NEC 2SK3325-ZJ

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
2SK3325
SWITCHING
N-CHANNEL POWER MOS FET
INDUSTRIAL USE
DESCRIPTION
ORDERING INFORMATION
The 2SK3325 is N-Channel DMOS FET device that features
PART NUMBER
PACKAGE
2SK3325
TO-220AB
2SK3325-S
TO-262
2SK3325-ZJ
TO-263
a low gate charge and excellent switching characteristics, and
designed for high voltage applications such as switching power
supply, AC adapter.
FEATURES
• Low gate charge:
QG = 22 nC TYP. (VDD = 400 V, VGS = 10 V, ID = 10 A)
(TO-220AB)
• Gate voltage rating: ±30 V
• Low on-state resistance
RDS(on) = 0.85 Ω MAX. (VGS = 10 V, ID = 5.0 A)
• Avalanche capability ratings
• TO-220AB, TO-262, TO-263 package
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
Drain to Source Voltage (VGS = 0 V)
VDSS
500
V
Gate to Source Voltage (VDS = 0 V)
VGSS(AC)
±30
V
ID(DC)
±10
A
ID(pulse)
±40
A
Total Power Dissipation (TC = 25°C)
PT
85
W
Total Power Dissipation (TA = 25°C)
PT
1.5
W
Channel Temperature
Tch
150
°C
Drain Current (DC)
Drain Current (pulse)
Note1
Storage Temperature
Tstg
–55 to +150
°C
Single Avalanche Current
Note2
IAS
10
A
Single Avalanche Energy
Note2
EAS
10.7
mJ
(TO-262)
(TO-263)
Notes 1. PW ≤ 10 µs, Duty Cycle ≤ 1 %
2. Starting Tch = 25 °C, VDD = 150 V, RG = 25 Ω, VGS = 20 V → 0 V
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No.
D14264EJ1V0DS00 (1st edition)
Date Published May 2000 NS CP(K)
Printed in Japan
©
1999, 2000
2SK3325
ELECTRICAL CHARACTERISTICS (TA = 25 °C)
CHARACTERISTICS
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Drain Leakage Current
IDSS
VDS = 500 V, VGS = 0 V
100
µA
Gate to Source Leakage Current
IGSS
VGS = ±30 V, VDS = 0 V
±100
nA
VGS(off)
VDS = 10 V, ID = 1 mA
2.5
3.5
V
| yfs |
VDS = 10 V, ID = 5.0 A
2.0
RDS(on)
VGS = 10 V, ID = 5.0 A
0.68
VDS = 10 V, VGS = 0 V, f = 1 MHz
1200
pF
Gate to Source Cut-off Voltage
Forward Transfer Admittance
Drain to Source On-state Resistance
4.0
S
Ω
0.85
Input Capacitance
Ciss
Output Capacitance
Coss
190
pF
Reverse Transfer Capacitance
Crss
10
pF
Turn-on Delay Time
td(on)
VDD = 150 V, ID = 5.0 A, VGS(on) = 10 V,
21
ns
RG = 10 Ω, RL = 60 Ω
11
ns
td(off)
40
ns
tf
9.5
ns
22
nC
Rise Time
tr
Turn-off Delay Time
Fall Time
Total Gate Charge
QG
Gate to Source Charge
QGS
6.5
nC
Gate to Drain Charge
QGD
7.5
nC
IF = 10 A, VGS = 0 V
1.0
V
IF = 10 A, VGS = 0 V, di/dt = 50 A / µs
0.5
µs
2.6
µC
Body Diode Forward Voltage
VDD = 400 V, VGS = 10 V, ID = 10 A
VF(S-D)
Reverse Recovery Time
trr
Reverse Recovery Charge
Qrr
TEST CIRCUIT 1 AVALANCHE CAPABILITY
D.U.T.
RG = 25 Ω
PG.
VGS = 20 → 0 V
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
L
50 Ω
VGS
RL
Wave Form
RG
PG.
