MAXWELL 7809LPRPFK

7809LP
16-Bit Latchup Protected Analog to Digital Converter
TABLE 1. 7809LP PIN DESCRIPTION
PIN
SYMBOL
DESCRIPTION
21
BUSY
Busy Output. Falls when a conversion is started, and remains LOW until the conversion is completed and the data is latched into the output shift register. CS or R/C must be HIGH when
BUSY rises, or another conversion will start without time for signal acquisition.
22
PWRD
Power Down Input. If HIGH, conversions are inhibited and power consumption is significantly
reduced. Results from the previous conversions are maintained in the output shift register.
23
LPVANA
Latchup Protection Analog Supply.
24
LPVDIG
Latchup Protection Digital Supply.
TABLE 2. 7809LP ABSOLUTE MAXIMUM RATINGS
SYMBOL
MIN
MAX
UNIT
Analog Inputs
R1IN
R2IN
R3IN
CAP
REF 1
-25
-25
-25
VANA + 0.3
25
25
25
AGND2 - 0.3
V
V
V
V
-0.3
0.3
V
--
7
V
7
V
Ground Voltage Differences: DGND, AGND2
VANA
VDIG
VDIG to VANA
--
0.3
V
°C
Specified Performance
-40
85
Digital Inputs
-0.3
VDIG + 0.3
V
150
°C
Storage Temperature
TSTG
-65
Memory
PARAMETER
1. Indefinite short to AGND2, momentarily short to VANA.
TABLE 3. 7809LP DC ACCURACY SPECIFICATIONS
(SPECIFIED PERFORMANCE -40 TO +85°C)
PARAMETER
MIN
TYP
MAX
UNIT
Integral Linearity Error
-40 to 85°C
---
---
±3
±5
LSB 1
Differential Linearity Error
-40 to 85°C
---
---
-2, 3
-1, 6
LSB
LSB
No Missing Codes 2
15
--
--
Bits
--
1.3
--
LSB
Full Scale Error 4,5
--
--
±0.6
%
Full Scale Error 4,5 (using ext. 2.5000 Vref)
--
±0.6
%
Full Scale Error Drift
--
--
ppm/° C
Transition Noise
3
01.11.05 Rev 7
±7
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3
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7809LP
16-Bit Latchup Protected Analog to Digital Converter
TABLE 3. 7809LP DC ACCURACY SPECIFICATIONS
(SPECIFIED PERFORMANCE -40 TO +85°C)
PARAMETER
MIN
TYP
MAX
UNIT
Full Scale Error Drift (using ext. 2.5000 Vref)
--
±2
--
ppm/° C
Bipolar Zero Error 4
--
--
±10
mV
Bipolar Zero Error Drift
--
±2
--
ppm/° C
Unipolar Zero Error 4
-40 to 85°C
---
---
±3
±16
mV
mV
Unipolar Zero Error Drift
--
±2
--
ppm/° C
Recovery to Rated Accuracy after Power Down (1 uF Capacitor to
CAP)
--
1
--
ms
Power Supply Sensitivity (VDIG = VANA = VD) 4.75 V > VD < 5.2 V
-40 to 85°C
---
---
±8
±32
LSB
LSB
1. LSB stands for Least Significant Bit. One LSB is equal to 305 µ V.
2. Not tested.
4. Measured with various fixed resistors.
5. For bipolar input ranges, full scale error is the worst case of -Full Scale or +Full Scale untrimmed deviation from ideal first and
last scale code transitions, divided by the transition voltage (not divided by the full-scale range) and includes the effect of offset
error. For unipolar input ranges, full scale error is the deviation of the last code transition divided by the transition voltage. It
also includes the effect of offset error.
