HITACHI 2SK1400

2SK1400, 2SK1400A
Silicon N-Channel MOS FET
Application
High speed power switching
Features
•
•
•
•
•
Low on-resistance
High speed switching
Low drive current
No secondary breakdown
Suitable for switching regulator and DC-DC converter
Outline
TO-220AB
D
1
2
3
1. Gate
2. Drain
(Flange)
3. Source
G
S
2SK1400, 2SK1400A
Absolute Maximum Ratings (Ta = 25°C)
Item
Drain to source voltage
2SK1400
Symbol
Ratings
Unit
VDSS
300
V
2SK1400A
350
Gate to source voltage
VGSS
Drain current
ID
Drain peak current
I D(pulse)*
Body to drain diode reverse drain current
I DR
2
1
±30
V
7
A
28
A
7
A
Channel dissipation
Pch*
50
W
Channel temperature
Tch
150
°C
Storage temperature
Tstg
–55 to +150
°C
Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1%
2. Value at TC = 25°C
2
2SK1400, 2SK1400A
Electrical Characteristics (Ta = 25°C)
Item
Symbol Min
Drain to source
K1400
breakdown voltage
K1400A
V(BR)DSS
Typ
Max
Unit
Test conditions
300
—
—
V
I D = 10 mA, VGS = 0
350
—
—
Gate to source breakdown
voltage
V(BR)GSS
±30
—
—
V
I G = ±100 µA, VDS = 0
Gate to source leak current
I GSS
—
—
±10
µA
VGS = ±25 V, VDS = 0
Zero gate voltage
K1400
I DSS
—
—
250
µA
VDS = 240 V, VGS = 0
drain current
K1400A
VDS = 280 V, VGS = 0
Gate to source cutoff voltage
VGS(off)
2.0
—
3.0
V
I D = 1 mA, VDS = 10 V
Static drain to source K1400
RDS(on)
—
0.50
0.70
Ω
I D = 4 A, VGS = 10 V *1
—
0.60
0.80
on state resistance
K1400A
Forward transfer admittance
|yfs|
3.0
5.0
—
S
I D = 4 A, VDS = 10 V *1
Input capacitance
Ciss
—
635
—
pF
VDS = 10 V, VGS = 0,
Output capacitance
Coss
—
230
—
pF
f = 1 MHz
Reverse transfer capacitance
Crss
—
40
—
pF
Turn-on delay time
t d(on)
—
10
—
ns
I D = 4 A, VGS = 10 V,
Rise time
tr
—
50
—
ns
RL = 7.5 Ω
Turn-off delay time
t d(off)
—
60
—
ns
Fall time
tf
—
40
—
ns
Body to drain diode forward
voltage
VDF
—
1.0
—
V
I F = 7 A, VGS = 0
Body to drain diode reverse
recovery time
t rr
—
240
—
ns
I F = 7 A, VGS = 0,
diF/dt = 100 A/µs
Note:
1. Pulse test
3
2SK1400, 2SK1400A
Maximum Safe Operation Area
Power vs. Temperature Derating
50
DS
5
PW
0
=
1
10
n
tio
ra
pe
2
1
0.5
µs
µs
m
s
m
s
(1
=
(T C
20
(o
n)
O
i s per
lim ati
ite on
d in
by th
R is a
40
10
10
10
O
Sh
ot
)
)
°C
25
Drain Current ID (A)
20
C
D
Channel Dissipation Pch (W)
re
a
60
0.2
0.1
Ta = 25°C
2SK1400
2SK1400A
0.05
0
50
100
Case Temperature TC (°C)
1
150
Typical Output Characteristics
15 V
Drain Current ID (A)
8
Pulse Test
8
5V
6
4
2
0
4
5.5 V
6V
10 V
Typical Transfer Characteristics
10
Drain Current ID (A)
10
3
30
10
100 300 1,000
Drain to Source Voltage VDS (V)
4.5 V
4
12
16
8
Drain to Source Voltage VDS (V)
6
4
75°C
2
4V
VGS = 3.5 V
20
VDS = 20 V
Pulse Test
0
Ta = 25°C
–25°C
2
6
8
4
Gate to Source Voltage VGS (V)
10
Drain to Source Saturation Voltage
vs. Gate to Source Voltage
Static Drain to Source on State Resistance