VDD
VGS
0
VGS(on)
10 %
90 %
VDD
ID
90 %
90 %
BVDSS
IAS
ID
VGS
0
ID
VDS
ID
τ
VDD
Starting Tch
τ = 1 µs
Duty Cycle ≤ 1 %
TEST CIRCUIT 3 GATE CHARGE
D.U.T.
IG = 2 mA
PG.
2
50 Ω
0
10 %
10 %
Wave Form
RL
VDD
Data Sheet D14264EJ1V0DS00
td(on)
tr
ton
td(off)
tf
toff
2SK3325
TYPICAL CHARACTERISTICS(TA = 25 °C)
Figure1. DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
Figure2. TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
100
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
100
80
60
40
20
0
20
40
80
60
100 120
140
80
60
40
20
0
160
20
40
W
10
0
Po
rD
ip
VGS = 20 V
µs
s
m
at
io
n
Li
160
Pulsed
10
s
iss
1
=
µs
1m
10
we
140
20
ID (pulse) P
ID - Drain Current - A
ID - Drain Current - A
10
100 120
Figure4. DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
Figure3. FORWARD BIAS SAFE OPERATING AREA
100
ID (DC)
80
Tc - Case Temperature - ˚C
Tc - Case Temperature - ˚C
d
ite )
im 0 V
)L 1
on
=
(
S
S
RD t VG
(a
60
m
ite
10 V
8.0 V
10
VGS = 6.0 V
d
Tc = 25 ˚C
Single Pulse
0.1
1
10
100
1000
0
VDS - Drain to Source Voltage - V
4
8
12
16
VDS - Drain to Source Voltage - V
Figure5. DRAIN CURRENT vs.
GATE TO SOURCE VOLTAGE
100
Pulsed
ID - Drain Current - A
10
1
0.1
TA = –25 ˚C
25 ˚C
75 ˚C
125 ˚C
0.01
0.001
0.0001
0
5
10
15
VGS - Gate to Source Voltage - V
Data Sheet D14264EJ1V0DS00
3
2SK3325
rth (t) - Transient Thermal Resistance - ˚C/W
Figure6. TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
100
Rth(ch-A) = 83.0 ˚C/W
10
Rth(ch-C) = 1.47 ˚C/W
1
0.1
Tc = 25 ˚C
Single Pulse
0.01
0.0001
0.001
0.01
0.1
1
10
100
1000
IyfsI - Forward Transfer Admittance - S
Figure7. FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
10
1
TA = –25 ˚C
25 ˚C
75 ˚C
125 ˚C
0.1
0.01
0.01
VDS = 10 V
Pulsed
0.1
1
10
100
RDS(on) - Drain to Source On-state Resistance - Ω
PW - Pulse Width - s
Figure8. DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
2.0
ID = 10 A
5.0 A
2.0 A
1.0
0.0
Pulsed
0
Pulsed
2.0
1.0
1
10
25
100
4.0
VDS = 10 V
ID = 1 mA
3.0
2.0
1.0
0.0
–50
0
50
100
150
Tch - Channel Temperature - ˚C
ID - Drain Current - A
4
20
Figure10. GATE TO SOURCE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
VGS(off) - Gate to Source Cut-off Voltage - V
RDS(on) - Drain to Source On-state Resistance - Ω
Figure9. DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
0
0.1
15
VGS - Gate to Source Voltage - V
ID - Drain Current - A
3.0
10
5
Data Sheet D14264EJ1V0DS00
200
Figure12. SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
Figure11. DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
3.0
100
ISD - Diode Forward Current - A
2.0
ID = 10 A
ID = 5.0 A
1.0
VGS = 10 V
0.0
–50
0
50
100
Pulsed
10
VGS = 10 V
1
VGS = 0 V
0.1
0.01
0.0
150
0.5
Tch - Channel Temperature - ˚C
VSD - Source to Drain Voltage - V
Figure13. CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
Figure14. SWITCHING CHARACTERISTICS
1000
VGS = 0 V
f = 1.0 MHz
Ciss
1000
Coss
100
10
Crss
1
td(on), tr, td(off), tf - Switching Time - ns
Ciss, Coss, Crss - Capacitance - pF
10000
tr
tf
100
td(on)
td(off)
10
VDD = 150 V
VGS = 10 V
RG = 10 Ω
1
0.1
0.1
10
1
1.5
1.0
100
1
10
ID - Drain Current - A
1000
100
VDS - Drain to Source Voltage - V
Figure16. DYNAMIC INPUT/OUTPUT CHARACTERISTICS
Figure15. REVERSE RECOVERY TIME vs.