TABLE 4. DELTA LIMITS
PARAMETER
VARIATION
ICC
+/- 10%
TABLE 5. 7809LP DIGITAL INPUTS
(SPECIFIED PERFORMANCE -40 TO +85°C)
PARAMETER
VIL
VIH
IIL, IIH
SUBGROUPS
MIN
TYP
MAX
UNIT
1, 2, 3
-0.3
2.0
--
----
0.8
VD + 0.3
±10
V
V
µA
01.11.05 Rev 7
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4
©2005 Maxwell Technologies
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Memory
3. Typical rms noise at worst case transitions and temperatures.
7809LP
16-Bit Latchup Protected Analog to Digital Converter
TABLE 6. 7809LP ANALOG INPUT AND THROUGHPUT SPEED
(SPECIFIED PERFORMANCE -40 TO +85°C)
PARAMETER
SUBGROUPS
MIN
TYP
Voltage Ranges
MAX
UNIT
10 V, 0 V to 5 V
See Table 2.
Impedance
Capacitance1
1, 2, 3
--
35
--
pF
Conversion Time
9, 10, 11
--
7.6
8
µs
Complete Cycle (Acquire and Convert)
9, 10, 11
--
--
10
µs
9, 10, 11
100
--
--
kHz
Throughput Rate 2
1. Guarenteed by design.
2. Tested by application of signal.
TABLE 7. 7809LP AC ACCURACY SPECIFICATIONS
Memory
(SPECIFIED PERFORMANCE -40 TO +85°C)
PARAMETER
SUBGROUPS
MIN
TYP
MAX
UNIT
Spurious-Free Dynamic Range, fIN = 20 kHz 1
4, 5, 6
90
100
--
dB 2
Total Harmonic Distortion, fIN = 20 kHz 1
4, 5, 6
--
-100
-90
dB
Signal-to-Noise (Noise + Distortion) 1
fIN = 20 kHz
-60 dB Input
4, 5, 6
83
--
88
30
---
83
88
--
dB
--
250
--
kHz
Signal-to-Noise 1, fIN = 20 kHz
Full-Power Bandwidth 1,3
9, 10, 11
dB
1. Guaranteed by design.
2. All specifications in dB are referred to a full-scale ±10 V input.
3. Full-Power Bandwidth defined as Full-Scale input frequency at which Signal-to-Noise (Noise + Distortion) degrades to 60 dB.
TABLE 8. 7809LP SAMPLING DYNAMICS
(SPECIFIED PERFORMANCE -40 TO +85°C)
PARAMETER
SUBGROUPS
MIN
TYP
MAX
UNIT
Aperture Delay
9, 10, 11
--
40
--
ns
Aperture Jitter
9, 10, 11
Transient Response FS Step
9, 10, 11
--
2
--
us
Overvoltage Recovery 1
9, 10, 11
--
150
--
ns
Sufficient to meet AC specification
1. Recovers to specified performance after 2 X FS input overvoltage.
01.11.05 Rev 7
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5
©2005 Maxwell Technologies
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7809LP
16-Bit Latchup Protected Analog to Digital Converter
TABLE 9. 7809LP REFERENCE
(SPECIFIED PERFORMANCE -40 TO +85°C)
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNIT
Internal Reference Voltage
No Load
2.48
2.5
2.52
V
Internal Reference Source Current (Must be
ext. buffer)
--
1
--
µA
External Reference Voltage Range for Specified Linearity 1
2.3
2.5
2.7
V
--
--
100
µA
External Reference Current Drain
Ext. 2.5000V Ref
1. Tested by application of signal.
TABLE 10. 7809LP DIGITAL OUTPUTS
(SPECIFIED PERFORMANCE -40 TO +85°C)
SUBGROUPS
Data Format
Data Coding
Pipeline Delay
CONDITIONS
MIN
TYP
MAX
UNIT
Memory
PARAMETER
Serial 16-bits
Binary Two’s Complement or Straight Binary
Conversion results only available after completed conversion
Selectable for internal or external data clock
Data Clock
Internal (Output Only When
9, 10, 11
EXT/INT Low
-Transmitting Data)
EXT/INT High
0.1
External (Can Run Continually)
