SEME-LAB 2N3904CSM

SEME
2N3904CSM
LAB
GENERAL PURPOSE
NPN TRANSISTOR IN A
HERMETICALLY SEALED
CERAMIC SURFACE MOUNT PACKAGE
FOR HIGH RELIABILITY APPLICATIONS
MECHANICAL DATA
Dimensions in mm (inches)
FEATURES
• SILICON PLANAR EPITAXIAL NPN
TRANSISTOR
0.31 rad.
(0.012)
3
2
• HERMETIC CERAMIC SURFACE MOUNT
PACKAGE (SOT23 COMPATIBLE)
0.76 ± 0.15
(0.03 ± 0.006)
2.54 ± 0.13
(0.10 ± 0.005)
0.51 ± 0.10
(0.02 ± 0.004)
1
1.91 ± 0.10
(0.075 ± 0.004)
• CECC SCREENING OPTIONS
A
0.31 rad.
(0.012)
3.05 ± 0.13
(0.12 ± 0.005)
A=
1.40
(0.055)
max.
1.02 ± 0.10
(0.04 ± 0.004)
Underside View
PAD 2 – Emitter
• HIGH SPEED SATURATED SWITCHING
APPLICATIONS:
SOT23 CERAMIC
(LCC1 PACKAGE)
PAD 1 – Base
• SPACE QUALITY LEVELS OPTIONS
PAD 3 – Collector
Hermetically sealed surface mount version
of the popular 2N3904 for high reliability /
space applications requiring small size
and low weight devices.
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise stated)
VCBO
Collector – Base Voltage
60V
VCEO
Collector – Emitter Voltage
40V
VEBO
Emitter – Base Voltage
6V
IC
Collector Current
PD
Total Device Dissipation
200mA
@ TA =25°C
Derate above 25°C
RθJA
Thermal Resistance Junction – Ambient
TSTG , TJ
Operating and Storage Temperature Range
Semelab plc.
Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.
500mW
2.86mW / °C
350°C/W
–55 to +200°C
Prelim. 4/95
SEME
2N3904CSM
LAB
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated)
Parameter
Test Conditions
Min.
Typ.
Max. Unit
V(BR)CEO*
Collector – Emitter Breakdown Voltage IC = 1mA
IB = 0
40
V(BR)CBO
Collector – Base Breakdown Voltage
IC = 10µA
IE = 0
60
V(BR)EBO
Emitter – Base Breakdown Voltage
IE = 10µA
IC = 0
6
ICEX
Collector – Emitter Cut-off Current
VCE = 30V
VEB = 3V
50
VCE(sat)
Collector – Emitter Saturation Voltage
IC = 10mA
IB = 1mA
0.2
IC = 50mA
IB = 5mA
0.3
VBE(sat)*
Base – Emitter Saturation Voltage
IC = 10mA
IB = 1mA
IC = 50mA
IB = 5mA
hFE*
DC Current Gain
VCE = 1V
V
0.65
nA
0.85
0.95
IC = 0.1mA
40
IC = 1mA
70
IC = 10mA
100
IC = 50mA
60
IC = 100mA
30
300
V
V
—
* Pulse Test: tp ≤ 300µs, δ ≤ 2%.
SMALL SIGNAL CHARACTERISTICS (TA = 25°C unless otherwise stated)
Parameter
Test Conditions
Min.
ft
Current Gain Bandwidth Product
Cob
Output Capacitance
Cib
Input Capacitance
hie
Input Impedance
hoe
Output Admittance
hre
Voltage Feedback Ratio
hfe
Small Signal Current Gain
NF
Noise Figure
VCE = 20V
IC = 10mA
f = 100MHz
VCB = 5V
Typ.
300
MHz
IE = 0
4
pF
8
pF
1
10
kΩ
1
40
µhmos
0.5
8
x 10-4
100
400
—
5
dB
f = 1MHz
VBE = 0.5V
IC = 0
f = 1MHz
VCE = 10V
IC = 1mA
f = 1kHz
VCE = 5V
IC = 100µA
f = 1kHz
RS = 1kΩ
SWITCHING CHARACTERISTICS (TA = 25°C unless otherwise stated)
Parameter
Test Conditions
Max. Unit
Min.
Typ.
Max. Unit
td
Delay Time
VCC = 3V
VBE = 0.5V
35
tr
Rise Time
IC = 10mA
IB1 = 1mA
35
ts
Storage Time
VCC = 3V
VBE = 0.5V
200
tf
Fall Time
IB1 = IB2 = 1mA
Semelab plc.
Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.
ns
50
Prelim. 4/95