DRAIN CURRENT
800
1000
ID = 10 A
di/dt = 50 A/µs
VGS = 0 V
VDS - Drain to Source Voltage - V
trr - Reverse Recovery Time - ns
900
800
700
600
500
400
300
200
100
0.1
1
10
12
VDD = 400 V
250 V
100 V
600
500
VGS
10
400
8
300
6
200
4
VDS
100
0
0
14
700
100
5
10
2
15
20
VGS - Gate to Source Voltage - V
RDS(on) - Drain to Source On-state Resistance - Ω
2SK3325
0
25
QG - Gate Charge - nC
IF - Drain Current - A
Data Sheet D14264EJ1V0DS00
5
2SK3325
Figure18. SINGLE AVALANCHE ENERGY vs
INDUCTIVE LOAD
Figure17. SINGLE AVALANCHE ENERGY vs
STARTING CHANNEL TEMPERATURE
ID(peak) = IAS
RG = 25 Ω
VGS = 20 V → 0 V
VDD = 150 V
14
12
EAS = 10.7 mJ
10
8
6
4
2
0
25
50
75
100
125
150
175
100
IAS - Single Avalanche Energy - A
EAS - Single Avalanche Energy - mJ
16
10
IAS = 10 A
EAS
= 10
.7 m
J
1
0.1
10 µ
Starting Tch - Starting Channel Temperature - ˚C
6
RG = 25 Ω
VDD = 150 V
VGS = 20 V → 0 V
Starting Tch = 25 ˚C
Data Sheet D14264EJ1V0DS00
100 µ
1m
L - Inductive Load - H
10 m
2SK3325
PACKAGE DRAWINGS (Unit : mm)
4.8 MAX.
10.6 MAX.
φ 3.6±0.2
(10)
1.3±0.2
10.0
4.8 MAX.
1.3±0.2
4
1
1 2 3
12.7 MIN.
6.0 MAX.
1.3±0.2
1.3±0.2
0.75±0.3
2.54 TYP.
0.5±0.2
0.75±0.1
2.54 TYP.
2
3
8.5±0.2
15.5 MAX.
5.9 MIN.
4
12.7 MIN.
3.0±0.3
2)TO-262 (MP-25 Fin Cut)
1.0±0.5
1)TO-220AB (MP-25)
0.5±0.2
2.8±0.2
2.54 TYP.
2.8±0.2
1.Gate
2.Drain
3.Source
4.Fin (Drain)
2.54 TYP.
1.Gate
2.Drain
3.Source
4.Fin (Drain)
3)TO-263 (MP-25ZJ)
4.8 MAX.
(10)
1.3±0.2
EQUIVALENT CIRCUIT
5.7±0.4
8.5±0.2
1.0±0.5
4
1.4±0.2
0.7±0.2
2
3 2.54 TYP.
2.8±0.2
2.54 TYP. 1
Remark
Drain
(0
)
.5R
)
.8R
(0
Body
Diode
Gate
0.5±0.2
1.Gate
2.Drain
3.Source
4.Fin (Drain)
Source
Strong electric field, when exposed to this device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as
much as possible, and quickly dissipate it once, when it has occurred.
Data Sheet D14264EJ1V0DS00
7
2SK3325
• The information in this document is current as of May, 2000. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
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third parties by or arising from the use of NEC semiconductor products listed in this document or any other
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• Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
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parties arising from the use of these circuits, software and information.
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The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
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(Note)
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(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
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M8E 00. 4