2.3
--
-10
MHz
VOL
VOH
1, 2, 3
ISINK = 1.6 mA
ISOURCE = 500 µ A
-4
---
0.4
--
V
Leakage Current 1
1, 2, 3
High-Z State,
VOUT = 0V to VDIG
--
--
±10
µA
Output Capacitance 1
1, 2, 3
High-Z State
--
15
--
pF
1. Not tested.
TABLE 11. 7809LP POWER SUPPLIES
(SPECIFIED PERFORMANCE -40 TO +85°C)
PARAMETER
SUBGROUPS
CONDITIONS
MIN
TYP
MAX
UNIT
Must be < VANA
4.75
5
5.25
V
VDIG
1, 2, 3
VANA
1, 2, 3
4.75
5
5.25
V
IDIG
1, 2, 3
--
0.3
--
mA
IANA
1, 2, 3
--
16
--
mA
Power Dissipation
PWRD LOW
PWRD HIGH
1, 2, 3
---
---
132
100
mW
VANA = VDIG = 5V
fs = 100 kHz
01.11.05 Rev 7
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7809LP
16-Bit Latchup Protected Analog to Digital Converter
TABLE 12. 7809LP CONTROL LINE FUNCTIONS FOR READ AND CONVERT
SPECIFIC FUNCTION
CS
R/C
BUSY
EXT/INT
DATACL
K
PWRD
Initiate Conversion and Output
Data using Internal Clock
1>0
0
1
0
Output
0
x
0
1>0
1
0
Output
0
x
SB/BTC OPERATION
Initiates conversion “n”.
Data from conversion “n1” clocked out on DATA
synchronized to 16 clock
pulses output on DATACLK
Initiates conversion “n”.
Data from conversion “n1” clocked out on DATA
synchronized to 16 clock
pulses output on DATACLK
1>0
0
1
1
Input
0
x
Initiates conversion “n”
0
1>0
1
1
Input
0
x
Initiates conversion “n”
1>0
1
1
1
Input
x
x
1>0
1
0
1
Input
0
x
Outputs a pulse on SYNC
followed by data from conversion “n” clocked out
synchronized to external
DATACLK.
0
0>1
0
1
Input
0
x
Outputs a pules on SYNC
followed by data from conversion “n-1” clocked out
synchronized to external
DATACLK 1. Conversion
“n” in process.
Outputs a pulse on SYNC
followed by data from conversion “n-1” clocked out
synchronized to external
DATACLK 1. Conversion
“n” in process.
Incorrect Conversions
0
0
0>1
x
x
0
x
CS or R/C must be HIGH
or a new conversion will
be initiated without time
for acquisition
Power Down
x
x
x
x
x
0
x
x
x
x
x
x
1
x
Analog circuitry powered.
Conversion will be initiated without time for
acquisition
Analog circuitry disabled.
Data from previous conversion maintained in output registers
01.11.05 Rev 7
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Memory
Initiate Conversion and Output
Data using External Clock
7809LP
16-Bit Latchup Protected Analog to Digital Converter
TABLE 12. 7809LP CONTROL LINE FUNCTIONS FOR READ AND CONVERT
SPECIFIC FUNCTION
CS
R/C
BUSY
EXT/INT
DATACL
K
PWRD
Selecting Output
Format
x
x
x
x
x
x
0
3
x
x
x
x
x
x
1
SB/BTC OPERATION
Serial data is output in
Binary Two’s Complement format.
Serial data is output in
Straight Binary format.
