SHARP LZ21N3VS

LZ21N3V/VS
1/2-type Interline Color CCD
Area Sensors with 2 140 k Pixels
LZ21N3V/VS
DESCRIPTION
PIN CONNECTIONS
The LZ21N3V/VS are 1/2-type (8.08 mm) solidstate image sensors that consist of PN photodiodes and CCDs (charge-coupled devices). With
approximately 2 140 000 pixels (1 704 horizontal x
1 255 vertical), the sensor provides a stable highresolution color image.
20-PIN HALF-PITCH WDIP
20-PIN HALF-PITCH WSOP
OD 1
FEATURES
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
Optical size : 8.08 mm (aspect ratio 4 : 3)
Interline scan format
Square pixel
Number of effective pixels : 1 650 (H) x 1 250 (V)
Number of optical black pixels
– Horizontal : 2 front and 52 rear
– Vertical : 3 front and 2 rear
Number of dummy bits
– Horizontal : 28
– Vertical : 2
Pixel pitch : 3.95 µm (H) x 3.95 µm (V)
R, G, and B primary color mosaic filters
Supports monitoring mode
Low fixed-pattern noise and lag
No burn-in and no image distortion
Blooming suppression structure
Built-in output amplifier
Built-in overflow drain voltage circuit and reset
gate voltage circuit
Variable electronic shutter
Packages
– LZ21N3V : 20-pin half-pitch WDIP [Plastic]
(WDIP020-P-0500)
Row space : 12.20 mm
– LZ21N3VS : 20-pin half-pitch WSOP [Plastic]
(WSOP020-P-0525)
TOP VIEW
20 OS
GND 2
19 GND
OFD 3
18 NC5
PW 4
17 NC4
ØRS 5
16 ØV1A
NC1 6
15 ØV1B
NC2 7
14 ØV2
ØH1 8
13 ØV3A
NC3 9
12 ØV3B
ØH2 10
11 ØV4
(WDIP020-P-0500)
(WSOP020-P-0525)
PRECAUTIONS
• The exit pupil position of lens should be 30 to 50
mm from the top surface of the CCD.
• Refer to "PRECAUTIONS FOR CCD AREA
SENSORS" for details.
COMPARISON TABLE
Package
LZ21N3V
20-pin half-pitch WDIP
LZ21N3VS
20-pin half-pitch WSOP
In the absence of confirmation by device specification sheets, SHARP takes no responsibility for any defects that may occur in equipment using any SHARP devices shown in
catalogs, data books, etc. Contact SHARP in order to obtain the latest device specification sheets before using any SHARP device.
1
LZ21N3V/VS
PIN DESCRIPTION
SYMBOL
OD
PIN NAME
Output transistor drain
OS
ØRS
Output signals
ØV1A, ØV1B, ØV2, ØV3A, ØV3B, ØV4
Vertical shift register clock
ØH1, ØH2
Horizontal shift register clock
Reset transistor clock
OFD
Overflow drain
PW
GND
P-well
Ground
NC1, NC2, NC3, NC4, NC5
No connection
ABSOLUTE MAXIMUM RATINGS
(TA = +25 ˚C)
SYMBOL
VOD
RATING
0 to +15
UNIT
V
NOTE
VOFD
VØRS
Internal output
Internal output
V
V
1
2
Vertical shift register clock voltage
VØV
Horizontal shift register clock voltage
VØH
VPW to +15
–0.3 to +12
V
V
Voltage difference between P-well and vertical clock
VPW-VØV
–24 to 0
V
Voltage difference between vertical clocks
Storage temperature
VØV-VØV
TSTG
0 to +15
–40 to +85
V
˚C
TOPR
–20 to +70
˚C
PARAMETER
Output transistor drain voltage
Overflow drain voltage
Reset gate clock voltage
Ambient operating temperature
3
NOTES :
1. Do not connect to DC voltage directly. When OFD is connected to GND, connect VOD to GND. Overflow drain clock is
applied below 22 Vp-p.
