NEC 2SK2826

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
2SK2826
SWITCHING
N-CHANNEL POWER MOS FET
INDUSTRIAL USE
ORDERING INFORMATION
DESCRIPTION
This product is N-Channel MOS Field Effect Transistor
PART NUMBER
PACKAGE
2SK2826
TO-220AB
FEATURES
2SK2826-S
TO-262
• Super Low On-State Resistance
2SK2826-ZJ
TO-263
designed for high current switching applications.
RDS(on)1 = 6.5 mΩ (MAX.) (VGS = 10 V, ID = 35 A)
RDS(on)2 = 9.7 mΩ (MAX.) (VGS = 4.0 V, ID = 35 A)
• Low Ciss : Ciss = 7200 pF (TYP.)
• Built-in Gate Protection Diode
ABSOLUTE MAXIMUM RATINGS (TA = 25 °C)
Drain to Source Voltage (VGS = 0 V)
VDSS
60
V
Gate to Source Voltage (VDS = 0 V)
VGSS(AC)
±20
V
Gate to Source Voltage (VDS = 0 V)
VGSS(DC)
+20, –10
V
ID(DC)
±70
A
ID(pulse)
±280
A
Total Power Dissipation (TC = 25°C)
PT
100
W
Total Power Dissipation (TA = 25°C)
PT
1.5
W
Channel Temperature
Tch
150
°C
Tstg
–55 to + 150
°C
IAS
70
A
EAS
490
mJ
Drain Current (DC)
Drain Current (Pulse)
Note1
Storage Temperature
Single Avalanche Current
Note2
Single Avalanche Energy
Note2
Notes 1. PW ≤ 10 µ s, Duty cycle ≤ 1 %
2. Starting Tch = 25 °C, RA = 25 Ω, VGS = 20 V → 0 V
THERMAL RESISTANCE
Channel to Case
Rth(ch-C)
1.25
°C/W
Channel to Ambient
Rth(ch-A)
83.3
°C/W
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No.
D11273EJ2V0DS00 (2nd edition)
Date Published April 1999 NS CP(K)
Printed in Japan
The mark • shows major revised points.
©
1998
2SK2826
ELECTRICAL CHARACTERISTICS (TA = 25 °C)
CHARACTERISTICS
•
SYMBOL
Drain to Source On-state Resistance
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
RDS(on)1
VGS = 10 V, ID = 35 A
5.5
6.5
mΩ
RDS(on)2
VGS = 4.0 V, ID = 35 A
7.0
9.7
mΩ
VGS(off)
VDS = 10 V, ID = 1 mA
1.0
1.5
2.0
V
Forward Transfer Admittance
| yfs |
VDS = 10 V, ID = 35 A
20
94
Drain Leakage Current
IDSS
VDS = 60 V, VGS = 0 V
10
µA
Gate to Source Leakage Current
IGSS
VGS = ±20 V, VDS = 0 V
±10
µA
Input Capacitance
Ciss
VDS = 10 V
7200
pF
Output Capacitance
Coss
VGS = 0 V
2000
pF
Reverse Transfer Capacitance
Crss
f = 1 MHz
700
pF
•
Turn-on Delay Time
td(on)
ID = 35 A
100
ns
•
Rise Time
VGS(on) = 10 V
1200
ns
•
Turn-off Delay Time
td(off)
VDD = 30 V
440
ns
•
Fall Time
tf
RG = 10 Ω
520
ns
Total Gate Charge
QG
ID = 70 A
150
nC
Gate to Source Charge
QGS
VDD = 48 V
20
nC
Gate to Drain Charge
QGD
VGS = 10 V
40
nC
Gate to Source Cut-off Voltage
tr
Body Diode Forward Voltage
S
VF(S-D)
IF = 70 A, VGS = 0 V
0.97
V
Reverse Recovery Time
trr
IF = 70 A, VGS = 0 V
80
ns
Reverse Recovery Charge
Qrr
di/dt = 100A/µ s
250
nC
TEST CIRCUIT 1 AVALANCHE CAPABILITY
D.U.T.