1. See Figure 4 for constraints on previous data valid during conversion.
TABLE 13. 7809LP INPUT RANGE CONNECTION
CONNECT R1IN VIA 200Ω CONNECT R2IN VIA 100Ω
IMPEDANCE
AGND
CAP
22.9 kΩ
AGND
VIN
CAP
13.3 kΩ
±3.3V
VIN
VIN
CAP
10.7 kΩ
0V to 10V
AGND
VIN
AGND
13.3kΩ
0V to 5V
AGND
AGND
VIN
10.0 kΩ
0V to 4V
VIN
AGND
VIN
10.7 kΩ
TO
TO
±10V
VIN
±5V
Memory
CONNECT R3IN TO
ANALOG INPUT RANGE
TABLE 14. 7809LP CONVERSION AND DATA TIMING
(TA = -40 ° C TO 85 ° C UNLESS OTHERWISE SPECIFIED)
SYMBOL
DESCRIPTION
SUBGROUPS
MIN
TYP
MAX
UNIT
t1
Convert Pulse Width
9, 10, 11
40
--
6000
ns
t2
BUSY Delay
9, 10, 11
--
--
65
ns
t3
BUSY LOW
9, 10, 11
--
--
8
µs
t4
BUSY Delay after End of Conversion
9, 10, 11
--
220
--
ns
t5
Aperture Delay
9, 10, 11
--
40
--
ns
t6
Conversion Time
9, 10, 11
--
7.6
8
µs
t7
Acquisition Time
9, 10, 11
--
--
2
µs
t6 + t7
Throughput Time
9, 10, 11
--
9
10
µs
t8
R/C Low to DATACLK Delay
9, 10, 11
--
450
--
ns
t9
DATACLK Period
9, 10, 11
--
440
--
ns
t10
Data Valid to DATACLK HIGH Delay
9, 10, 11
20
75
--
ns
t11
Data Valid after DATACLK LOW
Delay
9, 10, 11
100
125
--
ns
t12
External DATACLK
9, 10, 11
100
--
--
ns
01.11.05 Rev 7
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7809LP
16-Bit Latchup Protected Analog to Digital Converter
TABLE 14. 7809LP CONVERSION AND DATA TIMING
(TA = -40 ° C TO 85 ° C UNLESS OTHERWISE SPECIFIED)
SYMBOL
DESCRIPTION
SUBGROUPS
MIN
TYP
MAX
UNIT
t13
External DATACLK HIGH
9, 10, 11
20
--
--
ns
t14
External DATACLK LOW
9, 10, 11
30
--
--
ns
t15
DATACLK HIGH Setup Time
9, 10, 11
20
--
t12 + 5
ns
t16
R/C to CS Setup Time
9, 10, 11
10
--
--
ns
t17
SYNC Delay After DATACLK High
9, 10, 11
15
--
35
ns
t18
Data Valid Delay
9, 10, 11
25
--
55
ns
t19
CS to Rising Edge Delay
9, 10, 11
25
--
--
ns
t20
Data Available after CS LOW
9, 10, 11
6
--
--
µs
TABLE 15. 7809LP CONVERSION DATA TIMING
DESCRIPTION
BINARY TWO’S
COMPLEMENT (SB/BTC
LOW)
ANALOG INPUT
BINARY CODE
Full Scale
Range
±10
±5
±3.33V
0V to
10V
Least Significant Bit (LSB)
305 µ V
153 µ V
102 µ V
153 µ V
+ Full Scale
(FS - 1 LSB)
9.99969 4.99984 3.33323 9.99984 4.99992 3.99993
5V
7V
1V
7V
4V
8V
Midscale
One LSB
Below Midscale
-Full Scale
0V
0V
0V
5V
-5V
3.33333
3V
0V
STRAIGHT BINARY
(SB/BTC HIGH)
BINARY CODE
HEX
CODE
0V to 5V 0V to 4V
76 µ V
2.5V
61 µ V
2V
-305 µ V -153 µ V -102 µ V 4.99984 2.49992 1.99993
7V
4V
9V
-10V
HEX
CODE
Memory
DIGITAL OUTPUT
0V
01.11.05 Rev 7
0V
0111 1111
1111 1111
7FFF
1111 1111
1111 1111
FFFF
0000 0000
0000 0000
0000
1000 0000
0000 0000
8000
1111 1111
1111 1111
FFFF
0111 1111
1111 1111
7FFF
1000 0000
0000 0000
8000
0000 0000
0000 0000
0000
All data sheets are subject to change without notice
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©2005 Maxwell Technologies
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16-Bit Latchup Protected Analog to Digital Converter
7809LP
FIGURE 1. CONVERSION TIMING
FIGURE 2. SERIAL DATA TIMING USING INTERNAL CLOCK (CS, EXT/INT AND TAG TIED LOW)
Memory
FIGURE 3. CONVERSION AND READ TIMING WITH EXTERNAL CLOCK (EXT/INT TIED HIGH). READ AFTER
CONVERSION
01.11.05 Rev 7
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16-Bit Latchup Protected Analog to Digital Converter
7809LP
FIGURE 4. CONVERSION AND READ TIMING WITH EXTERNAL CLOCK (EXT/INT TIED HIGH). READ DURING
CONVERSION
Memory
01.11.05 Rev 7
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©2005 Maxwell Technologies
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16-Bit Latchup Protected Analog to Digital Converter
7809LP
FIGURE 5. OFFSET/GAIN CIRCUITS FOR UNIPOLAR INPUT RANGES
Memory
01.11.05 Rev 7
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©2005 Maxwell Technologies
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16-Bit Latchup Protected Analog to Digital Converter
7809LP
