MOSEL V29C51000T

PRELIMINARY
V29C51000T/V29C51000B
512K BIT (65,536 x 8 BIT)
5 VOLT CMOS FLASH MEMORY
MOSEL VITELIC
Features
Description
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The V29C51000T/V29C51000B is a high speed
65,536 x 8 bit CMOS flash memory. Programming
or erasing the device is done with a single 5 Volt
power supply. The device has separate chip enable
CE, program enable WE, and output enable OE
controls to eliminate bus contention.
The V29C51000T/V29C51000B offers a combination of features: Boot Block with Sector Erase
Mode. The end of program/erase cycle is detected
by DATA Polling of I/O7 or by the Toggle Bit I/O6.
The V29C51000T/V29C51000B features a
sector erase operation which allows each sector to
be erased and reprogrammed without affecting
data stored in other sectors. The device also
supports full chip erase.
Boot block architecture enables the device to
boot from either the top (V29C51000T) or bottom
(V29C51000B) sector. All inputs and outputs are
CMOS and TTL compatible.
The V29C51000T/V29C51000B is ideal for
applications that require updatable code and data
storage.
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64Kx8-bit Organization
Address Access Time: 45, 70, 90 ns
Single 5V ± 10% Power Supply
Sector Erase Mode Operation
8KB Boot Block (lockable)
512 bytes per Sector, 128 Sectors
– Sector-Erase Cycle Time: 10ms (Max)
– Byte-Program Cycle Time: 20µs (Max)
Minimum 10,000 Erase-Program Cycles
Low power dissipation
– Active Read Current: 20mA (Typ)
– Active Program Current: 30mA (Typ)
– Standby Current: 100µA (Max)
Hardware Data Protection
Low VCC Program Inhibit Below 3.2V
Self-timed program/erase operations with endof-cycle detection
– DATA Polling
– Toggle Bit
CMOS and TTL Interface
Available in two versions
– V29C51000T (Top Boot Block)
– V29C51000B (Bottom Boot Block)
Packages:
– 32-pin Plastic DIP
– 32-pin TSOP-I
– 32-pin PLCC
Device Usage Chart
Operating
Temperature
Range
Package Outline
P
T
J
45
70
90
Temperature
Mark
0°C to 70°C
•
•
•
•
•
•
Blank
V29C51000T/V29C51000B Rev. 0.5 October 2000
Access Time (ns)
1
MOSEL VITELIC
V
V29C51000T/V29C51000B
29
C
51 000
T
–
DEVICE
OPERATING VOLTAGE
51: 5V
BOOT BLOCK LOCATION
T: TOP
B: BOTTOM
SPEED
PKG.
1
2
3
4
5
6
7
A4
A3
A2
A1
A0
I/O0
I/O1
I/O2
GND
8
9
10
11
12
13
14
15
16
BLANK (0°C TO 70°C)
P = PDIP
T = TSOP-I
J = PLCC
45: 45ns
70: 70ns
90: 90ns
51000-01
Pin Configurations
N/C
N/C
A15
A12
A7
A6
A5
TEMP.