2. Do not connect to DC voltage directly. When ØRS is connected to GND, connect VOD to GND. Reset gate clock is
applied below 8 Vp-p.
3. When clock width is below 10 µs, and clock duty factor is below 0.1%, voltage difference between vertical clocks will be
below 22 V.
2
LZ21N3V/VS
RECOMMENDED OPERATING CONDITIONS
PARAMETER
Ambient operating temperature
SYMBOL
TOPR
MIN.
TYP.
25.0
MAX.
UNIT
˚C
Output transistor drain voltage
Overflow drain clock p-p level
VOD
12.5
13.0
13.5
V
VØOFD
18.6
19.5
20.9
V
1
Ground
P-well voltage
GND
VPW
VØVL
V
V
2
–6.65
V
LOW level
Vertical shift
register clock
INTERMEDIATE level
HIGH level
VØV1AL, VØV1BL, VØV2L
VØV3AL, VØV3BL, VØV4L
0.0
–8.0
–7.35
VØV1AI, VØV1BI, VØV2I
VØV3AI, VØV3BI, VØV4I
VØV1AH, VØV1BH
–7.0
0.0
V
12.5
13.0
13.5
V
–0.05
0.0
0.05
V
Horizontal shift
LOW level
VØV3AH, VØV3BH
VØH1L, VØH2L
register clock
HIGH level
VØH1H, VØH2H
4.5
4.8
5.5
V
VØRS
4.5
4.8
5.5
V
Reset gate clock p-p level
Vertical shift register clock frequency
Horizontal shift register clock frequency
fØV1A, fØV1B, fØV2
fØV3A, fØV3B, fØV4
fØH1, fØH2
7.87
kHz
17.94
MHz
fØRS
17.94
MHz
Reset gate clock frequency
NOTE
1
NOTES :
1. Use the circuit parameter indicated in "SYSTEM CONFIGURATION EXAMPLE", and do not connect to DC voltage directly.
2. VPW is set below VØVL that is low level of vertical shift register clock, or is used with the same power supply that is connected
to VL of V driver IC.
* To apply power, first connect GND and then turn on VOD. After turning on VOD, turn on PW first and then turn on other powers
and pulses. Do not connect the device to or disconnect it from the plug socket while power is being applied.
3
LZ21N3V/VS
CHARACTERISTICS (Drive method : 1/30 s frame accumulation)
(TA = +25 ˚C, Operating conditions : The typical values specified in "RECOMMENDED OPERATING CONDITIONS".
Color temperature of light source : 3 200 K, IR cut-off filter (CM-500, 1 mmt) is used.)
PARAMETER
Standard output voltage
SYMBOL
VO
Photo response non-uniformity
PRNU
Saturation output voltage
VSAT
Dark output voltage
VDARK
Dark signal non-uniformity
DSNU
Sensitivity (green channel)
Smear ratio
R
SMR
Image lag
Blooming suppression ratio
Output transistor drain current
MIN.
TYP.
150
450
530
320
400
mV
5
10
140
UNIT
mV
NOTE
2
%
3
mV
4
0.5
0.5
3.0
2.0
mV
mV
1, 6
1, 7
180
–89
–82
mV
dB
8
9
1.0
%
AI
ABL
IOD
MAX.
1 000
10
11
4.0
8.0
mA
NOTES :
6. The average output voltage under non-exposure
conditions.
7. The image area is divided into 10 x 10 segments under
non-exposure conditions. DSNU is defined by (Vdmax –
Vdmin), where Vdmax and Vdmin are the maximum and
minimum values of each segment's voltage respectively.
8. The average output voltage of G signal when a 1 000
lux light source with a 90% reflector is imaged by a lens
of F4, f50 mm.
9. The sensor is exposed only in the central area of V/10
square with a lens at F4, where V is the vertical image
size. SMR is defined by the ratio of the output voltage
detected during the vertical blanking period to the
maximum output voltage in the V/10 square.