RG = 25 Ω
PG.
VGS = 20V → 0 V
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
L
50 Ω
VGS
RL
RG
RG = 10 Ω
PG.
VDD
VGS
Wave Form
0
VGS(on)
10 %
90 %
VDD
ID
90 %
90 %
BVDSS
IAS
ID
ID
VGS
0
ID
VDS
t
VDD
Starting Tch
t = 1 µs
Duty Cycle ≤ 1 %
TEST CIRCUIT 3 GATE CHARGE
D.U.T.
IG = 2 mA
PG.
2
50 Ω
0
10 %
10 %
Wave Form
RL
VDD
Data Sheet D11273EJ2V0DS00
td(on)
tr
ton
td(off)
tf
toff
2SK2826
TYPICAL CHARACTERISTICS (TA = 25 °C)
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
140
100
80
60
40
20
0
20
40
60
80
120
100
80
60
40
20
0
100 120 140 160
TC - Case Temperature - ˚C
20
40
60
80
100 120 140 160
TC - Case Temperature - ˚C
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
FORWARD BIAS SAFE OPERATING AREA
1000
Pulsed
ID - Drain Current - A
)
on
100
R
S(
D
t
(a
10
d
ite V)
0
=1
S
0
m
Li
1
=
µs
100
10
µs
ID - Drain Current - A
PW
ID(pulse)
m
s
VG
ID(DC)
10
10
Po
0
we
rD
iss DC
ipa
tio
n
10
m
s
m
s
Lim
ite
d
80
60
VGS =10 V
40
VGS = 4.0 V
20
TC = 25˚C
Single Pulse
1
0.1
1
10
100
0
VDS - Drain to Source Voltage - V
0.2
0.4
0.6
0.8
VDS - Drain to Source Voltage - V
FORWARD TRANSFER CHARACTERISTICS
ID - Drain Current - A
1000
Pulsed
100
10
TA = -25˚C
25˚C
75˚C
125˚C
1
0
2
4
VDS = 10 V
6
8
VGS - Gate to Source Voltage - V
Data Sheet D11273EJ2V0DS00
3
2SK2826
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
rth(t) - Transient Thermal Resistance - ˚C/W
1 000
Rth(ch-A) = 83.3 ˚C/W
100
10
1
Rth(ch-C) = 1.25 ˚C/W
0.1
0.01
0.001
10 µ
Single Pulse
TC = 25˚C
100 µ
1m
10 m
100 m
1
10
100
1 000
100
VDS=10V
Pulsed
VGS = 0V
10
1.0
TA = 175˚C
75˚C
25˚C
-25˚C
0.1
0.1
1.0
10
100
RDS(on) - Drain to Source On-State Resistance - mΩ
ID - Drain Current - A
4
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
30
Pulsed
20
10
TA = 25˚C
ID = 35 A
0
20
10
VGS = 4.0 V
VGS = 10 V
0
10
100
30
GATE TO SOURCE CUTOFF VOLTAGE vs.
