TI CD74FCT821AEN

CD74FCT821A,
CD74FCT822A
Data sheet acquired from Harris Semiconductor
SCHS264
D
ENDE
M
M
ECO
IGNS
NOT R NEW DES ology
FOR OS Techn
January 1997
Features
• Buffered Inputs
M
Use C
• Typical Propagation Delay: 7.5ns at VCC = 5V,
TA = 25oC, CL = 50pF
• CD74FCT821A
- Noninverting
• CD74FCT822A
- Inverting
• SCR Latchup Resistant BiCMOS Process and
Circuit Design
• Speed of Bipolar FAST™/AS/S
• 48mA Output Sink Current
• Output Voltage Swing Limited to 3.7V at VCC = 5V
• Controlled Output Edge Rates
• Input/Output Isolation to VCC
• BiCMOS Technology with Low Quiescent Power
BiCMOS FCT Interface Logic,
10- Bit D-Type Flip-Flops, Three-State
Description
The CD74FCT821A and CD74FCT822A ten bit, D-Type,
three-state, positive edge triggered flip-flops use a small
geometry BiCMOS technology. The output stage is a combination of bipolar and CMOS transistors that limits the output
HIGH level to two diode drops below VCC. This resultant
lowering of output swing (0V to 3.7V) reduces power bus
ringing (a source of EMI) and minimizes VCC bounce and
ground bounce and their effects during simultaneous output
switching. The output configuration also enhances switching
speed and is capable of sinking 48 milliamperes.
The ten flip-flops enter data into their registers on the LOW
to HIGH transition of the clock(CP). The Output Enable (OE)
controls the three state outputs and is independent of the
register operation. When the Output Enable (OE) is HIGH,
the outputs are in the high impedance state. The
CD74FCT821A and CD74FCT822A share the same configurations, but the CD74FCT821A outputs are noninverted
while the CD74FCT822A devices have inverted outputs.
Ordering Information
PART NUMBER
TEMP.
RANGE (oC)
CD74FCT821AEN
0 to 70
24 Ld PDIP
E24.3
CD74FCT822AEN
0 to 70
24 Ld PDIP
E24.3
CD74FCT821AM
0 to 70
24 Ld SOIC
M24.3
PACKAGE
PKG.
NO.
NOTE: When ordering the suffix M packages, use the entire part
number. Add the suffix 96 to obtain the variant in the tape and reel.
Pinouts
CD74FCT821A
(PDIP, SOIC)
TOP VIEW
CD74FCT822A
(PDIP, SOIC)
TOP VIEW
OE 1
24 VCC
OE 1
24 VCC
D0 2
23 Q0
D0 2
23 Q0
D1 3
22 Q1
D1 3
22 Q1
D2 4
21 Q2
D2 4
21 Q2
D3 5
20 Q3
D3 5
20 Q3
D4 6
19 Q4
D4 6
19 Q4
D5 7
18 Q5
D5 7
18 Q5
D6 8
17 Q6
D6 8
17 Q6
D7 9
16 Q7
D7 9
16 Q7
D8 10
15 Q8
D8 10
15 Q8
D9 11
14 Q9
D9 11
14 Q9
GND 12
13 CP
GND 12
13 CP
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
FAST™ is a trademark of Fairchild Semiconductor.