10. The sensor is exposed at the exposure level
corresponding to the standard conditions. AI is defined
by the ratio of the output voltage measured at the 1st
field during the non-exposure period to the standard
output voltage.
11. The sensor is exposed only in the central area of V/10
square, where V is the vertical image size. ABL is
defined by the ratio of the exposure at the standard
conditions to the exposure at a point where blooming is
observed.
• Within the recommended operating conditions of VOD,
VOFD of the internal output satisfies with ABL larger than
1 000 times exposure of the standard exposure conditions,
and VSAT larger than 320 mV.
1. TA = +60 ˚C
2. The average output voltage of G signal under uniform
illumination. The standard exposure conditions are
defined as when Vo is 150 mV.
3. The image area is divided into 10 x 10 segments under
the standard exposure conditions. Each segment's
voltage is the average output voltage of all pixels within
the segment. PRNU is defined by (Vmax – Vmin)/Vo,
where Vmax and Vmin are the maximum and minimum
values of each segment's voltage respectively.
4. The image area is divided into 10 x 10 segments. Each
segment's voltage is the average output voltage of all
pixels within the segment. VSAT is the minimum
segment's voltage under 10 times exposure of the
standard exposure conditions. The operation of OFDC is
high. (for still image capturing)
5. The image area is divided into 10 x 10 segments. Each
segment's voltage is the average output voltage of all
pixels within the segment. VSAT is the minimum
segment's voltage under 10 times exposure of the
standard exposure conditions. The operation of OFDC is
low.
4
LZ21N3V/VS
PIXEL STRUCTURE
OPTICAL BLACK
(2 PIXELS)
OPTICAL BLACK
(2 PIXELS)
1 650 (H) x 1 250 (V)
1 pin
OPTICAL BLACK
(52 PIXELS)
OPTICAL BLACK
(3 PIXELS)
COLOR FILTER ARRAY
(1, 1 250)
Pin arrangement
of the vertical
readout clock
(1 650, 1 250)
ØV3B G B G B G B G B G B
G B G B G B G B G B
ØV1B R G R G R G R G R G
R G R G R G R G R G
ØV3A G B G B G B G B G B
G B G B G B G B G B
ØV1B R G R G R G R G R G
R G R G R G R G R G
ØV3B G B G B G B G B G B
G B G B G B G B G B
ØV1B R G R G R G R G R G
R G R G R G R G R G
ØV3B G B G B G B G B G B
G B G B G B G B G B
ØV1A R G R G R G R G R G
R G R G R G R G R G
ØV3B G B G B G B G B G B
G B G B G B G B G B
ØV1B R G R G R G R G R G
R G R G R G R G R G
ØV3B G B G B G B G B G B
G B G B G B G B G B
ØV1B R G R G R G R G R G
R G R G R G R G R G
ØV3B G B G B G B G B G B
G B G B G B G B G B
ØV1B R G R G R G R G R G
R G R G R G R G R G
ØV3B G B G B G B G B G B
G B G B G B G B G B
ØV1B R G R G R G R G R G
R G R G R G R G R G
ØV3A G B G B G B G B G B
G B G B G B G B G B
ØV1B R G R G R G R G R G
R G R G R G R G R G
ØV3B G B G B G B G B G B
G B G B G B G B G B
ØV1B R G R G R G R G R G
R G R G R G R G R G
ØV3B G B G B G B G B G B
G B G B G B G B G B
ØV1A R G R G R G R G R G
R G R G R G R G R G
ØV3B G B G B G B G B G B
G B G B G B G B G B
ØV1B R G R G R G R G R G
R G R G R G R G R G
(1, 1)
(1 650, 1)
5
LZ21N3V/VS
TIMING CHART
TIMING CHART EXAMPLE
Pulse diagram in more detail is shown in figures q to t after the next page.