Pin Names
32
31
30
29
28
27
32-Pin PDIP 26
Top View 25
24
23
22
21
20
19
18
17
VCC
WE
NC
A14
A13
A8
A9
A11
OE
A10
CE
I/O7
I/O6
I/O5
I/O4
I/O3
A0–A15
Address Inputs
I/O0–I/O7
Data Input/Output
CE
Chip Enable
OE
Output Enable
WE
Program Enable
VCC
5V ± 10% Power Supply
GND
Ground
NC
No Connect
2
NC
NC
NC
3
WE
A15
4
VCC
A12
51001-02
1 32 31 30
A7
5
29
A14
A6
A5
A4
A3
A2
A1
A0
I/O0
6
28
7
27
A13
A8
A9
A11
OE
A10
CE
I/O7
8
26
32 Pin PLCC
Top View
9
25
10
24
11
23
12
22
21
13
14 15 16 17 18 19 20
A11
A9
A8
A13
A14
NC
WE
VCC
N/C
N/C
A15
A12
A7
A6
A5
A4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32-Pin TSOP I
Standard Pinout
Top View
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
I/O6
I/O5
I/O4
I/O3
GND
I/O2
I/O1
51001-04
V29C51000T/V29C51000B Rev. 0.5 October 2000
51001-03
2
OE
A10
CE
I/O7
I/O6
I/O5
I/O4
I/O3
GND
I/O2
I/O1
I/O0
A0
A1
A2
A3
MOSEL VITELIC
V29C51000T/V29C51000B
Functional Block Diagram
65,536 Bit
Memory Cell Array
X-Decoder
A0–A15
Address buffer & latches
CE
OE
WE
Control Logic
Y-Decoder
I/O Buffer & Data Latches
I/O0–I/O7
51001-05
Capacitance (1,2)
Symbol
Parameter
CIN
Input Capacitance
COUT
Output Capacitance
CIN2
Control Pin Capacitance
Test mSetup
Typ.
Max.
Units
VIN = 0
6
8
pF
VOUT = 0
8
12
pF
VIN = 0
8
10
pF
NOTE:
1. Capacitance is sampled and not 100% tested.
2. TA = 25°C, VCC = 5V ± 10%, f = 1 MHz.
Latch Up Characteristics(1)
Parameter
Min.
Max.
Unit
Input Voltage with Respect to GND on A9, OE
-1
+13
V
Input Voltage with Respect to GND on I/O, address or control pins
-1
VCC + 1
V
-100
+100
mA
VCC Current
NOTE:
1. Includes all pins except VCC. Test conditions: VCC = 5V, one pin at a time.
AC Test Load
+5.0 V
IN3064
or Equivalent
2.7 kΩ
Device Under
Test
IN3064 or Equivalent
CL = 100 pF
6.2 kΩ
IN3064 or Equivalent
IN3064 or Equivalent
51001-06
V29C51000T/V29C51000B Rev. 0.5 October 2000
3
MOSEL VITELIC
V29C51000T/V29C51000B
Absolute Maximum Ratings(1)
Symbol
Parameter
Commercial
Unit
VIN
Input Voltage (input or I/O pins)
-2 to +7
V
VIN
Input Voltage (A9 pin, OE)
-2 to +13
V
VCC
Power Supply Voltage
-0.5 to +5.5
V
TSTG
Storage Temerpature (Plastic)
-65 to +125
°C
TOPR
Operating Temperature
0 to +70
°C
IOUT
Short Circuit Current(2)
200 (Max.)
mA
NOTE:
1. Stress greater than those listed unders “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. No more than one output maybe shorted at a time and not exceeding one second long.
DC Electrical Characteristics
(over the commercial operating range)
Parameter
Name
Parameter
Test Conditions
VIL
Input LOW Voltage
VIH
Min.
Max.
Unit
VCC = VCC Min.
—
0.8
V
Input HIGH Voltage
VCC = VCC Max.
2
—
V
IIL
Input Leakage Current
VIN = GND to VCC, VCC = VCC Max.
—
±1
µA
IOL
Output Leakage Current
VOUT = GND to VCC, VCC = VCC Max.
—
±1
µA
VOL
Output LOW Voltage
VCC = VCC Min., IOL = 2.1mA
—
0.4
V
VOH
Output HIGH Voltage
VCC = VCC Min, IOH = -400µA
2.4
—
V
ICC1
Read Current
CE = OE = VIL, WE = VIH, all I/Os open,
Address input = VIL/VIH, at f = 1/tRC Min.,
VCC = VCC Max.
—
40
mA
ICC2
Program Current
CE = WE = VIL, OE = VIH, VCC = VCC Max.
—
50
mA
ISB
TTL Standby Current
CE = OE = WE = VIH, VCC = VCC Max.
—
2
mA
ISB1
CMOS Standby Current
CE = OE = WE = VCC – 0.3V, VCC = VCC Max.
