NEC UPA1857

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
µPA1857
N-CHANNEL MOS FIELD EFFECT TRANSISTOR
FOR SWITCHING
PACKAGE DRAWING (Unit: mm)
DESCRIPTION
The µPA1857 features a low on-state resistance and
excellent switching characteristics, and is suitable for
applications such as power switch of portable machine
and so on.
8
5
1
2, 3
4
5
6, 7
8
FEATURES
• Low on-state resistance
RDS(on)1 = 67.0 mΩ MAX. (VGS = 10 V, ID = 2.0 A)
RDS(on)2 = 86.0 mΩ MAX. (VGS = 4.5 V, ID = 2.0 A)
RDS(on)3 = 95.0 mΩ MAX. (VGS = 4.0 V, ID = 2.0 A)
• Low Ciss Ciss = 580 pF TYP.
• Built-in G-S protection diode against ESD
µ PA1857GR-9JG
Power TSSOP8
1
4
0.65
VDSS
60
V
Gate to Source Voltage (VDS = 0 V)
VGSS
±20
V
Drain Current (DC) (TA = 25°C)
ID(DC)
±3.8
A
ID(pulse)
±15.2
A
PT1
1.0
W
PT2
1.7
W
Note2
Note2
Total Power Dissipation (2unit)
Channel Temperature
Tch
150
°C
Storage Temperature
Tstg
–55 to +150
°C
IAS
3.8
A
EAS
33
mJ
Single Avalanche Current
Note3
Single Avalanche Energy
Note3
1.0 ±0.2
0.1
0.10 M
EQUIVALENT CIRCUIT
Drain to Source Voltage (VGS = 0 V)
Total Power Dissipation (1unit)
4.4 ±0.1
0.8 MAX.
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
Note1
0.5
0.6 +0.15
–0.1
6.4 ±0.2
3.15 ±0.15
3.0 ±0.1
0.27 +0.03
–0.08
Drain Current (pulse)
0.25
0.1±0.05
0.145 ±0.055
PACKAGE
1.2 MAX.
1.0±0.05
3° +5°
–3°
ORDERING INFORMATION
PART NUMBER
:Drain1
:Source1
:Gate1
:Gate2
:Source2
:Drain2
Drain1
Gate1
Drain2
Body
Diode
Gate
Protection
Diode
Source1
Gate2
Body
Diode
Gate
Protection
Diode
Source2
Notes 1. PW ≤ 10 µs, Duty Cycle ≤ 1%
2
2. TA = 25°C Mounted on ceramic substrate of 50 cm x 1.1 mm
3. Starting Tch = 25°C, VDD = 30 V, RG = 25 Ω, VGS = 20 → 0 V
Remark
The diode connected between the gate and source of the transistor serves as a protector against ESD.
When this device actually used, an additional protection circuit is externally required if a voltage
exceeding the rated voltage may be applied to this device.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No.
G15060EJ2V0DS00 (2nd edition)
Date Published April 2001 NS CP(K)
Printed in Japan
The mark ★ shows major revised points.
©
2001
µPA1857
ELECTRICAL CHARACTERISTICS (TA = 25°C)
CHARACTERISTICS
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Zero Gate Voltage Drain Current
IDSS
VDS = 60 V, VGS = 0 V
10
µA
Gate Leakage Current
IGSS
VGS = ±20 V, VDS = 0 V
±10
µA
VGS(off)
VDS = 10 V, ID = 1 mA
1.5
2.0
2.5
V
| yfs |
VDS = 10 V, ID = 2.0 A
2.5
5.4
RDS(on)1
VGS = 10 V, ID = 2.0 A
53
67.0
mΩ
RDS(on)2
VGS = 4.5 V, ID = 2.0 A
64
86.0
mΩ
RDS(on)3
VGS = 4.0 V, ID = 2.0 A
71
95.0
mΩ
Gate Cut-off Voltage
Forward Transfer Admittance
Drain to Source On-state Resistance
S
Input Capacitance
Ciss
VDS = 10 V
580
pF
Output Capacitance
Coss
VGS = 0 V
100
pF
Reverse Transfer Capacitance
Crss
f = 1 MHz
50
pF
Turn-on Delay Time
td(on)
VDD = 30 V, ID = 2.0 A
10
ns
VGS = 10 V
9
ns
RG = 6 Ω
32
ns
4
ns
Rise Time
tr
Turn-off Delay Time
td(off)
Fall Time
tf
Total Gate Charge
QG
VDD = 48 V
12
nC
Gate to Source Charge
QGS
VGS = 10 V
2
nC
Gate to Drain Charge
QGD
ID = 3.8 A
3
nC
Body Diode Forward Voltage
VF(S-D)
IF = 3.8 A, VGS = 0 V
0.80
V
Reverse Recovery Time
trr
IF = 3.8 A, VGS = 0 V
33
ns
Reverse Recovery Charge
Qrr
di/dt = 100 A / µs
58
nC
TEST CIRCUIT 1 AVALANCHE CAPABILITY
D.U.T.