Field accumulation mode
q
263
q'
525 1
Frame accumulation Frame accumulation mode
mode at first
q
263
Field accumulation Field accumulation mode at first
mode
w
e
r
t
525 1
656 1
656 1
656 1
q
263
q'
525 1
VD
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
ØOFD
(at OFD shutter operation)
OFDC
OS
(Number of vertical line)
Field accumulation mode
(3, 8, 13,..) (3, 8, 13,..) (3, 8, 13,..)
Not for use (NOTE 1)
Frame accumulation mode
(1, 3, ..., 1247, 1249)
Not for use Field accumulation
2) mode (3, 8, 13,..)
(2, 4, ..., 1248, 1250) (NOTE
NOTES :
1. Do not use these signals immediately after field accumulation mode is transferred to frame
accumulation mode for still image capturing.
2. Do not use these signals immediately after frame accumulation mode is transferred to field
accumulation mode for monitoring image.
* Apply at least an OFD shutter pulse to OFD in each field accumulation mode.
6
LZ21N3V/VS
q VERTICAL TRANSFER TIMING ¿FIELD ACCUMULATION MODE¡
Shutter speed
1/30 s
257 258 259 260 261 262 263 264 265 266 267 268 269 270 271 272 273 274 275 276 277 278 279 280 281 282 283 284
HD
VD
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
OFDC
ØOFD
OS
1203
1213
1223
1233
1243
1198
1208
1218
1228
1238
1248
GB RG GB RG GB RG GB RG GB RG GB
OB1 3
8 13 18
RG GB RG GB
q' VERTICAL TRANSFER TIMING ¿FIELD ACCUMULATION MODE¡
519 520 521 522 523 524 525 1
2
3
4
5
6
7
8
9
Shutter speed
1/30 s
10 11 12 13 14 15 16 17 18 19 20 21
HD
VD
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
OFDC
ØOFD
1193
OS
1203
1213
1223
1233
1243
1198
1208
1218
1228
1238
1248
RG GB RG GB RG GB RG GB RG GB RG GB
OB1
7
3
8
13 18
RG GB RG GB
LZ21N3V/VS
w VERTICAL TRANSFER TIMING ¿FRAME ACCUMULATION MODE AT FIRST¡
519 520 521 522 523 524 525 1
2
3
4
5
6
7
8
Shutter speed
1/15 s
10 11 12 13 14 15 16 17 18 19 20 21
9
HD
VD
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
OFDC
ØOFD
OS
1198
1208
1218
1228
1238
1248
1193
1203
1213
1223
1233
1243
RG GB RG GB RG GB RG GB RG GB RG GB
Not for use
* Do not use the frame signals immediately after accumulation mode is transferred to frame
accumulation mode.
e VERTICAL TRANSFER TIMING ¿FRAME ACCUMULATION MODE¡
618 619 620 621 622 623 624
…
… 655 656 1
2 …
9
10 11 12 13 14 15 16 17 18 19 20 21
HD
VD
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
Charge swept transfer (1 368 stages)
OFDC
ØOFD
OB2
OS
1
3
5
RG RG RG
Not for use
* Do not use the frame signals immediately after field accumulation mode is transferred to frame
accumulation mode.
8
LZ21N3V/VS
r VERTICAL TRANSFER TIMING ¿FRAME ACCUMULATION MODE¡
… 656 1
638 639 640 641 642 643 644 645 646
2 …
9
10 11 12 13 14 15 16 17 18 19 20 21
HD
VD
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
Charge swept transfer (684 stages)
OFDC
ØOFD
1241
OS
1245
1249
1243
1247
OB1
RG RG RG RG RG
OB1 OB3
2
4
GB GB
Not for use
t VERTICAL TRANSFER TIMING ¿FIELD ACCUMULATION MODE AT FIRST¡
640 641 642 643 644 … 656 1
2
3
4
5
6
7
8
HD
VD
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
OFDC
ØOFD
OS
1246
1250
1244
1248
OB2
GB GB GB GB
9
Shutter speed
1/15 s
9 10 11 12 13 14 15 16 17 18 19 20 21
LZ21N3V/VS
READOUT TIMING ¿FIELD ACCUMULATION MODE¡
2280, 1
HD
228
2280, 1
732 852
932
92 212
ØV1A
228
212
ØV1B
172 292
1012
292
ØV2
1052 1172
892
52 252
ØV3A
252
ØV3B
132 332
ØV4
972
40.9 µs (732 bits)
58.8 µs (1 052 bits)
332
6.7 µs
(120 bits) 6.7 µs
(120 bits)
* Keep over 2.2 µs when vertical transfer clock pulse is overlapping.
