NEC NE23383B

SUPER LOW NOISE AMPLIFIER
N-CHANNEL HJ FET NE23383B
(SPACE QUALIFIED)
OUTLINE DIMENSIONS (Units in mm)
FEATURES
• SUPER LOW NOISE FIGURE:
NF = 0.35 dB TYP at f = 4 GHz
PACKAGE OUTLINE 83B
1.88 ± 0.3
• HIGH ASSOCIATED GAIN:
GA = 15.0 dB TYP at f = 4 GHz
1
• GATE LENGTH = LG = 0.3 µm
• GATE WIDTH = WG = 280 µm
• HERMETIC SEALED CERAMIC PACKAGE
0.5 ± 0.1
1.88 ± 0.3
4
2
• HIGH RELIABILITY
4.0 MIN (ALL LEADS)
3
DESCRIPTION
1.0 ± 0.1
The NE23383B is a heterojunction FET that utilizes the
heterojunction to create high mobility electrons. The device
features mushroom shaped gate for decreased gate resistance and improved power handling capabilities. The mushroom gate structure also results in low noise figure and high
associated gain. The device is housed in a rugged hermetically sealed metal ceramic stripline package selected for
industrial and space applications.
APPLICATION
NEC's stringent quality assurance and test procedures assure
the highest reliability and performance.
• BEST SUITED FOR LOW NOISE AMPS STAGE AT
C AND X BAND
1.45 MAX
+0.07
0.1
-0.03
ELECTRICAL CHARACTERISTICS (TA = 25°C)
PART NUMBER
PACKAGE OUTLINE
SYMBOLS
PARAMETERS AND CONDITIONS
NE23383B
UNITS
MIN
TYP
MAX
0.35
0.45
NF
Noise Figure at VDS = 2 V, ID = 10 mA, f = 4 GHz
dB
GA
Associated Gain at VDS = 2 V, ID = 10 mA, f = 4 GHz
dB
13.0
15.0
IDSS
Saturated Drain Current at VDS = 2 V, VGS = 0 V
mA
15
40
80
V
-0.2
-0.8
-2.0
45
70
VGS(off)
Gate to Source Cut off Voltage at VDS = 2 V, ID = 100 µA
gM
Transconductance at VDS = 2 V, ID = 10 mA
ms
IGDO
Gate to Drain Leakage Current at VGD = -3 V
µA
0.5
10
IGSO
Gate to Source Leakage Current at VGS = -3 V
µA
0.5
10
California Eastern Laboratories
NE23383B
ABSOLUTE MAXIMUM RATINGS1 (TA = 25°C)
SYMBOLS
PARAMETERS
UNITS
RATINGS
VDS
Drain to Source Voltage
V
4.0
VGS
Gate to Source Voltage
V
–3.0
Drain Current
mA
IDSS
PTOT
Total Power Dissipation
mW
165
TCH
Channel Temperature
°C
175
TSTG
Storage Temperature
°C
-65 to +175
ID
RECOMMENDED
OPERATING CONDITIONS (TA = 25°C)
PART NUMBER
NE23383B
SYMBOLS
PARAMETERS
VDS
Drain to Source Voltage
UNITS MIN TYP MAX
V
2
3
ID
Drain Current
mA
10
20
PIN
Input Power
dBm
0
Note:
1. Operation in excess of any one of these conditions may result in
permanent damage.
TYPICAL PERFORMANCE CURVES (TA = 25°C)
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
VGS = 0 V
50
200
Drain Current, ID (mA)
Total Power Dissipation, PTOT (mW)
250
150
100
50
0
50
100
150
200
-0.2 V
30
-0.4 V
20
-0.6 V
10
0
250
1
2
3
4
5
Ambient Temperature, TA (°C)
Drain to Source Voltage, VDS (V)
DRAIN CURRENT vs.