RG = 25 Ω
PG.
VGS = 20 → 0 V
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
L
50 Ω
VGS
RL
Wave Form
RG
PG.
VDD
VGS
0
VGS(on)
10%
90%
VDD
VDS
90%
BVDSS
IAS
VDS
VDS
ID
Starting Tch
τ
τ = 1 µs
Duty Cycle ≤ 1%
TEST CIRCUIT 3 GATE CHARGE
PG.
2
50 Ω
10%
0
10%
Wave Form
VDD
D.U.T.
IG = 2 mA
90%
VDS
VGS
0
RL
VDD
Data Sheet G15060EJ2V0DS
td(on)
tr
ton
td(off)
tf
toff
µPA1857
TYPICAL CHARACTERISTICS (TA = 25°C)
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
2
PT - Total Power Dissipation - W
dT - Derating Factor - %
120
100
80
60
40
20
1.8
1.6
1.4
1.2
25
50
75
100
125
TA - Ambient Temperature - ˚C
0
★
150
1unit
1
0.8
0.6
0.4
0.2
0
0
25
0
RD V
(@
PW
ID(pulse)
d
ite V)
Lim10
=
1m
s
ID(DC)
10
ms
1
DC
(
10
0m
DC
s
(
2u
nit
)
1u
nit
)
0.1
Single Pulse Mounted on Ceramic
Board of 50 cm2x1.1 mm
PD (FET1) : PD (FET2) = 1 : 1
0.01
0.1
100
10.0
1.0
3
VGS(off) - Gate Cut-off Voltage - V
ID - Drain Current - A
0.2
0.4
0.6
0.8
GATE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
TA = 125˚C
25˚C
75˚C
−25˚C
0.0001
0
4
FORWARD TRANSFER CHARACTERISTICS
0.001
1
2
3
150
4.0 V
VGS = 10 V
VDS - Drain to Source Voltage - V
0.1
0.00001
8
VDS - Drain to Source Voltage - V
10
0.01
125
12
0
0
100.0
VDS = 10 V
1
100
4.5 V
=1
00
µs
ID - Drain Current - A
ID - Drain Current - A
100
n)
GS
75
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
16
o
S(
50
TC - Case Temperature - ˚C
FORWARD BIAS SAFE OPERATING AREA
10
Single Pulse
Mounted on Ceramic
Board of 50 cm2 x1.1 mm
2unit:
PD (FET1) : PD (FET2) = 1 : 1
2unit
4
1.0
VDS = 10 V
ID = 1 mA
2.5
2
1.5
1
−50
VGS - Gate to Source Voltage - V
0
50
100
150
Tch - Channel Temperature - ˚C
Data Sheet G15060EJ2V0DS
3
FORWARD TRANSFER ADMITTANCE Vs.
