HITACHI TBB1002

TBB1002
Twin Build in Biasing Circuit MOS FET IC
VHF/UHF RF Amplifier
ADE-208-987F (Z)
7th. Edition
Dec. 2000
Features
•
•
•
•
Small SMD package CMPAK-6 built in twin BBFET; To reduce using parts cost & PC board space.
Suitable for World Standard Tuner RF amplifier.
Very useful for total tuner cost reduction.
Withstanding to ESD; Build in ESD absorbing diode. Withstand up to 200 V at C = 200 pF,
Rs = 0 conditions.
• Provide mini mold packages; CMPAK-6
Outline
CMPAK-6
6
5
4
2
1
Notes:
1.
2.
3
1. Gate-1(1)
2. Source
3. Drain(1)
4. Drain(2)
5. Gate-2
6. Gate-1(2)
Marking is “BM”.
TBB1002 is individual type number of HITACHI TWIN BBFET.
TBB1002
Absolute Maximum Ratings (Ta = 25°C)
Item
Symbol
Ratings
Unit
Drain to source voltage
VDS
6
V
Gate1 to source voltage
VG1S
+6
-0
V
Gate2 to source voltage
VG2S
+6
-0
V
Drain current
ID
30
mA
250
mW
*3
Channel power dissipation
Pch
Channel temperature
Tch
150
°C
Storage temperature
Tstg
–55 to +150
°C
Notes: 3. Value on the glass epoxy board (49mm × 38mm × 1mm).
Electrical Characteristics (Ta = 25°C)
The below specification are applicable for UHF unit (FET1)
Item
Symbol
Min
Typ
Max
Unit
Test Conditions
Drain to source breakdown
voltage
V(BR)DSS
6
—
—
V
I D = 200µA, VG1S = VG2S = 0
Gate1 to source breakdown
voltage
V(BR)G1SS
+6
—
—
V
I G1 = +10µA, VG2S = VDS = 0
Gate2 to source breakdown
voltage
V(BR)G2SS
+6
—
—
V
I G2 = +10µA, VG1S = VDS = 0
Gate1 to source cutoff current I G1SS
—
—
+100
nA
VG1S = +5V, V G2S = VDS = 0
Gate2 to source cutoff current I G2SS
—
—
+100
nA
VG2S = +5V, V G1S = VDS = 0
Gate1 to source cutoff voltage VG1S(off)
0.5
0.75
1.0
V
VDS = 5V, VG2S = 4V, ID = 100µA
Gate2 to source cutoff voltage VG2S(off)
0.5
0.75
1.0
V
VDS = 5V, VG1S = 5V, ID = 100µA
Drain current
I D(op)
13
17
21
mA
VDS = 5V, VG1 = 5V
VG2S = 4V, RG = 100kΩ
Forward transfer admittance
|yfs|
21
26
31
mS
VDS = 5V, VG1 = 5V, VG2S =4V
RG = 100kΩ, f = 1kHz
Input capacitance
c iss
1.4
1.8
2.2
pF
VDS = 5V, VG1 = 5V
Output capacitance
c oss
1.0
1.4
1.8
pF
VG2S =4V, RG = 100kΩ
Reverse transfer capacitance
c rss
—
0.02
0.04
pF
f = 1MHz
Power gain
PG
16
21
—
dB
VDS = VG1 = 5V, VG2S = 4V
RG = 100kΩ, f = 900MHz
Zi=S11*, Zo=S22*(:PG)
Noise figure
NF
—
1.7
2.5
dB
Zi=S11opt (:NF)
2
TBB1002
Electrical Characteristics (Ta = 25°C)
The below specification are applicable for VHF unit (FET2)
Item
Symbol
Min
Typ
Max
Unit
Test Conditions
Drain to source breakdown
voltage
V(BR)DSS
6
—
—
V
I D = 200µA, VG1S = VG2S = 0
Gate1 to source breakdown