CHANNEL TEMPERATURE
Pulsed
30
20
10
VGS - Gate to Source Voltage - V
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
1000
VGS(off) - Gate to Source Cutoff Voltage - V
| yfs | - Forward Transfer Admittance - S
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
RDS(on) - Drain to Source On-State Resistance - mΩ
PW - Pulse Width - s
VDS = 10 V
ID = 1 mA
2.0
1.5
1.0
0.5
0
- 50
ID - Drain Current - A
0
50
100
150
Tch - Channel Temperature - ˚C
Data Sheet D11273EJ2V0DS00
200
Pulsed
20
15
VGS = 4.0 V
10
VGS = 10 V
5
VGS = 10 V
10
VGS = 0 V
1
0.1
0
50
100
150
0
Tch - Channel Temperature - ˚C
100 000
•
td(on), tr, td(off), tf - Switching Time - ns
Ciss
Coss
1 000
Crss
1
10
SWITCHING CHARACTERISTICS
10 000
VGS = 0 V
f = 1 MHz
10 000
1.5
1.0
0.5
VSD - Source to Drain Voltage - V
tr
1 000
100
tf
td(off)
td(on)
100
10
0.1
1
VDS - Drain to Source Voltage - V
10
1.0
10
100
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
8
80
VDS - Drain to Source Voltage - V
trr - Reverse Recovery Time - ns
di/dt = 100 A/µs
VGS = 0 V
100
1
0.1
10
ID - Drain Current - A
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
1000
VDD = 30 V
VGS = 10 V
RG = 10 Ω
100
VGS
60
6
VDD = 48 V
30 V
12 V
40
4
20
2
VDS
0
IF - Drain Current - A
50
100
150
VGS - Gate to Source Voltage - V
- 50
100
0.1
100
ID = 25 A
0
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
Ciss, Coss, Crss - Capacitance - pF
SOURCE TO DRAIN DIODE FORWARD VOLTAGE
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
ISD - Diode Forward Current - A
RDS(on) - Drain to Source On-state Resistance - mΩ
2SK2826
200
QG - Gate Charge - nC
Data Sheet D11273EJ2V0DS00
5
2SK2826
SINGLE AVALANCHE ENERGY
DERATING FACTOR
160
100
IAS = 70 A
EAS
=4
90
Energy Derating Factor - %
| IAS | - Single Avalanche Energy - mJ
SINGLE AVALANCHE ENERGY vs.
INDUCTIVE LOAD
mJ
10
1.0
VDD = 30 V
VGS = 20 V → 0 V
RG = 25 Ω
10 µ
100 µ
VDD = 30 V
RG = 25 Ω
VGS = 20 V → 0 V
IAS ≤ 70 A
140
120
100
80
60
40
20
1m
10 m
L - Inductive Load - H
0
25
50
75
100
125
150
Starting Tch - Starting Channel Temperature - ˚C
6
Data Sheet D11273EJ2V0DS00
2SK2826
PACKAGE DRAWINGS (Unit : mm)
1)TO-220AB (MP-25)
φ 3.6±0.2
1.0±0.5
4.8 MAX.
10.6 MAX.
(10)
1.3±0.2
10.0
4.8 MAX.
1.3±0.2
15.5 MAX.
5.9 MIN.
4
4
1
2
3
1.3±0.2
12.7 MIN.
6.0 MAX.
1.3±0.2
0.5±0.2
0.75±0.1
2.54 TYP.
12.7 MIN.
1 2 3
2.8±0.2
8.5±0.2
3.0±0.3
2)TO-262 (MP-25 Fin Cut)
0.5±0.2
0.75±0.3
2.54 TYP.
2.8±0.2
2.54 TYP.
1.Gate
2.Drain
3.Source
4.Fin (Drain)
2.54 TYP.
1.Gate
2.Drain
3.Source
4.Fin (Drain)
3)TO-263 (MP-25ZJ)
4.8 MAX.
(10)
1.3±0.2
EQUIVALENT CIRCUIT
5.7±0.4
8.5±0.2
1.0±0.5
4
1.4±0.2
0.7±0.2
2
3 2.54 TYP.
2.8±0.2
2.54 TYP. 1
Drain
)
(
R
0.5
)
.8R
(0
Body
Diode
Gate
0.5±0.2
Gate
Protection
Diode
1.Gate
2.Drain
3.Source
4.Fin (Drain)
Source
Remark The diode connected between the gate and source of the transistor serves as a protector against ESD.
When this device actually used, an additional protection circuit is externally required if a voltage
exceeding the rated voltage may be applied to this device.
Data Sheet D11273EJ2V0DS00
7
2SK2826
• The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
• No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
• NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
• Descriptions of circuits, software, and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these circuits,
software, and information in the design of the customer's equipment shall be done under the full responsibility
of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third
parties arising from the use of these circuits, software, and information.
• While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
• NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
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systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
M7 98. 8