NEC 2SC2148

DATA SHEET
SILICON TRANSISTORS
2SC2148, 2SC2149
MICROWAVE LOW NOISE AMPLIFIER
NPN SILICON EPITAXIAL TRANSISTOR
DESCRIPTION
The 2SC2148, 2SC2149 are economical microwave transistors
PACKAGE DIMENSIONS
encapsulated into new hermetic stripline packages, "micro X".
(Unit : mm)
These are designed for small signal amplifier, low noise amplifier,
FEATURES
4.0 MIN.
2SC2148 NF: 2.1 dB TYP. @f = 500 MHz
2
0.5±0.05
4.0 MIN.
1
and oscillator applications in the L to C band, and CML circuit use.
4.0 MIN.
4
4.0 MIN.
2SC2149 NF: 2.6 dB TYP. @f = 2.0 GHz
45°
3
Emitter
Collector
Emitter
Base
1.8 MAX.
0.1−0.03
1.
2.
3.
4.
+0.06
0.55
0.5±0.05
2.55±0.2
φ 2.1
Derating curves of the 2SC2148, 2SC2149.
The maximum junction temperature of these transistors is allowed up to 200 °C, but the ambient or storage
temperature is limitted to 150 °C. The operating junction temperature is estimated with power consumption (PT) and
thermal resistance mentioned on these derating curves.
The information in this document is subject to change without notice.
Document No. P11809EJ2V0DS00 (2nd edition)
(Previous No. TC-1428)
Date Published August 1996 P
Printed in Japan
©
1981
2SC2148, 2SC2149
PT−Total Power Dissipation−mW
2SC2148
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
500
with infinite heat sink; Rth(j-c) 130 °C/W
mounting on ceramic boad with solder
(Al2O3 20 × 50 × 0.635 mm)
; Rth(j-a) 190 °C/W
400
300
200
free-air; Rth(j-a) 610 °C/W
100
0
50
100
150
200
48
TA−Ambient Temperature−°C
2SC2149
PT−Total Power Dissipation−mW
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
600
with infinite heat sink; Rth(j-c) 120 °C/W
400
mounting on ceramic boad with solder
(Al2O3 20 × 50 × 0.635 mm)
; Rth(j-a) 180 °C/W
200
free-air; Rth(j-a) 600 °C/W
0
50
100 110
140 150
TA−Ambient Temperature−°C
2
200
2SC2148, 2SC2149
2SC2148
ABSOLUTE MAXIMUM RATINGS (TA = 25 °C)
Collector to Base Voltage
V CBO
30
V
Collector to Emitter Voltage
V CEO
14
V
Emitter to Base Voltage
V EBO
3.0
V
Collector Current
IC
50
mA
Total Power Dissipation
P T(TA = 48 °C)
250
mW
Total Power Dissipation
P T(Tc = 150 °C)
250
mW
Junction Temperature
Tj
200
°C
Storage Temperature
Tstg
−65 to +150
°C
ELECTRICAL CHARACTERISTICS (TA = 25 °C)
CHARACTERISTIC
SYMBOL
MIN.
TYP.
MAX.
UNIT
TEST CONDITIONS
Collector Cutoff Current
ICBO
0.1
µA
VCB = 15 V, IE = 0
Emitter Cutoff Current
IEBO
0.1
µA
VEB = 2.0 V, IC = 0
DC Current Gain
hFE
Gain Bandwidth Product
fT
Output Capacitance *
Cob
Insertion Gain
S21e
Noise Figure
NF
2.1
Maximum Available Gain
MAG
13.3
30
2
80
7.5
200
VCE = 10 V, IC = 10 mA
3.0
GHz
0.55
pF
VCB = 10 V, IE = 0, f = 1.0 MHz
9.3
dB
VCE = 10 V, IC = 10 mA, f = 1.0 GHz
dB
VCE = 10 V, IC = 3.0 mA, f = 500 MHz
dB
VCE = 10 V, IC = 10 mA, f = 1.0 GHz
3.5
VCE = 10 V, IC = 10 mA
* The emitter terminal should be connected to the guard terminal of the three-terminal capacitance bridge.
TYPICAL CHARACTERISTICS (TA = 25 °C)
DC CURRENT GAIN vs.
COLLECTOR CURRENT
200
COLLECTOR CURRENT vs.
BASE TO EMITTER VOLTAGE
50
VCE = 10 V
IC−Collector Current−mA
hFE−DC Current Gain
VCE = 10 V
100
50
20
10
5
1
10
0.5
1
5
10
IC−Collector Current−mA
50
0.5
0.5
0.6
0.7
0.8
0.9
VBE−Base to Emitter Voltage−V
3
2SC2148, 2SC2149
GAIN BANDWIDTH PRODUCT vs.
COLLECTOR CURRENT
INSERTION GAIN vs.