RDS (on) (Ω)
Static Drain to Source on State
Resistance vs. Drain Current
10
Pulse Test
8
ID = 10 A
6
4
5A
2
2A
8
4
12
16
Gate to Source Voltage VGS (V)
0
5
Pulse Test
2
1
0.2
0.1
Pulse Test
VGS = 10 V
10 A
5A
2A
0.8
0.4
0
–40
0
80
120
40
Case Temperature TC (°C)
1.0
5
10
20
2
Drain Current ID (A)
50
Forward Transfer Admittance
vs. Drain Current
2.0
1.2
15 V
0.5
Static Drain to Source on State
Resistance vs. Temperature
1.6
VGS = 10 V
0.05
0.5
20
Forward Transfer Admittance yfs (S)
Static Drain to Source on State Resistance
RDS (on) (Ω)
Drain to Source Saturation Voltage VDS (on) (V)
2SK1400, 2SK1400A
160
50
20
VDS = 20 V
Pulse Test
10
–25°C
TC = 25°C
5
75°C
2
1
0.5
0.1
0.2
1
0.5
2
Drain Current ID (A)
5
10
5
2SK1400, 2SK1400A
Static Drain-Source on State
Resistance vs. Drain Current
Body to Drain Diode Reverse
Recovery Time
10,000
Ciss
200
Capacitance C (pF)
Reverse Recovery Time t rr (ns)
500
100
50
20
1,000
Coss
100
Crss
di/dt = 50 A/µs, VGS = 0
Ta = 25°C
Pulse Test
10
5
0.2
VGS = 0 V
f = 1 MHz
10
0.5
2
10
1
5
Reverse Drain Current IDR (A)
20
0
50
Switching Characteristics
Dynamic Input Characteristics
500
20
10
30
40
Drain to Source Voltage VDS (V)
500
20
VGS = 10 V VDD = 30 V
PW = 2 µs, duty < 1%
200
16
12
VGS
VDS
8
100
200 V
100 V
VDD = 50 V
8
ID = 7 A
16
24
32
Gate Charge Qg (nc)
4
0
40
•
Switching Time t (ns)
300
0
6
VDD = 50V
100 V
200 V
400
Gate to Source Voltage VGS (V)
Drain to Source Voltage VDS (V)
•
200
100
td (off)
50
tf
tr
20
td (on)
10
5
0.1
0.2
0.5
1
2
Drain Current ID (A)
5
10
2SK1400, 2SK1400A
Reverse Drain Current vs.
Sourse to Drain Voltage
Reverse Dratin Current IDR (A)
10
Pulse Test
8
6
4
2
5 V, 10 V
VGS = 0, –5 V
0
2.0
0.4
0.8
1.2
1.6
Source to Drain Voltage VSD (V)
Normalized Transient Thermal Impedance γS (t)
0
Normalized Transient Thermal Impedance vs. Pulse Width
3
1.0
TC = 25°C
D=1
0.5
0.3
0.2
0.1
0.1
0.05
θch–c (t) = γS (t) · θch–c
θch–c = 2.50°C/W, TC = 25°C
PDM
0.02
0.03
e
1
0.0 t Puls
o
h
1S
0.01
10 µ
T
100 µ
1m
10 m
Pulse Width PW (s)
100 m
Switching Time Test Circuit
PW
D = PW
T
1
10
Waveforms
Vin Monitor
90%
Vout Monitor
Vin
D.U.T
RL
50 Ω
Vin
10 V
Vout
VDD
.
=. 30 V
10%
10%
90%
td (on)
tr
10%
90%
td (off)
tf
7
Unit: mm
11.5 MAX
2.79 ± 0.2
10.16 ± 0.2
9.5
φ 3.6 -0.08
+0.1
1.26 ± 0.15
15.0 ± 0.3
6.4
18.5 ± 0.5
1.27
+0.2
–0.1
8.0
4.44 ± 0.2
7.8 ± 0.5
1.5 MAX
0.76 ± 0.1
2.54 ± 0.5
2.54 ± 0.5
14.0 ± 0.5
2.7 MAX
0.5 ± 0.1
Hitachi Code
JEDEC
EIAJ
Weight (reference value)
TO-220AB
Conforms
Conforms
1.8 g
Cautions
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received the latest product standards or specifications before final design, purchase or use.
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contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
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