SEME-LAB D2089

TetraFET
D2089UK
METAL GATE RF SILICON FET
MECHANICAL DATA
GOLD METALLISED
MULTI-PURPOSE SILICON
DMOS RF FET
1W – 28V – 2GHz
SINGLE ENDED
H
4
B
3
1
G
(2 pls)
D
2
FEATURES
F
C
(2 p ls)
• SIMPLIFIED AMPLIFIER DESIGN
E
A
PIN 1
SOURCE
PIN 2
GATE
PIN 3
SOURCE
PIN 4
DRAIN
• SUITABLE FOR BROAD BAND APPLICATIONS
• LOW Crss
• SIMPLE BIAS CIRCUITS
DIM
A
B
C
D
E
F
G
H
Millimetres
25.40
45°
0.76
5.21 DIA
1.02
0.13
3.18
3.18
Tol.
0.25
5°
0.05
0.13
0.13
0.02
0.13
REF
Inches
1.00
45°
0.030
0.205
0.040
0.005
0.125
0.125
Tol.
0.010
5°
0.002
0.005
0.005
0.001
0.005
REF
• LOW NOISE
• HIGH GAIN
APPLICATIONS
• HF/VHF/UHF COMMUNICATIONS
from DC to 2 GHz
ABSOLUTE MAXIMUM RATINGS (Tcase = 25°C unless otherwise stated)
PD
BVDSS
BVGSS
ID(sat)
Tstg
Tj
Semelab plc.
Power Dissipation
Drain – Source Breakdown Voltage
Gate – Source Breakdown Voltage
Drain Current
Storage Temperature
Maximum Operating Junction Temperature
Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.
4W
65V
±20V
1A
–65 to 150°C
200°C
Prelim. 5/96
D2089UK
ELECTRICAL CHARACTERISTICS (Tcase = 25°C unless otherwise stated)
Parameter
Test Conditions
Min.
BVDSS
Drain–Source
Typ.
Max. Unit
VGS = 0
|D = 10mA
VDS = 28V
VGS = 0
1
mA
VGS = 20V
VDS = 0
1
µA
VGS(th) Gate Threshold Voltage
ID = 10mA
VDS = VGS
7
V
gfs
Forward Transconductance*
VDS = 10V
ID = 0.2A
Pout
Power Output
VDS = 28V
IDQ = 75mA
f = 30MHz
Pin = 5mW
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
IDSS
IGSS
Breakdown Voltage
Zero Gate Voltage
Drain Current
Gate Leakage Current
* Pulse Test:
VDS = 0V
VGS = –5V f = 1MHz
VDS = 28V VGS = 0
f = 1MHz
65
1
V
0.18
mhos
750
mW
12
6
pF
0.5
Pulse Duration = 300 µs , Duty Cycle ≤ 2%
THERMAL DATA
RTHj–case
Semelab plc.
Thermal Resistance Junction – Case
Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.
Max. 30°C / W
Prelim. 5/96