voltage
V(BR)G1SS
+6
—
—
V
I G1 = +10µA, VG2S = VDS = 0
Gate2 to source breakdown
voltage
V(BR)G2SS
+6
—
—
V
I G2 = +10µA, VG1S = VDS = 0
Gate1 to source cutoff current I G1SS
—
—
+100
nA
VG1S = +5V, V G2S = VDS = 0
Gate2 to source cutoff current I G2SS
—
—
+100
nA
VG2S = +5V, V G1S = VDS = 0
Gate1 to source cutoff voltage VG1S(off)
0.5
0.75
1.0
V
VDS = 5V, VG2S = 4V, ID = 100µA
Gate2 to source cutoff voltage VG2S(off)
0.5
0.75
1.0
V
VDS = 5V, VG1S = 5V, ID = 100µA
Drain current
I D(op)
14
18
22
mA
VDS = 5V, VG1 = 5V, VG2S = 4V,
RG = 82kΩ
Forward transfer admittance
|yfs|
20
25
30
mS
VDS = 5V, VG1 = 5V, VG2S =4V,
RG = 82kΩ, f = 1kHz
Input capacitance
c iss
2.2
2.6
3.0
pF
VDS = 5V, VG1 = 5V
Output capacitance
c oss
1.2
1.6
2.0
pF
VG2S =4V, RG = 82kΩ
Reverse transfer capacitance
c rss
—
0.03
0.05
pF
f = 1MHz
Power gain
PG
22
27
—
dB
VDS = VG1 = 5V, VG2S = 4V
Noise figure
NF
—
1.2
1.7
dB
RG = 82kΩ, f = 200MHz
3
TBB1002
Test Circuits
• DC Biasing Circuit for Operating Characteristic Items (ID(op), |yfs|, Ciss, Coss, Crss, NF, PG)
Measurment of FET1
Gate 2
VG2
Open
Open
RG
A
Gate 1
VG1
ID
Drain
VD
Source
Measurment of FET2
VG2
Gate 2
RG
Drain
Gate 1
A
VD
VG1
Open
Open
Source
4
ID
TBB1002
• Equivalent Circuit
No.1
No.6
Gate-1(1)
Gate-1(2)
BBFET-(1)
BBFET-(2)
No.2
No.5
Source
Gate-2
No.3
No.4
Drain(1)
Drain(2)
• 200 MHz Power Gain, Noise Figure Test Circuit
1000p
1000p
47k
VT
VG2
VT
1000p
47k
1000p
47k
TWINBBFET
Output(50Ω)
1000p
L2
Input(50Ω)
L1
10p max
1000p
1000p
36p
1SV70
RG
RFC
82k
1SV70
1000p
V D = V G1
Unit : Resistance (Ω)
Capacitance (F)
L1 : φ1mm Enameled Copper Wire,Inside dia 10mm, 2Turns
L2 : φ1mm Enameled Copper Wire,Inside dia 10mm, 2Turns
RFC : φ1mm Enameled Copper Wire,Inside dia 5mm, 2Turns
5
Typical Output Characteristics (FET1)
25
200
100
0
50
100
150
Ambient Temperature
Ω
68
k
kΩ
kΩ
0
15
10
kΩ
0
12
kΩ
0
5
1
10
0k
18
5
0
200
G=
20
R
300
V G2S = 4 V
V G1 = VDS
82
I D (mA)
400
Maximum Channel Power
Dissipation Curve
Drain Current
Channel Power Dissipation
Pch* (mW)
TBB1002
Ta (°C)
1
2
3
Drain to Source Voltage
Ω
4
5
V DS (V)
* Value on the glass epoxy board (49mm × 38mm × 1mm)
20
Forward Transfer Admittance |y fs | (mS)
Drain Current
I D (mA)
25
Drain Current vs.
Gate1 Voltage (FET1)
V DS = 5 V
R G = 120 kΩ
4V
15
3V
10
2V
5
VG2S = 1 V
0
6
1
2
Gate1 Voltage
3
V G1
4
(V)
5
50
40
Forward Transfer Admittance
vs. Gate1 Voltage (FET1)
V DS = 5 V
V G2S = 4 V
30
R G = 68 k Ω
100 k Ω
150 kΩ
20
10
0
1
2
Gate1 Voltage
3
4
V G1 (V)
5
TBB1002
Drain Current vs.