FIGURE 6. OFFSET/GAIN CIRCUITS FOR BIPOLAR INPUT RANGES
Memory
01.11.05 Rev 7
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13
©2005 Maxwell Technologies
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16-Bit Latchup Protected Analog to Digital Converter
7809LP
LPTTM Operation
Latchup Protection Technology (LPTTM) automatically detects an increase in the supply current of the 7809LP converter due to a single event effect and internally cycles the power to the converter off, then on, which restores the
steady state operation of the device. A simplified block diagram of the 7809LP circuitry is shown in Figure 7. The
LPTTM circuitry consists of two power switch and current sensor blocks, an LPTTM controller block, a BIT current load
block, and an active input protection block.
Figure 7. 7809LP Simplified Block Diagram
Memory
The power switch/current sensor blocks sense the supply current drawn by the protected device on the analog and
digital supply pins. When a threshold level is exceeded on either supply line, indicating single event induced latchup of
the protected device, a signal is sent to the LPTTM controller block. The LPTTM controller then drives the power
switches to an off state which removes the power supplies from the protected device. At the same time, a signal is
sent to open the active input protection circuits and the LPSTATUS output pin is activated. After a period of time sufficient to clear the latchup, the LPTTM controller drives the power switches and input protection back to the on state
restoring the operation of the protected device. The LPTBIT circuit is used during system test to electrically trigger the
latchup function by drawing current through the power switch/current sensor blocks sufficient to trigger the LPTTM protection.
01.11.05 Rev 7
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14
©2005 Maxwell Technologies
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16-Bit Latchup Protected Analog to Digital Converter
7809LP
Differences Between the 7809LP and the ADS7809
Because the 7809LP uses the ADS7809 die to perform the analog to digital conversion function, its operation and performance is very similar to the ADS7809 packaged part from Burr-Brown. In general the operation and application will
be the same for both parts. There are three primary differences: the operation of the supply pins, the operation of the
additional LPBIT and LPSTATUS pins, and the operation of the I/O pins when a latchup is detected.
The ADS7809 provides separate analog and digital supply pins, VANA and VDIG. These same supply pins on the
7809LPRP should be connected to the analog and digital supplies. There is no limit to the capacitance that can be
connected to these pins in the system application.
The LPBIT input provides a means to electrically test the LPTTM circuit. A high level on the this pin causes a preset
current to be drawn in addition to the normal device current through the analog and digital current sensors. If the high
level is maintained for a sufficient duration, it will trigger the LPTTM circuit which will cycle the power to the protected
device. If the LPBIT remains high, the LPTTM circuit will continuously cycle the supply voltages off then on. Driving this
input with a 10 µ s high level pulse is sufficient duration to assure the LPTTM circuit cycles the power off then on one
time only.
A high level on the LPSTATUS output indicates that the LPTTM circuit has removed power from the protected device.
The LPSTATUS returns low when the power is restored. LPSTATUS can be used to generate an input to the system
data processor indicating that an LPTTM cycle has occurred and the protected device output accuracy may not be met
until after the respective recovery time to the event.