—
100
µA
VH
Device ID Voltage for A9
CE = OE = VIL, WE = VIH
11.5
12.5
V
IH
Device ID Current for A9
CE = OE = VIL, WE = VIH, A9 = VH Max.
—
50
µA
V29C51000T/V29C51000B Rev. 0.5 October 2000
4
MOSEL VITELIC
V29C51000T/V29C51000B
AC Electrical Characteristics
(over all temperature ranges)
Read Cycle
Parameter
Name
-45
Parameter
-70
-90
Min.
Max.
Min.
Max.
Min.
Max.
Unit
tRC
Read Cycle Time
45
—
70
—
90
—
ns
tAA
Address Access Time
—
45
—
70
—
90
ns
tACS
Chip Enable Access Time
—
45
—
70
—
90
ns
tOE
Output Enable Access Time
—
25
—
35
—
45
ns
tCLZ
CE Low to Output Active
0
—
0
—
0
—
ns
tOLZ
OE Low to Output Active
0
—
0
—
0
—
ns
tDF
Output Enable or Chip Disable to Output in
High Z
0
20
0
20
0
30
ns
tOH
Output Hold from Address Change
0
—
0
—
0
—
ns
Program (Erase/Program) Cycle
Parameter
Name
-45
Parameter
-70
-90
Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Unit
tWC
Program Cycle Time
45
—
—
70
—
—
90
—
—
ns
tAS
Address Setup Time
0
—
—
0
—
—
0
—
—
ns
tAH
Address Hold Time
35
—
—
45
—
—
45
—
—
ns
tCS
CE Setup Time
0
—
—
0
—
—
0
—
—
ns
tCH
CE Hold Time
0
—
—
0
—
—
0
—
—
ns
tOES
OE Setup Time
0
—
—
0
—
—
0
—
—
ns
tOEH
OE High Hold Time
0
—
—
0
—
—
0
—
—
ns
tWP
WE Pulse Width
25
—
—
35
—
—
45
—
—
ns
WE Pulse Width High
20
—
—
35
—
—
38
—
—
ns
tDS
Data Setup Time
20
—
—
25
—
—
30
—
—
ns
tDH
Data Hold Time
0
—
—
0
—
—
0
—
—
ns
tWHWH1
Programming Cycle
—
—
20
—
—
20
—
—
20
µs
tWHWH2
Sector Erase Cycle
—
—
10
—
—
10
—
—
10
ms
tWHWH3
Chip Erase Cycle
—
500
—
—
500
—
—
500
—
ms
tWPH
V29C51000T/V29C51000B Rev. 0.5 October 2000
5
MOSEL VITELIC
V29C51000T/V29C51000B
Waveforms of Read Cycle
tRC
ADDRESS
tAA
tCE
CE
tOE
tDF
OE
tOLZ
WE
tCLZ
HIGH-Z
I/O
tOH
VALID DATA OUT
HIGH-Z
VALID DATA OUT
51000-07
tAA
Waveforms of WE Controlled-Program Cycle
3rd bus cycle
tWC
tAS
5555H
ADDRESS
PA(2)
PA
tCH
tRC
tAH
CE
OE
tOES
tWHWH1
tWP
WE
tDF
tWPH
tCS
tDS
tOE
tDH
I/O
A0H
PD(3)
I/O7(1)
DOUT
tOH
51000-08
NOTES:
1. I/O7: The output is the complement of the data written to the device.
2. PA: The address of the memory location to be programmed.
3. PD: The data at the byte address to be programmed.
V29C51000T/V29C51000B Rev. 0.5 October 2000
6
MOSEL VITELIC
V29C51000T/V29C51000B
Waveforms of CE Controlled-Program Cycle
tWC
ADDRESS
5555H
PA(1)
PA
tAS
tRC
tAH
WE
OE
tWP
tWHWH1
CE
tDF
tWPH
tOES
tDS
tOE
tDH
I/O
PD(2)
A0H
I/O7
DOUT
tOH
51000-09
Waveforms of Erase Cycle(1)
tWC
ADDRESS
tAS
5555H
2AAAH
5555H
5555H
2AAAH
SA
tAH
CE
OE
tWP
WE
tWPH
tCS
tDS
10H for
Chip Erase
tDH
I/O
AAH
55H
80H
AAH
55H
30H
51000-10
NOTES:
1. PA: The address of the memory location to be programmed.
2. PD: The data at the byte address to be programmed.
3. SA: The sector address for Sector Erase. Address = don’t care for Chip Erase.
V29C51000T/V29C51000B Rev. 0.5 October 2000
7
MOSEL VITELIC
V29C51000T/V29C51000B
Waveforms of DATA Polling Cycle
tCH
CE
tDF
tOE
OE
tOEH
tCE
WE
tOH
tWHWH1
I/O7
I/O0-I/O6
I/O7
I/O7
INVALID
I/O0-I/O6
VALID DATA OUT
VALID DATA OUT
HIGH-Z
HIGH-Z
51000-11
Waveforms of Toggle Bit Cycle
CE
tOEH
WE
OE
I/O6
51000-12
V29C51000T/V29C51000B Rev. 0.5 October 2000
8
MOSEL VITELIC
V29C51000T/V29C51000B
Functional Description
V29C51000T
The V29C51000T/V29C51000B consists of 256
equally-sized sectors of 512 bytes each. The 8 KB
lockable Boot Block is intended for storage of the
system BIOS boot code. The boot code is the first
piece of code executed each time the system is
powered on or rebooted.
The V29C51000 is available in two versions: the
V29C51000T with the Boot Block address starting
from E000H to FFFFH, and the V29C51000B with
the Boot Block address starting from 0000H to
FFFFH.
8KB Boot Block
V29C51000B
FFFFH
512
E000H
512
512
512
512
1FFFH
512
Read Cycle
0000H
0000H
8KB Boot Block
51000-13
A read cycle is performed by holding both CE
and OE signals LOW. Data Out becomes valid only
when these conditions are met. During a read cycle
WE must be HIGH prior to CE and OE going LOW.
WE must remain HIGH during the read operation
for the read to complete (see Table 1).
8KB Boot Block = 16 Sectors
Byte Program Cycle
The V29C51000T/V29C51000B is programmed
on a byte-by-byte basis. The byte program
operation is initiated by using a specific four-buscycle sequence: two unlock program cycles, a
program setup command and program data
program cycles (see Table 2).
During the byte program cycle, addresses are
latched on the falling edge of either CE or WE,
whichever is last. Data is latched on the rising edge
of CE or WE, whichever is first. The byte program
cycle can be CE controlled or WE controlled.
Output Disable
Returning OE or CE HIGH, whichever occurs first
will terminate the read operation and place the l/O
pins in the HIGH-Z state.
Standby
The device will enter standby mode when the CE
signal is HIGH. The l/O pins are placed in the
HIGH-Z, independent of the OE signal.
Sector Erase Cycle
The V29C51000T/V29C51000B features a
sector erase operation which allows each sector to
be erased and reprogrammed without affecting
data stored in other sectors. Sector erase operation
is initiated by using a specific six-bus-cycle
sequence: Two unlock program cycles, a setup
command, two additional unlock program cycles,
and the sector erase command (see Table 2). A
sector must be first erased before it can be
reprogrammed. While in the internal erase mode,
Command Sequence
The V29C51000T/V29C51000B does not
provide the “reset” feature to return the chip to its
normal state when an incomplete command
sequence or an interruption has happened. In this
case, normal operation (Read Mode) can be
restored by issuing a “non-existent” command
sequence, for example Address: 5555H, Data FFH.