GATE TO SOURCE VOLTAGE
MAXIMUM AVAILABLE
GAIN, FORWARD INSERTION GAIN
vs. FREQUENCY
24
Maximum Stable Gain, MSG (dB)
Maximum Available Gain, MAG (dB)
Forward Insertion Gain, |S21|2 (dB)
50
VDS = 2 V
40
Drain Current, ID (mA)
40
30
20
10
0
VDS = 2 V
ID = 10 mA
MSG
20
MAG
16
|S21|
2
12
8
4
-2.0
-1.0
Gate to Source Voltage, VGS (V)
0
1
2
4
6
8 10
Frequency, f (GHz)
14
20
30
NE23383B
TYPICAL NOISE PARAMETERS (TA = 25°C)
VDS = 2 V, ID = 10 mA
ΓOPT
FREQ.
NFmin
GA
(GHz)
(dB)
(dB)
MAG
ANG
Rn/50
2.0
0.32
16.0
0.90
26
0.35
4.0
0.35
15.0
0.80
51
0.29
6.0
0.41
13.7
0.70
75
0.22
8.0
0.50
12.6
0.61
101
0.15
10.0
0.62
11.5
0.53
127
0.09
12.0
0.75
10.5
0.48
154
0.05
14.0
0.88
9.6
0.45
-178
0.05
16.0
1.02
8.8
0.44
-147
0.07
18.0
1.15
8.0
0.48
-115
0.14
TYPICAL SCATTERING PARAMETERS (TA = 25°C)
NE23383B
VDS = 2 V, ID = 10 mA
FREQUENCY
S11
GHz
MAG
2.0
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
11.0
12.0
13.0
14.0
15.0
16.0
17.0
18.0
0.96
0.91
0.88
0.80
0.77
0.69
0.63
0.59
0.57
0.55
0.54
0.53
0.53
0.53
0.53
0.52
0.50
S21
ANG
-39.94
-53.81
-64.11
-74.58
-85.67
-98.42
-115.67
-132.86
-145.83
-154.21
-164.09
-179.26
169.19
157.02
149.49
136.67
117.26
MAG
5.00
4.54
4.07
3.85
3.73
3.71
3.64
3.44
3.18
2.97
2.91
2.88
2.78
2.65
2.69
2.69
2.59
S12
S22
K
ANG
MAG
ANG
MAG
ANG
141.49
125.98
113.15
100.67
88.48
75.46
60.60
46.21
32.90
22.06
10.84
-2.27
-16.05
-29.31
-41.55
-57.64
-76.16
0.03
0.04
0.05
0.05
0.06
0.07
0.08
0.08
0.08
0.08
0.08
0.08
0.08
0.08
0.08
0.09
0.09
66.70
58.07
52.54
47.00
42.12
36.19
28.39
21.00
13.97
7.90
6.58
3.61
-4.59
-9.21
-10.08
-17.82
-30.52
0.52
0.54
0.54
0.57
0.51
0.46
0.41
0.40
0.41
0.43
0.46
0.47
0.46
0.49
0.55
0.58
0.61
-25.96
-38.70
-44.90
-51.85
-57.28
-66.10
-80.09
-95.43
-109.27
-115.64
-120.71
-131.41
-146.02
-156.04
-166.37
-177.96
-159.46
0.22
0.36
0.46
0.67
0.76
0.90
0.98
1.07
1.12
1.26
1.24
1.15
1.20
1.18
0.98
0.85
0.81
Note:
1. Gain Calculations:
MAG =
|S21|
|S12|
(K ±
K 2- 1
). When K ≤ 1, MAG is undefined and MSG values are used. MSG =
EXCLUSIVE NORTH AMERICAN AGENT FOR
2
2
2
|S21|
, K = 1 + | ∆ | - |S11| - |S22| , ∆ = S11 S22 - S21 S12
|S12|
2 |S12 S21|
RF, MICROWAVE & OPTOELECTRONIC SEMICONDUCTORS
CALIFORNIA EASTERN LABORATORIES • Headquarters • 4590 Patrick Henry Drive • Santa Clara, CA 95054-1817 • (408) 988-3500 • Telex 34-6393 • FAX (408) 988-0279
24-Hour Fax-On-Demand: 800-390-3232 (U.S. and Canada only) • Internet: http://WWW.CEL.COM
7/98
DATA SUBJECT TO CHANGE WITHOUT NOTICE