During the time that power is removed from the protected device, it is critical that external circuitry driving the device I/
O pins does not back-drive the device supply through input protection diodes or similar integrated structures. Backdriving of the supply through the device I/O pins could contribute to an extended or even a permanent latchup condition. For the ADS7809 testing has shown that for the normal signal range of operation on the analog input pins R1IN,
R2IN, and R3IN, latchup will not be sustained.
In order to prevent back-driving the supply from the digital I/O pins DATA, SYNC, TAG, R/C, CS, and PWRD, the
7809LP incorporates active input protection circuits. These circuits act as transmission gates in series with the digital
inputs. During normal operation, these gates are on and present low resistance connections between the package
input pins and the respective die pins. When the LPTTM circuit detects a latchup, these gates are switched off and
present a high resistance path between the package inputs and the die inputs. The protected I/O pins are crow barred
during the latchup. The bidirectional signal, DATACLK, is also protected by a transmission gate.
01.11.05 Rev 7
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All rights reserved.
Memory
The 7809LP package also provides access to the ADS7809 die supply pins with the LPVANA and LPVDIG pins. The
signal paths between the supply input pins and the respective die supply pins are low resistance during normal device
operation. When an excessive supply current due to a single event latchup is sensed on either of the supply pins, the
LPTTM circuit opens both paths to the die supply pins allowing the latchup condition to clear. The LPVANA and LPVDIG pins allow access to the current sense circuitry for electrical testing at the component level and provide optimal
locations for attaching supply decoupling capacitors. CAUTION: The LPVANA and LPVDIG pins must not be connected to the respective power supplies since this will defeat the LPTTM power switch and could result in permanent
latchup of the device during operation in a radiation environment. Electrolytic capacitors should not be connected to
these decoupling pins because the large capacitance will increase the recovery time of the 7809LP. Low ESR ceramic
capacitors should be used with a maximum of .2µ F per pin.
7809LP
16-Bit Latchup Protected Analog to Digital Converter
Dedicated digital outputs are not similarly protected since in most applications there will be no appreciable drive signal
on these outputs to back-drive the pins. Pull up resistors on these outputs should be 10 KΩ or greater to limit the
back-drive current. Low on resistance, transmission gate circuits are also connected between the package pins and
the die REF and CAP pins. These gates minimize the transient loading on the external filter capacitors required on
these pins. This greatly reduces the single event recovery time of the 7809LP to full accuracy after an LPTTM cycle.
During an LPTTM cycle, all outputs of the 7809LP are invalid and unpredictable until after the functional recovery time.
After the functional recovery time, data conversions occur with a degraded accuracy until the full accuracy recovery
time.
A summary of the pin differences between the ADS7809 and the 7809LP is provided in the table below.
TABLE 15. ADS7809 AND 7809LP PIN DIFFERENCES
ADS7809
7809LPRP
PIN DIFFERENCE DESCRIPTION
1-10
Various
Various
Equivalent function to ADS7809 pins 1-10 respectively. Timing specifications
change slightly (0 - 10 ns) for the 7809LPRP due to the latchup protection circuitry
on ADS7809 die inputs.
15-22
Various
Various
Equivalent function to ADS7809 pins 11-18 respectively. Timing specifications
change slightly (0 - 10 ns) for the 7809LPRP due to the latchup protection circuitry
on ADS7809 die inputs.
11
--
LPBIT
A built in test function of latchup protection. A TTL high level pulse for > 5 microseconds duration on this input will trigger latchup protection of the device. This input
shall be low during normal operation.
12
--
13
VANA
VANA
Equivalent function to ADS7809 pin 19. Analog Supply Input.
14
VDIG
VDIG
Equivalent function to ADS7809 pin 20. Digital Supply Input.
23
--
LPVANA
Latchup protected analog supply pin to the ADS7809 die. Decouple to analog
ground with 0.1 µ F ceramic capacitor. Do not exceed 0.2 µ F. Do not connect to
VDIG and/or VANA.