Copyright © Harris Corporation 1997
8-1
File Number
2390.2
CD74FCT821A, CD74FCT822A
Functional Diagram
821A 822A
2
23
3
22
4
21
5
20
6
19
7
18
8
17
9
16
10
15
11
14
D0
D1
D2
D3
D4
D5
D6
D7
D8
D9
Q0
Q1
Q1
Q2
Q2
Q3
Q3
Q4
Q4
Q5
Q5
Q6
Q6
Q7
Q7
Q8
Q8
Q9
Q9
13
1
OE
CP
Q0
GND = PIN 12
VCC = PIN 24
TRUTH TABLE
OUTPUTS
INPUTS
CD74FCT821A
CD74FCT822A
OE
CP
DN
QN
QN
L
↑
H
H
L
L
↑
L
L
H
L
L
X
NC
NC
H
X
X
Z
Z
NOTE:
1. H = HIGH level (steady state)
L = LOW level (steady state)
X = Immaterial
↑ = Transition from LOW to HIGH level
Z = HIGH impedance
NC = No change
IEC Logic Symbol
CD74FCT821A
1
13
EN
>C1
2
1D
CD74FCT822A
1
13
EN
>C1
1D
23
2
3
22
3
22
4
21
4
21
5
20
5
20
6
19
6
19
7
18
7
18
8
17
8
17
23
9
16
9
16
10
15
10
15
11
14
11
14
8-2
CD74FCT821A, CD74FCT822A
Absolute Maximum Ratings
Thermal Information
DC Supply Voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 6V
DC Diode Current, IIK (For VI < -0.5V) . . . . . . . . . . . . . . . . . . -20mA
DC Output Diode Current, IOK (for VO < -0.5V) . . . . . . . . . . . -50mA
DC Output Sink Current per Output Pin, IO . . . . . . . . . . . . . . . 70mA
DC Output Source Current per Output Pin, IO . . . . . . . . . . . . -30mA
DC VCC Current (ICC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260mA
DC Ground Current (IGND). . . . . . . . . . . . . . . . . . . . . . . . . . . 500mA
Thermal Resistance (Typical, Note 2)
θJA (oC/W)
PDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
75
SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
75
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300oC
(SOIC-Lead Tips Only)
Operating Conditions
Operating Temperature Range, TA . . . . . . . . . . . . . . . . .0oC to 70oC
Supply Voltage Range, VCC . . . . . . . . . . . . . . . . . . . .4.75V to 5.25V
DC Input Voltage, VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to VCC
DC Output Voltage, VO . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to ≤ VCC
Input Rise and Fall Slew Rate, dt/dv. . . . . . . . . . . . . . . . 0 to 10ns/V
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
2. θJA is measured with the component mounted on an evaluation PC board in free air.
Electrical Specifications Commercial Temperature Range 0oC to 70oC, VCC Max = 5.25V, VCC, Min = 4.75V
AMBIENT TEMPERATURE (TA)
25oC
TEST CONDITIONS
PARAMETER
SYMBOL
VI (V)
IO (mA)
0oC TO 70oC
VCC (V)
MIN
MAX
MIN
MAX
UNITS
High Level Input Voltage
VIH
4.75 to
5.25
2
-
2
-
V
Low Level Input Voltage
VIL
4.75 to
5.25
-
0.8
-
0.8
V
High Level Output Voltage
VOH
VIH or VIL
-15
Min
2.4
-
2.4
-
V
Low Level Output Voltage
VOL
VIH or VIL
48
Min
-
0.55
-
0.55
V
High Level Input Current
IIH
VCC
Max
-
0.1
-
1
µA
Low Level Input Current
IIL
GND
Max
-
-0.1
-
-1
µA
IOZH
VCC
Max
-
0.5
-
10
µA
IOZL
GND
Max
-
-0.5
-
-10
µA
Input Clamp Voltage
VIK
VCC or
GND
Min
-
-1.2
-
-1.2
V
Short Circuit Output Current
(Note 3)
IOS
VO = 0
VCC or
GND
Max
-75
-
-75
-
mA
Quiescent Supply Current,
MSI
ICC
VCC or
GND
Max
-
8
-
80
µA
∆ICC
3.4V
(Note 4)
Max
-
1.6
-
1.6
mA
Three-State Leakage Current
Additional Quiescent Supply
Current per Input Pin
TTL Inputs High, 1 Unit Load
-18
0
NOTES:
3. Not more than one output should be shorted at one time. Test duration should not exceed 100ms.
4. Inputs that are not measured are at VCC or GND.
5. FCT Input Loading: All inputs are 1 unit load. Unit load is ∆ICC limit specified in Electrical Specifications table, e.g., 1.6mA Max. at 70oC.
8-3
CD74FCT821A, CD74FCT822A
Switching Specifications Over Operating Range FCT Series tr, tf = 2.5ns, CL = 50pF, RL (See Figures)
PARAMETER
25oC
0oC TO 70oC
SYMBOL
VCC (V)
TYP
MIN
MAX
UNITS
Propagation Delays (Note 6)
Clock to Q
CD74FCT821A
tPLH, tPHL
5
7.5
1.5
10
ns
Clock to Q
CD74FCT822A
tPLH, tPHL
5
7.5
1.5
10
ns
Output Enable to Q
CD74FCT821A
tPZL, tPZH
5
9
1.5
12
ns
Output Disable to Q
CD74FCT821A
tPLZ, tPHZ
5
6
1.5
8
ns
Output Enable to Q
CD74FCT822A
tPZL, tPZH
5
9
1.5
12
ns
Output Disable to Q
CD74FCT822A
tPLZ, tPHZ
5
6
1.5
8
ns
CPD
−
Minimum (Valley) VOH During Switching of Other Outputs
(Output Under Test Not Switching)
VOHV
5
0.5 Typical at 25oC
V
Maximum (Peak) VOL During Switching of Other Outputs
(Output Under Test Not Switching)
VOLP
5
1 Typical at 25oC
V
Input Capacitance
CI
-
-
-
10
pF
Three-State Output Capacitance
CO
-
-
-
15
pF
Power Dissipation Capacitance (Note 7)
pF
NOTES:
6. 5V: Minimum is at 5.25V for 0oC to 70oC, Maximum is at 4.75 for 0oc t0 70oC, Typical is at 5V.