Table 1. Operation Modes Decoding
Decoding Mode
CE
OE
WE
A0
A1
A9
I/O
Read
VIL
VIL
VIH
A0
A1
A9
READ
Program
VIL
VIH
VIL
A0
A1
A9
PD
Standby
VIH
X
X
X
X
X
HIGH-Z
Autoselect Device ID
VIL
VIL
VIH
VIH
VIL
VH
CODE
Autoselect Manufacture ID
VIL
VIL
VIH
VIL
VIL
VH
CODE
Output Disable
VIL
VIH
VIH
X
X
X
HIGH-Z
NOTES:
1. X = Don’t Care, VIH = HIGH, VIL = LOW.
2. PD: The data at the byte address to be programmed.
V29C51000T/V29C51000B Rev. 0.5 October 2000
9
MOSEL VITELIC
V29C51000T/V29C51000B
Table 2. Command Codes
First Bus
Program Cycle
Second Bus
Program Cycle
Third Bus
Program Cycle
Fourth Bus
Program Cycle
Fifth Bus
Program Cycle
Six Bus
Program Cycle
Command
Sequence
Address
Data
Address
Data
Address
Data
Address
Data
Address
Data
Address
Data
Read
XXXXH
F0H
Read
5555H
AAH
2AAAH
55H
5555H
F0H
RA
RD
Autoselect
5555H
AAH
2AAAH
55H
5555H
90H
00H
40H
01H
00H(1)
A0H(2)
Byte
Program
5555H
AAH
2AAAH
55H
5555H
A0H
PA
PD(4)
Chip Erase
5555H
AAH
2AAAH
55H
5555H
80H
5555H
AAH
2AAAH
55H
5555H
10H
Sector Erase 5555H
AAH
2AAAH
55H
5555H
80H
5555H
AAH
2AAAH
55H
PA(3)
30H
NOTES:
1. Top Boot Sector
2. Bottom Boot Sector
3. PA: The address of the memory location to be programmed.
4. PD: The data at the byte address to be programmed.
the device ignores any program attempt into the
device. The internal erase completion can be
determined via DATA polling or toggle bit.
The V29C51000T/V29C51000B is shipped with
pre-erased sectors (all bits = 1).
attempt to read the device will received the
complement of the loaded data on I/O7. Once the
program cycle is completed, I/O7 will show true
data, and the device is then ready for the next
cycle.
Chip Erase Cycle
Toggle Bit (I/O6)
The V29C51000T/V29C51000B features a chiperase operation. The chip erase operation is
initiated by using a specific six-bus-cycle
sequence: two unlock program cycles, a setup
command, two additional unlock program cycles,
and the chip erase command (see Table 2).
The chip erase operation is performed
sequentially, one sector at a time. When the
automated on chip erase algorithm is requested
with the chip erase command sequence, the device
automatically programs and verifies the entire
memory array for an all zero pattern prior to erasure
The automatic erase begins on the rising edge of
the last WE or CE pulse in the command sequence
and terminates when the data on DQ7 is “1”.
The V29C51000T/V29C51000B also features
another method for determining the end of a
program cycle. When the device is in the program
cycle, any attempt to read the device will result in
l/O6 toggling between 1 and 0. Once the program is
completed, the toggling will stop. The device is then
ready for the next operation. Examining the toggle
bit may begin at any time during a program cycle.
Boot Block Protection
The V29C51000T/V29C51000B features
hardware Boot Block Protection. This feature will
prevent erasing/programming of data in the Boot
Block once the feature is enabled (see Table 3).
The device is shipped with the Boot Block
unprotected.
Program Cycle Status Detection
Autoselect
There are two methods for determining the state
of the V29C51000T/V29C51000B during a
program (erase/program) cycle: DATA Polling
(I/O7) and Toggle Bit (I/O6).
The V29C51000T/V29C51000B features an
Autoselect mode to identify the Boot Block
(protected/unprotected), the Device (Top/Bottom),
and the manufacturer ID.
To get to the Autoselect mode, a high voltage
(VH) must be applied to the A9 pin. Once the A9
signal is returned to LOW or HIGH, the device will
return to the previous mode.
DATA Polling (I/O7)
The V29C51000T/V29C51000B features DATA
polling to indicate the end of a program cycle.