24
--
LPVDIG
Latchup protected digital supply pin to the ADS7809 die. Decouple to digital ground
with 0.1 µ F ceramic capacitor. Do not exceed 0.2 µ F. Do not connect to VDIG and/
or VANA.
LPSTATUS Latchup protection status output. This TTL level output is low during normal operation and goes high during a 10 µ s decision time period prior to power being
removed. If the latch up current does not last at least 10 µ s then LPTSTATUS will
go low (inactive) after the 10 µ s decision period without power being removed.
When latchup protection is triggered, this output will go high for the duration of the
time that power is removed from the protected device (50 µ s). All output except
LPSTATUS are invalid during the time that power is removed from the ADS7809
die. This output foes low within 1 us of the power being re-applied to the protected
device. Functional operation of the device is within ~25 µ s after the LPSTATUS
output returns low with degraded accuracy due to the latchup filter circuitry. Full
accuracy is restored ~5 ms later. This output can be used to inform the system processor of the latchup protection trigger and the subsequent degraded accuracy in
the 7809LPRP output data. Output pull-up resistors should be 10kΩ or larger on
outputs. I/O pins must not be driven high while this signal is active.
01.11.05 Rev 7
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All rights reserved.
Memory
PIN NUMBER
16-Bit Latchup Protected Analog to Digital Converter
7809LP
Testing the 7809LPRP Latchup Protection Circuitry
The LPVANA and LPVDIG pins provide direct access to the 7809LP converter supply pins for attaching external
decoupling capacitors to ground. These pins can also be used to test the LPTTM operation and threshold level by sinking a pulsed current load to ground as shown in the test circuit in Figure 8. The most accurate threshold current measurements are made with the ADS7809 in its lowest power state (PWRD = 5V).
The LPTTM operation and device recovery times are most easily measured using the LPBIT input to trigger protection
and recovery. Applying a 10 µ sec high duration TTL level to the LPBIT pin causes internal test currents sufficient to
trigger the LPTTM circuit to be drawn through both the analog and digital supply sense circuits.
LPTTM operating characteristics are summarized in Table 16 according to the timing diagram shown in Figure 9. During the time that the power is cycled, output signals and data from the 7809LP are invalid. The LPSTATUS signal high
indicates that power is removed from the ADS7809 die. When this signal is low, power is applied to the ADS7809 die.
The LPSTATUS signal is used to measure the supply recovery time. The supply recovery time interval starts when the
supply current rises (causing LPSTATUS to go high) and ends when the LPSTATUS signal stabilizes low again.
TABLE 16. 7809LP LPTTM OPERATING CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS
TYP
UNIT
Supply Threshold Current
ITHR
PWRD = 5V
75
mA
Protection Time
TPT
LPBIT = 2.4V for 5 µ s
10
µ sec
Supply Recovery Time
TSR
LPBIT = 2.4V for 5 µ s
50
µ sec
Functional Recovery Time
TFR
LPBIT = 2.4V for 5 µ s
TSR + 25
µ sec
8-bit Accuracy Recovery Time
T8R
LPBIT = 2.4V for 5 µ s
80
µ sec
Full Accuracy Recovery Time
TFAR
LPBIT = 2.4V for 5 µ s
5
msec
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17
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Memory
Within the functional recovery time interval (~25 µ sec after the LPTTM circuit reapplies power), the normal functional
operation of the converter is restored with less than 5% full scale error. Additional settling time is then required to
return to full accuracy operation. Recovery time intervals are defined which indicate the time to recover first to within 8
bit accuracy, then to within 12 bit accuracy, and finally to full 16 bit accuracy. These recovery times are primarily due to
the single event and power cycling effects on the reference circuits and the settling times of their respective filter
capacitors.
16-Bit Latchup Protected Analog to Digital Converter
7809LP
FIGURE 8. 7809LP LPTTM TEST CIRCUIT
C4
GND
U?
