-
OUTB1+
INB+
OUTB1-
NB-
SAO=SAI=SBO=SBI=1
ENB=0 for Single 1:4 and
Dual 1:2 configurations
ENB=1 for Fan out 1:2
configuration
OUTB0+
OUTB0-
GND
Figure 11. Frequency Response (BW)
Network Analyzer
P1 50 W
P2
50 W
VCC
50 W
ENA
OUTA1+
OUTA1-
INA+
OUTA0+
INA-
OUTA0SAO=SAI=SBO=SBI=1
OUTB1+
INB+
OUTB1-
NB-
OUTB0+
ENB
GND
OUTB0-
Figure 12. Off Isolation (OISO)
Copyright © 2011, Texas Instruments Incorporated
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TS3DS10224
SCDS318 – JUNE 2011
www.ti.com
PARAMETER MEASUREMENT INFORMATION (continued)
Network Analyzer
P2
P1 50 W
50 W
VCC
ENA
OUTA1+
50 W
OUTA1INA+
OUTA0+
INA-
50 W
OUTA0-
OUTB1+
INB+
OUTB1-
NB-
OUTB0+
ENB
GND
SAO=SAI=SBO=SBI=1
OUTB0-
Figure 13. Crosstalk (XTALK)
12
Copyright © 2011, Texas Instruments Incorporated
PACKAGE OPTION ADDENDUM
www.ti.com
17-Jun-2011
PACKAGING INFORMATION
Orderable Device
TS3DS10224RUKR
Status
(1)
PREVIEW
Package Type Package
Drawing
QFN
RUK
Pins
Package Qty
20
3000
Eco Plan
TBD
(2)
Lead/
Ball Finish
Call TI
MSL Peak Temp
(3)
Samples
(Requires Login)
Call TI
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
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Addendum-Page 1
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