COLLECTOR CURRENT
15
VCE = 10 V
f = 1.0 GHz
VCE = 10 V
5
S21e2−Insertion Gain−dB
fT−Gain Bandwidth Product−GHz
7
3
1
0.5
0.3
0.1
0.5
1
5
10
10
5
0
0.5
50
1
IC−Collector Current−mA
10
50
IC−Collector Current−mA
COLLECTOR AND EMITTER CAPACITANCE vs.
REVERSE VOLTAGE
NOISE FIGURE vs.
COLLECTOR CURRENT
3
7
VCE = 10 V
f = 500 MHz
f = 1.0 MHz
6
2
1
NF−Noise Figure−dB
Cob−Collector Capacitance−pF
Cib−Emitter Capacitance−pF
5
Cob
Cib
0.5
5
untuned (50 Ω)
4
tuned
3
2
1
0.3
0
0.5
1
2
5
10
20 30
VCB−Collector to Base Voltage−V
VEB−Emitter to Base Voltage−V
4
0
0.5
1
5
10
IC−Collector Current−mA
50
2SC2148, 2SC2149
2SC2149
ABSOLUTE MAXIMUM RATINGS (TA = 25 °C)
Collector to Base Voltage
V CBO
25
V
Collector to Emitter Voltage
V CEO
12
V
Emitter to Base Voltage
V EBO
3.0
V
Collector Current
IC
70
mA
Total Power Dissipation
P T(TA = 25 °C)
290
mW
Total Power Dissipation
P T(Tc = 140 °C)
500
mW
Junction Temperature
Tj
200
°C
Storage Temperature
T stg
−65 to +150
°C
ELECTRICAL CHARACTERISTICS (TA = 25 °C)
CHARACTERISTIC
SYMBOL
MIN.
TYP.
MAX.
UNIT
TEST CONDITIONS
Collector Cutoff Current
ICBO
0.1
µA
VCB = 15 V, IE = 0
Emitter Cutoff Current
IEBO
0.1
µA
VEB = 2.0 V, IC = 0
DC Current Gain
hFE
Gain Bandwidth Product
fT
5.0
GHz
Output Capacitance *
Cob
0.6
pF
S21e2
12.7
dB
Insertion Gain
Noise Figure
NF
Maximum Available Gain
MAG
30
5.0
70
200
VCE = 10 V, IC = 20 mA
6.7
dB
1.7
dB
2.6
4.0
VCE = 10 V, IC = 20 mA
VCB = 10 V, IE = 0, f = 1.0 MHz
f = 1.0 GHz
VCE = 10 V, IC = 20 mA
f = 1.0 GHz
VCE = 10 V, IC = 5.0 mA
dB
17
dB
11
f = 2.0 GHz
f = 2.0 GHz
f = 1.0 GHz
VCE = 10 V, IC = 20 mA
dB
f = 2.0 GHz
* The emitter terminal should be connected to the guard terminal of the three-terminal capacitance bridge.
TYPICAL CHARACTERISTICS (TA = 25 °C)
DC CURRENT GAIN vs.
COLLECTOR CURRENT
COLLECTOR CURRENT vs.
BASE TO EMITTER VOLTAGE
200
70
50 VCE = 10 V
VCE = 10 V
IC−Collector Current−mA
hFE−DC Current Gain
100
50
20
20
10
5
2
1
10
0.5
1
5
10
IC−Collector Current−mA
50 70
0.5
0.5
0.6
0.7
0.8
0.9
VBE−Base to Emitter Voltage−V
5
2SC2148, 2SC2149
GAIN BANDWIDTH PRODUCT vs.
COLLECTOR CURRENT
INSERTION GAIN vs.
COLLECTOR CURRENT
15
VCE = 10 V
5
VCE = 10 V
f = 1.0 GHz
S21e2−Insertion Gain−dB
fT−Gain Bandwidth Product−GHz
7
2
1
0.5
0.2
0.1
0.5
1
5
10
10
5
0
0.5
50 70
1
IC−Collector Current−mA
COLLECTOR AND EMITTER CAPACITANCE vs.
REVERSE VOLTAGE
10
50 70
NOISE FIGURE vs.
COLLECTOR CURRENT
7
2
VCE = 10 V
f = 1.85 GHz
f = 1.0 MHz
6
NF−Noise Figure−dB
Cob−Collector Capacitance−pF
Cib−Emitter Capacitance−pF
5
IC−Collector Current−mA
Cob
1
Cib
0.5
5
4
3
2
1
0.3
0
0.5
1
2
5
10
20 30
VCB−Collector to Base Voltage−V
VEB−Emitter to Base Voltage−V
6
0
0.5
1
5
10
IC−Collector Current−mA
50 70
2SC2148, 2SC2149
[MEMO]
7
2SC2148, 2SC2149
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this document.
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rights of third parties by or arising from use of a device described herein or any other liability arising from use
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intellectual property rights of NEC Corporation or others.
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the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
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"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
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audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
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systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
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they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
M4 96.5