When the device is in the program cycle, any
V29C51000T/V29C51000B Rev. 0.5 October 2000
10
MOSEL VITELIC
V29C51000T/V29C51000B
Boot Block Detection
Manufacturer ID
In Autoselect mode, performing a read at
address 3CXX2H or address 0CXX2H will indicate
if the Top Boot Block sector or the Bottom Boot
Block sector is locked out. If the data is 01H, the
Top/Bottom Boot Block is protected. If the data is
00H, the Top/Bottom Boot Block is unprotected.
(see Table 3.)
In Autoselect mode, performing a read at
address. XXXX0H will determine the manufacturer
ID. 40H is the manufacturer code for Mosel Vitelic
Flash.
In addition the manufacturer ID can also be read
via the command register when the device is
erased or programmed in a system without
applying high voltage to the A9 pin. when A0 is
LOW, the manufacturer ID is presented at the
outputs.
Device ID
In Autoselect mode, performing a read at
address XXXXH will determine whether the device
is a Top Boot Block device or a Bottom Boot Block
device. If the data is 00H, the device is a Top Boot
Block. If the data is A0H, the device is a Bottom
Boot Block device (see Table 3).
In addition, the device ID can also be read via the
command register when the device is erased or
programmed in a system without applying high
voltage to the A9 pin. When A0 is HIGH, the device
ID is presented at the outputs.
Hardware Data Protection
VCC Sense Protection: the program operation is
inhibited when VCC is less than 2.5V.
Noise Protection: a CE or WE pulse of less than
5ns will not initiate a program cycle.
Program Inhibit Protection: holding any one of
OE LOW, CE HIGH or WE HIGH inhibits a program
cycle.
Table 3. Autoselect Decoding
Address
Decoding Mode
Boot Block
A0
A1
A2–A13
A14–A17
Boot Block Protection
Top
VIL
VIH
X
VIH
01H: protected
Bottom
VIL
VIH
X
VIL
00H: unprotected
Top
VIH
VIL
X
X
Device ID
Bottom
Manufacture ID
01H
00H
VIL
VIL
NOTE:
1. X = Don’t Care, VIH = HIGH, VIL = LOW.
V29C51000T/V29C51000B Rev. 0.5 October 2000
Data I/O0–I/O7
11
X
X
A0H
MOSEL VITELIC
V29C51000T/V29C51000B
Byte Program Algorithm
Chip/Sector Erase Algorithm
Write Program
Command Sequence
Write Erase
Command Sequence
Add/Data
5555H/AAH
Add/Data
5555H/AAH
2AAAH/55H
2AAAH/55H
Four Bus
Cycle
Sequence
5555H/A0H
5555H/80H
Six Bus
Cycle
Sequence
PA/PD
5555H/AAH
DATA Polling (I/O7)
or Toggle Bit (I/O6)
2AAAH/55H
5555H/10H (Chip Erase)
PA/30H (Sector Erase
No
Verify Byte?
Yes
DATA Polling or Toggle Bit
Successfully Completed
Programming
Completed
Erase Complete
51000-14
V29C51000T/V29C51000B Rev. 0.5 October 2000
12
MOSEL VITELIC
V29C51000T/V29C51000B
DATA Polling Algorithm
No
Toggle Bit Algorithm
Read I/O7
Address = PBA(1)
Read I/O6
I/O7 = Data
Read I/O6
Yes
Yes
I/O6 Toggle
Program
Done
No
Program
Done
51000-15
NOTE:
1. PBA: The byte address to be programmed.
V29C51000T/V29C51000B Rev. 0.5 October 2000
13
MOSEL VITELIC
V29C51000T/V29C51000B
Package Diagrams
32-pin Plastic DIP
1.660 MAX.
15° MAX
INDEX-1
EJECTOR MARK
.600 TYP
0.545/0.555
INDEX-2
+.004
.010 – .0004
.050 MAX
0.210 MAX
0.120 MIN
.100
TYP
+.006
.018 – .002
+.012
.047 – 0
0.010 MIN
.032 +.012
–0
32-pin PLCC
20 19 18
17 16 15 14
21
13
22
12
23
11
24
10
25
9
26
8
27
7
28
.590 ± .005
.550 ± .003
6
29 30 31 32
1
2
3
4
5
.045X45°
.450 ± .003
.110
.490 ± .005
.136 ± .003
.046 ± .003
.025
.050 TYP
30°
.017
.420 ± .003
V29C51000T/V29C51000B Rev. 0.5 October 2000
3° - 6°
3° - 6°
14
3° - 6°
MOSEL VITELIC
V29C51000T/V29C51000B
32-pin TSOP-I
Units in inches
Detail “A”
0.787 ± 0.008
0.010
0.315 TYP.
(0.319 MAX.)
0.024 ± 0.004
0.724 TYP. (0.728 MAX.)
0.035 ± 0.002
SEATING
PLANE
See Detail “A”
0.032 TYP.
0.005 MIN.
0.007 MAX.
V29C51000T/V29C51000B Rev. 0.5 October 2000
0.047 MAX.
0.020 MAX.
0.020 SBC
0.003 MAX
15
0.009 ± 0.002
MOSEL VITELIC
WORLDWIDE OFFICES
V29C51000T/V29C51000B
U.S.A.
TAIWAN
SINGAPORE
UK & IRELAND
3910 NORTH FIRST STREET
SAN JOSE, CA 95134
PHONE: 408-433-6000
FAX: 408-433-0952
7F, NO. 102
MIN-CHUAN E. ROAD, SEC. 3
TAIPEI
PHONE: 886-2-2545-1213
FAX: 886-2-2545-1209
10 ANSON ROAD #23-13
INTERNATIONAL PLAZA
SINGAPORE 079903
PHONE: 65-3231801
FAX: 65-3237013
NO 19 LI HSIN ROAD
SCIENCE BASED IND. PARK
HSIN CHU, TAIWAN, R.O.C.
PHONE: 886-3-579-5888
FAX: 886-3-566-5888
JAPAN
SUITE 50, GROVEWOOD
BUSINESS CENTRE
STRATHCLYDE BUSINESS
PARK
BELLSHILL, LANARKSHIRE,
SCOTLAND, ML4 3NQ
PHONE: 44-1698-748515
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(CONTINENTAL
EUROPE & ISRAEL)
BENZSTRASSE 32
71083 HERRENBERG
GERMANY
PHONE: +49 7032 2796-0
FAX: +49 7032 2796 22
U.S. SALES OFFICES
NORTHWESTERN
SOUTHWESTERN
3910 NORTH FIRST STREET
SAN JOSE, CA 95134
PHONE: 408-433-6000
FAX: 408-433-0952
302 N. EL CAMINO REAL #200
SAN CLEMENTE, CA 92672
PHONE: 949-361-7873
FAX: 949-361-7807
© Copyright 2000, MOSEL VITELIC Inc.
The information in this document is subject to change without
notice.
MOSEL VITELIC makes no commitment to update or keep current the information contained in this document. No part of this
document may be copied or reproduced in any form or by any
means without the prior written consent of MOSEL-VITELIC.
MOSEL VITELIC
CENTRAL,
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SOUTHEASTERN
604 FIELDWOOD CIRCLE
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PHONE: 972-690-1402
FAX: 972-690-0341
10/00
Printed in U.S.A.
MOSEL VITELIC subjects its products to normal quality control
sampling techniques which are intended to provide an assurance
of high quality products suitable for usual commercial applications. MOSEL VITELIC does not do testing appropriate to provide
100% product quality assurance and does not assume any liability for consequential or incidental arising from any use of its products. If such products are to be used in applications in which
personal injury might occur from failure, purchaser must do its
own quality assurance testing appropriate to such applications.
3910 N. First Street, San Jose, CA 95134-1501 Ph: (408) 433-6000 Fax: (408) 433-0952 Tlx: 371-9461