e
READOUT TIMING ¿FRAME ACCUMULATION MODE¡
2280, 1
HD
228
2280, 1
732 852
932
92 212
ØV1A
ØV1B
172 292
228
212
1012
292
ØV2
252
892
52 252
ØV3A
ØV3B
332
972
132 332
ØV4
40.9 µs (732 bits)
r
2280, 1
HD
ØV1A
ØV1B
6.7 µs
(120 bits)
2280, 1
228
92 212
932
172 292
1012
228
212
292
ØV2
ØV3A
ØV3B
1052 1172
892
52 252
132 332
972
ØV4
6.7 µs
58.8 µs (1 052 bits)
(120 bits)
* Keep over 2.2 µs when vertical transfer clock pulse is overlapping.
10
252
332
LZ21N3V/VS
HORIZONTAL TRANSFER TIMING ¿FIELD ACCUMULATION MODE¡-1
52
2280, 1
HD
92
132
172
212
1 clk = 55.8 ns (= 1/17.9 MHz)
228 252
292
332
ØH1
ØH2
ØRS
OS
πππ1650
OB (52)
40 clk
(= 2.2 µs)
Double transfer
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
Triple transfer
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
192
OFD
11
272
LZ21N3V/VS
HORIZONTAL TRANSFER TIMING ¿FIELD ACCUMULATION MODE¡-2
332
372
412
452
492
532
572
1 clk = 55.8 ns (= 1/17.9 MHz)
600
HD
ØH1
ØH2
ØRS
PRE SCAN (28)
OB (2)
OUTPUT (1 650) 1πππππππ
OS
Double transfer
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
Triple transfer
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
OFD
12
LZ21N3V/VS
HORIZONTAL TRANSFER TIMING ¿FRAME ACCUMULATION MODE¡-1
2280, 1
52
92
132
172
212
1 clk = 55.8 ns (= 1/17.9 MHz)
228 252
292
332
HD
ØH1
ØH2
ØRS
OS
..1650
40 clk
OB (52)
(= 2.2 µs)
Standard transfer
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
192
272
OFD
HORIZONTAL TRANSFER TIMING ¿FRAME ACCUMULATION MODE¡-2
332
372
412
452
492
532
572
1 clk = 55.8 ns (= 1/17.9 MHz)
600
HD
ØH1
ØH2
ØRS
OS
PRE SCAN (28)
OB (2)
OUTPUT (1 650) 1ππππππππ
Standard transfer
ØV1A
ØV1B
ØV2
ØV3A
ØV3B
ØV4
OFD
13
LZ21N3V/VS
CHARGE SWEPT TRANSFER TIMING ¿e¡
621H
622H 623H
1
•••••
655H 656H 1H 2H 3H
•••••
11H 12H
13H
228
HD
2242
2 42 82 122 162
ØV1A
ØV1B
2262
22 62 102 142
ØV2
2242
2 42 82 122 162
ØV3A
ØV3B
2262
22 62 102 142
ØV4
1
2
3
4
• • • • • • •
1366
1367
1368
* Keep over 1.1 µs when vertical transfer clock pulse of charge swept transfer is overlapping.