Gate Resistance (FET1)
4
V DS = 5 V
V G1 = 5 V
V G2S = 4 V
25
Input Capacitance Ciss (pF)
Drain Current I D (mA)
30
Input Capacitance vs.
Gate2 to Source Voltage (FET1)
20
15
10
5
0
10
20
50
100 200
V DS = 5 V
V G1 = 5 V
R G = 100 kΩ
f = 1 MHz
1
0
1
2
3
4
Gate Resistance R G (kΩ)
Gate2 to Source Voltage V G2S (V)
Typical Output Characteristics (FET2)
Drain Current vs.
Gate1 Voltage (FET2)
25
kΩ
82
kΩ
0
12 Ω
0k
15
10
5
Drain Current
10
0
kΩ
15
I D (mA)
kΩ
56
G=
68
20
kΩ
V G2S = 4 V
V G1 = VDS
R
I D (mA)
2
0
500 1000
25
Drain Current
3
20
V DS = 5 V
R G = 82 kΩ
4V
15
3V
10
2V
5
VG2S = 1 V
0
1
2
3
Drain to Source Voltage
4
5
V DS (V)
0
1
2
Gate1 Voltage
3
V G1
4
(V)
5
7
50
30
V DS = 5 V
V G2S = 4 V
40
R G = 56 k Ω
30
82 k Ω
20
120 kΩ
10
0
1
2
3
Gate1 Voltage
4
20
15
10
5
V G1 (V)
20
50
100 200
500 1000
Gate Resistance R G (kΩ)
Power Gain vs.
Gate Resistance (FET2)
40
4
35
Power Gain PG (dB)
Input Capacitance Ciss (pF)
V DS = 5 V
V G1 = 5 V
V G2S = 4 V
25
0
10
5
Input Capacitance vs.
Gate2 to Source Voltage (FET2)
3
2
V DS = 5 V
V G1 = 5 V
R G = 82 kΩ
f = 1 MHz
1
0
0
1
30
25
20
15
2
3
Gate2 to Source Voltage V G2S (V)
8
Drain Current vs.
Gate Resistance (FET2)
Forward Transfer Admittance
vs. Gate1 Voltage (FET2)
Drain Current I D (mA)
Forward Transfer Admittance |y fs | (mS)
TBB1002
4
10
10
V DS = 5 V
V G1 = 5 V
V G2S = 4 V
f = 200 MHz
20
50 100 200
500 1000
Gate Resistance R G (kΩ)
TBB1002
Noise Figure vs.
Gate Resistance (FET2)
Gain Reduction vs.
Gate2 to Source Voltage (FET2)
0
3
V DS = 5 V
V G1 = 5 V
V G2S = 4 V
f = 200 MHz
Gain Reduction GR (dB)
Noise Figure NF (dB)
4
2
1
0
10
10
20
30
40
50
20
50
100 200
500 1000
Gate Resistance R G (kΩ)
V DS = V G1 = 5 V
R G = 82 kΩ
4
3
2
1
0
Gate2 to Source Voltage V G2S (V)
9
TBB1002
Package Dimensions
As of January, 2001
(0.65)
+ 0.1
0.15 – 0.05
0 to 0.1
0.9 ± 0.1
+ 0.1
– 0.05
(0.2)
6-0.2
(0.65)
2.1 ± 0.3
2.0 ± 0.2
1.3 ± 0.2
(0.425) 1.25 ± 0.1 (0.425)
Unit: mm
Hitachi Code
JEDEC
EIAJ
Mass (reference value)
10
CMPAK-6
—
Conforms
0.006 g
TBB1002
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including
intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
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products.
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Copyright  Hitachi, Ltd., 2000. All rights reserved. Printed in Japan.
Colophon 2.0
11