DRAIN CURRENT
| yfs | - Forward Transfer Admittance - S
100
RDS(on) - Drain to Source On-state Resistance - mΩ
µPA1857
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
160
VDS = 10 V
VGS = 4.0 V
120
10
1
TA = −25˚C
25˚C
75˚C
125˚C
0.10
0.010
0.01
0.1
1
10
100
TA = 125˚C
75˚C
80
25˚C
−25˚C
40
0
0.01
0.1
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
160
VGS = 4.5 V
120
TA = 125˚C
75˚C
80
25˚C
−25˚C
40
0
0.01
0.1
1
10
100
ID = 2.0 A
110
4.5 V
VGS = 4.0 V
70
10 V
30
0
50
100
150
RDS (on) - Drain to Source On-state Resistance - mΩ
RDS (on) - Drain to Source On-state Resistance - mΩ
130
10
−50
160
VGS = 10 V
120
TA = 125˚C
80
75˚C
25˚C
−25˚C
40
0
0.01
0.1
1
10
100
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
150
ID = 2.0 A
125
100
75
50
25
0
0
2
4
6
8
10
12
14
16
VGS - Gate to Source Voltage - V
Tch - Channel Temperature - ˚C
4
100
ID - Drain Current - A
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
50
10
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
ID - Drain Current - A
90
1
ID - Drain Current - A
RDS(on) - Drain to Source On-state Resistance - mΩ
RDS(on) - Drain to Source On-state Resistance - mΩ
ID - Drain Current - A
Data Sheet G15060EJ2V0DS
18
20
µPA1857
CAPACITANCE vs.
DRAIN TO SOURCE VOLTAGE
SWITCHING CHARACTERISTICS
100
f = 1 MHz
1000
td(on), tr, td(off), tf - Switching Time - ns
Ciss, Coss, Crss - Capacitance - pF
10000
Ciss
100
Coss
Crss
10
0.1
1
10
td(off)
10
tf
1
0.1
100
VDS - Drain to Source Voltage - V
trr - Reverse Recovery Time - ns
IF - Source to Drain Current - A
1
ID - Drain Current - A
100
VGS = 0 V
10
1
0.1
0.01
0.4
VDD = 30 V
VGS(on) = 10 V
RG = 6 Ω
0.6
0.8
1
10
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
SOURCE TO DRAIN DIODE FORWARD VOLTAGE
100
td(on)
tr
10
1
0.1
1.2
di/dt = 100 A/µs
VGS = 0 V
VF(S-D) - Body Diode Forward Voltage - V
1.0
10
100
IF - Drain Current - A
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
VGS - Gate to Source Voltage - V
VDS - Drain to Source Voltage - V
12
10
8
VDD = 48 V
30 V
12 V
6
4
2
ID = 3.8 A
0
0
2
4
6
8
10
12
QG - Gate Charge - nC
Data Sheet G15060EJ2V0DS
5
µPA1857
SINGLE AVALANCHE ENERGY
DERATING FACTOR
SINGLE AVALANCHE CURRENT vs.
INDUCTIVE LOAD
120
Energy Derating Factor - %
IAS - Single Avalanche Current - A
10
IAS = 3.8 A
EAS = 33 mJ
VDD = 30 V
RG = 25 Ω
VGS = 20 → 0 V
Starting Tch = 25˚C
1
10 µ
100 µ
1m
100
80
60
40
20
0
25
10m
50
75
100
125
150
Starting Tch - Starting Channel Temperature - ˚C
L - Inductive Load - H
★
VDD = 30 V
RG = 25 Ω
VGS = 20 → 0 V
IAS ≤ 3.8 A
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
rth(t) - Transient Thermal Resistance - ˚C/W
1000
Rth(ch-A) = 125˚C/W (1unit)
Rth(ch-A) = 73.5˚C/W (2unit)
100
10
1
0.01
0.0001
Single Pulse
Mounted on Ceramic
Board of 50 cm2 x1.1 mm
2unit:
PD (FET1) : PD (FET2) = 1 : 1
0.001
0.01
0.1
1
10
PW - Pulse Width - s
6
Data Sheet G15060EJ2V0DS
100
1000
µPA1857
[MEMO]
Data Sheet G15060EJ2V0DS
7
µPA1857
• The information in this document is current as of April, 2001. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
• NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
• Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
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agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
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"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
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Customers must check the quality grade of each semiconductor product before using it in a particular
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systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
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support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
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(Note)
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(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
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M8E 00. 4