CHARGE SWEPT TRANSFER TIMING ¿r¡
645H
646H 647H
1
•••••
655H 656H 1H 2H 3H
•••••
11H 12H
13H
228
HD
ØV1A
ØV1B
2242
2 42 82 122 162
2262
22 62 102 142
ØV2
ØV3A
ØV3B
2242
2 42 82 122 162
2262
22 62 102 142
ØV4
1
2
3
4
• • • • • • •
682
683
684
* Keep over 1.1 µs when vertical transfer clock pulse of charge swept transfer is overlapping.
14
VMb
VL
V2
V4
NC
V3B
V3A
V1B
V1A
VMa
VH
15
13 14 15 16 17 18 19 20 21 22 23 24
9
7
6
5
(*1)
4
270
pF
3
(*1)
LZ21N3V
8
0. 1 µF
2
1
11 12 13 14 15 16 17 18 19 20
10
ØV2
ØV3A
ØV3B
ØV4
(*1) ØRS, OFD :
Use the circuit parameter indicated in
this circuit example, and do not connect
to DC voltage directly.
ØV1B
VDD
+VDD
V3X
VH1AX
V1X
V2X
OFDX
VH3BX
POFD
LR36685
+
1
ØH2
2
NC3
3
ØH1
4
NC1
5
NC2
6
0.01 µF
1 M$
100 k$
ØRS
7
1.0 µF
PW
8
100 $
OFD
9
33 k$
OD
12 11 10
47 k$
1 M$
CCD
OUT
+
V4X
VH3AX
5.6 k$
GND
VH1BX
VH
ØH2
VL (VPW)
ØRS
ØH1
OFDC
VOD
LZ21N3V/VS
SYSTEM CONFIGURATION EXAMPLE
OS
GND
NC5
NC4
ØV1A
VOFDH
VH3BX
OFDX
V2X
V1X
VH1AX
V3X
GND
+
VH3AX
V4X
VH1BX
+
PACKAGES FOR CCD AND CMOS DEVICES
PACKAGES
(Unit : mm)
20 WDIP (WDIP020-P-0500)
Center of effective imaging area and center of package
6.90±0.075
0.40±0.40
11
11.20±0.10 (◊2)
12.00±0.10
0.40±0.40
6.00±0.075
20
¬
CCD
1
Rotation error of die : ¬ = 1.0˚MAX.
(◊ 1 : Effective imaging area)
(◊ 2 : Lid's size)
10
12.20±0.10
13.00±0.10 (◊2)
Refractive index : nd = 1.5
0.02
(◊1)
A
±0.10
2.40±0.10
A
3.50±0.10
0.30TYP.
Center of effective imaging area and center of package
(1.00)
11
11.20±0.10 (◊2)
12.00±0.10
0.40±0.40
¬
CCD
13.00±0.10 (◊2)
10
Rotation error of die : ¬ = 1.0˚MAX.
(◊ 1 : Effective imaging area)
(◊ 2 : Lid's size)
(1.00)
13.80±0.10
12.20±0.10
Refractive index : nd = 1.5
0.02
(◊1)
A
A'
,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,
,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,
,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,
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Glass Lid
P-1.27TYP.
0.10
0.30TYP.
0.20 M
16
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CCD
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Package
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,,,,,,,,,,,,,,,,,,,,,,
1-5˚
0.25±0.10
2.90±0.10
1.00±0.10
A
0.50±0.05 (◊2)
1.41±0.05
6.00±0.075
0.50±0.05 (◊2)
1.41±0.05
+0.30
0.40±0.40
20
0.64TYP.
0.02
(◊1)
0.25±0.10
12.20–0
6.90±0.075
2.40±0.10
A'
0.04
0.20 M
20 WSOP (WSOP020-P-0525)
1
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P-1.27TYP.
A'
0.64TYP.