7. CPD, measured per flip-flop, is used to determine the dynamic power consumption.
PD (per package) = VCC ICC + Σ (VCC2 fI CPD + VO2 fOCL + VCC ∆ICC D) where:
VCC = supply voltage
∆ICC = flow through current x unit load
CL = output load capacitance
D = duty cycle of input high
fO = output frequency
fI = input frequency
Prerequisite for Switching
25oC
PARAMETER
0oC TO 70oC
SYMBOL
VCC (V)
TYP
MIN
MAX
UNITS
fMAX
5
-
70
-
MHz
Data to Clock Setup Time
tSU
5
-
4
-
ns
Data to Clock Hold Time
tH
5
-
2
-
ns
Clock Pulse Width
tW
5
-
7
-
ns
Maximum Frequency (Note 8)
NOTE:
8. 5V: Minimum is at 4.75V for 0oC to 70oC, Typical is at 5V.
8-4
CD74FCT821A, CD74FCT822A
Test Circuits and Waveforms
VCC
tr, tf = 2.5ns
(NOTE 9)
VI
3V
0
PULSE ZO
GEN
SWITCH POSITION
7V
500Ω
RL
V0
DUT
CL
50pF
RT
RT = ZO
500Ω
RL
9. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; ZOUT ≤ 50Ω;
tf, tr ≤ 2.5ns.
FIGURE 1. TEST CIRCUIT
tPLZ, tPZL, Open Drain
Closed
tPHZ, tPZH, tPLH, tPHL
Open
3V
1.5V
0V
DATA
INPUT
tH
3V
1.5V
0V
TIMING
INPUT
tREM
ASYNCHRONOUS CONTROL
SWITCH
DEFINITIONS:
CL = Load capacitance, includes jig and probe
capacitance.
RT = Termination resistance, should be equal to ZOUT of
the Pulse Generator.
VIN = 0V to 3V.
Input: tr = tf = 2.5ns (10% to 90%), unless otherwise specified
NOTE:
tSH
TEST
3V
1.5V
0V
LOW-HIGH-LOW
PULSE
1.5V
tW
SYNCHRONOUS CONTROL
PRESET CLEAR
CLOCK ENABLE
ETC.
3V
1.5V
0V
tH
tSH
HIGH-LOW-HIGH
PULSE
FIGURE 2. SETUP, HOLD, AND RELEASE TIMING
ENABLE
1.5V
FIGURE 3. PULSE WIDTH
DISABLE
3V
3V
SAME PHASE
INPUT TRANSITION
1.5V
CONTROL INPUT
0V
3.5V
OUTPUT
NORMALLY LOW
SWITCH
CLOSED
SWITCH
OPEN
tPHL
3.5V
VOH
1.5V
1.5V
VOL
OUTPUT
0.3V
tPZH
OUTPUT
NORMALLY HIGH
tPLH
tPLZ
tPZL
1.5V
tPHZ
0.3V
VOL
tPLH
tPHL
VOH
3V
OPPOSITE PHASE
INPUT TRANSITION
1.5V
0V
0V
0V
1.5V
0V
FIGURE 4. ENABLE AND DISABLE TIMING
FIGURE 5. PROPAGATION DELAY
8-5
Test Circuits and Waveforms
(Continued)
VOH
OTHER
OUTPUTS
VOL
VOH
OUTPUT
UNDER
TEST
VOHV
VOLP
VOL
NOTES:
10. VOLP is measured with respect to a ground reference near the output under test. VOHV is measured with respect to VOH.
11. Input pulses have the following characteristics:
PRR ≤ 1MHz, tr = 2.5ns, tf = 2.5ns, skew 1ns.
12. R.F. fixture with 700MHz design rules required. IC should be soldered into test board and bypassed with 0.1µF capacitor. Scope and
probes require 700MHz bandwidth.
FIGURE 6. SIMULTANEOUS SWITCHING TRANSIENT WAVEFORMS
8-6
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