R1
-7.5V
200
R2
R3
+ C1
2.2UF
GND
100
22.9K
+ C2
2.2UF
1
2
3
4
5
6
7
8
9
10
11
12
GND
R1IN
LPVDIG
AGND1
LPVANA
R2IN
PWRD
R3IN
BUSY
CAP
CS
REF
R/C
AGND2
TAG
SB/BTC
DATA
EXT/INT DATACLK
DGND
SYNC
LPBIT
VDIG
LPSTATUS VANA
.1UF
C4
.1UF
S1
24
23
22
21
20
19
18
17
16
15
14
13
DIGITAL
CONTROL
AND
MONITORING
D1
1N4149
D2
GND
GND
7809LPRP
Q1
2N2369A
R3
PULSE GENERATOR 2
IS
+5V
PULSE GENERATOR 1
+ C3
10UF
50
1N4149
GND
5 USEC PULSEWIDTH
RT/FT < 10 NS
2.4V
20 USEC PULSEWIDTH
0V
-VP
GND
.4V
Memory
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18
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16-Bit Latchup Protected Analog to Digital Converter
7809LP
FIGURE 9. 7809LP LPTTM TIMING DIAGRAM
2.4V
PULSE GENERATOR 1
LPBIT
.4V
0V
PULSE GENERATOR 2
-VP
CHARGE CURRENT INTO
DECOUPLING CAPACITOR
IS PEAK
ITHR
SUPPLY CURRENT (IS)
IS (TYP)
IS (TYP)
0
TPT
TSR
5V
LPSTATUS
0V
OUTPUTS
VALID
Memory
ALL OUTPUTS
OUTPUTS
VALID
OUTPUTS
INVALID
FULL SCALE (F.S.)
<1/20 F.S.
FULL
ACCURACY
<1/256 F.S.
FULL
<1/4096 F.S. ACCURACY
OUTPUT DATA
ERROR
>-1/20 F.S.
- FULL SCALE
TFR
T8R
T12R
TFAR
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16-Bit Latchup Protected Analog to Digital Converter
7809LP
FIGURE 10. SEL CROSS SECTION
Memory
FIGURE 11. SEU CROSS SECTION
01.11.05 Rev 7
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20
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16-Bit Latchup Protected Analog to Digital Converter
7809LP
Memory
24-PIN RAD-PAK® FLAT PACKAGE
DIMENSION
SYMBOL
MIN
NOM
MAX
A
0.255
0.278
0.302
b
0.015
0.017
0.022
c
0.006
0.008
0.010
D
--
0.596
0.640
E
0.900
0.400
0.410
E1
--
--
0.440
E2
0.268
0.270
0.272
E3
0.055
0.065
--
e
0.050 BSC
L
0.420
0.430
0.045
Q
0.040
0.045
0.006
S1
0.006
0.014
--
N
24
Note: All dimensions in inches
01.11.05 Rev 7
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16-Bit Latchup Protected Analog to Digital Converter
7809LP
Important Notice:
These data sheets are created using the chip manufacturers published specifications. Maxwell Technologies verifies
functionality by testing key parameters either by 100% testing, sample testing or characterization.
The specifications presented within these data sheets represent the latest and most accurate information available to
date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no
responsibility for the use of this information.
Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems
without express written approval from Maxwell Technologies.
Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Technologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts.
Memory
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22
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7809LP
16-Bit Latchup Protected Analog to Digital Converter
Product Ordering Options
Model Number
7809LP
RP
F
X
Option Details
Feature
Multi Chip Module (MCM)1
K = Maxwell Self-Defined Class K
H = Maxwell Self-Defined Class H
I = Industrial (testing @ -40°C,
+25°C, +85°C)
E = Engineering (testing @ +25°C)
Package
F = Flat Pack
Radiation Feature
RP = RAD-PAK® package
Base Product
Nomenclature
16-Bit Latchup Protected Analog
to Digital Converter
Memory
Screening Flow
1) Products are manufactured and screened to Maxwell Technologies self-defined Class H and Class K flows.
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