Glass Lid
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,,,,,,,,,,,,,,,,,,,,,,
CCD
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,,,,,,,,,,,,,,,,,,,,,,
,,,,,,,,,,,,,,,,,,,,,,
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Package
,,,,,,,,,,,,,,,,,,,,,,
,,,,,,,,,,,,,,,,,,,,,,
,,,,,,,,,,,,,,,,,,,,,,
14.00±0.10
2.90±0.10
13.80
A'
0.83
0.04
0.02
(◊1)
PRECAUTIONS FOR CCD AREA SENSORS
PRECAUTIONS FOR CCD AREA SENSORS
(In the case of plastic packages)
– The leads of the package are fixed with
package body (plastic), so stress added to a
lead could cause a crack in the package
body (plastic) in the jointed part of the lead.
1. Package Breakage
In order to prevent the package from being broken,
observe the following instructions :
1) The CCD is a precise optical component and
the package material is ceramic or plastic.
Therefore,
ø Take care not to drop the device when
mounting, handling, or transporting.
ø Avoid giving a shock to the package.
Especially when leads are fixed to the socket
or the circuit board, small shock could break
the package more easily than when the
package isn’t fixed.
2) When applying force for mounting the device or
any other purposes, fix the leads between a
joint and a stand-off, so that no stress will be
given to the jointed part of the lead. In addition,
when applying force, do it at a point below the
stand-off part.
Glass cap
Package
Lead
Fixed
Stand-off
3) When mounting the package on the housing,
be sure that the package is not bent.
– If a bent package is forced into place
between a hard plate or the like, the package may be broken.
4) If any damage or breakage occurs on the surface of the glass cap, its characteristics could
deteriorate.
Therefore,
ø Do not hit the glass cap.
ø Do not give a shock large enough to cause
distortion.
ø Do not scrub or scratch the glass surface.
– Even a soft cloth or applicator, if dry, could
cause dust to scratch the glass.
(In the case of ceramic packages)
– The leads of the package are fixed with low
melting point glass, so stress added to a
lead could cause a crack in the low melting
point glass in the jointed part of the lead.
Low melting point glass
Lead
2. Electrostatic Damage
As compared with general MOS-LSI, CCD has
lower ESD. Therefore, take the following anti-static
measures when handling the CCD :
1) Always discharge static electricity by grounding
the human body and the instrument to be used.
To ground the human body, provide resistance
of about 1 M$ between the human body and
the ground to be on the safe side.
2) When directly handling the device with the
fingers, hold the part without leads and do not
touch any lead.
Fixed
Stand-off
17
PRECAUTIONS FOR CCD AREA SENSORS
ø The contamination on the glass surface
should be wiped off with a clean applicator
soaked in Isopropyl alcohol. Wipe slowly and
gently in one direction only.
– Frequently replace the applicator and do not
use the same applicator to clean more than
one device.
◊ Note : In most cases, dust and contamination
are unavoidable, even before the device
is first used. It is, therefore, recommended
that the above procedures should be
taken to wipe out dust and contamination
before using the device.
3) To avoid generating static electricity,
a. do not scrub the glass surface with cloth or
plastic.
b. do not attach any tape or labels.
c. do not clean the glass surface with dustcleaning tape.
4) When storing or transporting the device, put it in
a container of conductive material.
3. Dust and Contamination
Dust or contamination on the glass surface could
deteriorate the output characteristics or cause a
scar. In order to minimize dust or contamination on
the glass surface, take the following precautions :
1) Handle the CCD in a clean environment such
as a cleaned booth. (The cleanliness level
should be, if possible, class 1 000 at least.)
2) Do not touch the glass surface with the fingers.
If dust or contamination gets on the glass
surface, the following cleaning method is
recommended :
ø Dust from static electricity should be blown
off with an ionized air blower. For antielectrostatic measures, however, ground all
the leads on the device before blowing off
the dust.
4. Other
1) Soldering should be manually performed within
5 seconds at 350 °C maximum at soldering iron.
2) Avoid using or storing the CCD at high temperature or high humidity as it is a precise
optical component. Do not give a mechanical
shock to the CCD.
3) Do not expose the device to strong light. For
the color device, long exposure to strong light
will fade the color of the color filters.
18